Article (33)
Miniaturization of InGaP/InGaAs/Ge solar cells for microconcentrator photovoltaics Auteur(s): Pierre Albert, Abdelatif Jaouad, Gwenaëlle Hamon, Maïté Volatier, Christopher E Valdivia, Yannick Deshayes, Karin Hinzer, Laurent Béchou, Vincent Aimez, Maxime Darnon Lien HAL : https://hal.science/hal-03219465v1 Three‐junction monolithic interconnected modules for concentrator photovoltaics Auteur(s): Pierre Albert, Abdelatif Jaouad, Gwenaëlle Hamon, Maïté Volatier, Yannick Deshayes, Laurent Béchou, Vincent Aimez, Maxime Darnon Lien HAL : https://hal.science/hal-03174950v1 Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy Auteur(s): Arnaud Royon, Kevin Bourhis, Laurent Béchou, Thierry Cardinal, Lionel Canioni, Yannick Deshayes Lien HAL : https://hal.science/hal-00932228v1 Extended modal gain measurement in DFB Laser diodes Auteur(s): Massimo Vanzi, Gulia Marchello, Giovanna Mura, Laurent Bechou, Yannick Deshayes, Germain Le Gales, Simon Joly Lien HAL : https://hal.science/hal-01711138v1 Practical optical gain by an extended Hakki-Paoli method Auteur(s): Massimo Vanzi, Gulia Marcello, Giovanna Mura, Germain Le Gales, Simon Joly, Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01711141v1 Examination of femtosecond laser matter interaction in multipulse regime for surface nanopatterning of vitreous substrates Auteur(s): Nadezda Varkentina, Thierry Cardinal, Fabien Moroté, Patrick Mounaix, Pascal André, Yannick Deshayes, Lionel Canioni Lien HAL : https://hal.science/hal-00909676v1 Thermal management characterization of microassembled high power DFB broad area lasers emitting at 975 nm Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Michel Lecompte, Olivier Parillaud, Michel Krakowski, Laurent Bechou Lien HAL : https://hal.science/hal-01711161v1 Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage Auteur(s): Raphael Baillot, Yannick Deshayes, Yves Ousten, Laurent Béchou Lien HAL : https://hal.science/hal-01213954v1 Overview on sustainability, robustness and reliability of GaN single chip LED devices Auteur(s): Yannick Deshayes, Raphael Baillot, Simon Joly, Yves Ousten, Laurent Béchou Lien HAL : https://hal.science/hal-01221533v1 Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes Auteur(s): Pamela del Vecchio, Arnaud Curutchet, Yannick Deshayes, Mauro Bettiati, François Laruelle, Nathalie Labat, Laurent Béchou Lien HAL : https://hal.science/hal-01214031v1 France : Le projet Archive & Forget pour l'archivage longue durée sur disque optique Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-00979982v1 High-power diode laser bars and shear strain Auteur(s): Daniel T. Cassidy, O. Rehioui, Chadwick K. Hall, L. Bechou, Y. Deshayes, A. Kohl, T. Fillardet, Y. Ousten Lien HAL : https://hal.science/hal-00979994v1 Starck effects model used to highlight selective activation of failure mechanisms in MQW InGaN/GaN light emitting diodes Auteur(s): Yannick Deshayes, Laurent Bechou, Yves Ousten Lien HAL : https://hal.science/hal-00979617v1 Effects of silicon coating degradation on GaN MQW LEDs performances using physical and chemical analyses Auteur(s): Raphael Baillot, Yannick Deshayes, Laurent Bechou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten Lien HAL : https://hal.science/hal-00979970v1 Failure Mechanisms in Packaged Light-Emitting Diodes Under Gamma Radiations: Piezoelectric Model Based on Stark Effect Auteur(s): Y. Deshayes, R. Baillot, O. Rehioui, L. Béchou, O. Gilard, Yves Ousten Lien HAL : https://hal.science/hal-00673553v1 Silver Clusters Embedded in Glass as a Perennial High Capacity Optical Recording Medium Auteur(s): Arnaud Royon, Kevin Bourhis, Matthieu Bellec, Gautier Papon, Bruno Bousquet, Yannick Deshayes, Thierry Cardinal, Lionel Canioni Lien HAL : https://hal.science/hal-00672097v1 Thermomechanical Stresses and Optical Misalignment in 1550 nm Emissive Optoelectronic Modules Using FEM and Process Dispersions Auteur(s): Yannick Deshayes, Laurent Bechou, Frederic Verdier, Yves Ousten, Dominique Laffitte, Jean-Luc Goudard Lien HAL : https://hal.science/hal-00402624v1 Proton effects on low noise and high responsivity silicon-based photodiodes