2022

HOBIT. Un concept innovant pour la transformation des pratiques pédagogiques en physique
Bousquet, Bruno ; Canioni, Lionel ; Guillet, Jean-Paul ; Fleck, Stéphanie ; Normand, Erwan ; Hachet, Martin
Dans : Reflets de la Physique
https://hal.science/hal-03783053

Terahertz Nondestructive Testing with Ultra-Wideband FMCW Radar
Carre, Barnabe ; Chopard, Adrien ; Guillet, Jean-Paul ; Fauquet, Frederic ; Mounaix, Patrick ; Gellie, Pierre
Dans : Sensors
https://hal.science/hal-03930018

Single-scan multiplane phase retrieval with a radiation of terahertz quantum cascade laser
Chopard, Adrien ; Tsiplakova, Elizaveta ; Balbekin, Nikolay ; Smolyanskaya, Olga ; Perraud, Jean-Baptiste ; Guillet, Jean-Paul ; Petrov, Nikolay ; Mounaix, Patrick
Dans : Applied Physics B - Laser and Optics
https://hal.science/hal-03845696

Single-scan multiplane phase retrieval with a radiation of terahertz quantum cascade laser
Chopard, Adrien ; Tsiplakova, Elizaveta ; Balbekin, Nikolay ; Smolyanskaya, Olga ; Perraud, Jean-Baptiste ; Guillet, Jean Paul ; Petrov, Nikolay V. ; Mounaix, Patrick
Dans : Applied Physics B - Laser and Optics
https://hal.science/hal-03692289

Avancées technologiques des sources et capteurs térahertz - Vers le transfert industriel
Mounaix, Patrick
Dans : Les Techniques de l'Ingenieur
https://hal.science/hal-03919736

Scanning point terahertz source microscopy of unstained comedo ductal carcinoma in situ
Okada, Kosuke ; Cassar, Quentin ; Murakami, Hironaru ; Macgrogan, Gaëtan ; Guillet, Jean Paul ; Mounaix, Patrick ; Tonouchi, Masayoshi ; Serita, Kazunori
Dans : Optics Continuum
https://hal.science/hal-03691895

The thermodynamic properties of interstellar isomers with 3 atoms
Oladimeji, Enock ; Etim, Emmanuel ; Ojo, Moses
Dans : Advances in Space Research
https://hal.science/hal-04017404

Tunable ultra-fast infrared generation in a gas-filled hollow core capillary by a four-wave mixing process: erratum
Zurita-Miranda, Olivia ; Fourcade-Dutin, Coralie ; Fauquet, Frederic ; Darracq, Frederic ; Guillet, Jean-Paul ; Mounaix, Patrick ; Maillotte, Herve ; Bigourd, Damien
Dans : Journal of the Optical Society of America B
https://hal.science/hal-03896790

Tunable ultrafast infrared generation in a gas-filled hollow-core capillary by a four-wave mixing process
Zurita Miranda, Olivia ; Fourcade Dutin, Coralie ; Fauquet, Frédéric ; Darracq, Frédéric ; Guillet, Jean-Paul ; Mounaix, Patrick ; Maillotte, Hervé ; Bigourd, Damien
Dans : Journal of the Optical Society of America B (JOSA B)
https://hal.science/hal-03813294

Tunable ultra-fast infrared generation in a gas-filled hollow core capillary by a four-wave mixing process
Zurita-Miranda, Olivia ; Fourcade-Dutin, Coralie ; Fauquet, Frederic ; Darracq, Frederic ; Guillet, Jean-Paul ; Mounaix, Patrick ; Maillotte, Herve ; Bigourd, Damien
Dans : Journal of the Optical Society of America B
https://hal.science/hal-03558771

2021

Terahertz refractive index-based morphological dilation for breast carcinoma delineation
Cassar, Quentin ; Caravera, Samuel ; Macgrogan, Gaëtan ; Bücher, Thomas ; Hillger, Philipp ; Pfeiffer, Ullrich ; Zimmer, Thomas ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : Scientific Reports
https://hal.science/hal-03273518

Towards Monolithic Indium Phosphide (InP)-Based Electronic Photonic Technologies for beyond 5G Communication Systems
Chhandak, Mukherjee ; Deng, Marina ; Nodjiadjim, Virginie ; Riet, Muriel ; Mismer, Colin ; Guendouz, Djeber ; Caillaud, Christophe ; Bertin, Hervé ; Vaissiere, Nicolas ; Luisier, Mathieu ; Wen, Xin ; de Matos, Magali ; Mounaix, Patrick ; Maneux, Cristell
Dans : Applied Sciences
https://hal.science/hal-03163305

Terahertz waves for contactless control and imaging in aeronautics industry
Chopard, A. ; Cassar, Q. ; Bou-Sleiman, J. ; Guillet, J.P. ; Pan, M. ; Perraud, J.B. ; Susset, A. ; Mounaix, Patrick
Dans : NDT & E International
https://hal.science/hal-03434613

Terahertz waves for contactless control and imaging in aeronautics industry
Chopard, A. ; Cassar, Q. ; Bou-Sleiman, J. ; Guillet, Jean-Paul ; Pan, M. ; Perraud, J.B. ; Susset, A. ; Mounaix, P.
Dans : NDT & E International
https://hal.science/hal-03273555

Mid-infrared ultra-short pulse generation in a gas filled hollow-core fiber pumped by two pulses
Fourcade-Dutin, Coralie ; Miranda, Olivia ; Mounaix, Patrick ; Bigourd, Damien
Dans : Fibers
https://hal.science/hal-03194763

Multiscale compact modelling of UTC-photodiodes enabling monolithic terahertz communication systems design
Guendouz, Djeber ; Chhandak, Mukherjee ; Deng, Marina ; de Matos, Magali ; Caillaud, Christophe ; Bertin, Hervé ; Bobin, Antoine ; Vaissière, Nicolas ; Mekhazni, Karim ; Mallecot, Franck ; Arabhavi, Akshay ; Chaudhary, Rimjhim ; Ostinelli, Olivier ; Bolognesi, Colombo ; Mounaix, Patrick ; Maneux, Cristell
Dans : Applied Sciences
https://hal.science/hal-03847207

Multiscale Compact Modelling of UTC-Photodiodes Enabling Monolithic Terahertz Communication Systems Design
Maneux, Cristell ; Mounaix, Patrick ; Bolognesi, Colombo ; Ostinelli, Olivier ; Chaudhary, Rimjhim ; Arabhavi, Akshay ; Mallecot, Franck ; Mekhazni, Karim ; Vaissière, Nicolas ; Bobin, Antoine ; Bertin, Hervé ; Caillaud, Christophe ; de Matos, Magali ; Deng, Marina ; Mukherjee, Chhandak ; Guendouz, Djeber
Dans : Applied Sciences
https://hal.science/hal-03657756

Investigation of Oil Shale Response Using Terahertz-Time Domain Spectroscopy
Ojo, Moses Eshovo ; Mounaix, Patrick ; Bigourd, Damien
Dans : petroleum technology development journal
https://hal.science/hal-03161931

Label-Free Observation of Micrometric Inhomogeneity of Human Breast Cancer Cell Density Using Terahertz Near-Field Microscopy
Okada, Kosuke ; Cassar, Quentin ; Murakami, Hironaru ; Macgrogan, Gaëtan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Tonouchi, Masayoshi ; Serita, Kazunori
Dans : Photonics
https://hal.science/hal-03273542

TeraPulse Lx for terahertz imaging of painting on canvas
Sirro, Sergei ; Odlyanitskiy, Evgeniy ; Portieri, Alessia ; Taday, Phil ; Arnone, Donald ; Guillet, Jean-Paul ; Smolyanskaya, Olga
Dans : Journal of Physics: Conference Series
https://hal.science/hal-03273528

2020

Characterization of Varnish Ageing and its Consequences on Terahertz Imagery: Demonstration on a Painting Presumed of the French Renaissance
Cassar, Q. ; Koch-Dandolo, C. ; Guillet, Jean-Paul ; Roux, M. ; Fauquet, F. ; Perraud, J. ; Mounaix, P.
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-03273504

Using soy protein in the three-component phantom for breast cancer mimicking
Cassar, Q. ; Lykina, A.A. ; Lepeshkin, A.I. ; Baranenko, D.A. ; Kravtsenyuk, O.V. ; Mounaix, P. ; Guillet, J.-P. ; Smolyanskaya, O.A.
Dans : Journal of Physics: Conference Series
https://hal.science/hal-02891061

Fast Terahertz Spectroscopic Holographic Assessment of Optical Properties of Diabetic Blood Plasma
Mounaix, Patrick ; Kulya, Maksim ; Odlyanitskiy, Evgeniy ; Cassar, Quentin ; Mustafin, Ilia ; Trukhin, Valery ; Gavrilova, Polina ; Korolev, Dmitry ; Kononova, Yulia ; Balbekin, Nikolay ; Guillet, Jean-Paul ; Petrov, Nikolay ; Smolyanskaya, Olga
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-03000003

Terahertz near-field microscopy of ductal carcinoma in situ (DCIS) of the breast
Mounaix, Patrick ; Okada, Kosuke ; Serita, Kazunori ; Cassar, Quentin ; Murakami, Hironaru ; Macgrogan, Gaëtan ; Guillet, Jean-Paul ; Tonouchi, Masayoshi
Dans : Journal of Physics: Photonics
https://hal.science/hal-02999983

Efficient compact modelling of UTC-photodiode towards terahertz communication system design
Mukherjee, Chhandak ; Natrella, Michele ; Seddon, James ; Graham, Chris ; Mounaix, Patrick ; Renaud, Cyril ; Maneux, Cristell
Dans : Solid-State Electronics
https://hal.science/hal-02651295

Guided Reflectometry Imaging Unit using Millimeter Wave FMCW Radars
Pan, M ; Chopard, A. ; Fauquet, F. ; Mounaix, P. ; Guillet, J.-P
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.science/hal-02896005

Guided terahertz pulse reflectometry with double photoconductive antenna
Pan, Mingming ; Cassar, Quentin ; Fauquet, Frederic ; Humbert, Georges ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : Applied optics
https://hal.science/hal-02476707

Terahertz Phase Retrieval Imaging in Reflection
Petrov, Nikolai ; Perraud, Jean-Baptiste ; Chopard, Adrien ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : Optics Letters
https://hal.science/hal-02891064

Spectral correlation of four wave mixing generated in a photonic crystal fiber pumped by a chirped pulse
Robert, Paul ; Fourcade-Dutin, Coralie ; Dauliat, Romain ; Jamier, Raphaël ; Muñoz-Marco, Hector ; Perez-Millan, Pere ; Dudley, John ; Roy, Philippe ; Maillotte, Herve ; Bigourd, Damien
Dans : Optics Letters
https://hal.science/hal-02965800

Modeling radiative-shocks created by laser- cluster interactions
Scott, R ; Booth, N ; Hawkes, S ; Symes, D ; Hooker, C ; Doyle, H. ; Olsson-Robbie, S ; Lowe, H ; Price, C ; Bigourd, D. ; Patankar, S ; Mecseki, K ; Gumbrell, E ; Smith, R
Dans : Physics of Plasmas
https://hal.science/hal-02523915

2019

Iterative Tree Algorithm to Evaluate Terahertz Signal Contribution of Specific Optical Paths within Multi-Layered Materials
Cassar, Quentin ; Chopard, Adrien ; Fauquet, Frederic ; Guillet, Jean-Paul ; Pan, Mingming ; Perraud, Jean-Baptiste ; Mounaix, Patrick
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.univ-grenoble-alpes.fr/hal-02335825

Terahertz Spectroscopy and Quantum Mechanical Simulations of Crystalline Copper-Containing Historical Pigments
Kleist, Elyse ; Koch Dandolo, Corinna ; Guillet, Jean-Paul ; Mounaix, Patrick ; Korter, Timothy
Dans : Journal of Physical Chemistry A
https://hal.univ-grenoble-alpes.fr/hal-02009689

Impact of temperature on calendar ageing of Lithium-ion battery using incremental capacity analysis
Maures, Matthieu ; Zhang, Yuanci ; Martin, Cyril ; Deletage, Jean-Yves ; Vinassa, Jean-Michel ; Briat, Olivier
Dans : Microelectronics Reliability
https://hal.science/hal-02506186

Scanning laser terahertz near-field reflection imaging system
Okada, Kosuke ; Serita, Kazunori ; Zang, Zirui ; Murakami, Hironaru ; Kawayama, Iwao ; Cassar, Quentin ; Macgrogan, Gaetan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Tonouchi, Masayoshi
Dans : Applied Physics Express
https://hal.science/hal-02347269

Shape-from-focus for real-time terahertz 3D imaging
Perraud, J.-B. ; Guillet, J.-P. ; Redon, O. ; Simoens, F. ; Mounaix, Patrick
Dans : Optics Letters
https://hal.univ-grenoble-alpes.fr/hal-02009683

Ex Vivo Breast Tumor Identification: Advances Toward a Silicon-Based Terahertz Near-Field Imaging Sensor
Pfeiffer, Ullrich ; Hillger, Philipp ; Jain, Ritesh ; Grzyb, Janusz ; Bucher, Thomas ; Cassar, Quentin ; Macgrogan, Gaetan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Zimmer, Thomas
Dans : IEEE Microwave Magazine
https://hal.univ-grenoble-alpes.fr/hal-02890448

Multimodal Optical Diagnostics of Glycated Biological Tissues
Smolyanskaya, O. ; Lazareva, E. ; Nalegaev, S. ; Petrov, N. ; Zaytsev, K. ; Timoshina, P. ; Tuchina, D. ; Toropova, Ya. ; Kornyushin, O. ; Babenko, A. Yu. ; Guillet, J.-P. ; Tuchin, V.
Dans : Биохимия / Biochemistry
https://hal.science/hal-02342804

Non-isothermal Ragone plots of Li-ion cells from datasheet and galvanostatic discharge tests
Zhang, Yuanci ; Briat, Olivier ; Boulon, Loïc ; Delétage, Jean-Yves ; Martin, Cyril ; Coccetti, Fabio ; Vinassa, Jean-Michel
Dans : Applied Energy
https://hal.science/hal-02117604

2018

Pilot study of freshly excised breast tissue response in the 300 – 600 GHz range
Cassar, Quentin ; Al-Ibadi, Amel ; Mavarani, Laven ; Hillger, Philipp ; Grzyb, Janusz ; Macgrogan, Gaetan ; Zimmer, Thomas ; Pfeiffer, Ullrich ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : Biomedical optics express
https://hal.science/hal-01923517

Terahertz frequency modulated continuous wave imaging advanced data processing for art painting analysis
Dandolo, Corinna ; Guillet, Jean-Paul ; Ma, Xue ; Fauquet, Frederic ; Roux, Marie ; Mounaix, Patrick
Dans : Optics Express
https://u-bourgogne.hal.science/hal-01718044

Terahertz pulse time-domain holography method for phase imaging of breast tissue
Hillger, Philipp ; Jain, Ritesh ; Grzyb, Janusz ; Forster, Wolfgang ; Heinemann, Bernd ; Macgrogan, Gaetan ; Mounaix, Patrick ; Zimmer, Thomas ; Pfeiffer, Ullrich
Dans : IEEE Journal of Solid-State Circuits
https://hal.univ-grenoble-alpes.fr/hal-02335929

NearSense – Advances Towards a Silicon-Based Terahertz Near-Field Imaging Sensor for Ex Vivo Breast Tumour Identification
Mounaix, Patrick ; Mavarani, Laven ; Hillger, Philipp ; Bucher, Thomas ; Grzyb, Janusz ; Cassar, Quentin ; Al-Ibadi, Amel ; Zimmer, Thomas ; Macgrogan, Gaetan ; Guillet, Jean-Paul ; Pfeiffer, Ullrich
Dans : Frequenz
https://hal.science/hal-01745775

Terahertz biophotonics as a tool for studies of dielectric and spectral properties of biological tissues and liquids
Smolyanskaya, O.A. ; Chernomyrdin, N.V. ; Konovko, A.A. ; Zaytsev, I. ; Ozheredov, I. ; Guillet, Jean-Paul ; Cherkasova, P. ; Nazarov, M.M. ; Kozlov, S.A. ; Kistenev, Yu. ; Coutaz, J.-L. ; Mounaix, P. ; Vaks, V.L. ; Son, H. ; Cheon, H. ; Wallace, V.P. ; Feldman, Yu. ; Popov, I. ; Yaroslavsky, A.N. ; Shkurinov, A.P. ; Tuchin, V.V.
Dans : Progress in Quantum Electronics
https://hal.science/hal-01923488

Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Zhang, Yuanci ; Briat, Olivier ; Delétage, Jean-Yves ; Martin, Cyril ; Chadourne, Nicolas ; Vinassa, Jean-Michel
Dans : Microelectronics Reliability
https://hal.science/hal-01892422

2017

Une « Mallette Scan Champ Proche » pour l’enseignement de la compatibilité électromagnétique
Dubois, Tristan ; Guillet, J-P. ; Duchamp, G. ; Tomas, J.
Dans : Journal sur l'enseignement des sciences et technologies de l'information et des systèmes
https://hal.science/hal-01698515

Art Painting Diagnostic Before Restoration with Terahertz and Millimeter Waves
Guillet, Jean-Paul ; Roux, M. ; Wang, K. ; Ma, Xue ; Fauquet, F. ; Balacey, H. ; Recur, B. ; Darracq, F. ; Mounaix, P.
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-01437051

TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : Microelectronics Reliability
https://hal.science/hal-01625567

2D and 3D Terahertz Imaging and X-Rays CT for Sigillography Study
Mounaix, Patrick ; Guillet, Jean-Paul ; Fauquet, F. ; Balacey, H. ; Recur, B. ; Darracq, F. ; Fabre, M. ; Bassel, L. ; Bou Sleiman, J. ; Perraud, J.-B.
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-01653623

