Article (53)
A Stochastic Model for Cancer Stem Cell Origin in Metastatic Colon Cancer Auteur(s): C. Odoux, H. Fohrer, T. Hoppo, L. Guzik, D. Stolz, D. Lewis, S. Gollin, T. Gamblin, D. Geller, E. Lagasse Lien HAL : https://hal.science/hal-02541002 Heavy ion-induced charge collection mechanisms in CMOS active pixel sensor Auteur(s): X. Belredon, J. David, D. Lewis, T. Beauchene, V. Pouget, S. Barde, P. Magnan Lien HAL : https://hal.science/hal-01887641 A physical approach on SCOBIC investigation in VLSI Auteur(s): T. Beauchêne, D. Lewis, F. Beaudoin, V. Pouget, P. Perdu, P. Fouillat, Y. Danto Lien HAL : https://hal.science/hal-01887645 INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER Auteur(s): P. Fouillat, V. Pouget, D. Lewis, S. Buchner, D. Mcmorrow Lien HAL : https://hal.science/hal-01887658 Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization Auteur(s): T. Beauchêne, D. Lewis, F. Beaudoin, V. Pouget, R. Desplats, P. Fouillat, P. Perdu, Marise Bafleur, David Trémouilles Lien HAL : https://hal.science/hal-01887647 From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing Auteur(s): F. Beaudoin, R. Desplats, P. Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis Lien HAL : https://hal.science/hal-01887652 Investigation of single-event transients in voltage-controlled oscillators Auteur(s): W. Chen, V. Pouget, H.J. Barnaby, J. D. Cressler, G. Niu, P. Fouillat, Y. Deval, D. Lewis Lien HAL : https://hal.science/hal-01887654 Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC Auteur(s): V. Pouget, D. Lewis, P. Fouillat Lien HAL : https://hal.science/hal-01887656 A way to implement the electro-optical technique to inertial MEMS Auteur(s): K Melendez, A Desmoulin, Kevin Sanchez, Philippe Perdu, D. Lewis Lien HAL : https://hal.science/hal-01264066 Low-frequency noise effect on terahertz tomography using thermal detectors. Auteur(s): Jean-Paul Guillet, Benoît Recur, Hugo Balacey, Joyce Bou Sleiman, F. Darracq, Dean Lewis, Patrick Mounaix Lien HAL : https://hal.science/hal-01263737 Effects of 1064 nm laser on MOS capacitor Auteur(s): R. Llido, P. Masson, V. Regnier, V. Goubier, G. Haller, V. Pouget, D. Lewis Lien HAL : https://hal.science/hal-00988338 A comprehensive study of the application of the EOP techniques on bipolar devices Auteur(s): Mohamed Mehdi Rebai, Frédéric Darracq, Jean-Paul Guillet, Bernou Elise, Kevin Sanchez, Philippe Perdu, Dean Lewis Lien HAL : https://hal.science/hal-01091179 CADless laser assisted methodologies for failure analysis and device reliability Auteur(s): Amjad Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis Lien HAL : https://hal.science/hal-00988334 Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell Auteur(s): Issam El Moukhtari, Vincent Pouget, Camille Larue, Frédéric Darracq, D. Lewis, Philippe Perdu Lien HAL : https://hal.science/hal-00880459 Characterization and modeling of laser-induced single-event burn-out in SiC power diodes Auteur(s): Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, D. Lewis Lien HAL : https://hal.science/hal-00880471 Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology Auteur(s): Issam El Moukhtari, Vincent Pouget, Frédéric Darracq, Camille Larue, Philippe Perdu, D. Lewis Lien HAL : https://hal.science/hal-00880480 Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing Auteur(s): Frédéric Darracq, Nogaye Mbaye, Stephane Azzopardi, Vincent Pouget, E. Lorfèvre, F. Bezerra, Dean Lewis Lien HAL : https://hal.science/hal-00772095 Electrical modeling of the effect of beam profile for pulsed laser fault injection Auteur(s): C. Godlewski, V. Pouget, D. Lewis, Mathieu Lisart Lien HAL : https://hal.science/hal-00669736 LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis Auteur(s): Guillaume Celi, Sylvain Dudit, T. Parassin, Philippe Perdu, Antoine Reverdy, D. Lewis, Maxime Vallet Lien HAL : https://hal.science/hal-00669760 3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing Auteur(s): Kai Shao, Adèle Morisset, V. Pouget, Emeric Faraud, Camille Larue, D. Lewis, D. Mcmorrow Lien HAL : https://hal.science/hal-00667432 Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis Auteur(s): G. Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, D. Lewis Lien HAL : https://hal.science/hal-00669825 Building the electricalmodel of the PhotoelectricLaserStimulation of a PMOS transistor in 90 nm technology Auteur(s): Sarafianos Alexandre, R. Llido, Jean-Max Dutertre, Olivier Gagliano, Valérie Serradeil, Mathieu Lisart, V. Goubier, Assia Tria, Vincent Pouget, D. Lewis Lien HAL : https://hal-emse.ccsd.cnrs.fr/emse-00742622 Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing Auteur(s): Emeric Faraud, V. Pouget, Kai Shao, Camille Larue, Frédéric Darracq, D. Lewis, A. Samaras, F. Bezerra, E. Lorfèvre, R. Ecoffet Lien HAL : https://hal.science/hal-00667336 Net integrity checking by optical localization techniques Auteur(s): Gerald Haller, A. Machouat, D. Lewis, V. Pouget Lien HAL : https://hal.science/hal-00669741 Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization Auteur(s): Fulvio Infante, Philippe Perdu, H.B Kor, C. Gan, D. Lewis Lien HAL : https://hal.science/hal-00669757 Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory Auteur(s): R. Llido, J. Gomez, V. Goubier, N. Froidevaux, L. Dufayard, G. Haller, V. Pouget, D. Lewis Lien HAL : https://hal.science/hal-00669826 Facing the defect characterization and localization challenges of bridge defects on submicronic technology (45nm and below) Auteur(s): Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet Lien HAL : https://hal.science/hal-00585642 Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation Auteur(s): F. Infante, Philippe Perdu, Dean Lewis Lien HAL : https://hal.science/hal-00585644 Impact of semiconductors material on IR Laser Stimulation signal Auteur(s): Abdellatif Firiti, Félix Beaudoin, G. Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat Lien HAL : https://hal.science/hal-00401285 Implementing laser-based failure analysis methodologies using test vehicles Auteur(s): Dean Lewis, Vincent Pouget, Félix Beaudoin, G. Haller, Phillipe Perdu, Pascal Fouillat Lien HAL : https://hal.science/hal-00397918 Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs Auteur(s): Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crepel, Dean Lewis Lien HAL : https://hal.science/hal-00401312 Effect of physical defect on shmoos in CMOS DSM technologies Auteur(s): A. Machouat, G. Haller, V. Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely Lien HAL : https://hal.science/hal-00401309 Study of Single Event Transients in High-Speed Operational Amplifiers Auteur(s): Patrice Jaulent, Vincent Pouget, Dean Lewis, Pascal Fouillat Lien HAL : https://hal.science/hal-00397747 Light Emission To time resolved emission for IC debug and failure analysis Auteur(s): Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit Lien HAL : https://hal.science/hal-00401289 Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses Auteur(s): Frédéric Darracq, Herve Lapuyade, Pascal Fouillat, Vincent Pouget, Dean Lewis, Yves Danto Lien HAL : https://hal.science/hal-00359396 Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure Auteur(s): Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Phillipe Perdu, Andre Touboul, Vincent Pouget, Dean Lewis Lien HAL : https://hal.science/hal-00397706 Optimizing pulsed OBIC technique for ESD defect localization Auteur(s): Fabien Essely, Nicolas Guitard, Frédéric Darracq, Vincent Pouget, Marise Bafleur, Philippe Perdu, Andre Touboul, Dean Lewis Lien HAL : https://hal.science/hal-00382949 NIR Laser stimulation for dynamic timing analysis Auteur(s): Kevin Sanchez, Romain Desplats, Félix Beaudoin, Philippe Perdu, J.P. Roux, Dean Lewis Lien HAL : https://hal.science/hal-00401294 Application of various optical techniques for ESD defect localization