for space applications Auteur(s): Guillaume Pedroza, Olivier Gilard, Marie-Lise Bourqui, Laurent Bechou, Yannick Deshayes, Lip Sun How, François Rosala Lien HAL : https://hal.science/hal-00402156v1 Challenges and potential of new approaches for reliability assessment of nanotechnologies Auteur(s): L. Bechou, Y. Danto, J.Y. Deletage, F. Verdier, Y. Deshayes, S. Fregonese, C. Maneux, T. Zimmer, D. Laffitte Lien HAL : https://hal.science/hal-00266387v1 Thermal characteristics measurement of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties Auteur(s): L. Bechou, O. Rehioui, Y. Deshayes, O. Gilard, Gianandrea Quadri, Y. Ousten Lien HAL : https://hal.science/hal-00266383v1 Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation Auteur(s): Yannick Deshayes, Isabelle Bord, Gérard Barreau, Mourad Aiche, Philippe Moretto, Laurent Béchou, A.C. Roherig, Yves Ousten Lien HAL : https://hal.science/hal-00326851v1 Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications Auteur(s): M.L. Bourqui, L. Bechou, O. Gilard, Y. Deshayes, P. del Vecchio, L.S. How, F. Rosala, Y. Ousten, A. Touboul Lien HAL : https://hal.science/hal-00334728v1 Reliability assessment: New tools for the next generation of packages Auteur(s): Isabelle Bord, Bruno Lévrier, Yannick Deshayes, Laurent Béchou, Yves Ousten Lien HAL : https://hal.science/hal-00313790v1 Study of Ca1-xPrxF2+x solid solution thin films grown on silicon substrates. Auteur(s): Pascal Tardy, Yannick Deshayes, Lionel Hirsch, Albert-Serge Barriere, B. Desbat, A. Elfajri Lien HAL : https://hal.science/hal-00183554v1 Impact of 1.55 µm laser diode degradation laws on fibre optic system performances using a system simulator Auteur(s): Laurent Mendizabal, Laurent Bechou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto Lien HAL : https://hal.science/hal-00183948v1 Reliability of Low-Cost PCB Interconnections for Telecommunication Applications Auteur(s): Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto Lien HAL : https://hal.science/hal-00181802v1 Study of influence of failure modes on lifetime distribution prediction of 1.55 µm DFB laser diodes using weak drift of monitored parameters during ageing tests Auteur(s): Laurent Mendizabal, Laurent Bechou, Yannick Deshayes, Frédéric Verdier, Yves Danto, D. Laffitte, Jl Goudard Lien HAL : https://hal.science/hal-00183946v1 Early failure signatures after thermal cycles of 1310 nm Laser modules using electrical, optical and spectral measurements Auteur(s): Yannick Deshayes, Laurent Bechou, Laurent Mendizabal, Yves Danto Lien HAL : https://hal.science/hal-00183947v1 Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations Auteur(s): Jean-Yves Deletage, Frédéric Verdier, Bernard Plano, Yannick Deshayes, Laurent Bechou, Yves Danto Lien HAL : https://hal.science/hal-00183949v1 Three-dimensional FEM simulations of thermomechanical stresses in 1.55 µm Laser modules Auteur(s): Yannick Deshayes, L. Bechou, Jy. Deletage, F. Verdier, Y. Danto, D. Laffitte, Jl. Goudard Lien HAL : https://hal.science/hal-00162350v1 Long-term reliability prediction of 935 nm InGaAs/GaAs Light Emitting Diodes using degradation laws and ageing tests with low acceleration factor Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183945v1 Electroluminescence spectroscopy for reliability investigations of 1.55µm Bulk Semiconductor Optical Amplifier Auteur(s): S. Huyghe, L. Bechou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, Jl. Goudard, Y. Danto Lien HAL : https://hal.science/hal-00162343v1 Spatial distribution of Pr3+ and ions in Ca1-xPrxF2+x luminescent thin films Auteur(s): Pascal Tardy, Yannick Deshayes, Lionel Hirsch, Albert-Serge Barriere, A. Elfajri, B. Desbat Lien HAL : https://hal.science/hal-00183553v1Book (6)
