Frédéric VERDIER

Associate Professor

Research group : RELIABILITY

Team : RIAD

Tel : 0540006556

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Article (12)

Methodological approach for predictive reliability: practical case studies Auteur(s): Hélène Fremont, Geneviève Duchamp, Alexandrine Guedon-Gracia, Frédéric Verdier Lien HAL : https://hal.science/hal-00788556 Challenges and potential of new approaches for reliability assessment of nanotechnologies Auteur(s): L. Bechou, Y. Danto, J.Y. Deletage, F. Verdier, Y. Deshayes, S. Fregonese, C. Maneux, T. Zimmer, D. Laffitte Lien HAL : https://hal.science/hal-00266387 Empirical modeling of LF gate noise in GaAs DCFET in impact ionization regime Auteur(s): Benoit Lambert, Nathalie Malbert, Nathalie Labat, Frédéric Verdier, Andre Touboul Lien HAL : https://hal.science/hal-00183494 Reliability of Low-Cost PCB Interconnections for Telecommunication Applications Auteur(s): Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto Lien HAL : https://hal.science/hal-00181802 Study of influence of failure modes on lifetime distribution prediction of 1.55 µm DFB laser diodes using weak drift of monitored parameters during ageing tests Auteur(s): Laurent Mendizabal, Laurent Bechou, Yannick Deshayes, Frédéric Verdier, Yves Danto, D. Laffitte, Jl Goudard Lien HAL : https://hal.science/hal-00183946 Three-dimensional FEM simulations of thermomechanical stresses in 1.55 µm Laser modules Auteur(s): Yannick Deshayes, L. Bechou, Jy. Deletage, F. Verdier, Y. Danto, D. Laffitte, Jl. Goudard Lien HAL : https://hal.science/hal-00162350 Long-term reliability prediction of 935 nm InGaAs/GaAs Light Emitting Diodes using degradation laws and ageing tests with low acceleration factor Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183945 Comparison of RF and DC life-test effects on GaAs power MESFETs Auteur(s): Benoit Lambert, Nathalie Malbert, Nathalie Labat, Frédéric Verdier, Andre Touboul, Pierre Huguet, François Garat Lien HAL : https://hal.science/hal-00183497 Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations Auteur(s): Jean-Yves Deletage, Frédéric Verdier, Bernard Plano, Yannick Deshayes, Laurent Bechou, Yves Danto Lien HAL : https://hal.science/hal-00183949 Evolution of LF noise in power PHEMTs submitted to RF and DC step Stresses Auteur(s): Benoit Lambert, Nathalie Malbert, Nathalie Labat, Frédéric Verdier, Andre Touboul, Pierre Huguet, René Bonnet, Gérard Pataud Lien HAL : https://hal.science/hal-00183495 Impact of 1.55 µm laser diode degradation laws on fibre optic system performances using a system simulator Auteur(s): Laurent Mendizabal, Laurent Bechou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto Lien HAL : https://hal.science/hal-00183948 Low Frequency Gate Noise in a Diode-Connected MESFET: Measurements and Modeling Auteur(s): Benoit Lambert, Nathalie Malbert, Nathalie Labat, Frédéric Verdier, Andre Touboul, Lode K.J. Vandamme Lien HAL : https://hal.science/hal-00183496

Conference proceedings (24)

