Tristan DUBOIS

Associate Professor

Research group : RELIABILITY

Team : REMI,RIAD,WBG

Tel : 0540003377

Read more

Article (9)

Modeling of a Current Injection System for Susceptibility Study Auteur(s): Guillaume Mejecaze, Laurine Curos, Tristan Dubois, Jean-Michel Vinassa, Frédéric Puybaret Lien HAL : https://hal.science/hal-02895355 A New Method for the Characterization of Electronic Components Immunity Auteur(s): Tristan Dubois, Ala Ayed, Jean-Luc Levant, Geneviève Duchamp Lien HAL : https://hal.science/hal-01725100 Immunity Measurement and Modeling of an ADC Embedded in a Microcontroller Using RFIP Technique Auteur(s): Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp Lien HAL : https://hal.science/hal-01725099 Une « Mallette Scan Champ Proche » pour l’enseignement de la compatibilité électromagnétique Auteur(s): Tristan Dubois, J-P. Guillet, G. Duchamp, J. Tomas Lien HAL : https://hal.science/hal-01698515 Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach Auteur(s): S. Hairoud-Airieau, G. Duchamp, Tristan Dubois, J.-Y. Delétage, A. Durier, H. Fremont Lien HAL : https://hal.science/hal-01659294 Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements Auteur(s): Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp Lien HAL : https://hal.science/hal-01180979 Characterization and model of temperature effect on the conducted immunity of Op. Amp Auteur(s): Tristan Dubois, Siham Hairoud, Marcio Gomes de Oliveira, Helene Frémont, Genevieve Duchamp Lien HAL : https://hal.science/hal-01180983 Effect of Low and High Power Continuous Wave Electromagnetic Interference on a Microwave Oscillator System: From VCO to PLL to QPSK Receiver Auteur(s): Tristan Dubois, Laurin Jean Jacques, Jérémy Raoult, Sylvie Jarrix Lien HAL : https://hal.science/hal-00938977 Subharmonic Oscillations Induced by Continuous Wave Electromagnetic Interference on a Microwave Phase-Locked Loop Auteur(s): Tristan Dubois, Laurin Jean Jacques Lien HAL : https://hal.science/hal-00938969

Conference proceedings (40)