Investigation of LED Devices for Public Light Applications Auteur(s): Raphaël Baillot, Yannick Deshayes Lien HAL : https://hal.science/hal-01711165v1 Fiabilité des LED infrarouges : méthodologie d’évaluation par la physique des défaillances Auteur(s): Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01711168v1 Méthodologies d’analyse de la fiabilité de dispositifs à LED Auteur(s): Raphaël Baillot, Yannick Deshayes Lien HAL : https://hal.science/hal-01711174v1 Reliability, Robustness and Failure Mechanisms of LED Devices Auteur(s): Yannick Deshayes, Laurent Béchou Lien HAL : https://hal.science/hal-01380736v1 DIAGNOSTIC DE DEFAILLANCES DE SYSTEMES OPTOELECTRONIQUES Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-00980005v1 Optoélectronique appliquée : mesures, instrumentation et modèles électro-optiques : diodes électroluminescentes Auteur(s): Y. Deshayes Lien HAL : https://hal.science/hal-01095719v1Book sections (4)
Chapter 7 : Laser Welding : characteristics and FEM simulations Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-00989417v1 Chapter 8 : Reliability estimation from the junction to packaging of LEDs : Light-Emitting Diodes and Optoelectronics: New Research Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-00989418v1 Chapitre 7 : Modélisation - Fiabilité Auteur(s): Y. Ousten, Y. Deshayes, L. Bechou Lien HAL : https://hal.science/hal-00334737v1 Three-Dimensional Techniques for FEM Simulations in Laser Modules and their Applications Auteur(s): Yannick Deshayes, Yves Ousten, Laurent Bechou Lien HAL : https://hal.science/hal-00182867v1Other publication (4)
Achieving a 60% Efficient Laser Diode Design With Optimized Thermal Management Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Laurent Béchou, Michel Lecomte, Olivier Parillaud, Michel Krakowski Lien HAL : https://hal.science/hal-01402314v1 Le projet Archive & Forget Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01219912v1 Archivage numérique pérenne - Les nouvelles solutions de stockage sur disques en verre Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01219923v1 Archivage numérique pérenne - Projet archive & Forget Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01219920v1Conference proceedings (48)
Towards miniaturization of concentrated photovoltaics (CPV): impact on fabrication, performance and robustness of solar cells Auteur(s): Pierre Albert, Gwenaelle Hamon, Maite Volatier, Yannick Deshayes, Abdelatif Jaouad, Vincent Aimez, Laurent Bechou, Maxime Darnon Lien HAL : https://hal.science/hal-03109711v1 Area downsizing effects on electrical performance and robustness of triple junction solar cells for CPV applications Auteur(s): Pierre Albert,, Abdelatif Jaouad, Maite Volatier, Christopher E. Valdivia, Yannick Deshayes, Laurent Bechou, Vincent Aimez., Maxime Darnon Lien HAL : https://hal.science/hal-02443117v1 Front-Contacted Multijunction Micro Solar Cells: Fabrication & Characterization Auteur(s): Pierre Albert, Abdelatif Jaouad, Maxime Darnon, Christopher Valdivia, Maite Volatier, Yannick Deshayes, Karin Hinzer, Laurent Bechou, Vincent Aimez Lien HAL : https://hal.science/hal-02339965v1 High-Voltage Low-Current Multijunction Monolithic Interconnected Microcells Auteur(s): Pierre Albert, Abdelatif Jaouad, Maxime Darnon, Maite Volatier, Yannick Deshayes, Laurent Bechou, Vincent Aimez Lien HAL : https://hal.science/hal-02339963v1 Imagerie multispectrale résolue en temps : Application à l'analyse de défauts ponctuels dans un matériau Auteur(s): Simon Joly, Western Bolanos, Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01721165v1 Failure analysis of laser crystals by their electrical characterization under high pump power density Auteur(s): Western Bolanos, Simon Joly, Inka Manek-Hönninger, Jean-Christophe Delagnes, Eric Cormier, Laurent Bechou, Yannick Deshayes Lien HAL : https://hal.science/hal-01721120v1 Time-resolved multispectral imaging: application to the characterization of photonic devices Auteur(s): Simon Joly, Western Bolanos, Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01721135v1 An extended model for optical gain calculations in single-mode Laser diodes, International Symposium on Reliability of Optoelectronics for Systems Auteur(s): Massimo Vanzi, Marcello Giulia, Giovanna Mura, Germain Le Gales, Simon Joly, Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01720721v1 Accurate electro-optical characterization of high power density GaAs-based laser diodes for screening strategies improvement Auteur(s): Pamela del Vecchio, Yannick Deshayes, Simon