Study of blood plasma optical properties in mice grafted with Ehrlich carcinoma in the frequencyrange 0.1–1.0 THz
Smolyanskaya, Olga ; Kravtsenyuk, O ; Panchenko, A.V. ; Cherkasova, A. V. ; Guillet, J.P. ; Odlyanitskiy, Evgeniy ; Khodzitsky, Mikhail
Dans : Quantum Electronics
https://u-bourgogne.hal.science/hal-01660495

2016

Advanced Processing Sequence for 3-D THz Imaging
Balacey, Hugo ; Recur, Benoit ; Perraud, Jean-Baptiste ; Sleiman, Joyce ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.science/hal-01390881

Automatic process for time-frequency scan of VLSI
Boscaro, Anthony ; Jacquir, Sabir ; Melendez, Kevin ; Sanchez, Kevin ; Perdu, Philippe ; Binczak, Stéphane
Dans : Microelectronics Reliability
https://hal.science/hal-01465737

Splitting of magnetic dipole modes in anisotropic TiO2 micro-spheres
Khromova, Irina ; Kužel, Petr ; Brener, Igal ; Reno, John L. ; Chung Seu, U-Chan ; Elissalde, Catherine ; Maglione, Mario ; Mounaix, Patrick ; Mitrofanov, Oleg
Dans : Laser and Photonics Reviews
https://hal.science/hal-01370336

Intrinsic Properties of Anisotropic Dielectric Micro-Resonators Obtained through Near-Field Terahertz Spectroscopy
Mounaix, Patrick ; Khromova, Irina ; Kuzel, P. ; Brener, Igal ; Reno, John L. ; Chung, U-Chan ; Elissalde, Catherine ; Maglione, Mario ; Mitrofanov, Oleg
Dans : Conference on Lasers and Electro-OpticsConference on Lasers and Electro-Optics, OSA Technical Digest (online) (Optical Society of America, 2016)
https://hal.science/hal-01390953

Liquid index matching for 2D and 3D terahertz imaging
Perraud, J. B. ; Bou Sleiman, J. ; Recur, B. ; Balacey, H. ; Simoens, F. ; Guillet, J. P. ; Mounaix, P.
Dans : Applied optics
https://hal.science/hal-01394023

Terahertz imaging and tomography as efficient instruments for testing polymer additive manufacturing objects
Perraud, Jean Baptiste ; Obaton, Anne Françoise ; Bou-Sleiman, Joyce ; Recur, Benoit ; Balacey, Hugo ; Darracq, Frederic ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : Applied optics
https://hal.science/hal-01390875

Bulk magnetic terahertz metamaterials based on dielectric microspheres
Sindler, Michal ; Kadlec, Christelle ; Dominec, Filip ; Kužel, Petr ; Elissalde, Catherine ; Kassas, Ahmad ; Lesseur, Julien ; Bernard, Dominique ; Mounaix, Patrick ; Němec, Hynec
Dans : Optics Express
https://hal.science/hal-01373166

2015

Quantitative Analysis of Hexahydro-1,3,5-trinitro-1,3,5, Triazine/Pentaerythritol Tetranitrate (RDX–PETN) Mixtures by Terahertz Time Domain Spectroscopy
Bou Sleiman, Joyce ; Bousquet, Bruno ; Palka, Norbert ; Mounaix, Patrick
Dans : Applied Spectroscopy
https://hal.science/hal-01263720

Low-frequency noise effect on terahertz tomography using thermal detectors.
Guillet, Jean-Paul ; Recur, Benoît ; Balacey, Hugo ; Bou Sleiman, Joyce ; Darracq, F. ; Lewis, Dean ; Mounaix, Patrick
Dans : Applied optics
https://hal.science/hal-01263737

A way to implement the electro-optical technique to inertial MEMS
Melendez, K ; Desmoulin, A ; Sanchez, Kevin ; Perdu, Philippe ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-01264066

2014

A comprehensive study of the application of the EOP techniques on bipolar devices
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Guillet, Jean-Paul ; Elise, Bernou ; Sanchez, Kevin ; Perdu, Philippe ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-01091179

Ordered subsets convex algorithm for 3D terahertz transmission tomography
Recur, Benoît ; Balacey, Hugo ; Bou Sleiman, Joyce ; Perraud, Jean-Baptiste ; Guillet, Jean-Paul ; Kingston, Andrew ; Mounaix, Patrick
Dans : Optics Express
https://hal.science/hal-01066999

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa
Wrobel, Frédéric ; Touboul, Antoine ; Pouget, Vincent ; Dilillo, Luigi ; Ecoffet, Robert ; Lorfèvre, Eric ; Bezerra, Francoise ; Brugger, Markus ; Saigné, Frédéric
Dans : IEEE Transactions on Nuclear Science
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234461

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses
Wrobel, Frédéric ; Dilillo, Luigi ; Touboul, Antoine ; Pouget, Vincent ; Saigné, Frédéric
Dans : IEEE Transactions on Nuclear Science
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234429

2013

La cobotique. La robotique soumise.
Claverie, Bernard ; Le Blanc, Benoît ; Fouillat, Pascal
Dans : Communication & Organisation
https://hal.science/hal-01014650

Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology
El Moukhtari, Issam ; Pouget, Vincent ; Darracq, Frédéric ; Larue, Camille ; Perdu, Philippe ; Lewis, D.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00880480

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell
El Moukhtari, Issam ; Pouget, Vincent ; Larue, Camille ; Darracq, Frédéric ; Lewis, D. ; Perdu, Philippe
Dans : Microelectronics Reliability
https://hal.science/hal-00880459

Variants at multiple loci implicated in both innate and adaptive immune responses are associated with Sjögren's syndrome.
Lessard, Christopher J ; Li, He ; Adrianto, Indra ; Ice, John A ; Rasmussen, Astrid ; Grundahl, Kiely M ; Kelly, Jennifer A ; Dozmorov, Mikhail G ; Miceli-Richard, Corinne ; Bowman, Simon ; Lester, Sue ; Eriksson, Per ; Eloranta, Maija-Leena ; Brun, Johan G ; Gøransson, Lasse G ; Harboe, Erna ; Guthridge, Joel M ; Kaufman, Kenneth M ; Kvarnström, Marika ; Jazebi, Helmi ; Graham, Deborah S Cunninghame ; Grandits, Martha E ; Nazmul-Hossain, Abu N M ; Patel, Ketan ; Adler, Adam J ; Maier-Moore, Jacen S ; Farris, a Darise ; Brennan, Michael T ; James, James ; James, Judith A ; Gopalakrishnan, Rajaram ; Hefner, Kimberly S ; Houston, Glen D ; Huang, Andrew J W ; Hughes, Pamela J ; Lewis, David M ; Radfar, Lida ; Rohrer, Michael D ; Stone, Donald U ; Wren, Jonathan D ; Vyse, Timothy J ; Gaffney, Patrick M ; Omdal, Roald ; Wahren-Herlenius, Marie ; Illei, Gabor G ; Witte, Torsten ; Jonsson, Roland ; Rischmueller, Maureen ; Rönnblom, Lars ; Nordmark, Gunnel ; Ng, Wan-Fai ; Mariette, Xavier ; Anaya, Juan-Manuel ; Rhodus, Nelson L ; Segal, Barbara M ; Scofield, R Hal ; Montgomery, Courtney G ; Harley, John B ; Sivils, Kathy L ; Lessard, He ; Cunninghame Graham, Deborah S
Dans : Nature Genetics
https://hal.univ-brest.fr/hal-01558145

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
Mbaye, Nogaye ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00880471

2012

Building the electricalmodel of the PhotoelectricLaserStimulation of a PMOS transistor in 90 nm technology
Alexandre, Sarafianos ; Llido, R. ; Dutertre, Jean-Max ; Gagliano, Olivier ; Serradeil, Valérie ; Lisart, Mathieu ; Goubier, V. ; Tria, Assia ; Pouget, Vincent ; Lewis, D.
Dans : Microelectronics Reliability
https://hal-emse.ccsd.cnrs.fr/emse-00742622

Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL
Buchner, S. ; Roche, Nicolas Jean-Henri ; Warner, J. ; Mcmorrow, D. ; Miller, F. ; Morand, S. ; Pouget, V. ; Larue, C. ; Ferlet-Cavrois, V. ; El Mamouni, F. ; Kettunen, Heikki ; Adell, P. C. ; Allen, G. ; Aveline, David
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01633618

Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing
Darracq, Frédéric ; Mbaye, Nogaye ; Azzopardi, Stephane ; Pouget, Vincent ; Lorfèvre, E. ; Bezerra, F. ; Lewis, Dean
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00772095

Coupling and propagation of Sommerfeld waves at 100 and 300 GHz
Guillet, Jean-Paul ; Chusseau, Laurent
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-01091187

Effects of 1064 nm laser on MOS capacitor
Llido, R. ; Masson, P. ; Regnier, V. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00988338

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology
Sarafianos, A ; Llido, R ; Gagliano, O ; Serradeil, V ; Lisart, M ; Goubier, V ; Dutertre, Jean-Max ; Tria, A ; Pouget, V ; Lewis, D
Dans : Microelectronics Reliability
https://hal-emse.ccsd.cnrs.fr/emse-01110360

2011

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis
Bascoul, G. ; Perdu, Philippe ; Benigni, A. ; Dudit, Sylvain ; Celi, Guillaume ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00669825

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis
Celi, Guillaume ; Dudit, Sylvain ; Parassin, T. ; Perdu, Philippe ; Reverdy, Antoine ; Lewis, D. ; Vallet, Maxime
Dans : Microelectronics Reliability
https://hal.science/hal-00669760

L'évolution disciplinaire des sciences de l'information : des technologies à l'ingénierie des usages
Claverie, Bernard ; Fouillat, Pascal
Dans : Projectics / Proyéctica / Projectique
https://hal.science/hal-00669468

Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing
Faraud, Emeric ; Pouget, V. ; Shao, Kai ; Larue, Camille ; Darracq, Frédéric ; Lewis, D. ; Samaras, A. ; Bezerra, F. ; Lorfèvre, E. ; Ecoffet, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00667336

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization
Infante, Fulvio ; Perdu, Philippe ; Kor, H.B ; Gan, C. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00669757

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory
Llido, R. ; Gomez, J. ; Goubier, V. ; Froidevaux, N. ; Dufayard, L. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00669826

3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing
Shao, Kai ; Morisset, Adèle ; Pouget, V. ; Faraud, Emeric ; Larue, Camille ; Lewis, D. ; Mcmorrow, D.
Dans : Optics Express
https://hal.science/hal-00667432

2010

Facing the defect characterization and localization challenges of bridge defects on submicronic technology (45nm and below)
Celi, Guillaume ; Dudit, Sylvain ; Perdu, Philippe ; Reverdy, Antoine ; Parrassin, Thierry ; Bechet, Emmanuel ; Lewis, Dean ; Vallet, Michel
Dans : Microelectronics Reliability
https://hal.science/hal-00585642

The disciplinary evolution of information science: from technology to usability engineering
Claverie, Bernard ; Fouillat, Pascal
Dans : Projectics / Proyéctica / Projectique
https://hal.science/hal-01672713

CADless laser assisted methodologies for failure analysis and device reliability
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00988334

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00585644

Compact modeling of optically gated carbon nanotube field effect transistor
Liao, Si-Yu ; Maneux, Cristell ; Pouget, Vincent ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : physica status solidi (b)
https://hal.science/hal-00495144

2009

Pervasion, transparence et cognition augmentée
Claverie, Bernard ; Lespinet-Najib, Véronique ; Fouillat, Pascal
Dans : Revue des Interactions Humaines Médiatisées (RIHM) = Journal of Human Mediated Interactions
https://hal.science/hal-01672718

A New Technique for SET Pulse Width Measurement in Chains of Inverters Using Pulsed Laser Irradiation
Ferlet-Cavrois, V. ; Mcmorrow, D. ; Kobayashi, D. ; Melinger, J. ; Schwank, J.R ; Gaillardin, M. ; Pouget, V. ; Essely, Fabien ; Baggio, J. ; Girard, Sébastien ; Flament, O. ; Paillet, Philippe ; Flores, R. ; Dodd, P.E. ; Shaneyfelt, M.R. ; Hirose, K. ; Saito, H.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00669755

Electrical modeling of the effect of beam profile for pulsed laser fault injection
Godlewski, C. ; Pouget, V. ; Lewis, D. ; Lisart, Mathieu
Dans : Microelectronics Reliability
https://hal.science/hal-00669736

Net integrity checking by optical localization techniques
Haller, Gerald ; Machouat, A. ; Lewis, D. ; Pouget, V.
Dans : Microelectronics Reliability
https://hal.science/hal-00669741

A CMOS Resizing Methodology for Analog Circuits: linear and non-linear applications
Levi, Timothée ; Tomas, Jean ; Lewis, Noëlle ; Fouillat, Pascal
Dans : IEEE Design & Test
https://hal.science/hal-00359990

Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits
Roche, Nicolas Jean-Henri ; Gonzalez Velo, Yago ; Dusseau, Laurent ; Boch, Jérôme ; Vaillé, Jean-Roch ; Saigné, Frédéric ; Azais, Bruno ; Auriel, Gérard ; Lorfèvre, Eric ; Pouget, Vincent ; Buchner, Stephen P. ; David, Jean-Pierre ; Marec, Ronan ; Calvel, Philippe
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01631440

2008

Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains
Cavrois, V.F ; Pouget, Vincent ; Mcmorrow, D. ; Schwank, J.R ; Fel, N. ; Essely, Fabien ; Flores, R. ; Paillet, P. ; Gaillardin, M. ; Kobayashi, D. ; Melinger, J. ; Duhamel, O. ; Dodd, P.E. ; Shaneyfelt, M.R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397995

Investigation of Single-Event Transients in Linear Voltage Regulators
Irom, F. ; Miyahira, T.F ; Adell, P. ; Laird, J.S ; Conder, B. ; Pouget, Vincent ; Essely, Fabien
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397996

Study of Single Event Transients in High-Speed Operational Amplifiers
Jaulent, Patrice ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397747

Effect of physical defect on shmoos in CMOS DSM technologies
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Perdu, Philippe ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien
Dans : Microelectronics Reliability
https://hal.science/hal-00401309

Evaluation of Recent Technologies of Nonvolatile RAM
Nuns, T. ; Duzellier, S. ; Bertrand, J. ; Hubert, G. ; Pouget, V. ; Darracq, Frédéric ; David, J.P ; Soonckindt, S.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00667419

A Stochastic Model for Cancer Stem Cell Origin in Metastatic Colon Cancer
Odoux, C. ; Fohrer, H. ; Hoppo, T. ; Guzik, L. ; Stolz, D. ; Lewis, D. ; Gollin, S. ; Gamblin, T. ; Geller, D. ; Lagasse, E.
Dans : Cancer Research
https://hal.science/hal-02541002

Laser-Induced Current Transients in Silicon-Germanium HBTs
Pellish, J.A ; Reed, R. ; Mcmorrow, D. ; Melinger, J. ; Jenkins, P. ; Sutton, A. ; Diestelhorst, R. ; Phillips, S. ; Cressler, J. ; Pouget, Vincent ; Pate, N. ; Kozub, J. ; Mendehall, M. ; Weller, R. ; Schrimpf, R.D. ; Marshall, P. ; Tipton, A. ; Niu, G.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397926

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Sanchez, Kevin ; Crepel, Olivier ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00401312

2007

Investigation of a new method for dopant characterization
Adrian, J. ; Rodriguez, N. ; Essely, F. ; Haller, G. ; Grosjean, C. ; Portavoce, A. ; Girardeaux, Christophe
Dans : Microelectronics Reliability
https://hal-amu.archives-ouvertes.fr/hal-02386183

Impact of VCO Topology on SET Induced Frequency Response
Chen, W. ; Varanasi, N. ; Pouget, V. ; Barnaby, H. ; Vermeire, B. ; Adell, P. ; Copani, T. ; Fouillat, P.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00206290

Optimizing pulsed OBIC technique for ESD defect localization
Essely, Fabien ; Guitard, Nicolas ; Darracq, Frédéric ; Pouget, Vincent ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : IEEE Transactions on Device and Materials Reliability
https://hal.science/hal-00382949

Total Dose and Single Event Transients in Linear Voltage Regulators
Kelly, A.T. ; Adell, P.C. ; Witulski, A.F. ; Holman, W.T. ; Schrimpf, R.D. ; Pouget, Vincent
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397727

A Heavy-Ion Tolerant Clock and Data Recovery Circuit for Satellite Embedded High-Speed Data Links
Lapuyade, Hervé ; Mazouffre, Olivier ; Goumballa, Birama ; Pignol, Michel ; Malou, Florence ; Neveu, Claude ; Pouget, Vincent ; Deval, Yann ; Begueret, Jean-Baptiste
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00182248

IP-based design for analogue ASICs: A case study
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : Design&Reuse Articles
https://hal.science/hal-00522419

Configuration errors analysis in SRAM-based FPGAs: software tool and practical results
Maingot, V. ; Ferron, J. ; Leveugle, Régis ; Pouget, V. ; Douin, A.
Dans : Microelectronics Reliability
https://hal.science/hal-00184528

In-depth resolution for LBIC technique by two-photon absorption
Wan, Dong Yun ; Pouget, Vincent ; Douin, Alexandre ; Jaulent, Patrice ; Lewis, Dean ; Fouillat, Pascal
Dans : Semiconductors
https://hal.science/hal-00204572

2006

Single Event Induced Instability in Linear Voltage Regulators
Adell, P.C. ; Witulski, A.F. ; Schrimpf, R.D. ; Marec, R. ; Pouget, Vincent ; Calvel, P. ; Bezerra, F.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397721

Radiation Hardened by Design RF Circuits Implemented in 0.13µm CMOS Technology
Chen, W. ; Pouget, Vincent ; Gentry, G.K. ; Barnaby, H. J. ; Vermeire, B. ; Bakkaloglu, B. ; Kiaei, K. ; Holbert, K.E. ; Fouillat, Pascal
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397725

Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses
Darracq, Frédéric ; Lapuyade, Herve ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : Journal of Integrated Circuits and Systems
https://hal.science/hal-00359396

A 4 Gsample/s 2 bits flash ADC with 2–4 GHz input bandwidth for radio astronomy application
Deschans, D. ; Bégueret, J.-B. ; Deval, Y. ; Scarabello, C. ; Fouillat, P. ; Montignac, G. ; Baudry, Alain
Dans : Analog Integrated Circuits and Signal Processing
https://hal.science/hal-00206668

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation
Douin, Alexandre ; Pouget, Vincent ; de Matos, Magali ; Lewis, Dean ; Perdu, Philippe ; Fouillat, Pascal
Dans : Microelectronics Reliability
https://hal.science/hal-00204571

Influence of Laser Pulse Duration in Single Event Upset Testing
Douin, Alexandre ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00204547

Application of various optical techniques for ESD defect localization
Essely, Fabien ; Darracq, Frédéric ; Pouget, Vincent ; Remmach, Mustapha ; Beaudoin, Félix ; Guitard, Nicolas ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00204570

A Radiation-Hardened Injection Locked Oscillator Devoted to Radio-Frequency Applications
Lapuyade, Hervé ; Pouget, Vincent ; Begueret, Jean-Baptiste ; Hellmuth, Patrick ; Taris, Thierry ; Mazouffre, Olivier ; Fouillat, Pascal ; Deval, Yann
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00183155

Laser mapping of SRAM Sensitive Cells : a way to obtain input parameters for DASIE calculation code
Miller, F. ; Buard, N. ; Hubert, G. ; Alestra, S. ; Baudrillard, G. ; Carrière, T. ; Gaillard, R. ; Palau, J.-M. ; Saigné, Frédéric ; Fouillat, P.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00206425

2005

Scanning laser ultrasonics experiments for in-situ non-destructive analysis of integrated circuits
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE Transactions on Device and Materials Reliability
https://hal.science/hal-00181926

Impact of semiconductors material on IR Laser Stimulation signal
Firiti, Abdellatif ; Beaudoin, Félix ; Haller, G. ; Perdu, Philippe ; Lewis, Dean ; Fouillat, Pascal
Dans : Microelectronics Reliability
https://hal.science/hal-00401285

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
Guitard, Nicolas ; Essely, Fabien ; Trémouilles, David ; Bafleur, Marise ; Nolhier, Nicolas ; Perdu, Phillipe ; Touboul, Andre ; Pouget, Vincent ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00397706

Implementing laser-based failure analysis methodologies using test vehicles
Lewis, Dean ; Pouget, Vincent ; Beaudoin, Félix ; Haller, G. ; Perdu, Phillipe ; Fouillat, Pascal
Dans : IEEE Transactions on Semiconductor Manufacturing
https://hal.science/hal-00397918

Rate Predictions for Single Event Effects – Critique II
Petersen, E. ; Pouget, Vincent ; Massengill, L. ; Buchner, S. ; Mcmorrow, D.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397715

Light Emission To time resolved emission for IC debug and failure analysis
Remmach, Mustapha ; Pigozzi, A. ; Desplats, Romain ; Perdu, Philippe ; Lewis, Dean ; Noel, J. ; Dudit, Sylvain
Dans : Microelectronics Reliability
https://hal.science/hal-00401289

NIR Laser stimulation for dynamic timing analysis
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Roux, J.P. ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00401294

2004

Investigation of millisecond-long analog single-event transients in the LM6144 op amp
Boulghassoul, Y. ; Buchner, S. ; Mcmorrow, D. ; Pouget, V. ; Massengill, L.W. ; Fouillat, P. ; Holman, W.T. ; Poivey, C. ; Howard, J.W. ; Savage, M. ; Maher, M.C.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01887662

Evaluation of SRAMS reliability for space electronics using ultra short laser pulses
Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : Electrochemical Society
https://hal.science/hal-00185395

INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER
Fouillat, P. ; Pouget, V. ; Lewis, D. ; Buchner, S. ; Mcmorrow, D.
Dans : International Journal of High Speed Electronics and Systems
https://hal.science/hal-01887658

Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC
Pouget, V. ; Lewis, D. ; Fouillat, P.
Dans : IEEE Transactions on Instrumentation and Measurement
https://hal.science/hal-01887656

Dynamic Behavior of a Chemical Sensor for Real-Time Measurement of Humidity Variations in Human Breath
Tetelin, Angélique ; Pouget, Vincent ; Lachaud, Jean-Luc ; Pellet, Claude
Dans : IEEE Transactions on Instrumentation and Measurement
https://hal.science/hal-00183110

2003

Application of picosecond ultrasonics to non-destructive analysis in VLSI circuits
Andriamonje, G. ; Pouget, V. ; Ousten, Y. ; Lewis, D. ; Danto, Y. ; Rampnoux, Jean-Michel ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, Stéphane ; Claeys, W. ; Rossignol, C. ; Audoin, Bertrand
Dans : Microelectronics Reliability
https://hal.science/hal-01550917

Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Danto, Yves ; Rampnoux, J. M. ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, S. ; Claeys, W. ; Rossignol, C. ; Audoin, Bertrand
Dans : Microelectronics Reliability
https://hal.science/hal-00181929

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing
Beaudoin, F. ; Desplats, R. ; Perdu, P. ; Firiti, Abdellatif ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-01887652

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization
Beauchêne, T. ; Lewis, D. ; Beaudoin, F. ; Pouget, V. ; Desplats, R. ; Fouillat, P. ; Perdu, P. ; Bafleur, Marise ; Trémouilles, David
Dans : Microelectronics Reliability
https://hal.science/hal-01887647

A physical approach on SCOBIC investigation in VLSI
Beauchêne, T. ; Lewis, D. ; Beaudoin, F. ; Pouget, V. ; Perdu, P. ; Fouillat, P. ; Danto, Y.
Dans : Microelectronics Reliability
https://hal.science/hal-01887645

Investigation of single-event transients in voltage-controlled oscillators
Chen, W. ; Pouget, V. ; Barnaby, H.J. ; Cressler, J. D. ; Niu, G. ; Fouillat, P. ; Deval, Y. ; Lewis, D.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01887654

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects
Darracq, Frédéric ; Lapuyade, Hervé ; Buard, N. ; Fouillat, Pascal ; Dufayel, R. ; Carriere, T.
Dans : Microelectronics Reliability
https://hal.science/hal-00185396

2002

Heavy ion-induced charge collection mechanisms in CMOS active pixel sensor
Belredon, X. ; David, J. ; Lewis, D. ; Beauchene, T. ; Pouget, V. ; Barde, S. ; Magnan, P.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01887641

Backside SEU laser testing for commercial off-the-shelf SRAMs
Darracq, Frédéric ; Lapuyade, Herve ; Buard, Nadine ; Mounsi, Faresse ; Foucher, Bruno ; Fouillat, Pascal ; Calvet, M. C. ; Dufayel, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00204728

Single-Event Sensitivity of a Single SRAM Cell
Darracq, Frédéric ; Beauchene, Thomas ; Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Touboul, Andre
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00185398

Evaluation of a Design Methodology Dedicated to Dose-Rate-Hardened Linear Integrated Circuits
Deval, Yann ; Lapuyade, Hervé ; Fouillat, Pascal ; Barnaby, H. J. ; Darracq, Frédéric ; Briand, Renaud ; Lewis, Dean ; Schrimpf, Rd
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00184299

Study of the interaction between Heavy Ions and Integrated Circuits using a Pulsed Laser Beam
Lewis, Dean ; Fouillat, Pascal ; Pouget, Vincent ; Lapuyade, Hervé
Dans : European Physical Journal: Applied Physics
https://hal.science/hal-00185399

A VLSI CMOS Delay Oriented Waveform Converter for Polyphase Frequency Synthesizer
Spataro, Anne ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal ; Belot, D.
Dans : IEEE Journal of Solid-State Circuits
https://hal.science/hal-00183165

2001

hiperLAN 5.4 GHz Low-Power CMOS Synchronous Oscillator
Deval, Yann ; Begueret, Jean-Baptiste ; Spataro, Anne ; Fouillat, Pascal ; Belot, D. ; Badets, Franck
Dans : IEEE Transactions on Microwave Theory and Techniques
https://hal.science/hal-00183168

Front side and Backside OBIT Mappings applied to Single Event Transient Testing
Lewis, Dean ; Pouget, Vincent ; Beauchene, Thomas ; Lapuyade, Hervé ; Fouillat, Pascal ; Touboul, Andre ; Beaudoin, Félix ; Perdu, Philippe
Dans : Microelectronics Reliability
https://hal.science/hal-00185401

Backside Laser Testing of ICs for SET Sensitivity Evaluation
Lewis, Dean ; Pouget, Vincent ; Beaudoin, Félix ; Perdu, Philippe ; Lapuyade, Hervé ; Fouillat, Pascal ; Touboul, Andre
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00185400

Theoretical Investigation of an Equivalent Laser LET
Pouget, Vincent ; Lapuyade, Hervé ; Fouillat, Pascal ; Lewis, Dean ; Buchner, S.
Dans : Microelectronics Reliability
https://hal.science/hal-00185402

2000

Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs
Duzellier, S. ; Falguere, D. ; Guibert, L. ; Pouget, V. ; Fouillat, P. ; Ecoffet, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01887628

Laser Cross Section Measurement for the Evaluation of Single-Event Effects in Integrated Circuits
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Darracq, Frédéric ; Touboul, Andre
Dans : Microelectronics Reliability
https://hal.science/hal-00185403

SPICE Modeling of the Transient Response of Irradiated MOSFETs
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Deval, Yann ; Fouillat, Pascal ; Sarger, L.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00184300

1999

Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
Pouget, Vincent ; Lewis, Dean ; Lapuyade, Hervé ; Briand, Renaud ; Fouillat, Pascal ; Sarger, L. ; Calvet, M. C.
Dans : Microelectronics Reliability
https://hal.science/hal-00185404

1997

Modélisation des effets des radiations sur les transistors bipolaires
Montagner, Xavier ; Fouillat, Pascal ; Touboul, Andre ; Lapuyade, Hervé ; Schrimpf, Rd ; Galloway, Kf
Dans : REVUE DE l'ELECTRICITE ET DE L'ELECTRONIQUE
https://hal.science/hal-00185405

1996

Numerical Modelling of Mechanisms involved in Latchup Triggering by a Laser Beam
Fouillat, Pascal ; Lapuyade, Hervé ; Touboul, Andre ; Dom, Jean-Paul ; Gaillard, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00185407

Analysis of Latchup susceptibility to internal logical states by using a Laser beam
Fouillat, Pascal ; Lapuyade, Hervé ; Maidon, Yvan ; Dom, Jean-Paul
Dans : Microelectronic Engineering
https://hal.science/hal-00185406

1994

Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing
Fouillat, Pascal ; Gervais-Ducouret, Stéphane ; Lapuyade, Hervé ; Dom, Jean-Paul
Dans : Quality and Reliability Engineering International
https://hal.science/hal-00185408

1990

Effect of cathode spacer layer on the current‐voltage characteristics of resonant tunneling diodes
Mounaix, Patrick ; Vanbesien, O. ; Lippens, D.
Dans : Applied Physics Letters
https://hal.science/hal-03932642

2023

Resonant tunneling diodes as sources for millimeter and submillimeter wavelengths
Bouregba, R. ; Vanbesien, O. ; Mounaix, Patrick ; Lippens, D. ; Palmateer, L. ; Pernot, J.C. ; Beaudin, G. ; Encrenaz, P. ; Bockenhoff, E. ; Nagle, J. ; Bois, P. ; Chevoir, F. ; Vinter, B.
Dans : IEEE Transactions on Microwave Theory and Techniques
https://hal.science/hal-03932659

2016

Les ondes Térahertz, une alternative prometteuse aux méthodes classiques de CND
Mounaix, Patrick ; Obaton, Anne Françoise
Dans :
https://hal.science/hal-01404483

2009

L'innovation comme moteur d'évolution des technologies de l'information ; vers un rapprochement des techniques et des usages
Claverie, Bernard ; Fouillat, Pascal
Dans : I-Revues - Edition Electronique de l'INIST - Information, innovation et interdisciplinarité
https://hal.science/hal-00983471

2007

IP-based design for analogue ASICs: A case study
Levi, Timothée ; Lewis, Noëlle ; Tomas, Jean ; Fouillat, Pascal
Dans : Einfochips Dashboard
https://hal.science/hal-00522423

1992

Resonant tunneling of holes in Ga 0.51 In 0.49 P/GaAs double‐barrier heterostructures
Lippens, D. ; Mounaix, Patrick ; Sadaune, V. ; Poisson, M. ; Brylinski, C.
Dans : Journal of Applied Physics
https://hal.science/hal-03932655

1991

Fabrication of high-performance Al/sub x/Ga/sub 1-x/As/In/sub y/Ga/sub 1-y/As/GaAs resonant tunneling diodes using a microwave-compatible technology
Lippens, D. ; Barbier, E. ; Mounaix, Patrick
Dans : IEEE Electron Device Letters
https://hal.science/hal-03932654

Integration of a resonant-tunneling structure for microwave applications
Mounaix, Patrick ; Fattorini, A. ; Lorriaux, J. ; Francois, M. ; Miens, M. ; Vanbremeerseh, J. ; Lippens, D.
Dans : Journal de Physique III
https://hal.science/hal-03932650

Measurement of negative differential conductance to 40 GHz for vertically integrated resonant tunnelling diodes
Mounaix, Patrick ; Bedu, P. ; Lippens, D. ; Barbier, E.
Dans : Electronics Letters
https://hal.science/hal-03932647

1989

Tunnel résonnant et effets d'électrons chauds dans les structures à double barrière : synthèse
Lippens, D. ; de Saint Pol, L. ; Bouregba, R. ; Mounaix, Patrick ; Vinchon, T.
Dans : Revue de Physique Appliquée
https://hal.science/hal-03932661

1988

Small-signal impedance of GaAs-AlxGa1−x as resonant tunnelling heterostructures at microwave frequency
Lippens, D. ; Mounaix, Patrick
Dans : Electronics Letters
https://hal.science/hal-03932662

2022

THz Spectroscopic Characterization of Oil Shales, IRMMW-THz 2022
Ojo, Moses ; Fauquet, Fréderic ; Bigourd, Damien ; Mounaix, Patrick
Dans : 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft (Netherlands)
https://hal.science/hal-03795106

THz pulse generation and single shot detection in a single ZnTe Crystal IRMMW-THz 2022
Ojo, Moses ; Fauquet, Fréderic ; Mounaix, Patrick ; Bigourd, Damien
Dans : 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft, Netherlands (France)
https://hal.science/hal-03795104

THz generation and single shot detection in a single-crystal layout
Ojo, Moses ; Fauquet, Frédéric ; Mounaix, Patrick ; Bigourd, D
Dans : French-German TeraHertz Conference 2022, Grande Motte (France)
https://hal.science/hal-03777627

THz-based spectral images of oil shales
Ojo, Moses ; Fauquet, Fréderic ; Bigourd, Damien ; Mounaix, Patrick
Dans : French-German TeraHertz Conference 2022, Grande Motte (France)
https://hal.science/hal-03777626

Multiplane phase retrieval with monochromatic terahertz sources
Petrov, Nikolay ; Chopard, Adrien ; Tsiplakova, Elizaveta ; Perraud, Jean-Baptiste ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : Unconventional Optical Imaging III, Strasbourg (France)
https://hal.science/hal-03845683

300 GHz frequency modulated continuous wave (FMCW) radar system for detecting rocks’ lithological changes
Sanjuan, Federico ; Fauquet, Frederic ; Fasentieux, Bertrand ; Mounaix, Patrick ; Guillet, Jean Paul
Dans : 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft (Netherlands)
https://hal.science/hal-03867518

2021

Teragogic : Open source platform for low cost millimeter wave sensing and terahertz imaging
Chopard, Adrien ; Fauquet, Frederic ; Goh, Jing Shun ; Pan, Mingming ; Mounaix, Patrick ; Simonov, Anton ; Smolyanskaya, Olga ; Guillet, Jean-Paul
Dans : 2021 IEEE Radar Conference (RadarConf21), Atlanta (France)
https://hal.science/hal-03273550

Toward Mid-Infrared Ultra-Short Pulse Generation in a Gas-Filled Hollow-Core Photonic Crystal fiber
Fourcade-Dutin, Coralie ; Miranda, Olivia ; Mounaix, Patrick ; Bigourd, Damien
Dans : OSA Advanced Photonics Congress, Washington DC (United States)
https://hal.science/hal-03425625

Augmented reality terahertz (AR-THz) interface for imaging and sensing
Guillet, Jean-Paul ; Fauquet, Frederic ; Chopard, Adrien ; Mounaix, Patrick ; Rioult, Jean ; Jaeschke, Timo
Dans : IRMMW-THz 2021, 46th International Conference on Infrared, Millimeter and Terahertz Waves, Chengdu (China)
https://hal.science/hal-03274777

Terahertz Diffractive Reflection Phase Imaging
Mounaix, Patrick
Dans : The 28th International Conference on Advanced Laser Technologies (ALT'21), Moscou (Russia)
https://hal.science/hal-03450100

Terahertz data processing for imaging and spectroscopy of artwork
Odlyanitskiy, Evgeniy ; Smolyanskaya, Olga ; Sirro, Sergei ; Guillet, Jean-Paul ; Detalle, Vincent ; Menu, Michel
Dans : Optics for Arts, Architecture, and Archaeology (O3A) VIII, Online Only (France)
https://hal.science/hal-03277818

Four-wave mixing process induced by a self-phase modulated pulse in a hollow core capillary
Zurita Miranda, Olivia ; Fourcade Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frédéric ; Maillotte, Hervé ; Mounaix, Patrick ; Bigourd, Damien
Dans : Advanced Photonics Congress, Washington (United States)
https://hal.science/hal-03446874

