Article (5)
Submicrometer InP/InGaAs DHBT Architecture Enhancements Targeting Reliability Improvements Auteur(s): Gilles Amadou Koné, Brice Grandchamp, Cyril Hainaut, François Marc, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin, Cristell Maneux Lien HAL : https://hal.science/hal-00909053 Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses Auteur(s): G. A. Koné, B. Grandchamp, C. Hainaut, F. Marc, C. Maneux, N. Labat, T. Zimmer, V. Nodjiadjim, M. Riet, J. Godin Lien HAL : https://hal.science/hal-00670550 Characterization and Modeling of Graphene Transistor Low-Frequency Noise Auteur(s): Brice Grandchamp, Sebastien Fregonese, Cédric Majek, Cyril Hainaut, Cristell Maneux, Nan Meng, Henri Happy, Thomas Zimmer Lien HAL : https://hal.science/hal-00669458 Trends in submicrometer InP-based HBT architecture targeting thermal management Auteur(s): Brice Grandchamp, Virginie Nodjiadjim, M. Zaknoune, Gilles Amadou Koné, Cyril Hainaut, Jean Godin, M. Riet, Thomas Zimmer, Cristell Maneux Lien HAL : https://hal.science/hal-00671675 Preliminary results of storage accelerated aging test on InP/InGaAs DHBT Auteur(s): Gilles Amadou Koné, Brice Grandchamp, Cyril Hainaut, François Marc, Cristell Maneux, Nathalie Labat, V. Nodjiadjim, J. Godin Lien HAL : https://hal.science/hal-00585073Send a email to Cyril HAINAUT :