Joly, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01721178v1 Thermal Management Characterization of Microassemblied High Power Distributed-Feedback Broad Area Lasers Emitting at 975nm Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Michel Lecompte, Michel Krakowski, Laurent Bechou Lien HAL : https://hal.science/hal-01716130v1 Submillimeter Multijunction Solar Cells: Impact of Dimension, Design and Architecture on Electrical Performances Auteur(s): Pierre Albert, Abdelatif Jaouad, Maxime Darnon, Yannick Deshayes, Laurent Bechou, Vincent Aimez Lien HAL : https://hal.science/hal-01716137v1 Original Screening Methodology based on Correlation between Low-Frequency Noise Measurements and Reverse Bias Behavior of GaAs-based Laser Diodes Auteur(s): Pamela del Vecchio, Arnaud Curutchet, Yannick Deshayes, Simon Joly, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01721054v1 Thermal investigation on high power dfb broad area lasers at 975 nm, with 60% efficiency Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Michel Lecomte, Michel Krakowski, Laurent Bechou Lien HAL : https://hal.science/hal-01380760v1 Original Screening Methodology based on Correlation betweenLow-Frequency Noise Measurements and Reverse Bias Behaviorof GaAs-based Laser Diodes Auteur(s): Pamela del Vecchio, Arnaud Curutchet, Yannick Deshayes, Simon Joly, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01163620v1 Photothermal activated pellicular failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage Auteur(s): Raphael Baillot, Yannick Deshayes, Laurent Béchou, Yves Ousten Lien HAL : https://hal.science/hal-01219195v1 Monte-carlo computations for predicted degradation of photonic devices in space environment Auteur(s): Laurent Bechou, Yannick Deshayes, Yves Ousten, Olivier Gilard, Gianandrea Quadri, L.S. How Lien HAL : https://hal.science/hal-01219189v1 Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy Auteur(s): Arnaud Royon, Kevin Bourhis, Laurent Béchou, Thierry Cardinal, Lionel Canioni, Yannick Deshayes Lien HAL : https://hal.science/hal-01219687v1 Correlation between Forward-Reverse Low-Frequency Noise and atypical I-V signatures in 980nm High-Power Laser Diodes Auteur(s): Pamela del Vecchio, Arnaud Curutchet, Yannick Deshayes, Mauro Bettiati, François Laruelle, Nathalie Labat, Laurent Bechou Lien HAL : https://hal.science/hal-01219200v1 Developpement et caractérisation de laser de pompe monomode, forte puissance et rendement élevé emettant a 975nm Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Robert Y., Eric Vinet, Olivier Parillaud, Michel Krakowski, Laurent Béchou Lien HAL : https://hal.science/hal-01219229v1 Direct Laser-writing in photosensitive glasses: Correlative microscopy of fluorescent silver aggregates and the associated space charge separation Auteur(s): G. Papon, A. Royon, K. Bourhis, N. Marquestaut, Y. Petit, Y. Deshayes, M. Dussauze, V. Rodriguez, T. Cardinal, L. Canioni Lien HAL : https://hal.science/hal-01019283v1 Electro-optical characterizations for robustness assessment of automotive qualified white LEDs multichip modules: failure analysis and packaging influence Auteur(s): B. Chambion, L. Mendizabal, A. Gasse, L. Bechou, Y. Deshayes, V. Carreau Lien HAL : https://hal.science/hal-01019770v1 Résultats du projet Archive & Forget Auteur(s): Y. Deshayes, P. André, L. Canioni Lien HAL : https://hal.science/hal-01020068v1 Femtosecond Laser and chemical etching for surface patterning of glass for long-term data storage Auteur(s): N. Varkentina, A. Royon, T. Cardinal, L. Canioni, Y. Deshayes Lien HAL : https://hal.science/hal-01019861v1 New step towards the future perennial high capacity optical recording medium Auteur(s): A. Royon, K. Bourhis, G. Papon, Matthieu Bellec, B. Bousquet, Y. Deshayes, T. Cardinal, L. Canioni Lien HAL : https://hal.science/hal-01017294v1 Accurate electro-optical characterization of high power density GaAs-based laser diodes for screening strategies improvement Auteur(s): Pamela del Vecchio, Yannick Deshayes, Simon Joly, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-00991556v1 Electro-optical characterizations for robustness