Four-wave mixing process induced by a self-phase modulated pulse in a hollow core capillary
Zurita-Miranda, Olivia ; Fourcade-Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frederic ; Maillotte, Hervé ; Mounaix, Patrick ; Bigourd, Damien
Dans : OSA Advanced Photonics Congress, Washington DC (United States)
https://hal.science/hal-03425631

2020

3D painting distribution extracted by time domain spectroscopy
Cassar, Q ; Chopard, A ; Fauquet, F ; Guillet, Jean-Paul ; Perraud, J ; Mounaix, P
Dans : SNAIA 2020, Paris (France)
https://hal.science/hal-03284459

Simplified FMCW Radars Implementation for Guided Terahertz Reflectometry Sensing
Chopard, A. ; Pan, M. ; Fauquet, F. ; Mounaix, P. ; Guillet, Jean-Paul
Dans : 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Buffalo (France)
https://hal.science/hal-03273467

Spectral Distributions of Chirped Pulsed Four-Wave Mixing in a Photonic Crystal Fiber Measured by Dispersive Fourier Transform Method
Fourcade-Dutin, Coralie ; Robert, Paul ; Dauliat, Romain ; Jamier, Raphaël ; Munõz-Marco, Hector ; Pérez-Millan, Pere ; Dudley, John ; Maillotte, Hervé ; Roy, Philippe ; Bigourd, Damien
Dans : Advanced Photonics Congress-Nonlinear Photonics,, Montreal (virtual ) (Canada)
https://hal.science/hal-02965784

Teragogic: Open source platform for low cost millimeter wave sensing, terahertz imaging and control
Guillet, Jean-Paul ; Chopard, Adrien ; Fauquet, Frederic ; Goh, Jing ; Pan, Mingming ; Simonov, Anton ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : SNAIA 2020, paris (France)
https://hal.science/hal-03284466

Terahertz Multiple-Plane Phase Retrieval
Mounaix, Patrick ; Petrov, Nikolay ; Perraud, Jean Baptiste ; Choppard, Adriene ; Guillet, Jean-Paul ; Smolyanskaya, Olga
Dans : Digital Holography and Three-Dimensional Imaging, Washington (United States)
https://hal.science/hal-03000014

Reconstruction of optical parameters for blood plasma pellets using pulse terahertz holography method
Odlyanitskiy, E.L. ; Kulya, M.S. ; Cassar, Q. ; Mustafin, I.A. ; Trukhin, V.N. ; Korolev, D.V. ; Kononova, Y.V. ; Mounaix, P. ; Guillet, Jean-Paul ; Petrov, N.V. ; Smolyanskaya, O.A.
Dans : 2020 International Conference Laser Optics (ICLO), St. Petersburg (France)
https://hal.science/hal-03273456

A fast and homogeneous illumination applied to full-field terahertz imaging
Perraud, J-B. ; Chopard, A. ; Guillet, Jean-Paul ; Gellie, P. ; Fauquet, F. ; Mounaix, P.
Dans : 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Buffalo (France)
https://hal.science/hal-03273485

Terahertz Phase Retrieval Imaging with Multiple-Plane Data
Petrov, Nikolay ; Baptiste Perraud, Jean ; Choppard, Adriene ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : SNAIA 2020, Paris (France)
https://hal.science/hal-03284478

Terahertz Diffractive Reflection Phase Imaging
Petrov, Nikolay ; Perraud, Jean-Baptiste ; Chopard, Adrien ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Buffalo (France)
https://hal.science/hal-03273489

TeraPulse Lx for terahertz imaging of painting on canvas
Sirro, Sergei ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Portieri, Alessia ; Taday, Phil ; Arnone, Donald
Dans : SNAIA 2020, Paris (France)
https://hal.science/hal-03284485

Tunable source of infrared pulses in gas-filled hollow core capillary
Zurita Miranda, Olivia ; Fourcade Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frédéric ; Guillet, Jean-Paul ; Darracq, Frédéric ; Mounaix, Patrick ; Maillotte, Hervé ; Bigourd, Damien
Dans : OSA Laser Congress, Washington, DC (United States)
https://hal.science/hal-03103884

Tunable source of infrared pulses in gas-filled hollow core capillary
Zurita-Miranda, Olivia ; Fourcade-Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frederic ; Guillet, Jean-Paul ; Darracq, Frédéric ; Mounaix, Patrick ; Maillotte, Hervé ; Bigourd, Damien
Dans : Laser Congress (virtual event), San Diego (France)
https://hal.science/hal-02965842

Optical parametric amplification in gas-filled hollow core capillary for the generation of tunable pulses in the infrared
Zurita-Miranda, Olivia ; Fourcade Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frederic ; Guillet, Jean-Paul ; Darracq, Frédéric ; Mounaix, Patrick ; Maillotte, H ; Bigourd, D
Dans : 9TH EPS-QEOD EUROPHOTON, Prague (Czech Republic)
https://hal.science/hal-02965824

2019

Terahertz pulse time-domain holography method for phase imaging of breast tissue
Balbekin, Nikolay ; Cassar, Quentin ; Smolyanskaya, Olga ; Kulya, Maksim ; Petrov, Nikolay ; Macgrogan, Gaëtan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Tuchin, Valery
Dans : Quantitative Phase Imaging V, San Francisco (France)
https://hal.science/hal-02481331

The terahertz pulse time-domain holography method for phase imaging of breast tissue sample
Balbekin, Nikolay ; Cassar, Quentin ; Smolyanskaya, Olga ; Macgrogan, Gaëtan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Kravtsenyuk, Olga ; Kulya, Maksim ; Petrov, Nikolay
Dans : Digital Holography and Three-Dimensional Imaging, Bordeaux (France)
https://hal.science/hal-02381146

Contactless Terahertz Paint Thickness Measurements : specificity of aeronautics industry
Cassar, Quentin ; Susset, A. ; Fauché, P. ; Bou Sleiman, J. ; Perraud, J-B. ; Guillet, J-P. ; Mounaix, Patrick
Dans : AeroNDT 2019 11th International Symposium on NDT in Aerospace, Nov 2019, Paris-Saclay, France, Saclay (France)
https://hal.science/hal-02877394

Iterative Tree Algorithm for the Assessment of Optical Path Contributions within Stratified Structures
Cassar, Q. ; Chopard, A. ; Fauquet, F. ; Guillet, J.P. ; Pan, M. ; Perraud, J.B. ; Mounaix, Patrick
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350806

Ancient Painting on Copper Substrate Inspected by Terahertz Spectroscopy-Imaging
Cassar, Q. ; Koch-Dandolo, C.L. ; Guillet, J.P. ; Roux, M. ; Fauquet, F. ; Mounaix, Patrick
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350792

Compact Modeling of UTC Photodiodes Enabling Future Terahertz Communication System Design
Chhandak, Mukherjee ; Natrella, M. ; Seddon, J. ; Grahams, C. ; Mounaix, Patrick ; Renaud, C. C. ; Maneux, Cristell
Dans : XIIIème Colloque du GdR SOC2, Montpellier (France)
https://hal.science/hal-02511632

Millimeter waves Radar: A way to see through the airplane covering?
Chopard, Adrien ; Sleiman, Joyce ; Cassar, Q. ; Fauché, P. ; Guillet, J. ; Mounaix, Patrick ; Jean-Baptiste, Perraud ; Susset, A.
Dans : 11 symposium international : NDT in Aerospace, Saclay (France)
https://hal.science/hal-02877339

A fast and homogeneous lighting for full-field THz imaging
Chopard, Angèle ; Perraud, J-B. ; Guillet, J-P. ; Gellie, P. ; Fauquet, F. ; Mounaix, Patrick
Dans : Information Storage System and Technology, Wuhan (France)
https://hal.science/hal-02877264

Sensing with terahertz FMCW radars
Guillet, Jean-Paul ; Fauquet, Frederic ; Mounaix, Patrick
Dans : Smart NanoMaterials 2019: Advances, Innovation and Applications, Paris (France)
https://hal.science/hal-02481272

Comparative study of millimeter wave III/V semiconductor and integrated silicon based FMCW radars
Guillet, Jean-Paul ; Fauquet, Frederic ; Chopard, Adrien ; Perraud, Jean-Baptiste ; Roux, Marie ; Mounaix, Patrick
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350788

Using soy protein in the three-component phantom for breast cancer mimicking
Mounaix, Patrick ; Cassar, Q. ; Lykina, A.A. ; Lepeshkin, A.I. ; Baranenko, D.A. ; Kravtsenyuk, O.V. ; Mounaux, P. ; Guillet, J.-P. ; Smolyanskaya, O.A.
Dans : SNAIA 2019, Paris (France)
https://hal.science/hal-02883376

Near field and far field investigations on breast cancer tissus
Mounaix, Patrick ; Quentin, Cassar ; Macgrogan, Gaëtan ; Pfeiffer, Ullrich ; Zimmer, Thomas ; Guillet, Jean-Paul
Dans : Smart NanoMaterials 2019: Advances, Innovation and Applications, Paris (France)
https://hal.science/hal-02481268

First Uni-Traveling Carrier Photodiode Compact Model Enabling Future Terahertz Communication System Design
Mukherjee, C ; Mounaix, Patrick ; Maneux, C. ; Natrella, M. ; Seddon, J ; Graham, C. ; Renaud, Cédric
Dans : ESSDERC 2019, Cracow (Poland)
https://hal.science/hal-02379096

Scanning laser terahertz near-field reflection microscope for biological analysis
Okada, Kosuke ; Serita, Kazunori ; Zang, Zirui ; Murakami, Hironaru ; Kawayama, Iwao ; Cassar, Quentin ; Al-Ibadi, Amel ; Macgrogan, Gaëtan ; Zimmer, Thomas ; Guillet, Jean-Paul ; Mounaix, Patrick ; Tonouchi, Masayoshi
Dans : Bio-Optics: Design and Application, Tucson (United States)
https://hal.science/hal-02381160

Pulse terahertz holographic reconstruction of optical parameters for blood plasma pellets
Olga, Smolyanskaya ; Trukhin, Valery ; Quentin, Cassar ; Evgeniy, Odlyanitskiy ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : Smart NanoMaterials 2019: Advances, Innovation and Applications, Paris (France)
https://hal.science/hal-02481283

THz imaging with a hollow core waveguide
Pan, Mingming ; Guillet, Jean-Paul ; Humbert, Georges ; Fauquet, Frederic ; Lewis, Dean ; Mounaix, Patrick
Dans : French-German THz Conference, Kaiserslautern (Germany)
https://hal.science/hal-02523215

Study of a THz Hollow-core Fiber for Sample Reflectance Analysis
Pan, Mingming ; Cordeiro, Cristiano ; Fauquet, Frederic ; Mounaix, Patrick ; Rodrigues, Gildo ; Franco, Marcos ; Guillet, Jean-Paul
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350784

Theoretical and Experimental Analysis of the Mechanisms of the Interaction of Terahertz Radiation with Neurons
Ratushniak, A ; Zapara, T ; Proskura, A ; Kozlov, A ; Serdyukov, D ; Cherkasova, O ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : Bright Far-Infrared Optoelectronic Sources Applied to Field-Matter Interaction Studies, Life Sciences and Environmental Monitoring International Workshop, Nizhny Novgorod (Russia)
https://hal.science/hal-02482586

Interaction of Terahertz Radiation with Bio-Like Objects: Theoretical and Numerical Modelling, Real Objects and Phantom Experiments
Smolyanskaya, O. ; Cassar, Q. ; Kravtsenyuk, O ; Odlyanitskiy, E ; Mounaix, Patrick ; Guillet, Jean-Paul ; Zaytsev, K. ; Petrov, N
Dans : Bright Far-Infrared Optoelectronic Sources Applied to Field-Matter Interaction Studies, Life Sciences and Environmental Monitoring International Workshop, Nizhny Novgorod (Russia)
https://hal.science/hal-02482611

Reconstructed THz phase image of the two-component numerical model of breast cancer tissue
Smolyanskaya, Olga ; Kulya, Maksim ; Cassar, Quentin ; Kravtsenuk, Olga ; Mounaix, Patrick ; Guillet, Jean-Paul ; Zaytsev, Kirill ; Petrov, Nikolay
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350797

Terahertz spectra of drug-laden magnetic nanoparticles
Smolyanskaya, Olga ; Trukhin, Valery ; Gavrilova, Polina ; Odlyanitskiy, Evgeniy ; Semenova, Anna ; Cassar, Quentin ; Guillet, Jean-Paul ; Mounaix, Patrick ; Gareev, Kamil ; Korolev, Dmitry
Dans : Colloidal Nanoparticles for Biomedical Applications XIV, San Francisco (United States)
https://hal.univ-grenoble-alpes.fr/hal-02335873

2018

Studies on PCA for Breast Tissue Segmentation
Cassar, Q. ; Al-Ibadi, A. ; Mavarani, L. ; Hillger, P. ; Grzyb, J. ; Macgrogan, G. ; Pfeiffer, U.R. ; Zimmer, T. ; Guillet, J.P. ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (France)
https://hal.science/hal-02877404

Varnishes of painting material studied by terahertz spectroscopy
Cassar, Q. ; Koch-Dandolo, C.L. ; Guillet, J.P. ; Roux, M. ; Fauquet, F. ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (France)
https://hal.science/hal-02877398

Varnishes of painting material studied by terahertz spectroscopy
Cassar, Q. ; Koch-Dandolo, C.L. ; Guillet, J.P. ; Roux, M. ; Fauquet, F. ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (France)
https://hal.science/hal-02877395

3D-additive manufacturing non-destructive characterization with terahertz waves (Conference Presentation)
Guillet, Jean-Paul ; Obaton, Anne-Françoise ; Perraud, Jean Baptiste ; Balacey, Hugo ; Recur, Benoît ; Mounaix, Patrick
Dans : Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, San Francisco (United States)
https://hal.science/hal-02877419

A 128-pixel 0.56THz sensing array for real-time near-field imaging in 0.13μm SiGe BiCMOS
Hillger, Philipp ; Jain, Ritesh ; Grzyb, Janusz ; Mavarani, Laven ; Heinemann, Bernd ; Grogan, Gaëtan Mac ; Mounaix, Patrick ; Zimmer, Thomas ; Pfeiffer, Ullrich
Dans : 2018 IEEE International Solid-State Circuits Conference (ISSCC), San Francisco (United States)
https://hal.science/hal-02877416

A Solid-State 0.56 THz Near-Field Array for μM-Scale Surface Imaging
Hillger, Philipp ; Jain, Ritesh ; Grzyb, Janusz ; Mavarani, Laven ; Bucher, Thomas ; Pfeiffer, Ullrich ; Macgrogan, Gaëtan ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya (Japan)
https://hal.science/hal-01923726

Shape from Focus Applied to Real- Time Terahertz Imaging
Jean-Baptiste, Perraud ; Guillet, Jean-Paul ; Hamdi, Maher ; Redon, Olivier ; Meilhan, Jérôme ; Simoens, François ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya (Japan)
https://hal.science/hal-01923691

Investigation of the trap-limited transient response of GaN HEMTs
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : 2018 Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop, Brives (France)
https://hal.science/hal-01851997

Investigation of Trapping Behaviour in GaN HEMTs through physical TCAD Simulation of Capacitance Voltage characteristics
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : EuroSimE 2018, Toulouse (France)
https://hal.science/hal-01718857

Comprehensive Study into Underlying Mechanisms of Anomalous Gate Leakage Degradation in GaN High Electron Mobility Transistors
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : IRPS 2018, San Francisco (United States)
https://hal.science/hal-01718850

Terahertz Spectroscopy and Quantum Mechanical Simulations of Crystalline Historical Pigments
Kleist, Elyse ; Dandolo, Corinna ; Korter, Timothy ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (France)
https://hal.science/hal-02877401

Terahertz frequency modulated continuous wave imaging for non-destructive evaluation of painting and multilayer parts
Ma, Xue ; Wang, Kejia ; Fauquet, Frederic ; Roux, Marie ; Koch Dandolo, Corinna Ludovica ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, San Francisco (France)
https://hal.science/hal-01923526

Towards industrial applications of terahertz real-time imaging
Mounaix, Patrick ; Simoens, François ; Dussopt, Laurent ; Meilhan, Jérôme ; Nicolas, Nicolas ; Monnier, Nicolas ; Siligaris, Alexandre ; Hiberty, Bruno ; Perraud, Jean-Baptiste ; Lalanne-Dera, Jérémy ; Redon, Olivier ; Sadwick, Laurence ; Yang, Tianxin
Dans : Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, San Francisco (France)
https://hal.science/hal-01734577

Guided terahertz pulsed reflectometry: a remote probe for near-field imaging (Conference Presentation)
Pan, Mingming ; Fauquet, Frederic ; Lewis, Dean ; Darracq, Frédéric ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, San Francisco (United States)
https://hal.science/hal-02877422

Comparative study of terahertz waveguide in reflective mode configuration
Pan, M. ; Guillet, J.P. ; Humbert, G. ; Fauquet, F. ; Lewis, D. ; Mounaix, P.
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (Japan)
https://hal.science/hal-02522845

Interaction of terahertz radiation with tissue phantoms: numerical and experimental studies
Smolyanskaya, O.A. ; Cassar, Q. ; Kulya, M.S. ; Petrov, N.V. ; Zaytsev, K.I. ; Lepeshkin, A.I. ; Guillet, J.-P. ; Mounaix, P. ; Tuchin, V.
Dans : 3rd International Conference “Terahertz and Microwave Radiation: Generation, Detection and Applications” (TERA-2018), Nizhny Novgorod (Russia)
https://hal.science/hal-02481311

Characterization of external pressure effects on lithium-ion pouch cell
Zhang, Yuanci ; Briat, Olivier ; Delétage, Jean-Yves ; Martin, Cyril ; Gager, Guillaume ; Vinassa, Jean-Michel
Dans : 19th International Conference of IEEE on Industrial Technology (ICIT), Lyon (France)
https://hal.science/hal-01892433

