NANOELECTRONIQUE
Présentation
Les objets de la recherche de l'équipe Nanoélectronique concernent les composants émergeants comme le transistor à nanotube de carbone, le Graphene-FET, les transistors hyperfréquences (SiGe et III-V) et les circuits à base de technologies avancées. Les thèmes clés sont la caractérisation électro-optique, l'analyse de défaillances et la fiabilité, la caractérisation hyperfréquences et la modélisation compacte. Les méthodes de recherche sont communes à toutes les actions : à partir d'une analyse physique, souvent appuyée par les outils de simulation de type éléments finis, les phénomènes observés sont étudiés, approfondis et expliqués. L'équipe s'appuie sur deux plateformes technologiques très avancées (Atlas et Nanocom). Un juste équilibre entre le caractère fondamental et le caractère appliqué des recherches permet à l'équipe de répondre aux enjeux stratégiques définis par le laboratoire.
Trois thématiques sont développées au sein de l'équipe Nanoélectronique :
- Test et analyse par faisceaux laser et terahertz , Responsable : Jean Paul Guillet
- Modélisation compacte et caractérisation des dispositifs électroniques, Responsable : Cristell Maneux
Membres
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| Sébastien Frégonèse, CR | Thomas Zimmer, PR | ||||
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| Patrick Mounaix, DR | Dean Lewis, PR |
Frédéric Darracq, MCF | Frédéric Fauquet, IE | ||
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| Damien Bigourd CR | Jean-Paul Guillet, MCF |
Compétences
- Caractérisation électriques DC, AC et grand signal des transistors
- Modélisation compacte de composants beyond CMOS
- Caractérisation et modélisation électro-thermique des transistors
- Analyse de fiabilité de transistors GaN
- Caractérisation opto-électrique de composants et circuits
- Test par faisceau laser et terahertz pour la détection de défauts dans les composants et matériaux.
- Analyse de la sensibilité des circuits et systèmes aux effets des rayonnements.
- Injection de fautes par laser et onde terahertz.
- Spectro Imagerie terahertz et Contrôle non destructif
Publications
Total : 1097
Articles dans des revues avec comité de lecture → 348 Voir
2023
A TCAD-based Analysis of Substrate Bias Effect on Asymmetric Lateral SiGe HBT for THz Applications
Panda, Soumya Ranjan ; Fregonese, Sebastien ; Chevalier, Pascal ; Chakravorty, Anjan ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-04037634
2022
HOBIT. Un concept innovant pour la transformation des pratiques pédagogiques en physique
Bousquet, Bruno ; Canioni, Lionel ; Guillet, Jean-Paul ; Fleck, Stéphanie ; Normand, Erwan ; Hachet, Martin
Dans : Reflets de la Physique
https://hal.science/hal-03783053
Terahertz Nondestructive Testing with Ultra-Wideband FMCW Radar
Carre, Barnabe ; Chopard, Adrien ; Guillet, Jean-Paul ; Fauquet, Frederic ; Mounaix, Patrick ; Gellie, Pierre
Dans : Sensors
https://hal.science/hal-03930018
Single-scan multiplane phase retrieval with a radiation of terahertz quantum cascade laser
Chopard, Adrien ; Tsiplakova, Elizaveta ; Balbekin, Nikolay ; Smolyanskaya, Olga ; Perraud, Jean-Baptiste ; Guillet, Jean-Paul ; Petrov, Nikolay ; Mounaix, Patrick
Dans : Applied Physics B - Laser and Optics
https://hal.science/hal-03845696
Single-scan multiplane phase retrieval with a radiation of terahertz quantum cascade laser
Chopard, Adrien ; Tsiplakova, Elizaveta ; Balbekin, Nikolay ; Smolyanskaya, Olga ; Perraud, Jean-Baptiste ; Guillet, Jean Paul ; Petrov, Nikolay V. ; Mounaix, Patrick
Dans : Applied Physics B - Laser and Optics
https://hal.science/hal-03692289
Concours CUBE2020 et réduction de l’impact environnemental du laboratoire IMS
Dejous, Corinne ; Alquier, Benoît ; Ferré, Guillaume ; Hirsch, Lionel ; Salotti, Jean-Marc ; Villesuzanne, Patrick ; Zimmer, Thomas
Dans : Journal sur l'enseignement des sciences et technologies de l'information et des systèmes
https://inria.hal.science/hal-03939893
Optimizing Finger Spacing in Multi-Finger Bipolar Transistors for Minimal Electrothermal Coupling
Gupta, Aakashdeep ; Nidhin, K. ; Balanethiram, Suresh ; Yadav, Shon ; Fregonese, Sebastien ; Zimmer, Thomas ; Chakravorty, Anjan
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-03846331
Avancées technologiques des sources et capteurs térahertz - Vers le transfert industriel
Mounaix, Patrick
Dans : Les Techniques de l'Ingenieur
https://hal.science/hal-03919736
Selective sublimation of GaN and regrowth of AlGaN to co-integrate enhancement mode and depletion mode high electron mobility transistors
Ngo, Thi Huong ; Comyn, Rémi ; Chenot, Sébastien ; Brault, Julien ; Nemoz, Maud ; Vennéguès, Philippe ; Damilano, Benjamin ; Vézian, S. ; Frayssinet, Eric ; Cozette, Flavien ; Defrance, N. ; Lecourt, François ; Labat, Nathalie ; Maher, Hassan ; Cordier, Yvon
