Characterisation, measurement techniques
The technologies studied, whether advanced or emerging, need to be characterised in order to extract their performance (extraction of figures of merit), as well as to extract model parameters. Several types of spike measurements can be performed.
- RF characterisation up to 500 GHz
RF on-wafer measurements require the use of off-wafer and on-wafer calibration techniques adapted to frequency bands up to 500 GHz. Advanced de-embedding techniques also need to be developed where conventional methods cannot be applied. A strategy for the development and design of test structures for each technology under study is conducted by our team, in order to achieve acceptable measurement quality and accuracy up to 500 GHz.