2017

Terahertz Biomedical Imaging: From Multivariate Analysis and Detection to Material Parameter Extraction
Amel, Al-Ibadi ; Bou-Sleiman, Joyce ; Quentin, Cassar ; Macgrogan, Gaëtan ; Balacey, Hugo ; Thomas, Zimmer ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : 2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), Saint Petersbourg (Russia)
https://u-bourgogne.hal.science/hal-01546451

Phase uncertainty in different THz time-domain spectrometers
Bernier, Maxime ; Garet, Frédéric ; Coutaz, Jean-Louis ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun (Mexico)
https://hal.univ-grenoble-alpes.fr/hal-02009670

Agar and Silica Gel Based Biotissue-mimicking Phantoms in THz Frequency Range
Evgeniy, Odlyanitskiy ; Olga, Smolyanskaya ; Kravtsenyuk, O ; Guillet, Jean-Paul ; A, Popov ; Mikhail, Khodzitsky
Dans : 2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), Saint Petersbourg (Russia)
https://u-bourgogne.hal.science/hal-01546453

HOBIT: Hybrid Optical Bench for Innovative Teaching
Furio, David ; Fleck, Stéphanie ; Bousquet, Bruno ; Guillet, Jean-Paul ; Canioni, Lionel ; Hachet, Martin
Dans : CHI'17 - Proceedings of the 2017 CHI Conference on Human Factors in Computing Systems, Denver (United States)
https://inria.hal.science/hal-01455510

Performances and robustness of IR seed Laser diodes under large overcurrent and short-pulse conditions for fiber Laser applications
Galès, Germain Le ; Joly, Simon ; Bolanos, Western ; Pedroza, Guillaume ; Morisset, Adèle ; Darracq, Frédéric ; Lewis, Dean ; Bettiati, Mauro ; Laruelle, François ; Bechou, Laurent
Dans : EMN Americas Meetings, Victoria (Canada)
https://hal.science/hal-01719975

Enseignement dans le supérieur impliquant l'usage du Smartphone.
Guillet, Jean-Paul
Dans : Réunion annuel du programme IDEX, Bordeaux (France)
https://hal.science/hal-03637774

Art Painting Testing with Terahertz Pulse and Frequency Modulated Continuous Wave
Guillet, Jean-Paul ; Roux, Marie ; Wang, Kejian ; Ma, Xue ; Fauquet, Frederic ; Darracq, Frederic ; Mounaix, Patrick
Dans : 2017 Progress In Electromagnetics Research Symposium, Saint Petersbourg (Russia)
https://u-bourgogne.hal.science/hal-01546450

Contrôle non destructif terahertz et fabrication additive
Guillet, Jean-Paul ; Mounaix, Patrick
Dans : La photonique appliquée à l'aéronautique, Bordeaux (France)
https://hal.science/hal-01456318

THz Tomography and image processing: a new tool for polymer and ceramic additive manufacturing quality control
Mounaix, Patrick
Dans : 15th ASIA PACIFIC CONFERENCE FOR NON-DESTRUCTIVE TESTING (APCNDT) , singapour (Singapore)
https://hal.science/hal-01653651

Terahertz Paint Thickness Measurements : from lab to automotive and aeronautics Industry
Mounaix, Patrick
Dans : 5th ASIA PACIFIC CONFERENCE FOR NON-DESTRUCTIVE TESTING (APCNDT), Singapour (Singapore)
https://hal.science/hal-01653647

Advantages of TCAD simulation towards inverstigation of reliability concerns in GaN HEMTs for RF power applications
Mukherjee, Kalparupa ; Darracq, Frederic ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : BEE Week at IEEE IM an MTT-S Day, IEEE student Branch, Bordeaux (France)
https://hal.science/hal-02462765

TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
Mukherjee, Kalparupa ; Darracq, Frederic ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : ESREF 2017, Bordeaux (France)
https://hal.science/hal-02462694

Guided terahertz pulsed reflectometry simulation with near field probe
Pan, M. ; Guillet, J.P. ; Fauquet, F. ; Lewis, D. ; Mounaix, P.
Dans : 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun (Mexico)
https://hal.science/hal-02478521

Performance quantification of last generation Li-ion batteries in wide temperature range
Zhang, Yuanci ; Briat, Olivier ; Martin, Cyril ; Delétage, Jean-Yves ; Gager, Guillaume ; Vinassa, Jean-Michel
Dans : 43th Annual Conference of the IEEE Industrial Electronics Society, IECON, Beijing (China)
https://hal.science/hal-01657701

2016

Frequency modulated continuous wave terahertz imaging for art restoration
Guillet, Jean-Paul ; Wang, Kejian ; Roux, Marie ; Fauquet, Frederic ; Darracq, Frédéric ; Mounaix, Patrick
Dans : IRMMW 2016, Copenhagen (Denmark)
https://hal.science/hal-01418837

1060nm seed laser diodes in pulsed operation: performances and safe operating area
Le Gales, Germain ; Giulia, Marcello ; Joly, Simon ; Pedroza, Guillaume ; Morisset, Adèle ; Laruelle, François ; Darracq, Frederic ; Bechou, Laurent
Dans : ISROS 2016, Otwock (Poland)
https://hal.science/hal-01720731

Bulk rigid terahertz metamaterials based on dielectric microspheres
Mounaix, Patrick ; Kadlec, C. ; Elissalde, Catherine ; Dominec, Filip ; Nemec, H. ; Kuzel, P.
Dans : TST 2016 , Budapest (Hungary)
https://hal.science/hal-01404436

Automated Data And Image Processing For Biomedical Sample Analysis
Mounaix, Patrick ; Balacey, Hugo ; Guillet, Jean-Paul ; Pickwell-Macpherson, Emma ; Macgrogan, Gaëtan ; Alabadi, Amel
Dans : IRRMW 2016, copenague (Denmark)
https://hal.science/hal-01404429

Near-field THz Time-domain Spectroscopy Of Anisotropic Dielectric Micro-particles
Mounaix, Patrick ; Matheisen, Christopher ; Brener, Igal ; Khromova, Irina ; Reno, John L. ; Kuzel, P. ; Chung, U-Chan ; Elissalde, Catherine
Dans : IRMMW 2016, copenague (Denmark)
https://hal.science/hal-01404422

Frequency Modulated Continuous Wave Terahertz Imaging For Art Restoration
Mounaix, Patrick ; Darracq, Frederic ; Guillet, Jean-Paul ; Fauquet, Frederic ; Roux, Marie ; Wang, Kejian
Dans : IRMMW 2016, copenague (Denmark)
https://hal.science/hal-01404415

Photoconductive Microprobe Based Near-field Scanning Of Terahertz Resonances Of A Single High-index TiO2 Microsphere
Mounaix, Patrick ; Elissalde, Catherine ; Nagel, Michael ; Sawallich, S. ; Matheisen, Christopher
Dans : IRMMW 2016, copenague (Denmark)
https://hal.science/hal-01404349

Extending Terahertz Paint Thickness Measurements To Advanced Industry-Standard Automotive Paint Structures
Mounaix, Patrick ; Gregory, Ian ; Taday, Phil ; May, Robert M.
Dans : IRMMW 2016, copenague (Denmark)
https://hal.science/hal-01404335

THz tomography and image processing : a new tool for polymer and ceramic additive manufacturing characrerization
Mounaix, Patrick ; Obaton, Anne Françoise ; Balacey, Hugo ; Perraud, Jean Baptiste ; Guillet, Jean-Paul ; Bou-Sleiman, Joyce ; Recur, Benoit
Dans : Pharos event 2016, Talence (France)
https://hal.science/hal-01404322

Terahertz paint thickness measurements : from automotive to aeronautics industry
Mounaix, Patrick ; Balacey, Hugo ; Taday, Phil ; Gregory, Ian ; May, Robert M.
Dans : PHAROS, Talence (France)
https://hal.science/hal-01404314

2015

Ordered subsets convex algorithm and automatic image processing sequences: the solid bases for 3D THz inspection
Balacey, Hugo ; Perraud, Jb ; Bou Sleiman, Joyce ; Recur, Benoît ; Mounaix, Patrick
Dans : 8èmes Journées THz , Areches-Beaufort (France)
https://hal.science/hal-01264807

Imagerie et spectroscopie Terahertz: applications aux problématiques de défense et de sécurité
Bou Sleiman, Joyce ; Perraud, Jb ; Recur, Benoît ; Bousquet, Bruno ; Palka, Norbert ; Mounaix, Patrick
Dans : JNRDM 2015, Bordeaux (France)
https://hal.science/hal-01264765

Discrimination and identification of RDX/PETN explosives by chemometrics applied to terahertz time-domain spectral imaging
Bou Sleiman, Joyce ; Perraud, Jb ; Bousquet, Bruno ; Guillet, Jean-Paul ; Palka, Norbert ; Mounaix, Patrick
Dans : VIII Millimetre Wave and Terahertz Sensors and Technology conference, Toulouse (France)
https://hal.science/hal-01263937

Chemical imaging and quantification of RDX/PETN mixtures by PLS applied on terahertz time-domain spectroscopy
Bou Sleiman, Joyce ; Perraud, Jb ; Bousquet, Bruno ; Palka, Norbert ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015, Hong Kong (China)
https://hal.science/hal-01263833

AMI : Augmented Michelson Interferometer
Furio, David ; Hachet, Martin ; Guillet, Jean-Paul ; Bousquet, Bruno ; Fleck, Stéphanie ; Reuter, Patrick ; Canioni, Lionel
Dans : ETOP 2015 - Education and Training in Optics & Photonics, Bordeaux (France)
https://inria.hal.science/hal-01121917

Near-field spectroscopy of sub-wavelength (<λ/10) anisotropic dielectric resonators at terahertz frequencies
Mitrofanov, Oleg ; Khromova, Irina ; Dominec, F. ; Kuzel, P. ; Reno, Jl ; Brener, Igal ; Chung, U-Chan ; Elissalde, Catherine ; Maglione, Mario ; Mounaix, Patrick
Dans : 2015 European Conference on Lasers and Electro-Optics, Munich (Germany)
https://hal.science/hal-01264060

Magnetic dipole and electric dipole resonances in TiO2 microspheres at terahertz frequencies
Mitrofanov, Oleg ; Domenic, Filip ; Kuzel, P. ; Reno, John ; Brener, Igal ; Chung, U-Chan ; Elissalde, Catherine ; Maglione, Mario ; Mounaix, Patrick
Dans : Quantum Sensing and Nanophotonic Devices XII,, San Francisco (United States)
https://hal.science/hal-01263842

Metrological Evaluation of Tomography Methods Applied to Objects Fabricated by Additive Manufacturing
Obaton, Anne-Françoise ; Costin, Marius ; Mounaix, Patrick ; Geffrin, Jean Michel ; Eyraud, Christelle ; Souvignet, Christelle ; Moschetta, Jean-Marc
Dans : International symposium on Digital Industrial radiology and computed tomography, Ghent (Belgium)
https://hal.science/hal-01264659

Terahertz detection of explosive materials and dangerous objects
Palka, Norbert ; Kowalski, M. ; Walczakowski, M ; Szustakowski, M ; Ciurapinski, W ; Wrobel, J. ; Jodlowski, L ; Rurka, E ; Bou Sleiman, Joyce ; Mounaix, Patrick ; Ellrich, F. ; Molter, D. ; Jonuscheit, J. ; von Freymann, G ; Beigang, R.
Dans : NATO ARW on THz Diagnostics of CBRN effects and Detection of Explosives & CBRN, Izmir (Turkey)
https://hal.science/hal-01264649

Immersion in refractive index matching liquid for 2D and 3D terahertz imaging
Perraud, Jb ; Bou Sleiman, Joyce ; Simoens, François ; Mounaix, Patrick
Dans : 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), Hong Kong (France)
https://hal.science/hal-01263947

THz imaging versus X-Ray tomography: Applications to material inspection
Recur, Benoît ; Balacey, Hugo ; Bou Sleiman, Joyce ; Perraud, Jb ; Mounaix, Patrick
Dans : ICMTS, Quebec (Canada)
https://hal.science/hal-01264760

THz response of TiO2 microspheres embedded in a dielectric layer
Sindler, Michal ; Kadlec, C ; Nemec, H. ; Dominec, F. ; Kuzel, P. ; Elissalde, Catherine ; Chung, U-C ; Mounaix, Patrick
Dans : 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), Hong Kong (France)
https://hal.science/hal-01264034

2014

Processing sequence for non-destructive inspection based on 3D terahertz images
Balacey, Hugo ; Jean-Baptiste, Perraud ; Bou Sleiman, Joyce ; Guillet, Jean-Paul ; Recur, Benoît ; Mounaix, Patrick
Dans : Infrared, Millimeter-Wave, and Terahertz Technologies III, Beijing (China)
https://hal.science/hal-01091194

Improved integrated circuits qualification using dynamic laser stimulation technique
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, D.
Dans : IEEE International Reliability Physics Symposium, 2009, Montreal (Canada)
https://hal.science/hal-00988351

Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Guillet, Jean-Paul ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, Dean
Dans : 21th International symposium on the Physical and Failure Analysis of integrated circuits, Singapour (Singapore)
https://hal.science/hal-01091188

Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures
Rebai, Mohamed ; Darracq, Frédéric ; Guillet, Jean-Paul ; Perdu, Philippe ; Sanchez, Kévin ; Lewis, D.
Dans : 21th International symposium on the Physical and Failure Analysis of integrated circuits (IPFA), Singapour (Singapore)
https://hal.science/hal-01020683

2013

A new processing sequence to assess airways using 3D CT-scan
Balacey, Hugo ; Dournes, Gaël ; Desbarats, Pascal ; Domenger, Jean-Philippe ; Laurent, François
Dans : 20th IEEE International Conference on Image Processing (ICIP), Melbourne (Australia)
https://hal.science/hal-01465173

Analysis of Short-Term NBTI Effect on the Single-Event Upset Sensitivity of a 65nm SRAM using Two-Photon Absorption
Issam, El Moukthari ; Pouget, Vincent ; Darracq, Frédéric ; Larue, Camille ; Lewis, Dean ; Perdu, Philippe
Dans : 14th European Conference on Radiation and Its Effects on Components and Systems, Oxford (United Kingdom)
https://hal.science/hal-01091193

Characterization and modelling of laser-induced single-event burn-out in SiC power diodes
Mbaye, N. ; Pouget, V. ; Darracq, F. ; Lewis, D.
Dans : ESREF 2013, Arcachon (France)
https://hal.science/hal-01935694

Analysis of short-term NBTI effect on the Single-Event Upset sensitivity of a 65nm SRAM using two-photon absorption
Moukhtari, I. El ; Pouget, V. ; Darracq, F. ; Larue, C. ; Perdu, P. ; Lewis, D.
Dans : IEEE RADECS, Oxford (United Kingdom)
https://hal.science/hal-01935693

Impact of Negative Bias Temperature Instability on the Single-Event Upset Threshold of a 65nm SRAM cell
Moukhtari, I. El ; Pouget, V. ; Larue, C. ; Darracq, Frédéric ; Lewis, D. ; Perdu, P.
Dans : ESREF 2013, Arcachon (France)
https://hal.science/hal-01935692

How to Interpret the Reflected Laser Probe Signal of Multiple Elementary Substructures in Very Deep Submicron Technologies
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Lewis, D. ; Perdu, Philippe ; Sanchez, Kévin
Dans : 39th International Symposium for Testing and Failure Analysis (ISTFA 2013), San José (United States)
https://hal.science/hal-00903364

A physical prediction model issued from TCAD investigations for single event burnout in power MOSFETs
Sara, Siconolfi ; Guillaume, Hubert ; Laurent, Artola ; Darracq, Frédéric ; Jean Pierre, David
Dans : 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Oxford (United Kingdom)
https://hal.science/hal-01091195

2012

Building the electricalmodel of the PhotoelectricLaserStimulation of a NMOS transistor in 90 nm technology
Alexandre, Sarafianos ; Llido, R. ; Dutertre, Jean-Max ; Gagliano, Olivier ; Serradeil, Valérie ; Lisart, Mathieu ; Goubier, V. ; Tria, Assia ; Pouget, Vincent ; Lewis, D.
Dans : 38th International Symposium for Testing and Failure Analysis, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-00742629

Signal propagation analysis by digital lock-in time resolved imaging
Bascoul, G. ; Perdu, Philippe ; Lewis, D.
Dans : 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2012, Singapour (Singapore)
https://hal.science/hal-00988346

Improving defect localization techniques with laser beam with specific analysis and set-up modules
Llido, R. ; Gomez, J. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : 2012 IEEE International Reliability Physics Symposium (IRPS), (France)
https://hal.science/hal-00988382

Characterization and TCAD Simulation of 90nm Technology PMOS Transistor Under Continuous Photoelectric Laser Stimulation for Failure Analysis Improvement
Llido, R ; Sarafianos, A ; Gagliano, O ; Serradeil, V ; Goubier, V ; Lisart, M ; Haller, G ; Pouget, Vincent ; Lewis, Dean ; Dutertre, Jean-Max ; Tria, Assia
Dans : 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-01130626

Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology
Sarafianos, A ; Llido, R ; Gagliano, O ; Serradeil, V ; Lisart, Mathieu ; Goubier, V. ; Dutertre, Jean-Max ; Tria, Assia ; Pouget, Vincent ; Lewis, Dean
Dans : 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-01130636

Characterization and TCAD simulation of 90 nm technology transistors under continuous photoelectric laser stimulation for failure analysis improvement
Sarafianos, Alexandre ; Llido, R. ; Gagliano, Olivier ; Serradeil, Valérie ; Goubier, V. ; Lisart, M. ; Haller, G. ; Pouget, V. ; Lewis, D. ; Dutertre, Jean-Max ; Tria, Assia
Dans : 19th IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS, Singapore (Singapore)
https://hal-emse.ccsd.cnrs.fr/emse-00742705