Dans : Journal of Crystal Growth
https://hal.science/hal-03741626
Combination of selective area sublimation of p-GaN and regrowth of AlGaN for the co-integration of enhancement mode and depletion mode high electron mobility transistors
Ngo, Thi Huong ; Comyn, Rémi ; Chenot, Sébastien ; Brault, Julien ; Damilano, Benjamin ; Vezian, Stephane ; Frayssinet, Eric ; Cozette, Flavien ; Defrance, N. ; Lecourt, François ; Labat, Nathalie ; Maher, Hassan ; Cordier, Yvon
Dans : Solid-State Electronics
https://hal.science/hal-03467546
BEOL Thermal Resistance Extraction in SiGe HBTs
Nidhin, K. ; Balanethiram, Suresh ; Nair, Deleep ; d'Esposito, Rosario ; Mohapatra, Nihar ; Fregonese, Sebastien ; Zimmer, Thomas ; Chakravorty, Anjan
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-03846371
Scanning point terahertz source microscopy of unstained comedo ductal carcinoma in situ
Okada, Kosuke ; Cassar, Quentin ; Murakami, Hironaru ; Macgrogan, Gaëtan ; Guillet, Jean Paul ; Mounaix, Patrick ; Tonouchi, Masayoshi ; Serita, Kazunori
Dans : Optics Continuum
https://hal.science/hal-03691895
The thermodynamic properties of interstellar isomers with 3 atoms
Oladimeji, Enock ; Etim, Emmanuel ; Ojo, Moses
Dans : Advances in Space Research
https://hal.science/hal-04017404
A Comprehensive Analysis of AlN spacer and AlGaN n-doping effects on the 2DEG Resistance in AlGaN/AlN/GaN Heterostructures
Piotrowicz, C. ; Mohamad, B. ; Rrustemi, B. ; Malbert, N. ; Jaud, M. A. ; Vandendaele, W. ; Charles, M. ; Gwoziecki, R.
Dans : Solid-State Electronics
https://hal.science/hal-03722735
A Technique for the in-situ Experimental Extraction of the Thermal Impedance of Power Devices
Scognamillo, Ciro ; Fregonese, Sebastien ; Zimmer, Thomas ; Daalessandro, Vincenzo ; Catalano, Antonio Pio
Dans : IEEE Transactions on Power Electronics
https://hal.science/hal-03776377
Tunable ultra-fast infrared generation in a gas-filled hollow core capillary by a four-wave mixing process: erratum
Zurita-Miranda, Olivia ; Fourcade-Dutin, Coralie ; Fauquet, Frederic ; Darracq, Frederic ; Guillet, Jean-Paul ; Mounaix, Patrick ; Maillotte, Herve ; Bigourd, Damien
Dans : Journal of the Optical Society of America B
https://hal.science/hal-03896790
Tunable ultrafast infrared generation in a gas-filled hollow-core capillary by a four-wave mixing process
Zurita Miranda, Olivia ; Fourcade Dutin, Coralie ; Fauquet, Frédéric ; Darracq, Frédéric ; Guillet, Jean-Paul ; Mounaix, Patrick ; Maillotte, Hervé ; Bigourd, Damien
Dans : Journal of the Optical Society of America B (JOSA B)
https://hal.science/hal-03813294
Tunable ultra-fast infrared generation in a gas-filled hollow core capillary by a four-wave mixing process
Zurita-Miranda, Olivia ; Fourcade-Dutin, Coralie ; Fauquet, Frederic ; Darracq, Frederic ; Guillet, Jean-Paul ; Mounaix, Patrick ; Maillotte, Herve ; Bigourd, Damien
Dans : Journal of the Optical Society of America B
https://hal.science/hal-03558771
2021
Stability of the threshold voltage in fluorine-implanted normally-off AlN/GaN HEMTs co-integrated with commercial normally-on GaN HEMT technology
Albany, Florent ; Lecourt, François ; Walasiak, Ewa ; Defrance, N. ; Curutchet, Arnaud ; Maher, Hassan ; Cordier, Yvon ; Labat, Nathalie ; Malbert, Nathalie
Dans : Microelectronics Reliability
https://hal.science/hal-03539673
Meander-Type Lines: An Innovative Design for On-Wafer TRL Calibration for mmW and sub-mmW Frequencies Measurements
Cabbia, Marco ; Fregonese, Sebastien ; Deng, Marina ; Curutchet, Arnaud ; Yadav, Chandan ; Celi, Didier ; de Matos, Magali ; Zimmer, Thomas
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.science/hal-03273404
Terahertz refractive index-based morphological dilation for breast carcinoma delineation
Cassar, Quentin ; Caravera, Samuel ; Macgrogan, Gaëtan ; Bücher, Thomas ; Hillger, Philipp ; Pfeiffer, Ullrich ; Zimmer, Thomas ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : Scientific Reports
https://hal.science/hal-03273518
Towards Monolithic Indium Phosphide (InP)-Based Electronic Photonic Technologies for beyond 5G Communication Systems
Chhandak, Mukherjee ; Deng, Marina ; Nodjiadjim, Virginie ; Riet, Muriel ; Mismer, Colin ; Guendouz, Djeber ; Caillaud, Christophe ; Bertin, Hervé ; Vaissiere, Nicolas ; Luisier, Mathieu ; Wen, Xin ; de Matos, Magali ; Mounaix, Patrick ; Maneux, Cristell
Dans : Applied Sciences
https://hal.science/hal-03163305
Terahertz waves for contactless control and imaging in aeronautics industry
Chopard, A. ; Cassar, Q. ; Bou-Sleiman, J. ; Guillet, J.P. ; Pan, M. ; Perraud, J.B. ; Susset, A. ; Mounaix, Patrick
Dans : NDT & E International
https://hal.science/hal-03434613
Terahertz waves for contactless control and imaging in aeronautics industry
Chopard, A. ; Cassar, Q. ; Bou-Sleiman, J. ; Guillet, Jean-Paul ; Pan, M. ; Perraud, J.B. ; Susset, A. ; Mounaix, P.