How SI/EMC and reliability issues could interact together in embedded electronic systems? Auteur(s): K. Weide-Zaage, A. Moujbani, G. Duchamp, Tristan Dubois, Frédéric Verdier, H. Fremont Lien HAL : https://hal.science/hal-01180993 Intégration de la fiabilité dès la conception du composant : Application aux approches Top-down et Bottom-up Auteur(s): L. Bechou, F. Verdier, Y. Ousten Lien HAL : https://hal.science/hal-00786235 Moisture induced effects in PoP Auteur(s): A. Guédon-Gracia, W. Feng, J.-Y. Delétage, F. Verdier, Hélène Null Fremont Lien HAL : https://hal.science/hal-00385358 Electrically driven matter transport effects in PoP interconnections Auteur(s): W. Feng, K. Weide-Zaage, F. Verdier, B. Plano, A. Guédon-Gracia, Hélène Null Fremont Lien HAL : https://hal.science/hal-00385360 Etude de la fiabilité des assemblages PoP (Package-on-Package) Auteur(s): W. Feng, H. Frémont, A. Guédon-Gracia, F. Verdier, B. Plano Lien HAL : https://hal.science/hal-00403605 Lifetime distribution estimation of Light emitting diode Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier Lien HAL : https://hal.science/hal-00402233 Analytical Model for Thermally-induced Warpage of POP Auteur(s): Wei Feng, Hélène Null Fremont, Alexandrine Guédon-Gracia, Frédéric Verdier, Bernard Plano Lien HAL : https://hal.science/hal-00323410 High Density IC Packaging Reliability Auteur(s): Geneviève Duchamp, Hélène Null Fremont, Alexandrine Guedon-Gracia, Frédéric Verdier Lien HAL : https://hal.science/hal-00323388 Simple Analytical Model for Thermally-induced Warpage of POP Auteur(s): Wei Feng, Hélène Null Fremont, Frédéric Verdier, Bernard Plano Lien HAL : https://hal.science/hal-00323385 Evaluation of low voltage ZnO varistors quality by low frequency noise characteristics Auteur(s): Frédéric Verdier, Sandrine Gouverneur, Claude Lucat, Andre Touboul Lien HAL : https://hal.science/hal-00203781 Analytical model for thermally-induced warpage of POP Auteur(s): Wei Feng, Hélène Fremont, Alexandrine Guédon-Gracia, Frédéric Verdier, Bernard Plano Lien HAL : https://hal.science/hal-00326445 SiP vs SoC : An application-driven perspective Auteur(s): Geneviève Duchamp, Hélène Frémont, Alexandrine Guédon-Gracia, Frédéric Verdier Lien HAL : https://hal.science/hal-00327271 Electrical response of screen-printed varistors to transient overvoltages Auteur(s): Sandrine Gouverneur, Claude Lucat, Francis Menil, Frédéric Verdier, Andre Touboul, Jean-Louis Aucouturier, J. Pinel Lien HAL : https://hal.science/hal-00203780 Reliability analysis of ceramic capacitors under 200C Auteur(s): Yves Ousten, Bruno Levrier, Frédéric Verdier Lien HAL : https://hal.science/hal-00182907 Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations Auteur(s): Y. Deshayes, L. Bechou, F. Verdier, B. Tregon, D. Laffitte, Jl. Goudard, Y. Hernandez, Y. Danto Lien HAL : https://hal.science/hal-00162359 Simulations of thermomechanical stresses and optical misalignment in 1.55 µm emissive optoelectronic modules using FEM and process dispersions Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183953 Prédiction de distributions de durées de vie de composants optoélectroniques émissifs 1.55 µm : Lois expérimentales et méthodologie statistique Auteur(s): L. Bechou, Y. Danto, Y. Deshayes, L. Mendizabal, F. Verdier Lien HAL : https://hal.science/hal-00162364 Low frequency drain and gate noise in GaN FEMTs Auteur(s): Nathalie Malbert, Nathalie Labat, Arnaud Curutchet, Frédéric Verdier, Andre Touboul Lien HAL : https://hal.science/hal-00183569 Prédiction de distributions de durées de vie de composants optoélectroniques émissifs 1.55 µm : Lois expérimentales et méthodologie statistique Auteur(s): Laurent Mendizabal, Laurent Bechou, Yannick Deshayes, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183951 Evolution of Reliability Assessment In PCB Assemblies Auteur(s): Yves Danto, Jean-Yves Deletage, Frédéric Verdier, Hélène Fremont Lien HAL : https://hal.science/hal-00183967 Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Bernard Tregon, D. Laffitte, Jl Goudard, Y. Hernandez, Yves Danto Lien HAL : https://hal.science/hal-00183952 Study of Degradations in PCB Interconnections for High Frequency Applications Auteur(s): Geneviève Duchamp, Frédéric Verdier, Bruno Levrier, François Marc, Yves Ousten, Yves Danto Lien HAL : https://hal.science/hal-00181898 Fiabilité des assemblages microélectroniques complexes Auteur(s): Frédéric Verdier, Geneviève Duchamp, Hélène Null Fremont Lien HAL : https://hal.science/hal-00167725 Analyse du bruit de grille aux basses fréquences des transistors à effet de champ de puissance sur GaAs Auteur(s): Benoit Lambert, Frédéric Verdier, Nathalie Labat, Nathalie Malbert, Andre Touboul Lien HAL : https://hal.science/hal-00183512

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