2011

Time resolved imaging at low power supply on 45nm technology
Bascoul, G. ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, D. ; Dudit, Sylvain ; Celi, Guillaume
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2011, Incheon (South Korea)
https://hal.science/hal-00988376

Imaging the Single Event Burnout sensitive volume of vertical power MOSFETs using the laser Two-Photon Absorption technique
Darracq, Frédéric ; Mbaye, Nogaye ; Larue, Camille ; Pouget, V. ; Azzopardi, Stephane ; Lorfèvre, E. ; Bezerra, F. ; Lewis, D.
Dans : 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Seville (Spain)
https://hal.science/hal-00772102

Sondes de champ proche THz sensibles à la polarisation
Guillet, J-P. ; Chusseau, Laurent ; Adam, R. ; Pénarier, A.
Dans : Journée "Antenne de Champ Proche'' du GDR Ondes, Paris (France)
https://hal.science/hal-01904167

Transition from rectangular waveguide to Sommerfeld mode on a wire
Guillet, J-P. ; Chusseau, Laurent
Dans : 6e Journées Térahertz, La Grande Motte (France)
https://hal.science/hal-01904163

Propagating and coupling Sommerfeld waves on wires
Guillet, J-P. ; Blin, S. ; Chusseau, Laurent
Dans : 6e Journées Térahertz, La Grande Motte (France)
https://hal.science/hal-01904162

Millimetric near-field imaging experiment using a transition from rectangular waveguide to cylindrical surface wave guide
Guillet, J-P. ; Chusseau, Laurent
Dans : ICONIC 2011, 5th International Conference on Electromagnetic Near-Field Characterization and Imaging, Rouen (France)
https://hal.science/hal-01904160

3D current path in stacked devices: Metrics and challenges
Kor, H.B ; Infante, Fulvio ; Perdu, Philippe ; Gan, P. ; Lewis, D.
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2011, Incheon (South Korea)
https://hal.science/hal-00988371

Comparison of classical and two-photon photoelectric laser stimulation capabilities for failure analysis
Shao, Kai ; Pouget, V. ; Faraud, Emeric ; Larue, C. ; Lewis, D.
Dans : 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Incheon (South Korea)
https://hal.science/hal-00669828

2010

Facing the defect characterization and localization challenges of bridge defects on submicronic technology (45nm and below)
Celi, Guillaume ; Dudit, Sylvain ; Perdu, Philippe ; Reverdy, A. ; Parrassin, T. ; Bechet, E. ; Lewis, Dean ; Vallet, Maxime
Dans : 20th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Monteccassino (Italy)
https://hal.science/hal-00585662

Dynamic power analysis under laser stimulation: a new Dynamic Laser Simulation approach
Deyine, Amjad ; Perdu, Philippe ; Sanchez, K. ; Courrège, J.C. ; Lewis, Dean
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.science/hal-00585673

Magnetic Microscopy for 3D structures: use of the Simulation Approach for the
precise localization of deep buried weak currents
Infante, Fulvio ; Gomes, R. ; Perdu, Philippe ; Battistella, Fabien ; Annereau, Sébastien ; Lewis, D.
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.science/hal-00988364

Magnetic microscopy for 3D structures: use of the Simulation Approach for the precise localization of deep buried weak currents
Infante, Fulvio ; Gomes, Rodolphe ; Perdu, Philippe ; Battistella, Fabien ; Annereau, Sébastien ; Lewis, Dean
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.science/hal-00585670

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : 20th European Symposium Reliabilty on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Monteccassino (Italy)
https://hal.science/hal-00585666

2009

Investigation of single event burnout sensitive depth in power MOSFETS
Darracq, Frédéric ; Pouget, V. ; Lewis, D. ; Fouillat, P. ; Lorfèvre, E. ; Ecoffet, R. ; Bezerra, F.
Dans : 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS),, Bruges (Belgium)
https://hal.science/hal-00667364

Full Dynamic Laser simulation set up
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, D. ; Deslandes, H.
Dans : 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009., Suzhou (China)
https://hal.science/hal-00988356

Net integrity checking by optical localization techniques
Haller, G. ; Machouat, A. ; Lewis, Dean ; Pouget, Vincent
Dans : 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Arcachon (France)
https://hal.science/hal-00585657

Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Arcachon (France)
https://hal.science/hal-00585654

Short circuit localization on integrated circuits using magnetic microscopy techniques coupled to simulations
Infante, F. ; Perdu, Philippe ; Petremont, S. ; Lewis, Dean
Dans : 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou (China)
https://hal.science/hal-00585648

Compact modeling of Optically-Gated Carbon NanoTube Field Effect Transistor
Liao, Si-Yu ; Maneux, Cristell ; Pouget, Vincent ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : Trends in NanoTechnologies 2009, Barcelonna (Spain)
https://hal.science/hal-00399897

Best test pattern failure analysis flow for functional logic failure localization by IR-OBIRCH technique
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, D. ; Perdu, Philippe ; Pouget, V. ; Essely, Fabien
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, Singapour (Singapore)
https://hal.science/hal-00670058

Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation for IC Characterization and Failure Analysis
Pouget, V. ; Faraud, Emeric ; Shao, Kai ; Jonathas, S. ; Horain, D. ; Haller, G. ; Goubier, V. ; Picart, B. ; Forli, L. ; Lewis, D.
Dans : 35th International Symposium for Testing and Failure Analysis (ISTFA), Sans José (United States)
https://hal.science/hal-00670060

2008

Dynamic Laser Stimulation Technique for device qualification process
Deyne-Barth, A. ; Perdu, Philippe ; Benetti, G. ; Sanchez, Kevin ; Battistella, F. ; Lewis, Dean
Dans : International Symposium for Testing and Failure Analysis (ISTFA), (France)
https://hal.science/hal-00401698

Methodologies and Tools for the Evaluation of the Sensitivity to Radiation of SRAM-based FPGAs
Foucard, G. ; Perronnard, P. ; Velazco, Raoul ; Ferron, J. ; Douin, A. ; Pouget, V. ; Bocquillon, A. ; Miller, F. ; Berger, G. ; Charlier, F. ; Boldrin, F.
Dans : 23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Grenoble (France)
https://hal.science/hal-00347662

SET sensitive volume imaging and measurement with two-photon absorption laser testing
Jaulent, Patrice ; Pouget, Vincent ; Mcmorrow, D. ; Bezerra, F. ; Fouillat, Pascal ; Lewis, Dean
Dans : Nuclear and Space Radiation Effects Conference (NSREC), Tucson (United States)
https://hal.science/hal-00401702

IP-based methodology for analog design flow: Application on neuromorphic engineering
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : IEEE NEWSCAS-TAISA 2008, Montréal (Canada)
https://hal.science/hal-00514205

Effect of Physical defect on schmoos in CMOS DSM technologies
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Perdu, Philippe ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Maastricht (Netherlands)
https://hal.science/hal-00401696

Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien ; Perdu, Philippe
Dans : 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapour (Singapore)
https://hal.science/hal-00398000

Remote SEE Testing Capabilities with Heavy Ions and Laser Beams at CYCLONE-HIF and ATLAS Facilities
Peronnard, P. ; Velazco, Raoul ; Foucard, G. ; Pouget, V. ; Berger, G. ; Charlier, F. ; Boldrin, F.
Dans : Radiation Effects Data Workshop, Tucson, AZ (United States)
https://hal.science/hal-00374744

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection
Pouget, V. ; Douin, A. ; Foucard, G. ; Peronnard, P. ; Lewis, D. ; Fouillat, P. ; Velazco, Raoul
Dans : 14th IEEE International Symposium On-Line Testing (IOLT'08), Rhodes (Greece)
https://hal.science/hal-00347751

Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits
Roche, N. ; Velo, Y. Gonzalez ; Dusseau, L. ; Boch, J. ; Vaillé, J.-R. ; Saigné, Frédéric ; Azais, B. ; Auriel, G. ; Lorfèvre, E. ; Pouget, V. ; Buchner, S. P. ; David, J.-P. ; Calvel, P. ; Marec, R.
Dans : 7th European Workshop on Radiation and its Effects on Components and Systems, Jyvaskyla (Finland)
https://hal.science/hal-01822766

Failure Analysis enhancement by evaluating the photoelectric laser stimulation impact on mixed-mode ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Sanchez, Kevin ; Crepel, Olivier ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Maastricht (Netherlands)
https://hal.science/hal-00401699

Failure analysis enhancement by evaluating the thermal laser stimulation impact on analog ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Crepel, Olivier ; Lewis, Dean
Dans : International Symposium on the Physical and Failure Analysis on Integrated Circuits (IPFA), Suzhou (China)
https://hal.science/hal-00401695

2007

Highlights of Laser Testing Capabilities Regarding the Understanding of SEE in SRAM-based FPGA
Bocquillon, A. ; Foucard, G. ; Miller, F. ; Buard, Nadine ; Leveugle, Régis ; Daniel, C. ; Rakers, S. ; Carriere, T. ; Pouget, Vincent ; Velazco, Raoul
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Deauville (France)
https://hal.science/hal-00397854

Highlights of laser testing capabilities regarding the understanding of SEE in SRAM Based FPGAs
Bocquillon, A. ; Foucard, G. ; Miller, F. ; Buard, N. ; Leveugle, Régis ; Daniel, C. ; Rakers, S. ; Carriere, T. ; Pouget, V. ; Velazco, Raoul
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS'07), Deauville (France)
https://hal.science/hal-00288250

Impact of VCO Topology on SET Induced Frequency Response
Chen, W. ; Varanasi, N. ; Pouget, Vincent ; Barnaby, H. J. ; Vermeire, B. ; Adell, P.C. ; Copani, T. ; Fouillat, Pascal
Dans : Nuclear and Space Radiation Effects Conference (NSREC) 2007, Honolulu (United States)
https://hal.science/hal-00398031

Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : 45th annual ieee International Reliability Physics Symposium (IRPS), Phoenix (United States)
https://hal.science/hal-00204584

Jitter Improvement of Time-Resolved Photoelectric Laser Stimulation for Dynamic Imaging of Integrated Circuits
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : Instrumentation and Measurement Technology Conference 2007, Varsovie (Poland)
https://hal.science/hal-00204580

IC Debug and Defect Localization using Dynamic Laser Stimulation and Time-Resolved Emission
Ferrigno, Julie ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, Dean ; Vallet, Michel ; Dudit, Sylvain
Dans : 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2007, Bangalore (India)
https://hal.science/hal-00204582

Study of Single Event Transients in High-Speed Operational Amplifiers
Jaulent, Patrice ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Deauville (France)
https://hal.science/hal-00397836

IP-Based Library for Analog Design Reuse
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : GDR SoC-SIP, Paris (France)
https://hal.science/hal-00514216

Scaling Guidelines for CMOS Linear Analog Design
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : International Conference on Ph.D. Research in Microelectronics & Electronics, Bordeaux (France)
https://hal.science/hal-00414788

IP-Based Library for Analog Design Reuse
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : GDR SoC-SIP, Paris (France)
https://hal.science/hal-00181424

Resizing methodology for CMOS analog circuit
Levi, Timothée ; Tomas, J. ; Lewis, N. ; Fouillat, P.
Dans : Proceedings SPIE VLSI Circuits and Systems III, Maspalomas, Gran Canaria (Spain)
https://hal.science/hal-00181420

IP-based design reuse for analogue systems: a case study
Levi, Timothée ; Tomas, J. ; Lewis, N. ; Fouillat, P.
Dans : Proceedings SPIE VLSI Circuits and Systems III, Maspalomas, Gran Canaria (Spain)
https://hal.science/hal-00181417

Configuration errors analysis in SRAM-based FPGAs
Maingot, V. ; Ferron, J. ; Leveugle, Régis ; Pouget, Vincent ; Douin, Alexandre
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon (France)
https://hal.science/hal-00401694

Evaluation of Recent Technologies of Non-Volatile RAM
Nuns, T. ; Duzellier, S. ; Bertrand, J. ; Hubert, G. ; Pouget, Vincent ; Darracq, Frédéric ; David, J.P. ; Soonckindt, S.
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Deauville (France)
https://hal.science/hal-00397841

Single Event Transient Mapping of a Voltage-Controlled Oscillator
Pouget, Vincent ; Chen, W. ; Lewis, Dean ; Barnaby, H. J. ; Fouillat, Pascal
Dans : 16th Single-Event Effects Symposium, Long Beach (United States)
https://hal.science/hal-00398024

Tools and methodology development for pulsed laser fault injection in SRAM-based FPGAs
Pouget, V. ; Douin, A. ; Lewis, D. ; Fouillat, P. ; Foucard, G. ; Peronnard, P. ; Maingot, V. ; Ferron, J. ; Anghel, Lorena ; Leveugle, Régis ; Velazco, Raoul
Dans : 8th Latin-American Test Workshop (LATW'07), Cuzco (Peru)
https://hal.science/hal-00156318

Failure Localization and design debug on mixed-mode ICs by using the dynamic laser stimulation techniques
Sienkiewicz, Magdalena ; Sanchez, Kevin ; Firiti, Abdellatif ; Crepel, Olivier ; Perdu, Philippe ; Lewis, Dean
Dans : International Symposium for Testing and Failure Analysis (ISTFA) 2007, San Jose (United States)
https://hal.science/hal-00204668

Linear Systems Analysis of Single Event Transients in Voltage Controlled Oscillators
Varanasi, N. ; Chen, W. ; Vermeire, B. ; Adell, P.C. ; Pouget, Vincent ; Fouillat, Pascal ; Barnaby, H. J.
Dans : 16th Single-Event Effects Symposium, Long Beach (United States)
https://hal.science/hal-00398028

2006

Time resolved imaging using synchronous picosecond photoelectric laser stimulation
Douin, Alexandre ; Pouget, Vincent ; de Matos, Magali ; Lewis, Dean ; Perdu, Philippe ; Fouillat, Pascal
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Wuppertal (Germany)
https://hal.science/hal-00401692

Applications of various optical techniques for ESD defect localization
Essely, Fabien ; Darracq, Frédéric ; Pouget, Vincent ; Remmach, Mustapha ; Beaudoin, Félix ; Guitard, Nicolas ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), wuppertal (Germany)
https://hal.science/hal-00401519

OBIC technique for ESD defect localization : Influence of the experimental procedure
Essely, F. ; Guitard, Nicolas ; Darracq, F. ; Pouget, V. ; Bafleur, Marise ; Touboul, A. ; Lewis, D.
Dans : 3th Workshop EOS/ESD/EMI, Toulouse (France)
https://hal.science/hal-00327412

Optimizing pulsed OBIC technique for ESD defect localization
Essely, Fabien ; Guitard, Nicolas ; Darracq, Frédéric ; Pouget, Vincent ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapour (Singapore)
https://hal.science/hal-00204574

Dynamic optical techniques for IC debug and failure analysis
Ferrigno, Julie ; Desplats, Romain ; Perdu, Philippe ; Sanchez, Kevin ; Beaudoin, Félix ; Lewis, Dean
Dans : 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2006, Singapour (Singapore)
https://hal.science/hal-00204578

IP-based design for analogue ASICs: A case study
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : IP-based SoC Design Conference 2006, IP-SoC 2006, Grenoble (France)
https://hal.science/hal-00181401

Scaling Rules for MOS Analog Design Reuse
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : Mixed Design of Integrated Circuits and Systems MIXDES 2006, Gdynia (Poland)
https://hal.science/hal-00181379

Recent developments for SEE testing at the ATLAS laser facility
Pouget, Vincent ; Wan, Dong Yun ; Jaulent, Patrice ; Douin, Alexandre ; Lewis, Dean ; Fouillat, Pascal
Dans : 15th Single-Event Effects Symposium, Long Beach (United States)
https://hal.science/hal-00398021

Single Event Transients (SETs) in RF Circuits
Varanasi, N. ; Chen, W. ; Barnaby, H. J. ; Vermeire, B. ; Cressler, J. ; Lapuyade, Herve ; Pouget, Vincent ; Fouillat, Pascal
Dans : 15th Single-Event Effects Symposium, Long Beach (United States)
https://hal.science/hal-00398023

In-depth resolution for LBIC technique by two-photon absorption
Wan, Dong Yun ; Pouget, Vincent ; Douin, Alexandre ; Jaulent, Patrice ; Lewis, Dean ; Fouillat, Pascal
Dans : Beam Injection Assessment of Microstructurs in Semiconductors (BIAMS), Saint Petersbourg (Russia)
https://hal.science/hal-00401693

2005

Intra-IC Inspection and Metrology with Picosecond Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Fouillat, Pascal ; Danto, Yves
Dans : 22nd IEEE Instrumentation and Measurement Technology Conference (IMTC) 2005, (Canada)
https://hal.science/hal-00182901

Formations à distance en EEA : Le projet de Master première année M1 e-EEA
Chambrelan, C. ; Gervais, N. ; Grisel, R. ; Horn, R. ; Danto, Yves ; Fouillat, Pascal ; Pellet, Claude ; Bonnaud, O. ; Thouroude, D. ; Despaux, G. ; Glaize, C. ; Nolhier, Nicolas ; Ablart, G. ; Graffeuil, Jacques ; Caignet, Fabrice ; Cazarré, Alain ; Barbier, Damien ; Abouchi, N. ; Jourlin, M. ; Garda, Patrick
Dans : 5ème Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes, (France)
https://hal.science/hal-00183071

Influence of Laser Pulse Duration in Single Event Upset Testing
Douin, Alexandre ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Phillipe
Dans : 8th European Conference on Radiation and its Effects on Components and Systems (RADECS) 2005, Cap d'Agde (France)
https://hal.science/hal-00397942

Electrical Modeling for Laser Testing with Different Pulse Durations
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Phillipe
Dans : 11th IEEE International On Line Testing Symposium, Saint Raphael (France)
https://hal.science/hal-00397739