Dans : NDT & E International
https://hal.science/hal-03273555
New barrier layer design for the fabrication of gallium nitride-metal-insulator-semiconductor-high electron mobility transistor normally-off transistor
Cozette, Flavien ; Hassan, Bilal ; Rodriguez, Christophe ; Frayssinet, Eric ; Comyn, Rémi ; Lecourt, François ; Defrance, N. ; Labat, Nathalie ; Boone, François ; Soltani, Ali ; Jaouad, Abdelatif ; Cordier, Yvon ; Maher, Hassan
Dans : Semiconductor Science and Technology
https://hal.science/hal-03341284
Mid-infrared ultra-short pulse generation in a gas filled hollow-core fiber pumped by two pulses
Fourcade-Dutin, Coralie ; Miranda, Olivia ; Mounaix, Patrick ; Bigourd, Damien
Dans : Fibers
https://hal.science/hal-03194763
Importance of Probe Choice for Extracting Figures of Merit of Advanced mmW Transistors
Fregonese, Sebastien ; de Matos, Magali ; Deng, Marina ; Celi, Didier ; Derrier, Nicolas ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-03776416
Multiscale compact modelling of UTC-photodiodes enabling monolithic terahertz communication systems design
Guendouz, Djeber ; Chhandak, Mukherjee ; Deng, Marina ; de Matos, Magali ; Caillaud, Christophe ; Bertin, Hervé ; Bobin, Antoine ; Vaissière, Nicolas ; Mekhazni, Karim ; Mallecot, Franck ; Arabhavi, Akshay ; Chaudhary, Rimjhim ; Ostinelli, Olivier ; Bolognesi, Colombo ; Mounaix, Patrick ; Maneux, Cristell
Dans : Applied Sciences
https://hal.science/hal-03847207
Extraction of True Finger Temperature from Measured Data in Multi-Finger Bipolar Transistors
Gupta, Aakashdeep ; Nidhin, K. ; Balanethiram, Suresh ; d'Esposito, Rosario ; Fregonese, Sebastien ; Zimmer, Thomas ; Chakravorty, Anjan
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-03273341
Multiscale Compact Modelling of UTC-Photodiodes Enabling Monolithic Terahertz Communication Systems Design
Maneux, Cristell ; Mounaix, Patrick ; Bolognesi, Colombo ; Ostinelli, Olivier ; Chaudhary, Rimjhim ; Arabhavi, Akshay ; Mallecot, Franck ; Mekhazni, Karim ; Vaissière, Nicolas ; Bobin, Antoine ; Bertin, Hervé ; Caillaud, Christophe ; de Matos, Magali ; Deng, Marina ; Mukherjee, Chhandak ; Guendouz, Djeber
Dans : Applied Sciences
https://hal.science/hal-03657756
Investigation of Oil Shale Response Using Terahertz-Time Domain Spectroscopy
Ojo, Moses Eshovo ; Mounaix, Patrick ; Bigourd, Damien
Dans : petroleum technology development journal
https://hal.science/hal-03161931
Label-Free Observation of Micrometric Inhomogeneity of Human Breast Cancer Cell Density Using Terahertz Near-Field Microscopy
Okada, Kosuke ; Cassar, Quentin ; Murakami, Hironaru ; Macgrogan, Gaëtan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Tonouchi, Masayoshi ; Serita, Kazunori
Dans : Photonics
https://hal.science/hal-03273542
Sub-THz and THz SiGe HBT Electrical Compact Modeling
Saha, Bishwadeep ; Fregonese, Sebastien ; Chakravorty, Anjan ; Panda, Soumya Ranjan ; Zimmer, Thomas
Dans : Electronics
https://hal.science/hal-03273304
Reliable Technology Evaluation of SiGe HBTs and MOSFETs: f MAX Estimation From Measured Data
Saha, Bishwadeep ; Fregonese, Sébastien ; Heinemann, Bernd ; Scheer, Patrick ; Chevalier, Pascal ; Aufinger, Klaus ; Chakravorty, Anjan ; Zimmer, Thomas
Dans : IEEE Electron Device Letters
https://hal.science/hal-03111195
TeraPulse Lx for terahertz imaging of painting on canvas
Sirro, Sergei ; Odlyanitskiy, Evgeniy ; Portieri, Alessia ; Taday, Phil ; Arnone, Donald ; Guillet, Jean-Paul ; Smolyanskaya, Olga
Dans : Journal of Physics: Conference Series
https://hal.science/hal-03273528
Investigation of Variation in on-Si on-Wafer TRL Calibration in sub-THz
Yadav, Chandan ; Deng, Marina ; Fregonese, Sebastien ; Cabbia, Marco ; de Matos, Magali ; Zimmer, Thomas
Dans : IEEE Transactions on Semiconductor Manufacturing
https://hal.science/hal-03273325
SiGe HBTs and BiCMOS technology for present and future millimeter-wave system
Zimmer, Thomas ; Bock, Josef ; Buchali, Fred ; Chevalier, Pascal ; Collisi, Michael ; Debaillie, Bjorn ; Deng, Marina ; Ferrari, Philippe ; Fregonese, Sebastien ; Gaquière, Christophe ; Ghanem, Haitham ; Hettrich, Horst ; Karakuzulu, Alper ; Maiwald, Tim ; Margalef-Rovira, Marc ; Maye, Caroline ; Moller, Michael ; Mukherjee, Anindya ; Rucker, Holger ; Sakalas, Paulius ; Schmid, Rolf ; Schneider, Karina ; Schuh, Karsten ; Templ, Wolfgang ; Visweswaran, Akshay ; Zwick, Thomas
Dans : IEEE Journal of Microwaves
https://hal.science/hal-03111157
2020
Silicon Test Structures Design for Sub-THz and THz Measurements
Cabbia, Marco ; Yadav, Chandan ; Deng, Marina ; Fregonese, Sebastien ; de Matos, Magali ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-03015973
Characterization of Varnish Ageing and its Consequences on Terahertz Imagery: Demonstration on a Painting Presumed of the French Renaissance
Cassar, Q. ; Koch-Dandolo, C. ; Guillet, Jean-Paul ; Roux, M. ; Fauquet, F. ; Perraud, J. ; Mounaix, P.
