Conference proceedings (5)
Non-destructive characterization of Breakdown Voltage measurement and Application on a 55nm SiGe HBT featuring fT/fMAX of 400GHz/500GHz Auteur(s): Lucas Réveil, Arthur Sarafinof, Florian Cacho, Maxime Pradeau, Nicolas Derrier, Magali de Matos, Mukherjee Chhandak, Cristell Maneux Année de publication: 2025 Journal: DOI: Lien HAL: https://hal.science/hal-05323108v1 Thermal and Ageing Characterizations of 55nm SiGe HBT Auteur(s): Arthur Sarafinof, Lucas Réveil, Florian Cacho, Magali de Matos, Mukherjee Chhandak, Joycelyn Hai, Cristell Maneux Année de publication: 2025 Journal: DOI: Lien HAL: https://hal.science/hal-05323119v1 Non-destructive characterization of Breakdown Voltage measurement and Application on a 55nm SiGe HBT featuring fT /fMAX of 400GHz/500GHz Auteur(s): Lucas Réveil, Arthur Sarafinof, Florian Cacho, Maxime Pradeau, Nicolas Derrier, Magali de Matos, Mukherjee Chhandak, Cristell Maneux Année de publication: 2025 Journal: DOI: Lien HAL: https://hal.science/hal-05394761v1 Thermal and Ageing Characterizations of 55nm SiGe HBT Auteur(s): Arthur Sarafinof, Lucas Réveil, Florian Cacho, Magali de Matos, Mukherjee Chhandak, Joycelyn Hai, Cristell Maneux Année de publication: 2025 Journal: DOI: Lien HAL: https://hal.science/hal-05394737v1 Scalable Thermal Characterization and Stress Type Comparison on 55nm SiGe HBT Auteur(s): A. Sarafinof, Mukherjee Chhandak, Magali de Matos, L. Réveil, F. Cacho, C. Maneux Année de publication: 2025 Journal: DOI: 10.1109/BCICTS63111.2025.11211184 Lien HAL: https://hal.science/hal-05393737v1Send a email to Arthur SARAFINOF :