Impact of semiconductors material on IR stimulation signal
Firiti, Abdellatif ; Beaudoin, Félix ; Haller, G. ; Perdu, Philippe ; Lewis, Dean ; Fouillat, Pascal
Dans : European Symposium of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon (France)
https://hal.science/hal-00401389

Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
Guitard, Nicolas ; Essely, Fabien ; Trémouilles, David ; Bafleur, Marise ; Nolhier, Nicolas ; Perdu, Philippe ; Touboul, Andre ; Pouget, Vincent ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.science/hal-00401483

Total Dose and Single Event Transients in Linear Voltage Regulators
Kelly, A.T. ; Adell, P.C. ; Witulski, A.F. ; Holman, W.T. ; Schrimpf, R.D. ; Pouget, Vincent
Dans : 8th European Conference on Radiation and Its Effects on Components and System (RADECS) 2005, Cap d 'Agde (France)
https://hal.science/hal-00397998

A radiation-hardened injection locked oscillator devoted to radio-frequency applications
Lapuyade, H. ; Pouget, V. ; Bequeret, J.-B. ; Hellmuth, P. ; Taris, T. ; Mazouffre, O. ; Fouillat, P. ; Deval, Y.
Dans : 8th European Conference on Radiation and its Effects on Components and Systems (RADECS 2005), Cap d'Agde (France)
https://hal.in2p3.fr/in2p3-00101436

A Radiation-Hardened Injection Locked Oscillator Devoted to Radio-Frequency Applications
Lapuyade, Hervé ; Pouget, Vincent ; Begueret, Jean-Baptiste ; Hellmuth, Patrick ; Fouillat, Pascal ; Deval, Yann
Dans : 8th European Conference on Radiation and Its Effects on Components and Systems (RADECS05), (France)
https://hal.science/hal-00183189

Laser Mapping of SRAM sensitive cells. A way to obtain input parameter for DASIE calculation code
Miller, F. ; Buard, N. ; Hubert, G. ; Alestra, S. ; Baudrillard, G. ; Carriere, T. ; Gaillard, R. ; Palau, J.-M. ; Saigné, Frédéric ; Fouillat, P.
Dans : 8th European Conference on Radiation and its Effects on Components and Systems, Cap d'Agde (France)
https://hal.science/hal-01807197

Banc de génération et détection de faisceau THz par photo commutateur ultrarapide sur GaAs BT
Mounaix, Patrick ; Tondusson, M. ; Sarger, Laurent ; Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : 3ème journées Thz, Aussois (France)
https://hal.science/hal-00398013

Identification of Some Key Parameters for Photoelectric Laser Simulation of IC: An Experimental Approach
Perdu, Phillipe ; Desplats, Romain ; Sanchez, Kevin ; Beaudoin, Félix ; Lewis, Dean ; Pouget, Vincent ; Douin, Alexandre ; Fouillat, Pascal
Dans : 12th International Symposium on the Physical and Failure Analysis Circuits (IPFA), Singapour (Singapore)
https://hal.science/hal-00397736

Light Emission to time resolved emission for IC debug and failure analysis
Remmach, Mustapha ; Pigozzi, A. ; Desplats, Romain ; Perdu, Philippe ; Lewis, Dean ; Noel, J. ; Dudit, Sylvain
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.science/hal-00401497

NIR Laser stimulation for dynamic timing analysis
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Roux, J.P. ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.science/hal-00401503

Delay Variation Mapping Induced by Dynamic Laser Stimulation
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Lewis, Dean ; Vedagarbha, P.
Dans : IEEE International Reliability Physics Symposium (IRPS), Santa Clara (United States)
https://hal.science/hal-00401387

Water solubility and diffusivity in BCB resins used in microelectronics packaging and sensor applications
Tetelin, Angélique ; Achen, A. ; Pouget, Vincent ; Pellet, Claude ; Toepper, M. ; Lachaud, Jean-Luc
Dans : 22nd Instrumentation and Measurement Technology Conference, (Canada)
https://hal.science/hal-00183075

2004

Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE International Reliability Physics Symposium (IRPS), (United States)
https://hal.science/hal-00182909

Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE International Reliability Physics Symposium (IRPS), (United States)
https://hal.science/hal-00182908

A 1.8 V 4.3 GHz SiGe Tunable Synchronous Oscillator
Begueret, Jean-Baptiste ; Deval, Yann ; Taris, Thierry ; Hellmuth, Patrick ; Mazouffre, Olivier ; Fouillat, Pascal
Dans : IEEE Asian Pacific Microwave Conference (APMC'2002), (Japan)
https://hal.science/hal-00183014

Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses
Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : 19th Symposium on Microelectronics Technology and Devices (SBMicro 2004), (Brazil)
https://hal.science/hal-00185409

Test chip for qualification of packaging assemblies
Deletage, Jean-Yves ; Fremont, Hélène ; Puig, Olivier ; Pellet, Claude ; Fouillat, Pascal ; Danto, Yves
Dans : SBMicro 2004, (Brazil)
https://hal.science/hal-00183081

Réalisation d un convertisseur 3 bits à 4 Géchantillons/s pour radiotélescopes en bande millimétrique et submillimétrique
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : Colloque Interdisciplinaire en Instrumentation (C2I), (France)
https://hal.science/hal-00183229

Sorting Out of Analogue IC Architectures using the DOE Method : a New Tool for Quality Design
Deval, Yann ; Tomas, Jean ; Fouillat, Pascal ; Dom, Jean-Paul
Dans : proceeding ESREF 93, (France)
https://hal.science/hal-00184310

Implementing laser based failure analysis methodologies using test vehicles
Lewis, D. ; Pouget, V. ; Beaudoin, F. ; Beauchene, T. ; Haller, G. ; Desplat, R. ; Perdu, P. ; Fouillat, P.
Dans : 2004 International Conference on Microelectronic Test Structures, Awaji Yumebutai (Japan)
https://hal.science/hal-01887706

Radiation Hardness Assessment of an ADC for Space Application using a Laser Test Equipment
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Darracq, Frédéric
Dans : Proc. of XIX Conference on Design of Circuits and Integrated Systems (DCIS) 2004, ISBN 2-9522971-0-X, Bordeaux (France)
https://hal.science/hal-01887701

Applications de l acoustique picoseconde à l analyse non destructive de circuits intégrés
Rampnoux, J. M. ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, S. ; Claeys, W. ; Rossignol, C. ; Audoin, Bertrand ; Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean
Dans : Colloque Interdisciplinaire en Instrumentation (C2I), (France)
https://hal.science/hal-00182903

2003

A Non-Linear Model to Express Laser-induced SRAM Cross-sections versus an Effective Laser LET
Darracq, Frédéric ; Lapuyade, Hervé ; Pouget, Vincent ; Fouillat, Pascal
Dans : 7th European Conference on Radiation and its Effects on Components and Systems (RADECS), (Netherlands)
https://hal.science/hal-00185410

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC
Pouget, V. ; Lewis, D. ; Fouillat, P.
Dans : 2003 IEEE Instrumentation and Measurement Technology Conference (IMTC 2003), Vail (United States)
https://hal.science/hal-01887685

Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures
Pouget, V. ; Fouillat, P. ; Velazco, Raoul ; Lewis, D. ; Dallet, D.
Dans : IEEE Nuclear and Space Radiation Effects Conference (NSREC'03), Monterey, CA (United States)
https://hal.science/hal-01376266

Dynamic Behavior of a Chemical Sensor for Real-Time Measurement of Humidity Variations in Human Breath
Tetelin, Angélique ; Pouget, Vincent ; Lachaud, Jean-Luc ; Pellet, Claude
Dans : 20th IEEE Instrumentation and Measurement Technology Conference, (United States)
https://hal.science/hal-00183123

2002

Caractérisation à distance de circuits radiofréquences
Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann ; Fouillat, Pascal ; Devreese, Regis ; Faurens, Christian
Dans : Septièmes Journées Pédagogiques du CNFM, (France)
https://hal.science/hal-00179943

A SiGe 4-Gsps 2-Bits Digitizer with 2-4 GHz Input Bandwidth
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Scarabello, Christophe ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : 9th IEEE Proc. Of International Conf. On Electronics, Circuits and Systems (ICECS'2002), (Croatia)
https://hal.science/hal-00183238

A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Scarabello, Christophe ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : EEE 15th Symposium on Integrated Circuits and System Design (SBCCI 2002), (Brazil)
https://hal.science/hal-00183236

A SiGe 4-Gsps 2-Bits Digitizer with 2-4 GHz Input Bandwidth
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Scarabello, Christophe ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : 9th IEEE Proc. Of International Conf. On Electronics, Circuits and Systems (ICECS'2002), (Croatia)
https://hal.science/hal-00183222

A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Scarabello, Christophe ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : EEE 15th Symposium on Integrated Circuits and System Design (SBCCI 2002), (Brazil)
https://hal.science/hal-00183220

The Synchronous Oscillator in Frequency Generation : an Overview
Deval, Yann ; Begueret, Jean-Baptiste ; Lapuyade, Hervé ; Fouillat, Pascal ; Kerherve, Eric
Dans : 14th IEEE International Conference on Microelectronics (ICM'2002), (Lebanon)
https://hal.science/hal-00183023

The Synchronous Oscillator in Frequency Generation : an Overview
Deval, Yann ; Begueret, Jean-Baptiste ; Lapuyade, Hervé ; Fouillat, Pascal ; Kerherve, Eric
Dans : 14th IEEE International Conference on Microelectronics (ICM'2002), (Lebanon)
https://hal.science/hal-00183003

Laser Utilization for Various Testing Purposes
Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Pouget, Vincent
Dans : 3rd IEEE Latin American Test Worksop LATW 02, (Uruguay)
https://hal.science/hal-00185423

A Novel 1-Gbps Clock and Data Recovery Architecture using Synchronous Oscillator in CMOS VLSI technology
Scarabello, Christophe ; Begueret, Jean-Baptiste ; Deval, Yann ; Deschans, David ; Fouillat, Pascal ; Pignol, Michel ; Le Gall, Jean-Yves
Dans : IEEE Proceedings of the 28th European Solid State Circuits Conference (ESSCIRC'2002), (Italy)
https://hal.science/hal-00183022

A Novel 1-Gbps Clock and Data Recovery Architecture using Synchronous Oscillator in CMOS VLSI technology
Scarabello, Christophe ; Begueret, Jean-Baptiste ; Deval, Yann ; Deschans, David ; Fouillat, Pascal ; Pignol, Michel ; Le Gall, Jean-Yves
Dans : IEEE Proceedings of the 28th European Solid State Circuits Conference (ESSCIRC'2002), (Italy)
https://hal.science/hal-00183001

2001

Transit Time Parameter Extraction for the HICUM Bipolar Compact Model
Ardouin, Bertrand ; Zimmer, Thomas ; Berger, Dominique ; Celi, D. ; Mnif, Hassene ; Burdeau, T. ; Fouillat, Pascal
Dans : IEEE Bipolar/BiCMOS circuits and technology meeting, (United States)
https://hal.science/hal-00203974

Direct Method for Bipolar Base-Emitter and Base-Collector Capacitance Splitting using High Frequency Measurements
Ardouin, Bertrand ; Zimmer, Thomas ; Mnif, Hassene ; Fouillat, Pascal
Dans : IEEE Bipolar/BiCMOS circuits and technology meeting, (United States)
https://hal.science/hal-00203972

Bipolar Transistor's Intrinsic and Extrinsic Capacitance Determination
Ardouin, Bertrand ; Zimmer, Thomas ; Mnif, Hassene ; Fouillat, Pascal ; Berger, Dominique ; Celi, D.
Dans : SISPAD 2001, International Conference on Simulation of Semiconductor Processes and Devices, (Greece)
https://hal.science/hal-00203971

Clock Generator Using Factorial DLL for Video Applications
Begueret, Jean-Baptiste ; Deval, Yann ; Mazouffre, Olivier ; Spataro, Anne ; Fouillat, Pascal ; Benoit, E. ; Mendoza, J.
Dans : IEEE Proceedings of the Custom IC Conf. (CICC'2001), (United States)
https://hal.science/hal-00183241

Clock Generator Using Factorial DLL for Video Applications
Begueret, Jean-Baptiste ; Deval, Yann ; Mazouffre, Olivier ; Spataro, Anne ; Fouillat, Pascal ; Benoit, E. ; Mendoza, J.
Dans : IEEE Proceedings of the Custom IC Conf. (CICC'2001), (United States)
https://hal.science/hal-00183225

Videoteaching for RF measurements of ICs in L - S - C bands
Begueret, Jean-Baptiste ; Deval, Yann ; Kerherve, Eric ; Fouillat, Pascal ; Devreese, Regis ; Faurens, Christian
Dans : 12th Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE'2001), (France)
https://hal.science/hal-00180917

Télé-enseignement de la caractérisation de circuits radiofréquences
Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann ; Fouillat, Pascal ; Devreese, Regis ; Faurens, Christian
Dans : CETSIS-EEA'01, (France)
https://hal.science/hal-00180916

Single-event Sensitivity of a single SRAM cell
Darracq, Frédéric ; Beauchene, Thomas ; Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Touboul, Andre
Dans : RADECS, (France)
https://hal.science/hal-00185411

Evaluation of a Design Methodology Dedicated to Dose Rate Hardened Linear Integrated Circuits
Deval, Yann ; Briand, Renaud ; Fouillat, Pascal ; Barnaby, H. J. ; Lapuyade, Hervé ; Lewis, Dean ; Schrimpf, Rd
Dans : European Conference on Radiation and its Effects on Components and Systems (RADECS), (France)
https://hal.science/hal-00184303

Improving an SEU Hard Design using a Pulsed Laser
Dutertre, Jean-Max ; Roche, Fernand-Michel ; Fouillat, Patrice ; Lewis, Dean
Dans : Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on, Grenoble (France)
https://hal-emse.ccsd.cnrs.fr/emse-01130950

Test de circuits intégrés par faisceau laser pulsé
Lewis, Dean ; Pouget, Vincent ; Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal
Dans : Colloque Interdisciplinaire en Instrumentation (C2I), (France)
https://hal.science/hal-00185412

A New Laser System for X-Rays Flashes Sensitivity Evaluation
Lewis, Dean ; Lapuyade, Hervé ; Deval, Yann ; Maidon, Yvan ; Darracq, Frédéric ; Briand, Renaud ; Fouillat, Pascal
Dans : Proc. of the 7th IEEE International On-Line Testing Workshop, (Italy)
https://hal.science/hal-00184302

A CMOS VLSI Delay Oriented Waveform Converter Dedicated to the Synthesizer of an UMTS Transceiver
Spataro, Anne ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal ; Belot, D.
Dans : IEEE Proceedings of the Custom IC Conf. (CICC'2001), (United States)
https://hal.science/hal-00183239

A CMOS VLSI Delay Oriented Waveform Converter Dedicated to the Synthesizer of an UMTS Transceiver
Spataro, Anne ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal ; Belot, D.
Dans : IEEE Proceedings of the Custom IC Conf. (CICC'2001), (United States)
https://hal.science/hal-00183223

Convertisseur de signaux orienté délai en technologie CMOS dédié à la réalisation d'un synthétiseur 2 GHz
Spataro, Anne ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal ; Belot, D.
Dans : Journées Nationales Micro-ondes (JNM'2001), (France)
https://hal.science/hal-00183024

A VLSI CMOS 2 GHz active load body effect mixer
Taris, Thierry ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal
Dans : IEEE Proceedings of the Design of Circuits and Integrated Systems Conf. (DCIS'2001), (Portugal)
https://hal.science/hal-00183240

A VLSI CMOS 2 GHz active load body effect mixer
Taris, Thierry ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal
Dans : IEEE Proceedings of the Design of Circuits and Integrated Systems Conf. (DCIS'2001), (Portugal)
https://hal.science/hal-00183224

Transistor model parameter determination with non-conventional optimisation algorithms
Zimmer, Thomas ; Ardouin, Bertrand ; Franze, Francesco ; Berger, Dominique ; Fouillat, Pascal
Dans : IEEE Electron Devices Conference, (Spain)
https://hal.science/hal-00203973

2000

Use of Genetic Algorithm for Efficient Integrated Circuits Compact Modelling and Parameter Extraction
Ardouin, Bertrand ; Zimmer, Thomas ; Batiste Duluc, Jean ; Marc, Francois ; Fouillat, Pascal
Dans : ACIDCA'2000, Monastir (Tunisia)
https://hal.science/hal-00189377

Model parameter extraction with non-conventional optimisation algorithms
Ardouin, Bertrand ; Zimmer, Thomas ; Franzè, F. ; Fouillat, Pascal
Dans : JSFT, (Tunisia)
https://hal.science/hal-00187311

An Overview of the Applications of a Pulsed Laser System for SEU Testing
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Sarger, L. ; Roche, Fernand-Michel ; Ecoffet, R.
Dans : 6th IEEE International On Line Testing Workshop, (Spain)
https://hal.science/hal-00185413

1999

A New SPICE Model Dedicated to the Analysis of the Transient Response of Irradiated MOSFETS for On Line Testing
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Sarger, L.
Dans : 5th IEEE International On Line Testing Workshop, (Greece)
https://hal.science/hal-00185414

SPICE Modeling of the Transient Response of Irradiated MOSFETs
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Deval, Yann ; Fouillat, Pascal ; Sarger, L.
Dans : 5th European Conference on Radiation and its Effects on Components and Systems (RADECS), (France)
https://hal.science/hal-00184305

Hierarchical Analogue Design and Behavioral Modelling
Zimmer, Thomas ; Lewis, Noëlle ; Fakhfakh, Ahmed ; Ardouin, Bertrand ; Levi, Herve ; Fouillat, Pascal
Dans : Microelectronic Systems Education Conference, MSE99, (United States)
https://hal.science/hal-00203979

1998

Evolution of base current in C-In doped GaInP/GaAs HBT under current induced stress
Maneux, Cristell ; Labat, Nathalie ; Fouillat, Pascal ; Touboul, Andre ; Danto, Yves
Dans : European Solid State Device Research Conference (Ed. Frontières), ESSDERC, (France)
https://hal.science/hal-00183480