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-03273504
Using soy protein in the three-component phantom for breast cancer mimicking
Cassar, Q. ; Lykina, A.A. ; Lepeshkin, A.I. ; Baranenko, D.A. ; Kravtsenyuk, O.V. ; Mounaix, P. ; Guillet, J.-P. ; Smolyanskaya, O.A.
Dans : Journal of Physics: Conference Series
https://hal.science/hal-02891061
A unified aging compact model for hot carrier degradation under mixed-mode and reverse E-B stress in complementary SiGe HBTs
Chhandak, Mukherjee ; Fischer, G.G. ; Marc, F ; Couret, Marine ; Zimmer, Thomas ; Maneux, Cristell
Dans : Solid-State Electronics
https://hal.science/hal-03014952
Scalable compact modeling of trap generation near the EB spacer oxide interface in SiGe HBTs
Couret, Marine ; Jaoul, Mathieu ; Marc, François ; Mukherjee, Chhandak ; Celi, Didier ; Zimmer, Thomas ; Maneux, Cristell
Dans : Solid-State Electronics
https://hal.science/hal-02541991
High-Frequency Noise Characterization and Modeling of Graphene Field-Effect Transistors
Deng, Marina ; Fadil, Dalal ; Wei, Wei ; Pallecchi, Emiliano ; Happy, Henri ; Dambrine, Gilles ; de Matos, Magali ; Zimmer, Thomas ; Frégonèse, Sébastien
Dans : IEEE Transactions on Microwave Theory and Techniques
https://hal.science/hal-02540064
A broadband active microwave monolithically integrated circuit balun in graphene technology
Fadil, Dalal ; Passi, Vikram ; Wei, Wei ; Salk, Soukaina ; Zhou, Di ; Strupinski, Wlodek ; Lemme, Max ; Zimmer, Thomas ; Pallecchi, Emiliano ; Happy, Henri ; Fregonese, Sebastien
Dans : Applied Sciences
https://hal.science/hal-02884085
Analysis of High-Frequency Measurement of Transistors Along With Electromagnetic and SPICE Cosimulation
Fregonese, Sebastien ; Cabbia, Marco ; Yadav, Chandan ; Deng, Marina ; Panda, Soumya Ranjan ; Matos, Magali De ; Celi, Didier ; Chakravorty, Anjan ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-03015012
THz characterization and modeling of SiGe HBTs: review (invited)
Fregonese, Sebastien ; Deng, Marina ; Cabbia, Marco ; Yadav, Chandan ; de Matos, Magali ; Zimmer, Thomas
Dans : IEEE Journal of the Electron Devices Society
https://hal.science/hal-03014869
Static Thermal Coupling Factors in Multi-Finger Bipolar Transistors: Part II-Experimental Validation
Gupta, Aakashdeep ; Nidhin, K ; Balanethiram, Suresh ; Yadav, Shon ; Chakravorty, Anjan ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : Electronics
https://hal.science/hal-02920343
Static Thermal Coupling Factors in Multi-Finger Bipolar Transistors: Part I—Model Development
Gupta, Aakashdeep ; Nidhin, K ; Balanethiram, Suresh ; Yadav, Shon ; Chakravorty, Anjan ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : Electronics
https://hal.science/hal-02920341
An Efficient Thermal Model for Multifinger SiGe HBTs Under Real Operating Condition
K, Nidhin ; Pande, Shubham ; Yadav, Shon ; Balanethiram, Suresh ; Nair, Deleep ; Fregonese, Sebastien ; Zimmer, Thomas ; Chakravorty, Anjan
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-03015948
Fast Terahertz Spectroscopic Holographic Assessment of Optical Properties of Diabetic Blood Plasma
Mounaix, Patrick ; Kulya, Maksim ; Odlyanitskiy, Evgeniy ; Cassar, Quentin ; Mustafin, Ilia ; Trukhin, Valery ; Gavrilova, Polina ; Korolev, Dmitry ; Kononova, Yulia ; Balbekin, Nikolay ; Guillet, Jean-Paul ; Petrov, Nikolay ; Smolyanskaya, Olga
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-03000003
Terahertz near-field microscopy of ductal carcinoma in situ (DCIS) of the breast
Mounaix, Patrick ; Okada, Kosuke ; Serita, Kazunori ; Cassar, Quentin ; Murakami, Hironaru ; Macgrogan, Gaëtan ; Guillet, Jean-Paul ; Tonouchi, Masayoshi
Dans : Journal of Physics: Photonics
https://hal.science/hal-02999983
Efficient compact modelling of UTC-photodiode towards terahertz communication system design
Mukherjee, Chhandak ; Natrella, Michele ; Seddon, James ; Graham, Chris ; Mounaix, Patrick ; Renaud, Cyril ; Maneux, Cristell
Dans : Solid-State Electronics
https://hal.science/hal-02651295
A physical and versatile aging compact model for hot carrier degradation in SiGe HBTs under dynamic operating conditions
Mukherjee, C. ; Marc, F. ; Couret, M. ; Fischer, G.G. ; Jaoul, M. ; Céli, D. ; Aufinger, K. ; Zimmer, T. ; Maneux, C.