Auteur(s): Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Félix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, Andre Touboul, Dean Lewis Lien HAL : https://hal.science/hal-00204570 In-depth resolution for LBIC technique by two-photon absorption Auteur(s): Dong Yun Wan, Vincent Pouget, Alexandre Douin, Patrice Jaulent, Dean Lewis, Pascal Fouillat Lien HAL : https://hal.science/hal-00204572 Influence of Laser Pulse Duration in Single Event Upset Testing Auteur(s): Alexandre Douin, Vincent Pouget, Frédéric Darracq, Dean Lewis, Pascal Fouillat, Philippe Perdu Lien HAL : https://hal.science/hal-00204547 Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation Auteur(s): Alexandre Douin, Vincent Pouget, Magali de Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat Lien HAL : https://hal.science/hal-00204571 Backside Laser Testing of ICs for SET Sensitivity Evaluation Auteur(s): Dean Lewis, Vincent Pouget, Félix Beaudoin, Philippe Perdu, Hervé Lapuyade, Pascal Fouillat, Andre Touboul Lien HAL : https://hal.science/hal-00185400 Scanning laser ultrasonics experiments for in-situ non-destructive analysis of integrated circuits Auteur(s): Grégory Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Bernard Plano, Yves Danto Lien HAL : https://hal.science/hal-00181926 Theoretical Investigation of an Equivalent Laser LET Auteur(s): Vincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner Lien HAL : https://hal.science/hal-00185402 Study of the interaction between Heavy Ions and Integrated Circuits using a Pulsed Laser Beam Auteur(s): Dean Lewis, Pascal Fouillat, Vincent Pouget, Hervé Lapuyade Lien HAL : https://hal.science/hal-00185399 Evaluation of a Design Methodology Dedicated to Dose-Rate-Hardened Linear Integrated Circuits Auteur(s): Yann Deval, Hervé Lapuyade, Pascal Fouillat, H. J. Barnaby, Frédéric Darracq, Renaud Briand, Dean Lewis, Rd Schrimpf Lien HAL : https://hal.science/hal-00184299 Validation of radiation hardened designs by pulsed laser testing and SPICE analysis Auteur(s): Vincent Pouget, Dean Lewis, Hervé Lapuyade, Renaud Briand, Pascal Fouillat, L. Sarger, M. C. Calvet Lien HAL : https://hal.science/hal-00185404 Single-Event Sensitivity of a Single SRAM Cell Auteur(s): Frédéric Darracq, Thomas Beauchene, Vincent Pouget, Hervé Lapuyade, Dean Lewis, Pascal Fouillat, Andre Touboul Lien HAL : https://hal.science/hal-00185398 Front side and Backside OBIT Mappings applied to Single Event Transient Testing Auteur(s): Dean Lewis, Vincent Pouget, Thomas Beauchene, Hervé Lapuyade, Pascal Fouillat, Andre Touboul, Félix Beaudoin, Philippe Perdu Lien HAL : https://hal.science/hal-00185401 Laser Cross Section Measurement for the Evaluation of Single-Event Effects in Integrated Circuits Auteur(s): Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, Frédéric Darracq, Andre Touboul Lien HAL : https://hal.science/hal-00185403 Evaluation of SRAMS reliability for space electronics using ultra short laser pulses Auteur(s): Frédéric Darracq, Hervé Lapuyade, Pascal Fouillat, Vincent Pouget, Dean Lewis, Yves Danto Lien HAL : https://hal.science/hal-00185395 SPICE Modeling of the Transient Response of Irradiated MOSFETs Auteur(s): Vincent Pouget, Hervé Lapuyade, Dean Lewis, Yann Deval, Pascal Fouillat, L. Sarger Lien HAL : https://hal.science/hal-00184300Book sections (3)
Using the SEEM software for SET testing and analysis Auteur(s): Vincent Pouget, Pascal Fouillat, Dean Lewis Lien HAL : https://hal.science/hal-00397867 Using the SEEM Software for Laser SET Testing and Analysis Auteur(s): V. Pouget, P. Fouillat, D. Lewis Lien HAL : https://hal.science/hal-00206320 Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing Auteur(s): P. Fouillat, V. Pouget, D. Mcmorrow, F. Darracq, S. Buchner, D. Lewis Lien HAL : https://hal.science/hal-00206315Conference proceedings (85)
