Equipments
Equipments
Chips caracterization on baseplate
- Tester under tips on temperature (4.2K to 350K) to electrical (4 arms) and optical (2 fibres) caracterization
- Very low electrical level measure (DC, impluse 500ns-5A, Keithley electrometer, 10-18 A resolution for 0.1 fA mesured) in direct and reverse regime
- Spectro-polarimetric measure with spectrometer with very high resolution (few pm) networks ine the filed 300nm-*1500nm
- Bench dedicated to polarisation degree by electrominescence laser emitters (below and over the laser threshold) in temperature by optic differentiation of modes TE/TM
- Spectral imagery with silicium camera (0,4-1,1 µm), InGaAs (0,8-1,8 µm), InSb/MCT (3-5 µm) et THz detection