Dans : Solid-State Electronics
https://hal.science/hal-02475429
Guided Reflectometry Imaging Unit using Millimeter Wave FMCW Radars
Pan, M ; Chopard, A. ; Fauquet, F. ; Mounaix, P. ; Guillet, J.-P
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.science/hal-02896005
Guided terahertz pulse reflectometry with double photoconductive antenna
Pan, Mingming ; Cassar, Quentin ; Fauquet, Frederic ; Humbert, Georges ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : Applied optics
https://hal.science/hal-02476707
TCAD and EM co-simulation method to verify SiGe HBT measurements up to 500 GHz
Panda, Soumya Ranjan ; Fregonese, Sebastien ; Deng, Marina ; Chakravorty, Anjan ; Zimmer, Thomas
Dans : Solid-State Electronics
https://hal.science/hal-03016002
Terahertz Phase Retrieval Imaging in Reflection
Petrov, Nikolai ; Perraud, Jean-Baptiste ; Chopard, Adrien ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : Optics Letters
https://hal.science/hal-02891064
Spectral correlation of four wave mixing generated in a photonic crystal fiber pumped by a chirped pulse
Robert, Paul ; Fourcade-Dutin, Coralie ; Dauliat, Romain ; Jamier, Raphaël ; Muñoz-Marco, Hector ; Perez-Millan, Pere ; Dudley, John ; Roy, Philippe ; Maillotte, Herve ; Bigourd, Damien
Dans : Optics Letters
https://hal.science/hal-02965800
Modeling radiative-shocks created by laser- cluster interactions
Scott, R ; Booth, N ; Hawkes, S ; Symes, D ; Hooker, C ; Doyle, H. ; Olsson-Robbie, S ; Lowe, H ; Price, C ; Bigourd, D. ; Patankar, S ; Mecseki, K ; Gumbrell, E ; Smith, R
Dans : Physics of Plasmas
https://hal.science/hal-02523915
Importance and Requirement of frequency band specific RF probes EM Models in sub-THz and THz Measurements up to 500 GHz
Yadav, Chandan ; Deng, Marina ; Fregonese, Sebastien ; Cabbia, Marco ; de Matos, Magali ; Plano, Bernard ; Zimmer, Thomas
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.science/hal-02884144
2019
Validation of Thermal Resistance Extracted From Measurements on Stripe Geometry SiGe HBTs
Balanethiram, Suresh ; d'Esposito, Rosario ; Fregonese, Sebastien ; Chakravorty, Anjan ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-02277502
Iterative Tree Algorithm to Evaluate Terahertz Signal Contribution of Specific Optical Paths within Multi-Layered Materials
Cassar, Quentin ; Chopard, Adrien ; Fauquet, Frederic ; Guillet, Jean-Paul ; Pan, Mingming ; Perraud, Jean-Baptiste ; Mounaix, Patrick
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.univ-grenoble-alpes.fr/hal-02335825
Long term accelerated ageing of an ASIC dedicated to cryptographic application
Coutet, Julien ; Doche, Emmanuel ; Guétard, Romain ; Janvresse, Aurélien ; Lavagne, Suzel ; Lebossé, Pierre ; Pastre, Antonin ; Sarlotte, Michel ; Moreau, Christian ; Marc, Francois ; Bayle, Franck
Dans : Microelectronics Reliability
https://hal.science/hal-02394907
Comparison of on-wafer TRL calibration to ISS SOLT calibration with open-short de-embedding up to 500 GHz
Fregonese, Sebastien ; Deng, Marina ; de Matos, Magali ; Yadav, Chandan ; Raya, Christian ; Ardouin, Bertrand ; Joly, Simon ; Plano, Bernard ; Zimmer, Thomas
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.science/hal-01985495
A Compact Formulation for Avalanche Multiplication in SiGe HBTs at High Injection Levels
