A Premier European Forum for Electronic Reliability
ESREF is the leading European conference dedicated to the reliability of electronic components and systems. Every year, it brings together more than 250 participants from Europe, Asia, and the Americas, creating a unique platform for researchers, engineers, and industry professionals to exchange on the latest advances in Quality and Reliability Management of materials, devices, and circuits in micro-, nano-, and optoelectronics.
This international symposium explores innovative methods to improve the quality and reliability of electronic technologies, from individual components to complex systems, including packages and assemblies. Discussions cover failure analysis, degradation mechanisms, and new strategies for ensuring long-term device performance across emerging applications.
Scientific Highlights and IMS Contributions
Throughout the four days of the symposium, attendees explored a broad range of high-impact technical topics, including:
- Quality and Reliability assessment techniques and methods for Devices and Systems
- Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
- Progress in Failure Analysis: Defect Detection and Analysis
- Reliability of Microwave devices and circuits
- Packaging and Assembly Reliability and Failure Analysis
- Power Devices and Microelectronic System: Reliability and Failure Analysis
- Photonics Reliability
- MEMS and sensors Reliability
- Extreme environments and Radiation
IMS teams were honored to present their latest research contributions, sharing new insights and innovative methodologies developed within the laboratory. Their active participation reflected IMS’ strong commitment to advancing reliability science and supporting industry needs.
An Exhibition Bridging Research and Industry
Alongside the scientific program, ESREF 2025 hosted an exhibition featuring leading in-service providers, equipment manufacturers, and suppliers from the aeronautics, space, and embedded systems sectors. This exhibition provided a valuable opportunity for direct dialogue between academia and industry, showcasing cutting-edge tools and technologies that support reliability assessment and failure analysis.
A Collective Achievement
The IMS Laboratory is proud to have led the organizing committee and co-organized this significant event alongside its valued partners: LAAS-CNRS, CNES, and ADERA. The success of ESREF 2025 highlights the vitality of the European reliability community and reinforces the role of Bordeaux as a hub for scientific excellence and collaboration in electronics.
Conference Chair: François Marc (IMS)
Organizing Committee: Guillaume BASCOUL (CNES), Alexandrine Guédon-Gracia (IMS), Nathalie Labat (IMS), Nicolas Nolhier (LAAS), Loïc Théolier (IMS), Yannick Deshayes (IMS) and Ceren Duffour (ADERA).
A sincere thank you to the sponsors: PVA TePla AG, JEOL EUROPE, and Milexia France; to Région Nouvelle-Aquitaine for their support; and to everyone who contributed to the success of ESREF 2025.
