Laurent BECHOU

Professor

Research group : WAVES

Team : EDMINA

Tel : 0540002767

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Article (51)

Influence of Losses, Device Size, and Mode Confinement on Integrated Micro-Ring Resonator Performance for Absorption Spectroscopy Using Evanescent Field Sensing Auteur(s): P. Girault, L. Oyhenart, T. Rouanet, S. Joly, G. Beaudin, Michael Canva, L. Bechou, Paul Charette Lien HAL : https://hal.science/hal-04170945 An analytical approach to predict maximal sensitivity of microring resonators for absorption spectroscopy Auteur(s): M. Diez Garcia, P. Girault, S. Joly, L. Oyhenart, Vincent Raimbault, Corinne Dejous, L. Bechou Lien HAL : https://hal.science/hal-02299723 A quantitative thermal and thermomechanical analysis for design optimization and robustness assessment of microassembled high power Yb:CaF2 thin-disk Laser Auteur(s): S. Joly, M-A. Lemesre, B. Lévrier, C. Lyszyk, B. Plano, A. Courjaud, T. Taira, L. Bechou Lien HAL : https://hal.science/hal-02273406 III—V Laser Power Converters With Vertically Stacked Subcells Demonstrating Superior Radiation Resilience Auteur(s): Mark C.A. York, Francine Proulx, Olivier Gilard, Laurent Bechou, Richard A Arès, Vincent Aimez, Denis Masson, Simon Fafard Lien HAL : https://hal.science/hal-02149932 Ba0.6Sr0.4TiO3 thin films deposited by spray coating for high capacitance density capacitors Auteur(s): Emmanuel Tetsi, Gilles Philippot, Isabelle Bord Majek, Cyril Aymonier, Jean Audet, Roxan Lemire, Laurent Bechou, Dominique A Drouin Lien HAL : https://hal.science/hal-01890960 Practical optical gain by an extended Hakki-Paoli method Auteur(s): Massimo Vanzi, Gulia Marcello, Giovanna Mura, Germain Le Gales, Simon Joly, Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01711141 Extended modal gain measurement in DFB Laser diodes Auteur(s): Massimo Vanzi, Gulia Marchello, Giovanna Mura, Laurent Bechou, Yannick Deshayes, Germain Le Gales, Simon Joly Lien HAL : https://hal.science/hal-01711138 Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability Auteur(s): M. Balmont, I. Bord Majek, B. Poupard, L. Bechou, Y. Ousten Lien HAL : https://hal.science/hal-01885226 Thermal management characterization of microassembled high power DFB broad area lasers emitting at 975 nm Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Michel Lecompte, Olivier Parillaud, Michel Krakowski, Laurent Bechou Lien HAL : https://hal.science/hal-01711161 Direct patterning of polymer optical periodic nanostructures on CYTOP for visible light waveguiding Auteur(s): Miguel Diez, Vincent Raimbault, S. Joly, L. Oyhenart, Jean-Baptiste Doucet, I. Obieta, Corinne Dejous, L. Bechou Lien HAL : https://hal.science/hal-01825019 Inorganic/organic nanocomposites: Reaching a high filler content without increasing viscosity using core-shell structured nanoparticles Auteur(s): Warda Benhadjala, Morgane Gravoueille, Isabelle Bord-Majek, Laurent Bechou, Ephraim Suhir, Matthieu Buet, Mélanie Louarn, M Weiss, Fabien Rougé, Vincent Gaud, Yves Ousten Lien HAL : https://hal.science/hal-01240791 High-power diode laser bars and shear strain Auteur(s): Daniel T. Cassidy, O. Rehioui, Chadwick K. Hall, L. Bechou, Y. Deshayes, A. Kohl, T. Fillardet, Y. Ousten Lien HAL : https://hal.science/hal-00979994 Strain Estimation in III-V Materials by Analysis of the Degree of Polarization of Luminescence Auteur(s): Dt Cassidy, Ck. Hall, O. Rehioui, L. Bechou Lien HAL : https://hal.science/hal-01061416 Crack Propagation Modeling in Silicon: A Comprehensive Thermomechanical Finite-Element Model Approach for Power Devices Auteur(s): Damien Calvez, Fabrice Roqueta, Sébastien Jacques, Laurent Bechou, Yves Ousten, Samuel Ducret Lien HAL : https://hal.science/hal-01061431 Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing Auteur(s): E. Suhir, L. Bechou Lien HAL : https://hal.science/hal-00937728 Starck effects model used to highlight selective activation of failure mechanisms in MQW InGaN/GaN light emitting diodes Auteur(s): Yannick Deshayes, Laurent Bechou, Yves Ousten Lien HAL : https://hal.science/hal-00979617 Effects of silicon coating degradation on GaN MQW LEDs performances using physical and chemical analyses Auteur(s): Raphael Baillot, Yannick Deshayes, Laurent Bechou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten Lien HAL : https://hal.science/hal-00979970 Hardening Principles and Characterization of an Optocoupler Including a Vertical Cavity Surface Emitting Laser Auteur(s): O. Gilard, P. del Vecchio, R. Moglia, L. Bechou, Gianandrea Quadri Lien HAL : https://hal.science/hal-00786227 Predicted Thermal Stresses in a Photovoltaic Module (PVM) Auteur(s): Ephraim Suhir, Dongai Shangguan, Laurent Bechou Lien HAL : https://hal.science/hal-00797395 Technical Diagnostics in Electronics: Application of Bayes Formula and Boltzmann-Arrhenius-Zhurkov (BAZ) Model Auteur(s): E. Suhir, L. Bechou, A. Bensoussan Lien HAL : https://hal.science/hal-00797400 An original DoE-based tool for silicon photodetectors EoL estimation in space environments Auteur(s): P. Spezzigu, L. Bechou, Gianandrea Quadri, O. Gilard, Y. Ousten, M. Vanzi Lien HAL : https://hal.science/hal-00673537 Implementation of a Design of Experiments Methodology for the Prediction of Phototransistor Degradation in a Space Environment