THz imaging with a hollow core waveguide Auteur(s): Mingming Pan, Jean-Paul Guillet, Georges Humbert, Frederic Fauquet, Dean Lewis, Patrick Mounaix Lien HAL : https://hal.science/hal-02523215 Comparative study of terahertz waveguide in reflective mode configuration Auteur(s): M. Pan, J.P. Guillet, G. Humbert, F. Fauquet, D. Lewis, P. Mounaix Lien HAL : https://hal.science/hal-02522845 Guided terahertz pulsed reflectometry simulation with near field probe Auteur(s): M. Pan, Jean-Paul Guillet, F. Fauquet, D. Lewis, P. Mounaix Lien HAL : https://hal.science/hal-02478521 Guided terahertz pulsed reflectometry: a remote probe for near-field imaging (Conference Presentation) Auteur(s): Mingming Pan, Frederic Fauquet, Dean Lewis, Frédéric Darracq, Patrick Mounaix, Jean-Paul Guillet Lien HAL : https://hal.science/hal-02877422 Radiation Hardness Assessment of an ADC for Space Application using a Laser Test Equipment Auteur(s): Vincent Pouget, Pascal Fouillat, Dean Lewis, Frédéric Darracq Lien HAL : https://hal.science/hal-01887701 Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC Auteur(s): V. Pouget, D. Lewis, P. Fouillat Lien HAL : https://hal.science/hal-01887685 Performances and robustness of IR seed Laser diodes under large overcurrent and short-pulse conditions for fiber Laser applications Auteur(s): Germain Le Galès, Simon Joly, Western Bolanos, Guillaume Pedroza, Adèle Morisset, Frédéric Darracq, Dean Lewis, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01719975 Characterization and modelling of laser-induced single-event burn-out in SiC power diodes Auteur(s): N. Mbaye, V. Pouget, F. Darracq, D. Lewis Lien HAL : https://hal.science/hal-01935694 Impact of Negative Bias Temperature Instability on the Single-Event Upset Threshold of a 65nm SRAM cell Auteur(s): I. El Moukhtari, V. Pouget, C. Larue, Frédéric Darracq, D. Lewis, P. Perdu Lien HAL : https://hal.science/hal-01935692 Implementing laser based failure analysis methodologies using test vehicles Auteur(s): D. Lewis, V. Pouget, F. Beaudoin, T. Beauchene, G. Haller, R. Desplat, P. Perdu, P. Fouillat Lien HAL : https://hal.science/hal-01887706 Analysis of short-term NBTI effect on the Single-Event Upset sensitivity of a 65nm SRAM using two-photon absorption Auteur(s): I. El Moukhtari, V. Pouget, F. Darracq, C. Larue, P. Perdu, D. Lewis Lien HAL : https://hal.science/hal-01935693 Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures Auteur(s): V. Pouget, P. Fouillat, Raoul Velazco, D. Lewis, D. Dallet Lien HAL : https://hal.science/hal-01376266 Elaboration of a new pulsed laser system for SEE testing Auteur(s): V. Pouget, T. Calin, H. Lapuyade, D. Lewis, P. Fouillat, Raoul Velazco, Y. Maidon, L. Sarger Lien HAL : https://hal.science/hal-01384704 Improving an SEU Hard Design using a Pulsed Laser Auteur(s): Jean-Max Dutertre, Fernand-Michel Roche, Patrice Fouillat, Dean Lewis Lien HAL : https://hal-emse.ccsd.cnrs.fr/emse-01130950 Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology Auteur(s): A Sarafianos, R Llido, O Gagliano, V Serradeil, Mathieu Lisart, V. Goubier, Jean-Max Dutertre, Assia Tria, Vincent Pouget, Dean Lewis Lien HAL : https://hal-emse.ccsd.cnrs.fr/emse-01130636 Characterization and TCAD Simulation of 90nm Technology PMOS Transistor Under Continuous Photoelectric Laser Stimulation for Failure Analysis Improvement Auteur(s): R Llido, A Sarafianos, O Gagliano, V Serradeil, V Goubier, M Lisart, G Haller, Vincent Pouget, Dean Lewis, Jean-Max Dutertre, Assia Tria Lien HAL : https://hal-emse.ccsd.cnrs.fr/emse-01130626 Improving defect localization techniques with laser beam with specific analysis and set-up modules Auteur(s): R. Llido, J. Gomez, V. Goubier, G. Haller, V. Pouget, D. Lewis Lien HAL : https://hal.science/hal-00988382 Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures Auteur(s): Mohamed Rebai, Frédéric Darracq, Jean-Paul Guillet, Philippe Perdu, Kévin Sanchez, D. Lewis Lien HAL : https://hal.science/hal-01020683 3D current path in stacked devices: Metrics and challenges Auteur(s): H.B Kor, Fulvio Infante, Philippe Perdu, P. Gan, D. Lewis