assessment of automotive qualified white LEDs multichip modules: failure analysis and packaging influence Auteur(s): B. Chambion, L. Mendizabal, L. Bechou, A. Gasse, Y. Deshayes, V. Carreau Lien HAL : https://hal.science/hal-01022723v1 Eclairage Automobile: Les conséquences de l'intégration de DEL blanches de puissance sur la stratégie des tests de fiabilité Auteur(s): B. Chambion, L. Mendizabal, L. Bechou, V. Carreau, Y. Deshayes, A. Gasse Lien HAL : https://hal.science/hal-00786240v1 Long term reliability prediction of fluorescent silver nanoclusters embedded in glass for perennial optical recording Auteur(s): A. Royon, G. Papon, K. Bourhis, Y. Petit, T. Cardinal, Y. Deshayes, L. Canioni Lien HAL : https://hal.science/hal-00798436v1 Overview of thermal studies on photonics devices for reliability, robustness and new design Auteur(s): Y. Deshayes, A. Royon, R. Baillot, L. Bechou, L. Canioni, Y. Petit, Th. Cardinal, I. Bord, B. Levrier, Y. Ousten Lien HAL : https://hal.science/hal-00786204v1 Optical performances degradation of InGaN/GaN MQW LEDs related to fluorescence shift of copolymer-based silicone coating Auteur(s): R. Baillot, L. Béchou, C. Belin, T. Buffeteau, I. Pianet, C. Absalon, O. Babot, Y. Deshayes, Y. Ousten Lien HAL : https://hal.science/hal-00673972v1 Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses Auteur(s): R. Baillot, Y. Deshayes, L. Bechou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Y. Ousten Lien HAL : https://in2p3.hal.science/in2p3-00532869v1 Méthodologie d'analyse physique pour l'évaluation de la fiabilité de Diodes Electroluminescentes InGaN/GaN Auteur(s): Raphaël Baillot, Yannick Deshayes, Yves Ousten, Laurent Bechou Lien HAL : https://hal.science/hal-00402734v1 Benefits of individual emitter electro-optical characterizations in packaged high power Laser diode bars for space applications Auteur(s): Othman Rehioui, Laurent Bechou, Thierry Fillardet, Andreas Kohl, Daniel T. Cassidy, Yannick Deshayes, Yves Ousten, Gérard Volluet Lien HAL : https://hal.science/hal-00402617v1 Silicon phototransistor reliability assessment and new selection strategies for space applications Auteur(s): Piero Spezzigu, Laurent Bechou, Yannick Deshayes, Yves Ousten, Gianandrea Quadri, Olivier Gilard, Massimo Vanzi Lien HAL : https://hal.science/hal-00402616v1 Lifetime distribution estimation of Light emitting diode Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier Lien HAL : https://hal.science/hal-00402233v1 Different Approaches to Packaging Reliability Auteur(s): Yves Ousten, Laurent Bechou, Frederic Verdier, Yannick Deshayes, Bruno Levrier, Isabelle Bord, Bertrand Carbonne Lien HAL : https://hal.science/hal-00335551v1 Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations Auteur(s): Y. Deshayes, L. Bechou, F. Verdier, B. Tregon, D. Laffitte, Jl. Goudard, Y. Hernandez, Y. Danto Lien HAL : https://hal.science/hal-00162359v1 Impact of radiation effects on AlGaAs/GaAs, InGaN/GaN and AlGaInP/GaP packaged light emitting diodes for space applications Auteur(s): O. Gilard, L. Bechou, B. Kurz, O. Rehioui, M.L. Bourqui, D. Campillo, Y. Deshayes, Gianandrea Quadri Lien HAL : https://hal.science/hal-00162386v1 Etude de la fiabilité de composants et modules optoélectroniques Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-00183955v1 Prédiction de distributions de durées de vie de composants optoélectroniques émissifs 1.55 µm : Lois expérimentales et méthodologie statistique Auteur(s): Laurent Mendizabal, Laurent Bechou, Yannick Deshayes, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183951v1 Three-Dimensional FEM Simulations of Thermomechanical Stresses in 1.55 µm Laser modules Auteur(s): Yannick Deshayes, Laurent Bechou, Yves Danto, D. Laffitte, Jl Goudard Lien HAL : https://hal.science/hal-00183954v1 VIGOR European Project New industrial applications in 3D interconnection Auteur(s): A. Val, J. Delmas, O. Lignier, Y. Ousten, N. Chandler, A. Pizzato, Y. Deshayes Lien HAL : https://hal.science/hal-00162374v1 Prédiction de distributions de durées de vie de composants optoélectroniques émissifs 1.55 µm : Lois expérimentales et méthodologie statistique