Auteur(s): Piero Spezzigu, C. Caddeo, Gianandrea Quadri, O. Gilard, Laurent Bechou, Yves Ousten, M. Vanzi Lien HAL : https://hal.science/hal-00584333 OPERATIONAL PERFORMANCES DEMONSTRATION OF POLYMER-CERAMIC EMBEDDED CAPACITORS FOR MMIC APPLICATIONS Auteur(s): Isabelle Bord-Majek, Philippe Kertesz, Julie Mazeau, Daniel Caban-Chastas, Bruno Levrier, Laurent Bechou, Yves Ousten Lien HAL : https://hal.science/hal-00641070 Proton effects on low noise and high responsivity silicon-based photodiodes for space applications Auteur(s): Guillaume Pedroza, Olivier Gilard, Marie-Lise Bourqui, Laurent Bechou, Yannick Deshayes, Lip Sun How, François Rosala Lien HAL : https://hal.science/hal-00402156 Thermomechanical Stresses and Optical Misalignment in 1550 nm Emissive Optoelectronic Modules Using FEM and Process Dispersions Auteur(s): Yannick Deshayes, Laurent Bechou, Frederic Verdier, Yves Ousten, Dominique Laffitte, Jean-Luc Goudard Lien HAL : https://hal.science/hal-00402624 Challenges and potential of new approaches for reliability assessment of nanotechnologies Auteur(s): L. Bechou, Y. Danto, J.Y. Deletage, F. Verdier, Y. Deshayes, S. Fregonese, C. Maneux, T. Zimmer, D. Laffitte Lien HAL : https://hal.science/hal-00266387 Thermal characteristics measurement of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties Auteur(s): L. Bechou, O. Rehioui, Y. Deshayes, O. Gilard, Gianandrea Quadri, Y. Ousten Lien HAL : https://hal.science/hal-00266383 Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications Auteur(s): M.L. Bourqui, L. Bechou, O. Gilard, Y. Deshayes, P. del Vecchio, L.S. How, F. Rosala, Y. Ousten, A. Touboul Lien HAL : https://hal.science/hal-00334728 Use of signal processing imaging for the study of a 3D package in harsh environment Auteur(s): J. Augereau, Y. Ousten, B. Levrier, L. Bechou Lien HAL : https://hal.science/hal-00334732 Comparison between piezoelectric method and ultrasonic signal analysis for multilayer ceramic capacitors type II crack detection Auteur(s): Yves Ousten, Laurent Bechou, Bernard Tregon, Yves Danto Lien HAL : https://hal.science/hal-00181936 Study of influence of failure modes on lifetime distribution prediction of 1.55 µm DFB laser diodes using weak drift of monitored parameters during ageing tests Auteur(s): Laurent Mendizabal, Laurent Bechou, Yannick Deshayes, Frédéric Verdier, Yves Danto, D. Laffitte, Jl Goudard Lien HAL : https://hal.science/hal-00183946 The Use Impedance Spectroscopy, SEM and SAM Imaging for Early Detection of Failure in SMT Assemblies Auteur(s): Y. Ousten, S. Medji, A. Fenech, J. Y. Deletage, L. Bechou, M.G. Perichaud, Y. Danto Lien HAL : https://hal.science/hal-00164931 Comparison between piezoelectric method and ultrasonic signal analysis for MLCC crack detection Auteur(s): Y. Ousten, S. Mejdi, L. Bechou, B. Tregon, Y. Danto Lien HAL : https://hal.science/hal-00164925 Three-dimensional FEM simulations of thermomechanical stresses in 1.55 µm Laser modules Auteur(s): Yannick Deshayes, L. Bechou, Jy. Deletage, F. Verdier, Y. Danto, D. Laffitte, Jl. Goudard Lien HAL : https://hal.science/hal-00162350 Long-term reliability prediction of 935 nm InGaAs/GaAs Light Emitting Diodes using degradation laws and ageing tests with low acceleration factor Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183945 Early failure signatures after thermal cycles of 1310 nm Laser modules using electrical, optical and spectral measurements Auteur(s): Yannick Deshayes, Laurent Bechou, Laurent Mendizabal, Yves Danto Lien HAL : https://hal.science/hal-00183947 FFT et applications : choix d'une fenêtre de pondération, caractérisation d'un CAN et réponse en fréquence d'un système linéaire Auteur(s): Gérard Couturier, Laurent Bechou, Jean-Baptiste Begueret, Claude Pellet Lien HAL : https://hal.science/hal-00183112 Ultrasonic images interpretation improvement for microassembling technologies characterization Auteur(s): L. Bechou, B. Tregon, Y. Ousten, F. Marc, Y. Danto, Ph. Kertesz, R. Even Lien HAL : https://hal.science/hal-00164920 Localization of defects in die-attach assembly by continuous wavelet transform using scanning acoustic microscopy Auteur(s): Laurent Bechou, Léopoldo Angrisani, Yves Ousten, Dominique Dallet, Hervé Levi, Yves Danto, Pasquale Daponte Lien HAL : https://hal.science/hal-00180223 Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations Auteur(s): Jean-Yves Deletage, Frédéric Verdier, Bernard Plano, Yannick Deshayes, Laurent Bechou, Yves Danto Lien HAL : https://hal.science/hal-00183949 Electroluminescence spectroscopy for reliability investigations of 1.55µm Bulk Semiconductor Optical Amplifier Auteur(s): S. Huyghe, L. Bechou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, Jl. Goudard, Y. Danto Lien HAL : https://hal.science/hal-00162343 Comparison between piezoelectric method and ultrasonic signal analysis for crack detection in type II multilayer ceramic capacitors Auteur(s): Yves Ousten, Said Mejdi, Laurent Bechou, Bernard Tregon, Yves Danto Lien HAL : https://hal.science/hal-00181935 Ultrasonic characterisation improvement of microassembling technologies using Time-Frequency analysis Auteur(s): Laurent Bechou, Yves Ousten, Yves Danto Lien HAL : https://hal.science/hal-00181937 Behavioral studyof passive components and coating materials under isostatic pressure