Jaoul, Mathieu ; Maneux, Cristell ; Celi, Didier ; Schröter, Michael ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-02379143
Terahertz Spectroscopy and Quantum Mechanical Simulations of Crystalline Copper-Containing Historical Pigments
Kleist, Elyse ; Koch Dandolo, Corinna ; Guillet, Jean-Paul ; Mounaix, Patrick ; Korter, Timothy
Dans : Journal of Physical Chemistry A
https://hal.univ-grenoble-alpes.fr/hal-02009689
Investigation of trap induced power drift on 0.15µm GaN technology after aging tests
Magnier, Florent ; Lambert, Benoit ; Chang, Christophe ; Curutchet, Arnaud ; Labat, Nathalie ; Malbert, Nathalie
Dans : Microelectronics Reliability
https://hal.science/hal-02462730
Impact of temperature on calendar ageing of Lithium-ion battery using incremental capacity analysis
Maures, Matthieu ; Zhang, Yuanci ; Martin, Cyril ; Deletage, Jean-Yves ; Vinassa, Jean-Michel ; Briat, Olivier
Dans : Microelectronics Reliability
https://hal.science/hal-02506186
Scalable Modeling of Thermal Impedance in InP DHBTs Targeting Terahertz Applications
Mukherjee, Chhandak ; Couret, Marine ; Nodjiadjim, Virginie ; Riet, Muriel ; Dupuy, J.-Y. ; Fregonese, Sebastien ; Zimmer, Thomas ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-02372518
Scanning laser terahertz near-field reflection imaging system
Okada, Kosuke ; Serita, Kazunori ; Zang, Zirui ; Murakami, Hironaru ; Kawayama, Iwao ; Cassar, Quentin ; Macgrogan, Gaetan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Tonouchi, Masayoshi
Dans : Applied Physics Express
https://hal.science/hal-02347269
Shape-from-focus for real-time terahertz 3D imaging
Perraud, J.-B. ; Guillet, J.-P. ; Redon, O. ; Simoens, F. ; Mounaix, Patrick
Dans : Optics Letters
https://hal.univ-grenoble-alpes.fr/hal-02009683
Ex Vivo Breast Tumor Identification: Advances Toward a Silicon-Based Terahertz Near-Field Imaging Sensor
Pfeiffer, Ullrich ; Hillger, Philipp ; Jain, Ritesh ; Grzyb, Janusz ; Bucher, Thomas ; Cassar, Quentin ; Macgrogan, Gaetan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Zimmer, Thomas
Dans : IEEE Microwave Magazine
https://hal.univ-grenoble-alpes.fr/hal-02890448
Multimodal Optical Diagnostics of Glycated Biological Tissues
Smolyanskaya, O. ; Lazareva, E. ; Nalegaev, S. ; Petrov, N. ; Zaytsev, K. ; Timoshina, P. ; Tuchina, D. ; Toropova, Ya. ; Kornyushin, O. ; Babenko, A. Yu. ; Guillet, J.-P. ; Tuchin, V.
Dans : Биохимия / Biochemistry
https://hal.science/hal-02342804
A Multiscale TCAD Approach for the Simulation of InP DHBTs and the Extraction of Their Transit Times
Wen, Xin ; Mukherjee, Chhandak ; Raya, Christian ; Ardouin, Bertrand ; Deng, Marina ; Fregonese, Sebastien ; Nodjiadjim, Virginie ; Riet, Muriel ; Quan, Wei ; Arabhavi, Akshay ; Ostinelli, Olivier ; Bolognesi, Colombo ; Maneux, Cristell ; Luisier, Mathieu
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-02379133
Non-isothermal Ragone plots of Li-ion cells from datasheet and galvanostatic discharge tests
Zhang, Yuanci ; Briat, Olivier ; Boulon, Loïc ; Delétage, Jean-Yves ; Martin, Cyril ; Coccetti, Fabio ; Vinassa, Jean-Michel
Dans : Applied Energy
https://hal.science/hal-02117604
2018
Simulation and modelling of long term reliability of digital circuits implemented in FPGA
Aguirre Morales, J.D. ; Marc, F. ; Bensoussan, A. ; Durier, A.