Auteur(s): L. Bechou, Y. Danto, Y. Deshayes, L. Mendizabal, F. Verdier Lien HAL : https://hal.science/hal-00162364v1 Simulations of thermomechanical stresses and optical misalignment in 1.55 µm emissive optoelectronic modules using FEM and process dispersions Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183953v1 VIGOR European Project New industrial applications in 3D interconnection Auteur(s): A. Val, J. Delmas, O. Lignier, Yves Ousten, N. Chandler, A. Pizzato, Yannick Deshayes Lien HAL : https://hal.science/hal-00182864v1 Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Bernard Tregon, D. Laffitte, Jl Goudard, Y. Hernandez, Yves Danto Lien HAL : https://hal.science/hal-00183952v1 Performance and reliability predictions of 1550 nm WDM optical transmission links using a system simulator Auteur(s): L. Bechou, L. Mendizabal, Christelle Aupetit-Berthelemot, Y. Deshayes, Jean-Michel Dumas, D. Laffitte, J.L. Goudard, Y. Danto Lien HAL : https://hal.science/hal-00162382v1 Three-Dimensional FEM Simulations of Thermomechanical Stresses in 1.55 µm Laser modules Auteur(s): Y. Deshayes, L. Bechou, Y. Danto, D. Laffitte, Jl. Goudard Lien HAL : https://hal.science/hal-00162362v1Invited lectures (17)
Thermal management characterization of microassembled high power DFB broad area lasers emitting at 975 nm Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Michel Lecompte, Olivier Parillaud, Michel Krakowski, Laurent Bechou Lien HAL : https://hal.science/hal-01716140v1 Les LEDs : Un défi technologique permanent Auteur(s): Y. Deshayes Lien HAL : https://hal.science/hal-01140920v1 Les LEDs, un défi technologique permanent Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01221516v1 Les LEDs : un défi technologique permanent Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01221520v1 Overview on reliability investigation on LEDs devices Auteur(s): Raphael Baillot, Laurent Bechou, Colette Belin, Thierry Buffeteau, Isabelle Pianet, Christelle Absalon, Yannick Deshayes Lien HAL : https://hal.science/hal-01219888v1 Les LEDS, un défi technologique permanent Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01177135v1 Les LEDS, un défi technologique permanen Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01219935v1 LES LEDs : un défi technologique permanent Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01177133v1 Overview of light emitting diodes: Reliability estimation from the junction to the packaging Auteur(s): Yannick Deshayes, Laurent Béchou, Yves Ousten Lien HAL : https://hal.science/hal-01223382v1 Les LEDS, un défi technologique permanent Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01177131v1 Les LEDS, un défi technologique permanent Auteur(s): Yannick Deshayes, Laurent Béchou Lien HAL : https://hal.science/hal-01177128v1 Quelques solutions alternatives et leur évaluation Auteur(s): Yannick Deshayes Lien HAL : https://hal.science/hal-01219908v1 Overview of thermal studies on photonics devices for reliability, robustness and new design Auteur(s): Y. Deshayes, A. Royon, R. Baillot, L. Béchou, L. Canioni, Y. Petit, Th. Cardinal, I. Bord, B. Levrier, Y. Ousten Lien HAL : https://hal.science/hal-01019130v1 Les LEDs : un défi technologique permanent Auteur(s): Yannick Deshayes, Laurent Béchou Lien HAL : https://hal.science/hal-01095556v1 Performances and reliability predictions of optical data transmission links using a system simulator for aerospace applications Auteur(s): Laurent Bechou, Yannick Deshayes, Christelle Aupetit-Berthelemot, Alexandre Guerin, Christian Tronche Lien HAL : https://unilim.hal.science/hal-00917358v1 Methodology of failure analysis applied to packaged LEDs Auteur(s): Raphael Baillot, Laurent Bechou, Yannick Deshayes, Colette Belin, Thierry Buffeteau, Isabelle Pianet, Christelle Absalon, Yves Ousten Lien HAL : https://hal.science/hal-00600570v1 Electroluminescence spectroscopy for reliability investigations of 1.55µm Bulk Semiconductor Optical Amplifier Auteur(s): S. Huyghe, L. Bechou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, Jl Goudard, Y. Danto Lien HAL : https://hal.science/hal-00162384v1Send a email to Yannick DESHAYES :