and temperature stress conditions Auteur(s): Bernard Tregon, Yves Ousten, Yves Danto, Laurent Bechou, B. Parmentier Lien HAL : https://hal.science/hal-00181931 Simulation of assembly generated constraints during SMT processing and size optimisation of the capacitors by design of experiments Auteur(s): Y. Ousten, L. Bechou, N. Xiong Lien HAL : https://hal.science/hal-00164908 Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet Transform Auteur(s): Léopoldo Angrisani, Laurent Bechou, Dominique Dallet, Pasquale Daponte, Yves Ousten Lien HAL : https://hal.science/hal-00180545 Nondestructive defect detection in multilayer ceramic chip capacitors using piezoelectric analysis and acoustic microscopy Auteur(s): L. Bechou, S. Mejdi, Y. Ousten, Y. Danto Lien HAL : https://hal.science/hal-00164912 Acoustic analysis of an assembly : Structural identification by signal processing (wavelets) Auteur(s): Jean Augereau, Yves Ousten, Laurent Bechou, Yves Danto Lien HAL : https://hal.science/hal-00181930 Nondestructive detection and localization of defects in multilayer ceramic chip capacitors using electromechanical resonances Auteur(s): L. Bechou, S. Mejdi, Y. Ousten, Y. Danto Lien HAL : https://hal.science/hal-00164916 An improved method for automatic detection and location of defects in electronics components using scanning ultrasonic microscopy Auteur(s): Laurent Bechou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano Lien HAL : https://hal.science/hal-00180554 Impact of 1.55 µm laser diode degradation laws on fibre optic system performances using a system simulator Auteur(s): Laurent Mendizabal, Laurent Bechou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto Lien HAL : https://hal.science/hal-00183948

Other publication (6)

Photonics and Aeronautics: A wedding with a promising future – Physics of Failure and Reliability Assessment of Photonic Devices and Systems Auteur(s): Laurent Bechou Lien HAL : https://hal.science/hal-01719964 IMS Bordeaux : Wave-based resonant microsensors for (bio)chemical detection, environmental and health related applications Auteur(s): Corinne Dejous, Laurent Bechou, Hamida Hallil, Simon Hemour, Simon Joly, Jean-Luc Lachaud, Laurent Oyhenart, Vincent Raimbault, Dominique Rebière, Ollivier Tamarin Lien HAL : https://hal.science/hal-01516416 IMS Bordeaux : Wave-based resonant microsensors for (bio)chemical detection, environmental and health related applications Auteur(s): Corinne Dejous, Laurent Bechou, Hamida Hallil, Simon Hemour, Simon Joly, Jean-Luc Lachaud, Laurent Oyhenart, Vincent Raimbault, Dominique Rebière, Ollivier Tamarin Lien HAL : https://hal.science/hal-01516415 IMS Bordeaux: Wave-based resonant microsensors for chemical and biological detection, examples of environmental and health related applications Auteur(s): Corinne Dejous, Laurent Bechou, Hamida Hallil, Simon Hemour, Simon Joly, Jean-Luc Lachaud, Laurent Oyhenart, Vincent Raimbault, Dominique Rebière, Ollivier Tamarin Lien HAL : https://hal.science/hal-01393046 Photonics & Aeronautics: a wedding with a promising future Auteur(s): Patrick Mounaix, Laurent Bechou Lien HAL : https://hal.science/hal-01404480 IMS Bordeaux: Wave-based resonant microsensors for chemical and biological detection, examples of environmental and health related applications Auteur(s): Corinne Dejous, Laurent Bechou, Hamida Hallil, Simon Hemour, Simon Joly, Jean-Luc Lachaud, Laurent Oyhenart, Vincent Raimbault, Dominique Rebière, Ollivier Tamarin Lien HAL : https://hal.science/hal-01393045

Conference proceedings (105)

Enhanced absorption spectroscopy sensing using a polymer micro-resonator on a porous silicon substrate Auteur(s): P. Girault, T. Rouanet, G. Beaudin, S. Joly, L. Oyhenart, M. Canva, P. Charette, L. Bechou Lien HAL : https://hal.science/hal-04303430 Towards miniaturization of concentrated photovoltaics (CPV): impact on fabrication, performance and robustness of solar cells Auteur(s): Pierre Albert, Gwenaelle Hamon, Maite Volatier, Yannick Deshayes, Abdelatif Jaouad, Vincent Aimez, Laurent Bechou, Maxime Darnon Lien HAL : https://hal.science/hal-03109711 Optical microring resonator for low-cost integrated sensor Auteur(s): Pauline Girault, Beaudin Guillaume, Miguel Diez, Simon Joly, Oyhenart Laurent, C.T. Nguyen, Isabelle Ledoux-Rak, Michael Canva, P. Charette, Laurent Bechou Lien HAL : https://hal.science/hal-03070823 Area downsizing effects on electrical performance and robustness of triple junction solar cells for CPV applications Auteur(s): Pierre Albert,, Abdelatif Jaouad, Maite Volatier, Christopher E. Valdivia, Yannick Deshayes, Laurent Bechou, Vincent Aimez., Maxime Darnon Lien HAL : https://hal.science/hal-02443117 Integrated optical microring resonators for absorption spectroscopy Auteur(s): Pauline Girault, Beaudin Guillaume, Miguel Diez, Simon Joly, Oyhenart Laurent, C.T. Nguyen, I. Ledoux-Rak, Michael Canva, P. Charette, Laurent Bechou Lien HAL : https://hal.science/hal-03078950 Micro/nanotechnologies to improve concentrated photovoltaics systems Auteur(s): M. Darnon, M. Volatier, M. De Lafontaine, P. Albert, C. Laucher, G. Hamon, E. Pargon, L. Bechou, S. Fafard, V. Aimez, A. Jaouad Lien HAL : https://hal.univ-grenoble-alpes.fr/hal-02916153 Optimization of integrated optical ring microresonator structure for sensitive