Dans : Microelectronics Reliability
https://hal.science/hal-01946442
Pilot study of freshly excised breast tissue response in the 300 – 600 GHz range
Cassar, Quentin ; Al-Ibadi, Amel ; Mavarani, Laven ; Hillger, Philipp ; Grzyb, Janusz ; Macgrogan, Gaetan ; Zimmer, Thomas ; Pfeiffer, Ullrich ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : Biomedical optics express
https://hal.science/hal-01923517
Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories
Coutet, Julien ; Marc, Francois ; Dozolme, Flavien ; Guétard, Romain ; Janvresse, Aurélien ; Lebossé, Pierre ; Pastre, Antonin ; Clément, Jean-Claude
Dans : Microelectronics Reliability
https://hal.science/hal-01946449
Analysis of Electrothermal and Impact-Ionization Effects in Bipolar Cascode Amplifiers
d'Alessandro, Vincenzo ; d'Esposito, Rosario ; Metzger, Andre ; Kwok, Kai ; Aufinger, Klaus ; Zimmer, Thomas ; Rinaldi, Niccolo
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01695662
Terahertz frequency modulated continuous wave imaging advanced data processing for art painting analysis
Dandolo, Corinna ; Guillet, Jean-Paul ; Ma, Xue ; Fauquet, Frederic ; Roux, Marie ; Mounaix, Patrick
Dans : Optics Express
https://u-bourgogne.hal.science/hal-01718044
On-Wafer Characterization of Silicon Transistors Up To 500 GHz and Analysis of Measurement Discontinuities Between the Frequency Bands
Fregonese, Sebastien ; de Matos, Magali ; Deng, Marina ; Potéreau, Manuel ; Ayela, Cédric ; Aufinger, Klaus ; Zimmer, Thomas
Dans : IEEE Transactions on Microwave Theory and Techniques
https://hal.science/hal-01818021
Terahertz pulse time-domain holography method for phase imaging of breast tissue
Hillger, Philipp ; Jain, Ritesh ; Grzyb, Janusz ; Forster, Wolfgang ; Heinemann, Bernd ; Macgrogan, Gaetan ; Mounaix, Patrick ; Zimmer, Thomas ; Pfeiffer, Ullrich
Dans : IEEE Journal of Solid-State Circuits
https://hal.univ-grenoble-alpes.fr/hal-02335929
NearSense – Advances Towards a Silicon-Based Terahertz Near-Field Imaging Sensor for Ex Vivo Breast Tumour Identification
Mounaix, Patrick ; Mavarani, Laven ; Hillger, Philipp ; Bucher, Thomas ; Grzyb, Janusz ; Cassar, Quentin ; Al-Ibadi, Amel ; Zimmer, Thomas ; Macgrogan, Gaetan ; Guillet, Jean-Paul ; Pfeiffer, Ullrich
Dans : Frequenz
https://hal.science/hal-01745775
Scalable Compact Modeling of III–V DHBTs: Prospective Figures of Merit Toward Terahertz Operation
Mukherjee, Chhandak ; Raya, Christian ; Ardouin, Bertrand ; Deng, Marina ; Fregonese, Sebastien ; Zimmer, Thomas ; Nodjiadjim, Virginie ; Riet, Muriel ; Dupuy, Jean-Yves ; Luisier, Mathieu ; Quan, Wei ; Arabhavi, Akshay ; Bolognesi, Colombo ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01985507
Terahertz biophotonics as a tool for studies of dielectric and spectral properties of biological tissues and liquids
Smolyanskaya, O.A. ; Chernomyrdin, N.V. ; Konovko, A.A. ; Zaytsev, I. ; Ozheredov, I. ; Guillet, Jean-Paul ; Cherkasova, P. ; Nazarov, M.M. ; Kozlov, S.A. ; Kistenev, Yu. ; Coutaz, J.-L. ; Mounaix, P. ; Vaks, V.L. ; Son, H. ; Cheon, H. ; Wallace, V.P. ; Feldman, Yu. ; Popov, I. ; Yaroslavsky, A.N. ; Shkurinov, A.P. ; Tuchin, V.V.
Dans : Progress in Quantum Electronics
https://hal.science/hal-01923488
Efficient state of health estimation of Li-ion battery under several ageing types for aeronautic applications
Zhang, Yuanci ; Briat, Olivier ; Delétage, Jean-Yves ; Martin, Cyril ; Chadourne, Nicolas ; Vinassa, Jean-Michel
Dans : Microelectronics Reliability
https://hal.science/hal-01892422
2017
A Large-Signal Monolayer Graphene Field-Effect Transistor Compact Model for RF-Circuit Applications
Aguirre-Morales, Jorge-Daniel ; Fregonese, Sébastien ; Mukherjee, Chhandak ; Wei, Wei ; Happy, Henri ; Maneux, Cristell ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01639648
Accurate Modeling of Thermal Resistance for On-Wafer SiGe HBTs Using Average Thermal Conductivity
Balanethiram, Suresh ; Chakravorty, Anjan ; d'Esposito, Rosario ; Fregonese, Sebastien ; Céli, Didier ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01639642
Extraction of BEOL Contributions for Thermal Resistance in SiGe HBTs
Balanethiram, Suresh ; d'Esposito, Rosario ; Chakravorty, Anjan ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01477147
Multiscaled simulation methodology for neuro-inspired circuits demonstrated with an organic memristor
Bennett, Christopher ; Lorival, Jean-Etienne ; Marc, François ; Cabaret, Théo ; Jousselme, Bruno ; Derycke, Vincent ; Klein, Jacques-Olivier ; Maneux, Cristell
Dans : IEEE Transactions on Multi-Scale Computing Systems
https://hal-cea.archives-ouvertes.fr/cea-01656702
Electrical Runaway in AlGaN/GaN HEMTs: Physical Mechanisms and Impact on Reliability
Brunel, Laurent ; Lambert, Benoit ; Carisetti, Dominique ; Malbert, Nathalie ; Curutchet, Arnaud ; Labat, Nathalie
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-02462652
Si/SiGe:C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications
Chevalier, Pascal ; Schroter, Michael ; Bolognesi, Colombo R. ; d'Alessandro, Vincenzo ; Alexandrova, Maria ; Bock, Josef ; Flickiger, Ralf ; Fregonese, Sébastien ; Heinemann, Bernd ; Jungemann, C. ; Lovblom, Rickard ; Maneux, Cristell ; Ostinelli, Olivier ; Pawlak, Andreas ; Rinaldi, Niccolo ; Rucker, Holger ; Wedel, Gerald ; Zimmer, Thomas
Dans : Proceedings of the IEEE
https://hal.science/hal-01639677
Thermal Penetration Depth Analysis and Impact of the BEOL Metals on the Thermal Impedance of SiGe HBTs
d'Esposito, Rosario ; Balanethiram, Suresh ; Battaglia, Jean-Luc ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : IEEE Electron Device Letters
https://hal.science/hal-01639596
Une « Mallette Scan Champ Proche » pour l’enseignement de la compatibilité électromagnétique
Dubois, Tristan ; Guillet, J-P. ; Duchamp, G. ; Tomas, J.