A new Investigation Methodology to predict Far Field Radiated Immunity from Near Field Scan Immunity Measurements Auteur(s): André Durier, Sonia Ben Dhia, Alexandre Boyer, Tristan Dubois Lien HAL : https://laas.hal.science/hal-03773310 Study of the coupling of wide band Near Field Scan probe dedicated to the investigation of the radiated immunity of Printed Circuit Boards Auteur(s): André Durier, Sonia Ben Dhia, Tristan Dubois Lien HAL : https://hal.science/hal-02522183 Study of the radiated immunity of a drain-source current sensor using Near Field Scan Immunity method Auteur(s): André Durier, Sonia Ben Dhia, Tristan Dubois Lien HAL : https://hal.science/hal-02523743 Modèle ICIM-CI multiports d'une référence de tension Auteur(s): Siham Hairoud Airieau, Tristan Dubois, Geneviève Duchamp, André Durier Lien HAL : https://hal.science/hal-02141398 Perturbation d’une boucle à verrouillage de phase par injection conduite d’onde électromagnétique Auteur(s): Matthieu Maures, Tristan Dubois, Patrick Hoffmann Lien HAL : https://hal.science/hal-01698523 Preliminary studies of the impact of dose radiation on the electromagnetic susceptibility of comparators Auteur(s): Sylvie Jarrix, Laurent Dusseau, Adrien Doridant, Tristan Dubois, Blain Amable, Jérémy Raoult Lien HAL : https://hal.science/hal-01893985 Modélisation d'un Moyen d'Injection en Courant pour l'Etude Auteur(s): Guillaume Mejecaze, Frédéric Puybaret, Tristan Dubois, Jean-Michel Vinassa Lien HAL : https://hal.science/hal-01698531 Effets du stress électromagnétique sur un transistor p-HEMT GaAs Auteur(s): Maxime Girard, Patrick Hoffmann, Tristan Dubois, Geneviève Duchamp Lien HAL : https://hal.science/hal-01698527 Multiport ICIM-CI modeling approach applied to a bandgap voltage reference Auteur(s): Siham Hairoud Airieau, Tristan Dubois, Geneviève Duchamp, André Durier Lien HAL : https://hal.science/hal-01688230 First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors Auteur(s): Sylvie Jarrix, Laurent Dusseau, Nathalie Chatry, Patrick Hoffmann, Adrien Doridant, Blain Amable, Jérémy Raoult, Tristan Dubois, Philippe Calvel Lien HAL : https://hal.science/hal-01893983 Near-field scan tools for embedded electronic analysis Auteur(s): Tristan Dubois, Geneviève Duchamp, Julien Weckbrodt, Stephane Azzopardi Lien HAL : https://hal.science/hal-01659420 EMC susceptibility characterization of an operational amplifier-based circuit combining different technique Auteur(s): Maxime Girard, Tristan Dubois, Geneviève Duchamp, Patrick Hoffmann Lien HAL : https://hal.science/hal-01659305 An Analog-to-Digital Converter Immunity Modelling based on a Stochastic Approach Auteur(s): Siham Hairoud Airieau, Tristan Dubois, Geneviève Duchamp, André Durier Lien HAL : https://hal.science/hal-01655915 Multiport ICIM-CI modeling approach applied to a bandgap voltage reference Auteur(s): Siham Hairoud Airieau, Tristan Dubois, Geneviève Duchamp, Andre Durier Lien HAL : https://hal.science/hal-01659310 BEHAVIORAL MODELLING TAKING INTO ACCOUNT AGEING EFFECTS FOR IC'S IMMUNITY PREDICTION Auteur(s): Geneviève Duchamp, Tristan Dubois Lien HAL : https://hal.science/hal-01598944 Methodology Based on Experiments and 3-D EM Simulations for Frequency Characterization of Buried Capacitors Auteur(s): Massar Wade, Isabelle Bord-Majek, Tristan Dubois, Genevieve Duchamp Lien HAL : https://hal.science/hal-01109473 Méthode RFIP : vers une meilleure caractérisation de l’immunité des circuits intégrés Auteur(s): Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp Lien HAL : https://hal.science/hal-01109486 Leakage current measurements of core/shell hyperbranched polyester /BaTi03 composites for embedded capacitors Auteur(s): Massar Wade, Isabelle Bord-Majek, Bruno Levrier, Tristan Dubois, Geneviève Duchamp Lien HAL : https://hal.science/hal-01180995 Measurement and simulation of electromagnetic drift for obsolescence management in electronics Auteur(s): Geneviève Duchamp, Tristan Dubois, Ala Ayed, Christian Marot, Hélène Fremont Lien HAL : https://hal.science/hal-01180999 Measurement and Simulation of Electromagnetic Drift for Obsolescence Management in Electronics Auteur(s): Geneviève Duchamp, Tristan Dubois, Ala Ayed, Christian Marot, Hélène Fremont Lien HAL : https://hal.science/hal-01153333 RFIP method: towards a better characterization