Lien HAL : https://hal.science/hal-00988371 Time resolved imaging at low power supply on 45nm technology Auteur(s): G. Bascoul, Philippe Perdu, Kevin Sanchez, D. Lewis, Sylvain Dudit, Guillaume Celi Lien HAL : https://hal.science/hal-00988376 Signal propagation analysis by digital lock-in time resolved imaging Auteur(s): G. Bascoul, Philippe Perdu, D. Lewis Lien HAL : https://hal.science/hal-00988346 Improved integrated circuits qualification using dynamic laser stimulation technique Auteur(s): Amjad Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, D. Lewis Lien HAL : https://hal.science/hal-00988351 Magnetic Microscopy for 3D structures: use of the Simulation Approach for the precise localization of deep buried weak currents Auteur(s): Fulvio Infante, R. Gomes, Philippe Perdu, Fabien Battistella, Sébastien Annereau, D. Lewis Lien HAL : https://hal.science/hal-00988364 Full Dynamic Laser simulation set up Auteur(s): Amjad Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, D. Lewis, H. Deslandes Lien HAL : https://hal.science/hal-00988356 Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures Auteur(s): Mohamed Mehdi Rebai, Frédéric Darracq, Jean-Paul Guillet, Philippe Perdu, Kevin Sanchez, Dean Lewis Lien HAL : https://hal.science/hal-01091188 Analysis of Short-Term NBTI Effect on the Single-Event Upset Sensitivity of a 65nm SRAM using Two-Photon Absorption Auteur(s): El Moukthari Issam, Vincent Pouget, Frédéric Darracq, Camille Larue, Dean Lewis, Philippe Perdu Lien HAL : https://hal.science/hal-01091193 Imaging the Single Event Burnout sensitive volume of vertical power MOSFETs using the laser Two-Photon Absorption technique Auteur(s): Frédéric Darracq, Nogaye Mbaye, Camille Larue, V. Pouget, Stephane Azzopardi, E. Lorfèvre, F. Bezerra, D. Lewis Lien HAL : https://hal.science/hal-00772102 How to Interpret the Reflected Laser Probe Signal of Multiple Elementary Substructures in Very Deep Submicron Technologies Auteur(s): Mohamed Mehdi Rebai, Frédéric Darracq, D. Lewis, Philippe Perdu, Kévin Sanchez Lien HAL : https://hal.science/hal-00903364 Investigation of single event burnout sensitive depth in power MOSFETS Auteur(s): Frédéric Darracq, V. Pouget, D. Lewis, P. Fouillat, E. Lorfèvre, R. Ecoffet, F. Bezerra Lien HAL : https://hal.science/hal-00667364 Best test pattern failure analysis flow for functional logic failure localization by IR-OBIRCH technique Auteur(s): A. Machouat, G. Haller, V. Goubier, D. Lewis, Philippe Perdu, V. Pouget, Fabien Essely Lien HAL : https://hal.science/hal-00670058 Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation for IC Characterization and Failure Analysis Auteur(s): V. Pouget, Emeric Faraud, Kai Shao, S. Jonathas, D. Horain, G. Haller, V. Goubier, B. Picart, L. Forli, D. Lewis Lien HAL : https://hal.science/hal-00670060 Building the electricalmodel of the PhotoelectricLaserStimulation of a NMOS transistor in 90 nm technology Auteur(s): Sarafianos Alexandre, R. Llido, Jean-Max Dutertre, Olivier Gagliano, Valérie Serradeil, Mathieu Lisart, V. Goubier, Assia Tria, Vincent Pouget, D. Lewis Lien HAL : https://hal-emse.ccsd.cnrs.fr/emse-00742629 Comparison of classical and two-photon photoelectric laser stimulation capabilities for failure analysis Auteur(s): Kai Shao, V. Pouget, Emeric Faraud, C. Larue, D. Lewis Lien HAL : https://hal.science/hal-00669828 Characterization and TCAD simulation of 90 nm technology transistors under continuous photoelectric laser stimulation for failure analysis improvement Auteur(s): Alexandre Sarafianos, R. Llido, Olivier Gagliano, Valérie Serradeil, V. Goubier, M. Lisart, G. Haller, V. Pouget, D. Lewis, Jean-Max Dutertre, Assia Tria Lien HAL : https://hal-emse.ccsd.cnrs.fr/emse-00742705 Dynamic power analysis under laser stimulation: a new Dynamic Laser Simulation approach Auteur(s): Amjad Deyine, Philippe Perdu, K. Sanchez, J.C. Courrège, Dean Lewis Lien HAL : https://hal.science/hal-00585673 Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package Auteur(s): F. Infante, Philippe Perdu, Dean Lewis Lien HAL : https://hal.science/hal-00585654 Short circuit localization on integrated circuits using magnetic microscopy techniques coupled to simulations Auteur(s): F. Infante, Philippe Perdu, S. Petremont, Dean Lewis Lien HAL : https://hal.science/hal-00585648 Magnetic microscopy for 3D structures: use of the Simulation Approach for the precise localization of deep buried weak currents Auteur(s): Fulvio Infante, Rodolphe Gomes, Philippe Perdu, Fabien Battistella, Sébastien Annereau, Dean Lewis Lien HAL : https://hal.science/hal-00585670 Net integrity checking by optical localization techniques Auteur(s): G. Haller, A. Machouat, Dean Lewis, Vincent Pouget Lien HAL : https://hal.science/hal-00585657 Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation Auteur(s): F. Infante, Philippe Perdu, Dean Lewis Lien HAL : https://hal.science/hal-00585666 Facing the defect characterization and localization challenges of bridge defects on submicronic technology (45nm and below) Auteur(s): Guillaume Celi, Sylvain Dudit, Philippe Perdu, A. Reverdy, T. Parrassin, E. Bechet, Dean Lewis, Maxime Vallet Lien HAL : https://hal.science/hal-00585662 Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure Auteur(s): Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, Andre Touboul, Vincent Pouget, Dean Lewis Lien HAL : https://hal.science/hal-00401483 In-depth resolution for LBIC technique by two-photon absorption Auteur(s): Dong Yun Wan, Vincent Pouget, Alexandre Douin, Patrice Jaulent, Dean Lewis, Pascal Fouillat Lien HAL : https://hal.science/hal-00401693 Single Event Transient Mapping of a Voltage-Controlled Oscillator Auteur(s): Vincent Pouget, W. M. Chen, Dean Lewis, H. J. Barnaby, Pascal Fouillat Lien HAL : https://hal.science/hal-00398024 Recent developments for SEE testing at the ATLAS laser facility Auteur(s): Vincent Pouget, Dong Yun Wan, Patrice Jaulent, Alexandre Douin, Dean Lewis, Pascal Fouillat Lien HAL : https://hal.science/hal-00398021 Impact of semiconductors material on IR stimulation signal Auteur(s): Abdellatif Firiti, Félix Beaudoin, G. Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat Lien HAL : https://hal.science/hal-00401389 Delay Variation Mapping Induced by Dynamic Laser Stimulation Auteur(s): Kevin Sanchez, Romain Desplats, Félix Beaudoin, Philippe Perdu, Dean Lewis, P. Vedagarbha Lien HAL : https://hal.science/hal-00401387 Study of Single Event Transients in High-Speed Operational Amplifiers Auteur(s): Patrice Jaulent, Vincent Pouget, Dean Lewis, Pascal Fouillat Lien HAL : https://hal.science/hal-00397836 Banc de génération et détection de faisceau THz par photo commutateur ultrarapide sur GaAs BT Auteur(s): Patrick Mounaix, M. Tondusson, Laurent Sarger, Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat Lien HAL : https://hal.science/hal-00398013 Influence of Laser Pulse Duration in Single Event Upset Testing Auteur(s): Alexandre Douin, Vincent Pouget, Frédéric Darracq, Dean Lewis, Pascal Fouillat, Phillipe Perdu Lien HAL : https://hal.science/hal-00397942 Electrical Modeling for Laser Testing with Different Pulse Durations Auteur(s): Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Phillipe Perdu Lien HAL : https://hal.science/hal-00397739 NIR Laser stimulation for dynamic timing analysis Auteur(s): Kevin Sanchez, Romain Desplats, Félix Beaudoin, Philippe Perdu, J.P. Roux, Dean Lewis Lien HAL : https://hal.science/hal-00401503 Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure Auteur(s): A. Machouat, G. Haller, V. Goubier, Dean Lewis, Vincent Pouget, Pascal Fouillat, Fabien Essely, Philippe Perdu Lien HAL : https://hal.science/hal-00398000 Dynamic Laser Stimulation Technique for device qualification process Auteur(s): A. Deyne-Barth, Philippe Perdu, G. Benetti, Kevin Sanchez, F. Battistella, Dean Lewis Lien HAL : https://hal.science/hal-00401698 