The ”Reliability of devices and systems against Electromagnetic interferences” theme focuses on the  study of the impact of electromagnetic interferences (EMI) on electronic components and systems.

The theme gathers specialists from the ElectroMagnetic compatibility (EMC) field and the researches consider the « Electromagnetic reliability” that concerns the EMC behaviour of devices and systems, considering their mission profile (severe environment, ageing, etc.) and their behaviour against EMI.

Our objective is therefore to study the behaviour of electronic systems, which can range from simple jamming to their definitive destruction, against such interference, and to develop new experimental benches and new simulation models to improve the safety of electronic devices and systems.

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REMI IMS Bordeaux

Presentation of the research theme

With the increase in the number of electronic modules in systems (connected objects for the major application areas of the future: autonomous vehicles, more electric aircraft, connected health, connected cities, etc.) and the availability of impulse (sub-GHz), “high-power” (a few GHz) and millimetre (a few tens to a few hundreds of GHz) sources, the likelihood of scenarios associating intentional or unintentional “low- and high-frequency” electromagnetic interference with electronic systems is becoming increasingly important.

The researchers gathered in the theme have a solid experience in the study of the effects (non-linear behaviour, degradation, destruction…) of EM interference on electronic components and circuits (low frequency analogue/digital, high frequency, power). They have for many years been developing work relating to the analysis of the electromagnetic susceptibility of electronic systems to intentional electromagnetic interferences (IEMI). This work has made it possible to design platforms for measuring this susceptibility.

The research activities are structured around different aspects: the consideration of new technologies and new materials for packaging in the EMC behaviour of devices and systems, the study of the vulnerability of systems to high-power EM disturbances, and finally the study of the electromagnetic behaviour of highly integrated systems both in terms of modelling and the development of measurement techniques in immunity.

The objective is to develop behavioural models (VHDL-AMS, Simplorer… ) and measurement techniques that allow, on the one hand, to take into account the effect of environmental constraints (temperature, humidity rate, saline environment) that can induce premature ageing, on the evolution of the EMC characteristics (emissivity and susceptibility) of electronic components and circuits, and, on the other hand, to understand and predict the behaviour of electronic components, circuits and systems against unintentional and intentional electromagnetic interference (EMI and IEMI). So many studies have been conducted such as the effect of IEMI on the operation of phase-locked loops used in radio frequency receivers, or also the destruction effects induced by AEDEM type IEMI on the low noise amplifier of the input stage of a radio frequency receiver and IEMN-HA (Electromagnetic Pulse of Nuclear Origin – High Altitude) type on low power electronic power supplies of the flyback type.


The team has acquired solid skills in the study of susceptibility at the component and electronic board level, but also at the system level, particularly in the automotive sector. Various studies have led us to develop methodologies for studying the influence of composite materials on the coupling phenomena between EM radiation and automotive equipment and cable bundles, and considering “mesoband” (broadband) signals in EMC tests. More recently, the team has undertaken work on the problem of so-called “intelligent” electromagnetic disturbances of autonomous and connected electronic systems, going as far as “hacking”.

To drive these studies the EMI teams uses facilities such as:

REMI skills

Electromagnetic compatibility and immunity of components and systems

Influence of electromagnetic disturbances on reliability, and, of reliability on electromagnetic immunity

Electromagnetic Reliability

Failure analysis and kinetics of degradation mechanism

Accelerated aging protocols and models, close to actual in-field use conditions

Multiphysics characterization of components and systems

Characterization of materials and of their aging

Contribution to qualification standards


Collaborations and partners

For the various research projects underway, the IMS Bordeaux laboratory and its teams rely on strong partnerships and collaborations, which allow for the creation of a synergy of strengths and a sharing of technical and human resources









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IRT St Exupéry


CEA Gramat





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Latest news from the team

Study of Electromagnetic safety of connected systems (IoT) against intentional electromagnetic interference – (2022-2025)


Meet the members of the research team

Jean-Michel VINASSA
Baptiste HAMARD
Tristan DUBOIS
Geneviéve DUCHAMP
Antoine DUGUET
Isabelle FAVRE
Résumé en français

Les axes de recherche de la thématique Fiabilité des dispositifs face aux interférences électromagnétiques non-intentionnelles et intentionnelles concerne tout particulièrement les interférences électromagnétiques et leur impact sur la fiabilité des composants et systèmes.

Avec l’augmentation du nombre de modules électroniques dans les systèmes (objets connectés pour les grands domaines d’application d’avenir : les véhicules autonomes, l’avion plus électrique, la santé connectée, les villes connectées…) et de la disponibilité des sources impulsionnelles (inférieures au GHz), microondes de « forte puissance » (quelques GHz) et millimétrique (de quelques dizaines à quelques centaines de GHz), la probabilité que des scénarios associant des interférences électromagnétiques intentionnelles ou non « basses et hautes fréquences » et des systèmes électroniques devient de plus en plus importante. Notre objectif est donc d’étudier le comportement des systèmes électroniques, pouvant aller d’un simple brouillage à leur destruction définitive, face à ces interférences, et de développer de nouveaux bancs expérimentaux et de nouveaux modèles de simulation pour améliorer la sécurité des dispositifs électroniques.

L’objectif est l’élaboration de modèles comportementaux (VHDL-AMS, Simplorer…) et le développement de techniques de mesure permettant, d’une part de prendre en compte l’effet de contraintes environnementales (température, taux d’humidité, environnement salin) pouvant induire des vieillissements prématurés, sur l’évolution des caractéristiques CEM (émissivité et susceptibilité) des composants et circuits électroniques, et d’autre part, de comprendre et prédire le comportement de composants, circuits et systèmes électroniques face à des interférences électromagnétiques non-intentionnelles et intentionnelles (IEM et IEMI).

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