absorption spectroscopy Auteur(s): Pauline Girault, Beaudin Guillaume, Miguel Díaz, Simon Joly, Oyhenart Laurent, Michael Canva, P. Charette, Laurent Bechou Lien HAL : https://hal.science/hal-03070817 Vers des systèmes optiques intégrés à base de polymères nanostructurés pour la détection en milieu liquide Auteur(s): Pauline Girault, Miguel Diez, Simon Joly, Vincent Raimbault, Laurent Oyhenart, Corinne Dejous, Chi Thanh Nguyen, Isabelle Ledoux-Rak, Laurent Bechou Lien HAL : https://hal.science/hal-02519382 Front-Contacted Multijunction Micro Solar Cells: Fabrication & Characterization Auteur(s): Pierre Albert, Abdelatif Jaouad, Maxime Darnon, Christopher Valdivia, Maite Volatier, Yannick Deshayes, Karin Hinzer, Laurent Bechou, Vincent Aimez Lien HAL : https://hal.science/hal-02339965 Imaging based on low-coherence interferometry in the visible spectrum Auteur(s): M. Bravo Acha, R. Robles, P. G. Charette, L. Bechou, J. Sylvestre Lien HAL : https://hal.science/hal-02093409 High-Voltage Low-Current Multijunction Monolithic Interconnected Microcells Auteur(s): Pierre Albert, Abdelatif Jaouad, Maxime Darnon, Maite Volatier, Yannick Deshayes, Laurent Bechou, Vincent Aimez Lien HAL : https://hal.science/hal-02339963 Ba1−xSrxTiO3 (x =0.4) nanoparticles dispersion for 3D integration of decoupling capacitors on glass interposer Auteur(s): E. Tetsi, Gilles Philippot, I. Bord Majek, Cyril Aymonier, J. Audet, L. Bechou, D. Drouin Lien HAL : https://hal.science/hal-02074288 Measurement and Characterization of Quantum Socket based on LGA Inteconnect Solutions at Low Temperature Auteur(s): Zakaryae Ezzouine, David Danovitch, Laurent Bechou, Michel Pioro-Ladriere, Michael Lacerte Lien HAL : https://hal.science/hal-02320581 Failure analysis of laser crystals by their electrical characterization under high pump power density Auteur(s): Western Bolanos, Simon Joly, Inka Manek-Hönninger, Jean-Christophe Delagnes, Eric Cormier, Laurent Bechou, Yannick Deshayes Lien HAL : https://hal.science/hal-01721120 La fiabilité construite : Application à la photonique Auteur(s): Laurent Bechou Lien HAL : https://hal.science/hal-01719929 Seed laser diodes in pulsed operation: limitations and reliability Auteur(s): Germain Le Gales, Simon Joly, Marcello Giulia, Guillaume Pedroza, Adèle Morisset, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01720741 Performances and robustness of IR seed Laser diodes under large overcurrent and short-pulse conditions for fiber Laser applications Auteur(s): Germain Le Galès, Simon Joly, Western Bolanos, Guillaume Pedroza, Adèle Morisset, Frédéric Darracq, Dean Lewis, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01719975 Scanning acoustic microscopy and shear wave imaging mode performances for failure detection in high-density microassembling technologies Auteur(s): Z. Remili, Y. Ousten, B. Levrier, E. Suhir, L. Bechou Lien HAL : https://hal.science/hal-01719760 Column-Grid-Array (CGA) Technology: Could Lead to a Highly Reliable Package Design ? Auteur(s): Ephraim Suhir, R. Ghaffarian, Laurent Bechou, Johann Nicolics Lien HAL : https://hal.science/hal-01719903 Contraintes de pilotage en courant et performances de diodes Laser IR dans des conditions de surintensité et pulsées en régime sub-µs Auteur(s): Laurent Bechou Lien HAL : https://hal.science/hal-01719955 Accurate electro-optical characterization of high power density GaAs-based laser diodes for screening strategies improvement Auteur(s): Pamela del Vecchio, Yannick Deshayes, Simon Joly, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01721178 An extended model for optical gain calculations in single-mode Laser diodes, International Symposium on Reliability of Optoelectronics for Systems Auteur(s): Massimo Vanzi, Marcello Giulia, Giovanna Mura, Germain Le Gales, Simon Joly, Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01720721 Design and fabrication of polymer-on-glass optical sensors for environmental pollutants detection Auteur(s): Miguel Diez, Simon Joly, Vincent Raimbault, Laurent Oyhenart, Leire Bilbao, Laurent Bechou, Isabel Obieta, Corinne Dejous Lien HAL : https://hal.science/hal-01721145 Bow-Free Electronic Assembly: Predicted Stresses in Its Components and Embedded Devices Auteur(s): Ephraim Suhir, Johann Nicolics, Laurent Bechou Lien HAL : https://hal.science/hal-01719899 Seed laser diodes in pulsed operation: limitations and reliability investigations Auteur(s): Germain Le Gales, Marcello Giulia, Simon Joly, Guillaume Pedroza, Adèle Morisset, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01721126 Time-resolved multispectral imaging: application to the characterization of photonic devices Auteur(s): Simon Joly, Western Bolanos, Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01721135 Fabrication of High Capacitance Density Capacitor Using Spray Coated Ba0.6Sr0.4TiO3 Thin Films Auteur(s): Emmanuel Tetsi, Isabelle Bord Majek, Gilles Philippot, Cyril Aymonier, Roxan Lemire, Jean Audet, Laurent Bechou, Dominique A Drouin Lien HAL : https://hal.science/hal-01885255 Thermal Management Characterization of Microassemblied High Power Distributed-Feedback Broad Area Lasers Emitting at 975nm Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Michel Lecompte, Michel Krakowski, Laurent Bechou Lien HAL : https://hal.science/hal-01716130 