of integrated circuits immunity Auteur(s): Ala Ayed, Tristan Dubois, Jean-Luc Levant, Genevieve Duchamp Lien HAL : https://hal.science/hal-01109462 Simulations and Measurements to Predict EMC Characteristics in Electronic Assemblies: Obsolescence Management Auteur(s): Geneviève Duchamp, Tristan Dubois, Hélène Frémont Lien HAL : https://hal.science/hal-01153323 Evaluation of a Surface Equivalent Model in the Case of Conductive Reinforced Composite Sheets Auteur(s): Ammar Kader, Marco Klingler, Tristan Dubois, Genevieve Duchamp Lien HAL : https://hal.science/hal-01104480 Evaluation of the EMC Performances of a Partial Composite Vehicle Body Depending on the Type of Material. Auteur(s): Ammar Kader, Marco Klingler, Tristan Dubois, Geneviève Duchamp Lien HAL : https://hal.science/hal-01122149 How SI/EMC and reliability issues could interact together in embedded electronic systems? Auteur(s): K. Weide-Zaage, A. Moujbani, G. Duchamp, Tristan Dubois, Frédéric Verdier, H. Fremont Lien HAL : https://hal.science/hal-01180993 Leakage current measurements of core/shell hyperbranched polyester/BaTiO3 composites for embedded capacitors Auteur(s): Massar Wade, Isabelle Bord-Majek, Bruno Levrier, Tristan Dubois, Geneviève Duchamp Lien HAL : https://hal.science/hal-01188929 Evaluation of the Radiated Field by a Harness Above a Partial Composite Material Chassis Auteur(s): Ammar Kader, Marco Klingler, Tristan Dubois, Genevieve Duchamp Lien HAL : https://hal.science/hal-01109451 Evaluation de la résistance entre deux points d’un matériau composite Auteur(s): Ammar Kader, Marco Klingler, Tristan Dubois, Geneviève Duchamp Lien HAL : https://hal.science/hal-01109481 Embedded capacitor design rules in multilayer organic-based substrate for HF circuits Auteur(s): Massar Wade, Isabelle Bord-Majek, Tristan Dubois, Genevieve Duchamp Lien HAL : https://hal.science/hal-00934187 Surface Equivalent Modeling of Layered Composite Material Auteur(s): Ammar Kader, Marco Klingler, Tristan Dubois, Genevieve Duchamp, Gilles Ruffié, Fabrice Bonnaudin Lien HAL : https://hal.science/hal-00938681 To improve the variability of one complex system with the MKME Auteur(s): Maxime Breant, O. Maurice, Tristan Dubois, Geneviève Duchamp Lien HAL : https://hal.science/hal-00938985 Electromagnetic Susceptibility studies of Op. Amps. and a VCO for a PLL application Auteur(s): Tristan Dubois, Sylvie Jarrix, Jérémy Raoult, Annick Pénarier, Philippe Nouvel, Daniel Gasquet, Bruno Azais Lien HAL : https://hal.science/hal-00991590 Effects of CW interferences on a 5 GHz monolithic VCO Auteur(s): Blain Amable, Jérémy Raoult, Adrien Doridant, Sylvie Jarrix, Tristan Dubois Lien HAL : https://hal.science/hal-00991560 Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling Auteur(s): Siham Hairoud, Tristan Dubois, Geneviève Duchamp, Angélique Tételin Lien HAL : https://hal.science/hal-00938699 On the effect of amplitude modulated EMI injected on a PLL active filter Auteur(s): Tristan Dubois, Laurin Jean Jacques, Jérémy Raoult, Sylvie Jarrix Lien HAL : https://hal.science/hal-00991554 Methodology Based on Experiments and 3-D EM Simulations for Frequency Characterization of Buried Capacitors Auteur(s): Massar Wade, Isabelle Bord-Majek, Tristan Dubois, Genevieve Duchamp Lien HAL : https://hal.science/hal-01067613 Perturbation of components, circuits, systems using near-field injection Auteur(s): Tristan Dubois Lien HAL : https://hal.science/hal-00991577 To improve the variability of one complex system with the MKME Auteur(s): Maxime Breant, Olivier Maurice, Tristan Dubois, Geneviève Duchamp Lien HAL : https://hal.science/hal-00844418 Conception, simulation et réalisation de condensateurs enterrés à base de nanocomposites pour des circuits hautes fréquences Auteur(s): Massar Wade, Isabelle Bord-Majek, Tristan Dubois, Geneviève Duchamp Lien HAL : https://hal.science/hal-00859249 Measurement and simulation of moisture effects on electromagnetic radiation of printed circuit boards Auteur(s): Hassene Fridhi, Geneviève Duchamp, Valerie Vigneras, Alexandrine Guedon-Gracia, Jean-Yves Deletage, Hélène Fremont, Tristan Dubois Lien HAL : https://hal.science/hal-00709116

Send a email to Tristan DUBOIS :

    Contact our team

    If you have a request or questions about the laboratory, please contact our team.