Failure Analysis enhancement by evaluating the photoelectric laser stimulation impact on mixed-mode ICs Auteur(s): Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crepel, Dean Lewis Lien HAL : https://hal.science/hal-00401699 SET sensitive volume imaging and measurement with two-photon absorption laser testing Auteur(s): Patrice Jaulent, Vincent Pouget, D. Mcmorrow, F. Bezerra, Pascal Fouillat, Dean Lewis Lien HAL : https://hal.science/hal-00401702 Light Emission to time resolved emission for IC debug and failure analysis Auteur(s): Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit Lien HAL : https://hal.science/hal-00401497 Time resolved imaging using synchronous picosecond photoelectric laser stimulation Auteur(s): Alexandre Douin, Vincent Pouget, Magali de Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat Lien HAL : https://hal.science/hal-00401692 Effect of Physical defect on schmoos in CMOS DSM technologies Auteur(s): A. Machouat, G. Haller, V. Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely Lien HAL : https://hal.science/hal-00401696 Identification of Some Key Parameters for Photoelectric Laser Simulation of IC: An Experimental Approach Auteur(s): Phillipe Perdu, Romain Desplats, Kevin Sanchez, Félix Beaudoin, Dean Lewis, Vincent Pouget, Alexandre Douin, Pascal Fouillat Lien HAL : https://hal.science/hal-00397736 Failure analysis enhancement by evaluating the thermal laser stimulation impact on analog ICs Auteur(s): Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Olivier Crepel, Dean Lewis Lien HAL : https://hal.science/hal-00401695 Applications of various optical techniques for ESD defect localization Auteur(s): Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Félix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, Andre Touboul, Dean Lewis Lien HAL : https://hal.science/hal-00401519 IC Debug and Defect Localization using Dynamic Laser Stimulation and Time-Resolved Emission Auteur(s): Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis, Michel Vallet, Sylvain Dudit Lien HAL : https://hal.science/hal-00204582 Failure Localization and design debug on mixed-mode ICs by using the dynamic laser stimulation techniques Auteur(s): Magdalena Sienkiewicz, Kevin Sanchez, Abdellatif Firiti, Olivier Crepel, Philippe Perdu, Dean Lewis Lien HAL : https://hal.science/hal-00204668 Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation Auteur(s): Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu Lien HAL : https://hal.science/hal-00204584 Optimizing pulsed OBIC technique for ESD defect localization Auteur(s): Fabien Essely, Nicolas Guitard, Frédéric Darracq, Vincent Pouget, Marise Bafleur, Philippe Perdu, Andre Touboul, Dean Lewis Lien HAL : https://hal.science/hal-00204574 Dynamic optical techniques for IC debug and failure analysis Auteur(s): Julie Ferrigno, Romain Desplats, Philippe Perdu, Kevin Sanchez, Félix Beaudoin, Dean Lewis Lien HAL : https://hal.science/hal-00204578 Jitter Improvement of Time-Resolved Photoelectric Laser Stimulation for Dynamic Imaging of Integrated Circuits Auteur(s): Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu Lien HAL : https://hal.science/hal-00204580 OBIC technique for ESD defect localization : Influence of the experimental procedure Auteur(s): F. Essely, Nicolas Guitard, F. Darracq, V. Pouget, Marise Bafleur, A. Touboul, D. Lewis Lien HAL : https://hal.science/hal-00327412 Single-event Sensitivity of a single SRAM cell Auteur(s): Frédéric Darracq, Thomas Beauchene, Vincent Pouget, Hervé Lapuyade, Dean Lewis, Pascal Fouillat, Andre Touboul Lien HAL : https://hal.science/hal-00185411 Laser Utilization for Various Testing Purposes Auteur(s): Pascal Fouillat, Dean Lewis, Hervé Lapuyade, Vincent Pouget Lien HAL : https://hal.science/hal-00185423 A New Laser System for X-Rays Flashes Sensitivity Evaluation Auteur(s): Dean Lewis, Hervé Lapuyade, Yann Deval, Yvan Maidon, Frédéric Darracq, Renaud Briand, Pascal