Submicron polymer optical waveguides on CYTOP for visible range operation Auteur(s): Miguel Diez, Simon Joly, Vincent Raimbault, Jean-Baptiste Doucet, Oyhenart Laurent, Laurent Bechou, Corinne Dejous Lien HAL : https://hal.science/hal-01720764 Highlighting two integration technologies based on vias: Through Silicon Vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability Auteur(s): Mickaël Balmont, Isabelle Bord Majek, B. Poupard, Laurent Bechou, Yves Ousten Lien HAL : https://hal.science/hal-01957288 Submillimeter Multijunction Solar Cells: Impact of Dimension, Design and Architecture on Electrical Performances Auteur(s): Pierre Albert, Abdelatif Jaouad, Maxime Darnon, Yannick Deshayes, Laurent Bechou, Vincent Aimez Lien HAL : https://hal.science/hal-01716137 Spray coating of Ba0.6Sr0.4TiO3 nanoparticles: a low-cost and scalable process for the deposition of dielectric thin films Auteur(s): Emmanuel Tetsi, Gilles Philippot, Isabelle Bord Majek, Cyril Aymonier, Jean Audet, Roxan Lemire, Laurent Bechou, Dominique Drouin Lien HAL : https://hal.science/hal-01957047 1060nm seed laser diodes in pulsed operation: performances and safe operating area Auteur(s): Germain Le Gales, Marcello Giulia, Simon Joly, Guillaume Pedroza, Adèle Morisset, François Laruelle, Frederic Darracq, Laurent Bechou Lien HAL : https://hal.science/hal-01720731 Analysis of optical responses of 1060nm seed laser diodes under overcurrent and short-pulse conditions for reliability investigations Auteur(s): G. Le Galès, S. Joly, G. Pedroza, A. Morisset, F. Laruelle, L. Bechou Lien HAL : https://hal.science/hal-01720697 Original Screening Methodology based on Correlation between Low-Frequency Noise Measurements and Reverse Bias Behavior of GaAs-based Laser Diodes Auteur(s): Pamela del Vecchio, Arnaud Curutchet, Yannick Deshayes, Simon Joly, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01721054 Thermal and thermomechanical management of microassemblied high power thin-disk laser: a parametric study Auteur(s): Simon Joly, Marc Antoine Lemesre, Bruno Levrier, Caroline Lyszyk, Antoine Courjaud, Takunori Taira, Laurent Bechou Lien HAL : https://hal.science/hal-01721102 Imagerie multispectrale résolue en temps : Application à l'analyse de défauts ponctuels dans un matériau Auteur(s): Simon Joly, Western Bolanos, Yannick Deshayes, Laurent Bechou Lien HAL : https://hal.science/hal-01721165 Thermal investigation on high power dfb broad area lasers at 975 nm, with 60% efficiency Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Michel Lecomte, Michel Krakowski, Laurent Bechou Lien HAL : https://hal.science/hal-01380760 Digital microfluidic system incorporating optical ring resonator for trace-level hexavalent chromium ions Cr(VI) detection Auteur(s): Farida Meziane, Vincent Raimbault, Simon Joly, Hamida Hallil, Véronique Conédéra, Jean-Luc Lachaud, Laurent Bechou, Corinne Dejous Lien HAL : https://hal.science/hal-01308538 Monte-carlo computations for predicted degradation of photonic devices in space environment Auteur(s): Laurent Bechou, Yannick Deshayes, Yves Ousten, Olivier Gilard, Gianandrea Quadri, L.S. How Lien HAL : https://hal.science/hal-01219189 Correlation between Forward-Reverse Low-Frequency Noise and atypical I-V signatures in 980nm High-Power Laser Diodes Auteur(s): Pamela del Vecchio, Arnaud Curutchet, Yannick Deshayes, Mauro Bettiati, François Laruelle, Nathalie Labat, Laurent Bechou Lien HAL : https://hal.science/hal-01219200 Original Screening Methodology based on Correlation betweenLow-Frequency Noise Measurements and Reverse Bias Behaviorof GaAs-based Laser Diodes Auteur(s): Pamela del Vecchio, Arnaud Curutchet, Yannick Deshayes, Simon Joly, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-01163620 A novel approach on accelerated ageing towards reliability optimization of high concentration photovoltaic cells Auteur(s): John A. Tsanakas, Damien Jaffre, Mathieu Sicre, Rachid Elouamari, Alexis Vossier, Jean-Edouard de Salins, Laurent Bechou, Bruno Levrier, Arnaud Perona, Alain Dollet Lien HAL : https://hal.science/hal-01070179 Thermomechanical stress analysis of copper/silicon interface in Through Silicon Vias using FEM simulations and experimental analysis Auteur(s): Z. Remili, Y. Ousten, B. Levrier, D. Mercier, E. Suhir, L. Bechou Lien HAL : https://hal.science/hal-01067621 Prediction of Remaining Useful Life (RUL) of Ball-Grid-Array (BGA) Interconnections during Testing on the Board Level Auteur(s): David Gucik-Derigny, Ali Zolghadri, E. Suhir, Laurent Bechou Lien HAL : https://hal.science/hal-00984636 A model-based prognosis strategy for prediction of Remaining Useful Life of Ball-Grid-Array Interconnections Auteur(s): David Gucik-Derigny, Ali Zolghadri, E. Suhir, Laurent Bechou Lien HAL : https://hal.science/hal-00984629 Optoélectronique des fibres et télécoms Auteur(s): Laurent Bechou Lien HAL : https://hal.science/hal-01019473 Electro-optical characterizations for robustness assessment of automotive qualified white LEDs multichip modules: failure analysis and packaging influence Auteur(s): B. Chambion, L. Mendizabal, A. Gasse, L. Bechou, Y. Deshayes, V. Carreau Lien HAL : https://hal.science/hal-01019770 Improvement of Stacked High Power Laser Diodes bars by Individual Emitter Characterization