Elaboration of a new pulsed laser system for SEE testing
Pouget, V. ; Calin, T. ; Lapuyade, H. ; Lewis, D. ; Fouillat, P. ; Velazco, Raoul ; Maidon, Y. ; Sarger, L.
Dans : IEEE International On-Line Testing Workshop (IOLTW'98), Capri (Italy)
https://hal.science/hal-01384704

New Capabilities for SEE Testing with a Femtosecond Pulsed Laser System
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Sarger, L.
Dans : Journées Nationales d Etudes de l association RADECS, (United Kingdom)
https://hal.science/hal-00185416

Elaboration of a New Pulsed Laser System for SEE Testing
Pouget, Vincent ; Calin, T. ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Velazco, Raoul ; Maidon, Yvan ; Sarger, L.
Dans : 4th IEEE International On Line Testing Workshop, (Italy)
https://hal.science/hal-00185415

1997

Simulation d upsets dans une mémoire SRAM CMOS utilisant des capteurs de courant intégrés
Calin, T. ; Lapuyade, Hervé ; Nicolaidis, Michael ; Velazco, Raoul ; Fouillat, Pascal
Dans : Journées Nationales d Etudes de l association RADECS, (France)
https://hal.science/hal-00185417

Influence des effets de dose cumulée sur les règles de conception des circuits intégrés bipolaires
Montagner, Xavier ; Deval, Yann ; Fouillat, Pascal ; Touboul, Andre ; Dom, Jean-Paul
Dans : Colloque CAO des circuits intégrés et systèmes, (France)
https://hal.science/hal-00184311

1996

Simulations électriques des effets de débit de dose et de dose cumulée dans les circuits intégrés bipolaires : méthodologie de conception durcie aux radiations
Deval, Yann ; Briand, Renaud ; Montagner, Xavier ; Fouillat, Pascal ; Tomas, Jean ; Dom, Jean-Paul
Dans : Journées d'étude RADECS96, (France)
https://hal.science/hal-00184312

Analysis of Latchup susceptibility to internal logical states by using a Laser beam
Fouillat, Pascal ; Lapuyade, Hervé ; Maidon, Yvan ; Dom, Jean-Paul
Dans : Proc. of the 5th European Conference on Electron and Optical Beam Testing of Electronic Devices, (Germany)
https://hal.science/hal-00185418

A new approach to determine active doping profiles of bipolar transistors using electrical measurements and a physical device simulator
Hachicha, I. ; Fouillat, P. ; Zimmer, T. ; Dom, J.P.
Dans : International Conference on Microelectronic Test Structures, Trento (France)
https://hal.science/hal-01721688

Built-In Laser Sensitive Cells For a New Testing Technique
Lapuyade, Hervé ; Fouillat, Pascal ; Dom, Jean-Paul
Dans : Proc. of the 2nd IEEE International On-Line Testing Workshop, (France)
https://hal.science/hal-00185419

1995

Numerical Modelling of Mechanisms involved in Latchup Triggering by a Laser Beam
Fouillat, Pascal ; Lapuyade, Hervé ; Touboul, Andre ; Dom, Jean-Paul ; Gaillard, R.
Dans : Proc. of the Third European Conference on Radiation and its Effects on Components and Systems, (France)
https://hal.science/hal-00185422

A microcontroller failure analysis using a LASER beam latchup triggering technique
Fouillat, Pascal ; Le Calve, Jean-Edmond ; Lapuyade, Hervé ; Maidon, Yvan ; Dom, Jean-Paul
Dans : Proc. of the 6th European Symposium on Reliability of Electronic devices, Failure Physics and analysis, (France)
https://hal.science/hal-00185420

Design For Testability of Built-In Laser Sensitive Cells
Lapuyade, Hervé ; Fouillat, Pascal ; Maidon, Yvan ; Tomas, Jean ; Dom, Jean-Paul
Dans : Proc. of the 6th European Symposium Reliability of Electronic devices, Failure Physics and analysis, (France)
https://hal.science/hal-00185421

2022

Advanced Data Processing For Tomography and 3D Rendering With Terahertz Waves
Mounaix, Patrick
Dans : 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft (Netherlands)
https://hal.science/hal-03845666

2020

THz Spectroscopy, Holographic Approach and Phantoms Design for the Diagnostics of Socially Significant Diseases
Smolyanskaya, O. ; Petrov, N. ; Nazarov, M. ; Vaks, V. ; Kistenev, Yu. ; Cherkasova, O. ; Guillet, Jean-Paul ; Mounaix, P. ; Shkurinov, A.
Dans : 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Buffalo (France)
https://hal.science/hal-03273482

2019

Terahertz systems for NDT demonstration and contact-less coatings thickness determination
Mounaix, Patrick
Dans : Albatros Techno Day (ATD), Merignac (France)
https://hal.science/hal-02381436

Data processing for multilayered material characterized by terahertz spectroscopy
Mounaix, Patrick
Dans : THz French Poland meeting , (October 17 and 18) Annual International Associated Laboratory - TERAMIR – warsaw, Varsovie (Poland)
https://hal.science/hal-02381417

Data processing for multilayered material characterized by terahertz spectroscopy
Mounaix, Patrick
Dans : THz symposium in Paris, 10-13 December 2019 (https://snaia2019.com/thz-optoelectronics-and-photonics-symposium/), Paris (France)
https://hal.science/hal-02381401

2018

Interaction THz / matière biologique : état des lieux
Mounaix, Patrick
Dans : Effets Biologiques et Sanitaires des Rayonnements Non-Ionisants, Montpellier (France)
https://hal.science/hal-02389070

Submillimeter wave Tomography and image processing advances : Applications additive manufacturing quality control
Mounaix, Patrick
Dans : TERA 2018, nizhny novgorod (Russia)
https://hal.science/hal-02389066

2017

Tomography and terahertz image processing : a new tool for polymer and ceramic additive manufacturing characterization
Mounaix, Patrick
Dans : 4ème édition 3D PRINT, Lyon (France)
https://hal.science/hal-02389099

Advances on spectro thz imaging : From sources to applications
Mounaix, Patrick
Dans : RFIC 2017, Honolulu (United States)
https://hal.science/hal-02389097

Terahertz spectroscopy imaging for oncology studies
Mounaix, Patrick
Dans : SON2017 workshop, Grenoble (France)
https://hal.science/hal-02389093

Spectro terahertz imaging : from lab to industrial applications
Mounaix, Patrick
Dans : AG GDR Ondes, Nice (France)
https://hal.science/hal-02389089

Data And Image Processing For Biomedical Sample Analysis with terahertz beam
Mounaix, Patrick
Dans : BIPSA 2017, Bordeaux (France)
https://hal.science/hal-02389084

Production , structural characterization of TiO2 spheres and characterization at THz frequencies
Mounaix, Patrick
Dans : ICAE 2017, Jeju island (South Korea)
https://hal.science/hal-02389079

Terahertz, perspectives pour la filière viti/vini
Mounaix, Patrick
Dans : Seminaire VVOP , IOA bordeaux, Talence (France)
https://hal.science/hal-02389075

Tomography and terahertz image processing : a new tool for polymer and ceramic additive manufacturing characterization
Mounaix, Patrick
Dans : 3D Print lyon, Lyon (France)
https://hal.science/hal-01653672

Data And Image Processing For Biomedical Sample Analysis with terahertz beam
Mounaix, Patrick
Dans : BIPSA 2017, Bordeaux (France)
https://hal.science/hal-01653668

Terahertz spectroscopy imaging for oncology studies
Mounaix, Patrick
Dans : Complementarity between Optics and Neutron spectroscopy in the THz domain – SON2017, Grenoble (France)
https://hal.science/hal-01653664

Spectro terahertz imaging : from lab to industrial applications
Mounaix, Patrick
Dans : AG du GDR Ondes, sophia antipolis (France)
https://hal.science/hal-01653658

Production , structural characterization of TiO2 spheres and characterization at THz frequencies
Mounaix, Patrick
Dans : ICAE 2017, JeJu (South Korea)
https://hal.science/hal-01653655

Advances on spectro thz imaging : From sources to applications
Mounaix, Patrick
Dans : RFIC 2017, Honolulu (United States)
https://hal.science/hal-01653639

2016

Tomography And Image Processing For Polymeradditive Manufacturing Characterization
Mounaix, Patrick
Dans : 8th International Symposium on Ultrafast Phenomena and Terahertz Waves, chonqking (China)
https://hal.science/hal-02389117

2D and 3D THz imaging: necessity of automated data processing tools
Mounaix, Patrick
Dans : SPIE Asia, Beijing (China)
https://hal.science/hal-02389111

Automated data and image processing tools for THz applications : Additive manufacturing and Biomedical cases
Mounaix, Patrick
Dans : 7 THz Bio conference, Seoul (South Korea)
https://hal.science/hal-02389107

Advanced processing sequence for 3D THz imaging
Mounaix, Patrick
Dans : 7th International Workshop on Terahertz Technology and Applications, Kaiserlautern (Germany)
https://hal.science/hal-02389102

2D and 3D THz imaging: necessity of automated data processing tools
Mounaix, Patrick
Dans : SPIE Asia Beijing 2016, pekin (China)
https://hal.science/hal-01393433

Tomography and image processing for polymer additive manufacturing objects
Mounaix, Patrick
Dans : 8th International Symposium on Ultrafast Phenomena and Terahertz Waves, Chongqing (China)
https://hal.science/hal-01393428

Automated data and image processing tools for THz applications : Additive manufacturing and  Biomedical  cases
Mounaix, Patrick
Dans : 7 THz Bio conference , Seoul (South Korea)
https://hal.science/hal-01393425

Advanced processing sequence for 3D THz imaging
Mounaix, Patrick
Dans : 7th International Workshop on Terahertz Technology and Applications,, Kaiserslautern (Germany)
https://hal.science/hal-01393422

2015

Chemical imaging of RDX/PETN explosives by chemometrics appliyed on terahertz time-domain spectroscopy
Bou Sleiman, Joyce ; Perraud, Jb ; Bousquet, Bruno ; Palka, Norbert ; Mounaix, Patrick
Dans : SPIE Security + Defence, Toulouse (France)
https://hal.science/hal-01264631

2009

Failure mechanisms in deep sub-micron technologies
Pouget, Vincent
Dans : Latin America Test Workshop, Buzios (Brazil)
https://hal.science/hal-00398047

2008

Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges
Perdu, Philippe ; Lewis, Dean ; Pouget, V.
Dans : European Symposium on Reliability of Electron Devices (ESREF), Maastricht (Netherlands)
https://hal.science/hal-00401385

2007

CAD tools dedicated to the design and test of RFICs
Deval, Yann ; Taris, Thierry ; Shirakawa, Alexandre ; Mazouffre, Olivier ; Pouget, Vincent ; Kerherve, Eric ; Lewis, Deal ; Begueret, Jean-Baptiste
Dans : Design, Automation & Test in Europe (DATE) 2007, (France)
https://hal.science/hal-00178343

Using Pulsed laser for security purpose
Pouget, V.
Dans : USE-IT Workshop, Toulouse (France)
https://hal.science/hal-00401384

Test et analyse par faisceau laser: plateforme et applications
Pouget, V.
Dans : Journée thématique du GDR SOC-SiP, Paris (France)
https://hal.science/hal-00401383

Fundamentals and recent developments on laser testing at the IMS laboratory
Pouget, V.
Dans : RALFDAY, Suresnes (France)
https://hal.science/hal-00401382

2006

A Review and some Future Prospects on Laser-Based Techniques for Single-Event Effects Testing and Analysis
Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Darracq, Frédéric
Dans : International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA), Tokyo (Japan)
https://hal.science/hal-00398038

Fundamentals of the Pulsed Laser Technique for single-event effects testing
Mcmorrow, D. ; Pouget, Vincent ; Fouillat, Pascal ; Darracq, Frédéric ; Buchner, S. ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Séville (Spain)
https://hal.science/hal-00401321

Analog Single Event Transients in Linear and RF Devices
Pouget, Vincent
Dans : 2nd International School on the Effects of Radiation on Embedded Systems for Space Applications, Séville (Spain)
https://hal.science/hal-00398045

2005

Fundamentals of the Pulsed Laser Technique for single-event upset testing
Fouillat, Pascal ; Pouget, Vincent ; Mcmorrow, D. ; Darracq, Frédéric ; Buchner, S. ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Manaus (Brazil)
https://hal.science/hal-00401314

Laser SEE Testing and Analysis Case Studies
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Manaus (Brazil)
https://hal.science/hal-00401316

2009

Pour un rapprochement des technologies et des usages : le futur du pôle TIC de Bordeaux
Fouillat, Pascal ; Claverie, Bernard
https://hal.science/hal-00983405

2007

Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing
Fouillat, P. ; Pouget, V. ; Mcmorrow, D. ; Darracq, F. ; Buchner, S. ; Lewis, D.
https://hal.science/hal-00206315

Using the SEEM software for SET testing and analysis
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean
https://hal.science/hal-00397867

Using the SEEM Software for Laser SET Testing and Analysis
Pouget, V. ; Fouillat, P. ; Lewis, D.
https://hal.science/hal-00206320

2017

Des ondes térahertz pour sonder les tableaux et les peintures
Mounaix, Patrick
https://hal.science/hal-01653682

2016

Franco-Chinese Workshop : Collaboration in Photonics between University of Bordeaux and Huazhong University of Science and Technology
Guillet, Jean-Paul ; Mounaix, Patrick ; Canioni, Lionel ; Prakasam, Mythili ; Jubera, Veronique ; Dousset, Vincent
https://hal.science/hal-01456327

Photonics & Aeronautics: a wedding with a promising future
Mounaix, Patrick ; Bechou, Laurent
https://hal.science/hal-01404480

CONTRÔLES ET MESURES UN NOUVEL ENJEU POUR LA FABRICATION ADDITIVE
Mounaix, Patrick ; Obaton, Anne Françoise
https://hal.science/hal-01404478

De nouvelles ondes pour le CND
Mounaix, Patrick
https://hal.science/hal-01404469

2015

De nouvelles ondes à la vue perçante
Mounaix, Patrick
https://hal.science/hal-01404487

2017

Hybrid simulator and method for teaching optics or for training adjustment of an optical device
Canioni, Lionel ; Hachet, Martin ; Guillet, Jean-Paul ; Bousquet, Bruno ; Furio, David
https://u-bourgogne.hal.science/hal-01536384

2002

Récupération d'Horloge et de Données à Base d'Oscillateur Synchrone
Begueret, Jean-Baptiste ; Deval, Yann ; Fouillat, Pascal ; Le Gall, Jean-Yves ; Pignol, Michel ; Scarabello, Christophe
https://hal.science/hal-00178602

2000

Circuits et Procédés de Génération de Signaux en Décalage de Phase
Begueret, Jean-Baptiste ; Belot, Didier ; Deval, Yann ; Fouillat, Pascal ; Spataro, Anne
https://hal.science/hal-00178593

2020

Terahertz radiations for breast tumour recognition
Cassar, Quentin
https://theses.hal.science/tel-03053722

Terahertz Radiations for Breast Tumour Recognition
Cassar, Quentin
https://hal.science/tel-02899590

Terahertz wave-guided reflectometry system
Pan, Mingming
https://hal.science/tel-02926290

2019

Performance and ageing quantification of electrochemical energy storage elements for aeronautical usage
Zhang, Yuanci
https://theses.hal.science/tel-02275816

2018

Terahertz imaging and spectroscopy of biomedical tissues : application to breast cancer detection
Al-Ibadi, Amel
https://theses.hal.science/tel-01834560

Characterization and simulation of defects induced by a continuous wave laser during electrical failure analysis on the 28FDSOI technology
Penzes, Maxime
https://theses.hal.science/tel-01783955

Fast 3D terahertz imaging
Perraud, Jean-Baptiste
https://theses.hal.science/tel-01949401

2016

Imagerie et spectroscopie térahertz : application aux problématiques de défense et de sécurité
Bou Sleiman, Joyce
https://theses.hal.science/tel-01343342

2014

Integrated circuit analysis by laser probing techniques
Rebaï, Mohamed Mehdi
https://theses.hal.science/tel-01150670

2013

Study, applications and improvements of the LVI technique on the advanced CMOS technologies 45nm and below.
Celi, Guillaume
https://theses.hal.science/tel-00904697

Prediction tool development of an Integrated Circuit behavior under laser impact in CMOS technology
Godlewski, Catherine
https://theses.hal.science/tel-00958998

Study of the atmospherical neutrons effect on electronic components embbeded for avionics application and search of hardening solutions
Renard, Sébastien
https://theses.hal.science/tel-01015741

2012

DEVELOPPEMENT ET APPLICATIONS DE TECHNIQUES LASER IMPULSIONNELLES POUR L'ANALYSE DE DEFAILLANCE DES CIRCUITS INTEGRES
Faraud, Emeric
https://theses.hal.science/tel-00997458

NOUVELLES METHODES D'IMAGERIE HAUTE RESOLUTION POUR L'ANALYSE DES COMPOSANTS NANOELECTRONIQUES
Shao, Kai
https://theses.hal.science/tel-00997436

2010

Terahertz-Nahfeldmikroskopie
Guillet, Jean-Paul
https://theses.hal.science/tel-01316243

METHODOLOGIE DE LOCALISATION DES DEFAUTS SOFT DANS LES CIRCUITS INTEGRES MIXTES ET ANALOGIQUES PAR STIMULATION PAR FAISCEAU LASER : ANALYSE DE RESULTATS DES TECHNIQUES DYNAMIQUES PARAMETRIQUES
Sienkiewicz, Magdalena
https://theses.hal.science/tel-00998834

2009

Etude des effets singuliers transitoires dans les amplificateurs opérationnels linéaires par photogénération impulsionnelle non-linéaire
Jaulent, Patrice
https://theses.hal.science/tel-00997385