Fouillat Lien HAL : https://hal.science/hal-00184302 An Overview of the Applications of a Pulsed Laser System for SEU Testing Auteur(s): Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, Fernand-Michel Roche, R. Ecoffet Lien HAL : https://hal.science/hal-00185413 A New SPICE Model Dedicated to the Analysis of the Transient Response of Irradiated MOSFETS for On Line Testing Auteur(s): Vincent Pouget, Hervé Lapuyade, Dean Lewis, Pascal Fouillat, L. Sarger Lien HAL : https://hal.science/hal-00185414 Applications de l acoustique picoseconde à l analyse non destructive de circuits intégrés Auteur(s): J. M. Rampnoux, Y. Ezzahri, S. Dilhaire, S. Grauby, W. Claeys, C. Rossignol, Bertrand Audoin, Grégory Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis Lien HAL : https://hal.science/hal-00182903 SPICE Modeling of the Transient Response of Irradiated MOSFETs Auteur(s): Vincent Pouget, Hervé Lapuyade, Dean Lewis, Yann Deval, Pascal Fouillat, L. Sarger Lien HAL : https://hal.science/hal-00184305 Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics Auteur(s): Grégory Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Bernard Plano, Yves Danto Lien HAL : https://hal.science/hal-00182908 Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics Auteur(s): Grégory Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Bernard Plano, Yves Danto Lien HAL : https://hal.science/hal-00182909 Test de circuits intégrés par faisceau laser pulsé Auteur(s): Dean Lewis, Vincent Pouget, Frédéric Darracq, Hervé Lapuyade, Pascal Fouillat Lien HAL : https://hal.science/hal-00185412 Elaboration of a New Pulsed Laser System for SEE Testing Auteur(s): Vincent Pouget, T. Calin, Hervé Lapuyade, Dean Lewis, Pascal Fouillat, Raoul Velazco, Yvan Maidon, L. Sarger Lien HAL : https://hal.science/hal-00185415 Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses Auteur(s): Frédéric Darracq, Hervé Lapuyade, Pascal Fouillat, Vincent Pouget, Dean Lewis, Yves Danto Lien HAL : https://hal.science/hal-00185409 Evaluation of a Design Methodology Dedicated to Dose Rate Hardened Linear Integrated Circuits Auteur(s): Yann Deval, Renaud Briand, Pascal Fouillat, H. J. Barnaby, Hervé Lapuyade, Dean Lewis, Rd Schrimpf Lien HAL : https://hal.science/hal-00184303 New Capabilities for SEE Testing with a Femtosecond Pulsed Laser System Auteur(s): Vincent Pouget, Hervé Lapuyade, Dean Lewis, Pascal Fouillat, L. Sarger Lien HAL : https://hal.science/hal-00185416 Intra-IC Inspection and Metrology with Picosecond Laser Ultrasonics Auteur(s): Grégory Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Pascal Fouillat, Yves Danto Lien HAL : https://hal.science/hal-00182901 Tools and methodology development for pulsed laser fault injection in SRAM-based FPGAs Auteur(s): V. Pouget, A. Douin, D. Lewis, P. Fouillat, G. Foucard, P. Peronnard, V. Maingot, J. Ferron, Lorena Anghel, Régis Leveugle, Raoul Velazco Lien HAL : https://hal.science/hal-00156318Invited lectures (5)
Fundamentals of the Pulsed Laser Technique for single-event upset testing Auteur(s): Pascal Fouillat, Vincent Pouget, D. Mcmorrow, Frédéric Darracq, S. Buchner, Dean Lewis Lien HAL : https://hal.science/hal-00401314 A Review and some Future Prospects on Laser-Based Techniques for Single-Event Effects Testing and Analysis Auteur(s): Pascal Fouillat, Vincent Pouget, Dean Lewis, Frédéric Darracq Lien HAL : https://hal.science/hal-00398038 Laser SEE Testing and Analysis Case Studies Auteur(s): Vincent Pouget, Pascal Fouillat, Dean Lewis Lien HAL : https://hal.science/hal-00401316 Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges Auteur(s): Philippe Perdu, Dean Lewis, V. Pouget Lien HAL : https://hal.science/hal-00401385 Fundamentals of the Pulsed Laser Technique for single-event effects testing Auteur(s): D. Mcmorrow, Vincent Pouget, Pascal Fouillat, Frédéric Darracq, S. Buchner, Dean Lewis Lien HAL : https://hal.science/hal-00401321Send a email to Dean LEWIS :