Auteur(s): O. Rehioui, L. Bechou, Y. Ousten, A. Kohl, T. Fillardet Lien HAL : https://hal.science/hal-01022734 Accurate electro-optical characterization of high power density GaAs-based laser diodes for screening strategies improvement Auteur(s): Pamela del Vecchio, Yannick Deshayes, Simon Joly, Mauro Bettiati, François Laruelle, Laurent Bechou Lien HAL : https://hal.science/hal-00991556 Electro-optical characterizations for robustness assessment of automotive qualified white LEDs multichip modules: failure analysis and packaging influence Auteur(s): B. Chambion, L. Mendizabal, L. Bechou, A. Gasse, Y. Deshayes, V. Carreau Lien HAL : https://hal.science/hal-01022723 Degradation analysis of individual emitters in 808nm QCW Laser diode array for space applications Auteur(s): O. Rehioui, L. Bechou, Y. Ousten, A. Kohl, T. Fillardet, G. Volluet Lien HAL : https://hal.science/hal-01019447 Long term in-vacuum reliability testing of 980nm Laser Diode Pump Modules for Space Applications Auteur(s): G. Pedroza, L. Bechou, Y. Ousten, Ls. How, O. Gilard, Jl Goudard, F. Laruelle Lien HAL : https://hal.science/hal-01022862 Proton irradiation effects on InGaAs/InP Photodiodes for Space Applications Auteur(s): G. Pedroza, M. Boutillier, L.S. How, L. Bechou, T. Nuns, P. Arnolda, Y. Ousten Lien HAL : https://hal.science/hal-00798135 Eclairage Automobile: Les conséquences de l'intégration de DEL blanches de puissance sur la stratégie des tests de fiabilité Auteur(s): B. Chambion, L. Mendizabal, L. Bechou, V. Carreau, Y. Deshayes, A. Gasse Lien HAL : https://hal.science/hal-00786240 Thermal stresses in a pre-framed silicon-based photovoltaic module (PVM): How thick should the backsheet be? Auteur(s): Ephraim Suhir, Dongai Shangguan, Laurent Bechou Lien HAL : https://hal.science/hal-00797387 Overview of thermal studies on photonics devices for reliability, robustness and new design Auteur(s): Y. Deshayes, A. Royon, R. Baillot, L. Bechou, L. Canioni, Y. Petit, Th. Cardinal, I. Bord, B. Levrier, Y. Ousten Lien HAL : https://hal.science/hal-00786204 Probabilistic Design for Reliability (PDfR) and a Novel Approach to Qualification Testing (QT) Auteur(s): Ephraim Suhir, Ravi Mahajan, Alan Lucero, Laurent Bechou Lien HAL : https://hal.science/hal-00797407 Intégration de la fiabilité dès la conception du composant : Application aux approches Top-down et Bottom-up Auteur(s): L. Bechou, F. Verdier, Y. Ousten Lien HAL : https://hal.science/hal-00786235 Novel Core-Shell Nanocomposite for RF Embedded Capacitors: Processing and Characterization Auteur(s): Warda Benhadjala, Isabelle Bord, Laurent Bechou, Ephraïm Suhir, Matthieu Buet, Fabien Rougé, Yves Ousten Lien HAL : https://hal.science/hal-00713850 A simplified and meaningful crack propagation model in silicon for microelectronic power devices Auteur(s): Damien Calvez, Fabrice Roqueta, Sébastien Jacques, Samuel Ducret, Laurent Bechou, Yves Ousten Lien HAL : https://hal.science/hal-00766150 Modèle prédictif Simplifié de Propagation de Fissure dans les Puces en Silicium de Composants de Puissance Auteur(s): Damien Calvez, Fabrice Roqueta, Sébastien Jacques, Samuel Ducret, Laurent Bechou, Yves Ousten Lien HAL : https://hal.science/hal-00766157 OpERaS : un nouveau consortium pour l'évaluation de la fiabilité de dispositifs optoélectroniques et photoniques dédiés à l'environnement spatial Auteur(s): L. Bechou, L.S. How, F. Rosala, G. Guibaud, O. Gilard, Gianandrea Quadri, Y. Ousten Lien HAL : https://hal.science/hal-00673559 An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy Auteur(s): Dominique Dallet, Laurent Bechou, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano Lien HAL : https://hal.science/hal-00568039 Environmental conditions influence on embedded capacitors - Comparison with discrete capacitors Auteur(s): Yves Ousten, Isabelle Bord, Cyril Blot, Bruno Levrier, Laurent Bechou, Philippe Kertesz Lien HAL : https://hal.science/hal-00600734 Active pedagogy: A practical experiment at the Institut Universitaire de Technologie Bordeaux Auteur(s): H. Fremont, G. Couturier, C. Pellet, L. Bechou Lien HAL : https://hal.science/hal-00577603 OpERaS : "OptoElectronic Reliability applied to Space environment" Un nouveau consortium pour l'évaluation de la fiabilité de dispositifs optoélectroniques et photoniques dédiés à l'environnement spatial Auteur(s): Laurent Bechou, F. Rosala, Gérald Guibaud, Yves Ousten Lien HAL : https://hal.science/hal-00584317 Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses Auteur(s): R. Baillot, Y. Deshayes, L. Bechou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Y. Ousten Lien HAL : https://hal.in2p3.fr/in2p3-00532869 Evaluation of static and dynamic performances of silicon-based bipolar phototransistors under radiation Auteur(s): Gianandrea Quadri, O. Gilard, J. L. Roux, Piero Spezzigu, Laurent Bechou, M. Vanzi, Yves Ousten, D. Gibard Lien HAL : https://hal.science/hal-00402614 Strain Estimation in III-V Materials by Analysis of the Degree of Polarization of Luminescence Auteur(s): Daniel T. Cassidy, Chadwick K. Hall, Othman Rehioui, Laurent Bechou Lien HAL : https://hal.science/hal-00402230 Benefits of individual emitter electro-optical characterizations in packaged high power Laser diode bars for space applications Auteur(s): Othman Rehioui, Laurent Bechou, Thierry Fillardet, Andreas Kohl, Daniel T. Cassidy, Yannick Deshayes, Yves Ousten, Gérard Volluet Lien HAL : https://hal.science/hal-00402617 Customized and highly reliable 8-channel phototransistor array for aerospace optical encoder Auteur(s): Matteo Bregoli, Alfredo Maglione, M. Franchesci, Amos Collini, Pierluigi Bellutti, Piero Spezzigu, Laurent Bechou Lien HAL : https://hal.science/hal-00402242 Electro-optical Characterizations at the Emitter Level in Stacked Laser Diodes Bars for Space Applications Auteur(s): Othman Rehioui, Laurent Bechou, Thierry Fillardet, Andreas Kohl, Yves Ousten, E. Brousse, Gérard Volluet Lien HAL : https://hal.science/hal-00402236 Silicon phototransistor reliability assessment and new selection strategies for space applications Auteur(s): Piero Spezzigu, Laurent Bechou, Yannick Deshayes, Yves Ousten, Gianandrea Quadri, Olivier Gilard, Massimo Vanzi Lien HAL : https://hal.science/hal-00402616 Lifetime distribution estimation of Light emitting diode Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier Lien HAL : https://hal.science/hal-00402233 Trapped mobile charges effects on electro-optical performances in silicon phototransistors for space applications Auteur(s): Piero Spezzigu, Gianandrea Quadri, Olivier Gilard, Laurent Bechou, Yves Ousten, Massimo Vanzi Lien HAL : https://hal.science/hal-00403233 Méthodologie d'analyse physique pour l'évaluation de la fiabilité de Diodes Electroluminescentes InGaN/GaN Auteur(s): Raphaël Baillot, Yannick Deshayes, Yves Ousten, Laurent Bechou Lien HAL : https://hal.science/hal-00402734 Thermomechanical behaviour of ceramic ball grid array based on FEM simulations and experimentations Auteur(s): Jean-Yves Delétage, Alain Fenech, Laurent Bechou, Yves Ousten, Yves Danto, Michel Salagoity, Christiane Faure, S. Rao Lien HAL : https://hal.science/hal-00385312 Different Approaches to Packaging Reliability Auteur(s): Yves Ousten, Laurent Bechou, Frederic Verdier, Yannick Deshayes, Bruno Levrier, Isabelle Bord, Bertrand Carbonne Lien HAL : https://hal.science/hal-00335551 Study of Time-Frequency methods for multilayer structures characterization Auteur(s): Dominique Dallet, Laurent Bechou, Yannick Berthoumieu, Yves Ousten Lien HAL : https://hal.science/hal-00182922 Improvement of ultrasonic images on Microassemblies using adapted signal processing techniques Auteur(s): Laurent Bechou, Yves Ousten, Bernard Tregon, Yves Danto, Sylvain Allano, Michel Salagoity Lien HAL : https://hal.science/hal-00182919 FFT et applications : caractérisation d'un CAN, choix d'une fenêtre d'analyse et réponse en fréquence d'un système Auteur(s): Gérard Couturier, Laurent Bechou, Jean-Baptiste Begueret, Claude Pellet Lien HAL : https://hal.science/hal-00183132 Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations Auteur(s): Y. Deshayes, L. Bechou, F. Verdier, B. Tregon, D. Laffitte, Jl. Goudard, Y. Hernandez, Y. Danto Lien HAL : https://hal.science/hal-00162359 Impact of radiation effects on AlGaAs/GaAs, InGaN/GaN and AlGaInP/GaP packaged light emitting diodes for space applications Auteur(s): O. Gilard, L. Bechou, B. Kurz, O. Rehioui, M.L. Bourqui, D. Campillo, Y. Deshayes, Gianandrea Quadri Lien HAL : https://hal.science/hal-00162386 Extraction of the MLCC Matrix of Compliance Used for Reliability Auteur(s): Yves Ousten, Bruno Levrier, Jean Augereau, Laurent Bechou Lien HAL : https://hal.science/hal-00182910 Prédiction de distributions de durées de vie de composants optoélectroniques émissifs 1.55 µm : Lois expérimentales et méthodologie statistique Auteur(s): Laurent Mendizabal, Laurent Bechou, Yannick Deshayes, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183951 Three-Dimensional FEM Simulations of Thermomechanical Stresses in 1.55 µm Laser modules Auteur(s): Yannick Deshayes, Laurent Bechou, Yves Danto, D. Laffitte, Jl Goudard Lien HAL : https://hal.science/hal-00183954 The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies Auteur(s): Yves Ousten, Said Mejdi, Alain Fenech, Jean-Yves Deletage, Laurent Bechou, Marie-Genevieve Perichaud, Yves Danto Lien HAL : https://hal.science/hal-00182923 Simulations of thermomechanical stresses and optical misalignment in 1.55 µm emissive optoelectronic modules using FEM and process dispersions Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Yves Danto Lien HAL : https://hal.science/hal-00183953 Prédiction de distributions de durées de vie de composants optoélectroniques émissifs 1.55 µm : Lois expérimentales et méthodologie statistique Auteur(s): L. Bechou, Y. Danto, Y. Deshayes, L. Mendizabal, F. Verdier Lien HAL : https://hal.science/hal-00162364 Caractérisation d interfaces Cu/Al2O3 par un système d analyse ultrasonore Auteur(s): Laurent Bechou, Yves Ousten, Yves Danto, Omar Rachidi, Claude Lucat Lien HAL : https://hal.science/hal-00182873 Dissipation thermique dans les dispositifs à fortes densités de puissance. Cas des TBHs sur GaAs et évaluation de deux techniques de report Auteur(s): Laurent Bechou, Yves Ousten Lien HAL : https://hal.science/hal-00182914 Analyse nondestructive par microscopie ultrasonore et laminographie X d assemblages CBGA soumis à des cyclages thermiques Auteur(s): Laurent Bechou, Dominique Navarro, Yves Ousten, Yves Danto, Christian Zardini, Jean-Louis Aucouturier, Michel Salagoity Lien HAL : https://hal.science/hal-00182916 Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations Auteur(s): Yannick Deshayes, Laurent Bechou, Frédéric Verdier, Bernard Tregon, D. Laffitte, Jl Goudard, Y. Hernandez, Yves Danto Lien HAL : https://hal.science/hal-00183952 Improving Reliability Evaluation of Electronic Assemblies Using Early Physical and Electrical Indicators Auteur(s): Yves Ousten, S. Ponomarenko, Laurent Bechou, Yves Danto, Said Mejdi, A. Hijazi Lien HAL : https://hal.science/hal-00182920 Three-Dimensional FEM Simulations of Thermomechanical Stresses in 1.55 µm Laser modules Auteur(s): Y. Deshayes, L. Bechou, Y. Danto, D. Laffitte, Jl. Goudard Lien HAL : https://hal.science/hal-00162362 Performance and reliability predictions of 1550 nm WDM optical transmission links using a system simulator Auteur(s): L. Bechou, L. Mendizabal, Christelle Aupetit-Berthelemot, Y. Deshayes, Jean-Michel Dumas, D. Laffitte, J.L. Goudard, Y. Danto Lien HAL : https://hal.science/hal-00162382 Ultrasonic images interpretation improvement for microassembling technologies characterization Auteur(s): Laurent Bechou, Yves Ousten, Bernard Tregon, François Marc, Yves Danto, Philippe Kertesz Lien HAL : https://hal.science/hal-00181907 MLCC Type II tested by resonant sound Auteur(s): Yves Ousten, Laurent Bechou, Yves Danto Lien HAL : https://hal.science/hal-00182917 Comparison between piezoelectric method and ultrasonic signal analysis for multilayer ceramic capacitors type II crack detection Auteur(s): Yves Ousten, Laurent Bechou, Bernard Tregon, Yves Danto Lien HAL : https://hal.science/hal-00182918 Time frequency methods for multilayer structures characterization Auteur(s): Laurent Bechou, Dominique Dallet, Yannick Berthoumieu, Yves Ousten Lien HAL : https://hal.science/hal-00182872 Acoustic analysis of an assembly : Structural identification by signal processing (wavelets) Auteur(s): Jean Augereau, Yves Ousten, Laurent Bechou, Yves Danto Lien HAL : https://hal.science/hal-00182912 New Methods for Scanning Ultrasonic Microscopy - Applications for Failure Analysis of Microassembling Technologies Auteur(s): Laurent Bechou, Yves Ousten, Yves Danto Lien HAL : https://hal.science/hal-00182915 La Licence Professionnelle Microélectronique Microsystèmes: Une nouvelle approche dans le pôle CNFM bordelais (PCB) Auteur(s): Jean-Baptiste Begueret, Dominique Rebiere, Laurent Bechou, Claude Pellet, Yvan Maidon, Ac Salaun, H. Lhermite Lien HAL : https://hal.science/hal-00183078 FFT et applications : caractérisation d un CAN, choix d une fenêtre d analyse et réponse en fréquence d un système Auteur(s): Gérard Couturier, Laurent Bechou, Jean-Baptiste Begueret, Claude Pellet Lien HAL : https://hal.science/hal-00183133

Invited lectures (10)

Composant optofluidique polymère pour la détection de polluants dans l’eau (COPDepol) Auteur(s): Miguel Diez, Simon Joly, Laurent Oyhenart, Vincent Raimbault, Laurent Bechou, Corinne Dejous Lien HAL : https://hal.science/hal-02526901 Thermal management characterization of microassembled high power DFB broad area lasers emitting at 975 nm Auteur(s): Roberto Mostallino, Michel Garcia, Yannick Deshayes, Larrue Alexandre, Yannick Robert, Eric Vinet, Michel Lecompte, Olivier Parillaud, Michel Krakowski, Laurent Bechou Lien HAL : https://hal.science/hal-01716140 Resonant wave-based microsensors for environmental and health related applications Auteur(s): Corinne Dejous, Laurent Bechou, Hamida Hallil, Simon Hemour, Simon Joly, Jean-Luc Lachaud, Laurent Oyhenart, Vincent Raimbault, Dominique Rebière, Ollivier Tamarin, Prince Bahoumina, Miguel Diez, Farida Meziane, Ioannis Nikolaou Lien HAL : https://hal.science/hal-01393043 Hybrid materials for packaging Auteur(s): Isabelle Bord-Majek, Laurent Bechou, Yves Ousten Lien HAL : https://hal.science/hal-01195940 Overview on reliability investigation on LEDs devices Auteur(s): Raphael Baillot, Laurent Bechou, Colette Belin, Thierry Buffeteau, Isabelle Pianet, Christelle Absalon, Yannick Deshayes Lien HAL : https://hal.science/hal-01219888 OpERaS : A new consortium for reliability investigations of optoelectronic and photonic devices dedicated to space environments Auteur(s): L. Bechou, F. Rosala, G. Guibaud, Y. Ousten Lien HAL : https://hal.science/hal-01019413 Performances and reliability predictions of optical data transmission links using a system simulator for aerospace applications Auteur(s): Laurent Bechou, Yannick Deshayes, Christelle Aupetit-Berthelemot, Alexandre Guerin, Christian Tronche Lien HAL : https://unilim.hal.science/hal-00917358 Reliability assessment of optoelectronic and photonic devices in severe environments: architecture and applications of the OpERaS consortium Auteur(s): L. Bechou, P. Spezzigu Lien HAL : https://hal.science/hal-00673563 Methodology of failure analysis applied to packaged LEDs Auteur(s): Raphael Baillot, Laurent Bechou, Yannick Deshayes, Colette Belin, Thierry Buffeteau, Isabelle Pianet, Christelle Absalon, Yves Ousten Lien HAL : https://hal.science/hal-00600570 Electroluminescence spectroscopy for reliability investigations of 1.55µm Bulk Semiconductor Optical Amplifier Auteur(s): S. Huyghe, L. Bechou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, Jl Goudard, Y. Danto Lien HAL : https://hal.science/hal-00162384

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