Dans : Journal sur l'enseignement des sciences et technologies de l'information et des systèmes
https://hal.science/hal-01698515
Art Painting Diagnostic Before Restoration with Terahertz and Millimeter Waves
Guillet, Jean-Paul ; Roux, M. ; Wang, K. ; Ma, Xue ; Fauquet, F. ; Balacey, H. ; Recur, B. ; Darracq, F. ; Mounaix, P.
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-01437051
TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : Microelectronics Reliability
https://hal.science/hal-01625567
Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit
Kamrani, Hamed ; Jabs, Dominic ; d'Alessandro, Vincenzo ; Rinaldi, Niccolo ; Jacquet, Thomas ; Maneux, Cristell ; Zimmer, Thomas ; Aufinger, Klaus ; Jungemann, Christoph
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01695268
Vertical charge transfer and lateral transport in graphene/germanium heterostructures
Kazemi, Alireza ; Vaziri, Sam ; Aguirre Morales, Jorge Daniel ; Fregonese, Sebastien ; Cavallo, Francesca ; Zamiri, Marziyeh ; Dawson, Noel ; Artyushkova, Kateryna ; Jiang, Ying Bing ; Brueck, Steven R. J. ; Krishna, Sanjay
Dans : ACS Applied Materials & Interfaces
https://hal.science/hal-01513606
Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis
Labat, Nathalie ; Marc, François ; Frémont, Helene ; Bafleur, Marise
Dans : Microelectronics Reliability
https://hal.science/hal-01660958
2D and 3D Terahertz Imaging and X-Rays CT for Sigillography Study
Mounaix, Patrick ; Guillet, Jean-Paul ; Fauquet, F. ; Balacey, H. ; Recur, B. ; Darracq, F. ; Fabre, M. ; Bassel, L. ; Bou Sleiman, J. ; Perraud, J.-B.
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-01653623
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit
Mukherjee, C. ; Jacquet, T. ; Chakravorty, A. ; Zimmer, T. ; Boeck, J. ; Aufinger, K. ; Maneux, C.
Dans : Microelectronics Reliability
https://hal.science/hal-01695265
Hot-Carrier Degradation in SiGe HBTs: A Physical and Versatile Aging Compact Model
Mukherjee, Chhandak ; Jacquet, Thomas ; Fischer, Gerhard ; Zimmer, Thomas ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01695254
Reliability-Aware Circuit Design Methodology for Beyond-5G Communication Systems
Mukherjee, Chhandak ; Ardouin, Bertrand ; Dupuy, Jean-Yves ; Nodjiadjim, Virginie ; Riet, Muriel ; Zimmer, Thomas ; Marc, François ; Maneux, Cristell
Dans : IEEE Transactions on Device and Materials Reliability
https://hal.science/hal-01670929
Enhanced Intrinsic Voltage Gain in Artificially Stacked Bilayer CVD Graphene Field Effect Transistors
Pandey, Himadri ; Aguirre-Morales, Jorge-Daniel ; Kataria, Satender ; Fregonese, Sébastien ; Passi, Vikram ; Iannazzo, Mario ; Zimmer, Thomas ; Alarcon, Eduard ; Lemme, Max C.
Dans : Annalen der Physik
https://hal.science/hal-01639708
Study of blood plasma optical properties in mice grafted with Ehrlich carcinoma in the frequencyrange 0.1–1.0 THz
Smolyanskaya, Olga ; Kravtsenyuk, O ; Panchenko, A.V. ; Cherkasova, A. V. ; Guillet, J.P. ; Odlyanitskiy, Evgeniy ; Khodzitsky, Mikhail
Dans : Quantum Electronics
https://u-bourgogne.hal.science/hal-01660495
2016
Efficient Modeling of Distributed Dynamic Self-Heating and Thermal Coupling in Multifinger SiGe HBTs
Balanethiram, Suresh ; d'Esposito, Rosario ; Chakravorty, Anjan ; Fregonese, Sebastien ; Celi, Didier ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01399074
Advanced Processing Sequence for 3-D THz Imaging
Balacey, Hugo ; Recur, Benoit ; Perraud, Jean-Baptiste ; Sleiman, Joyce ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : IEEE Transactions on Terahertz Science and Technology
https://hal.science/hal-01390881
Automatic process for time-frequency scan of VLSI
Boscaro, Anthony ; Jacquir, Sabir ; Melendez, Kevin ; Sanchez, Kevin ; Perdu, Philippe ; Binczak, Stéphane
Dans : Microelectronics Reliability
https://hal.science/hal-01465737
Analytic Estimation of Thermal Resistance in HBTs
Chakravorty, Anjan ; d'Esposito, Rosario ; Balanethiram, Suresh ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01399079
On the development of a novel high VSWR programmable impedance tuner
Curutchet, Arnaud ; Ghiotto, Anthony ; Potéreau, Manuel ; de Matos, Magali ; Fregonese, Sebastien ; Kerhervé, Eric ; Zimmer, Thomas
Dans : International Journal of Microwave and Wireless Technologies
https://hal.science/hal-01345690
Innovative SiGe HBT Topologies With Improved Electrothermal Behavior
d'Esposito, Rosario ; Fregonese, Sebastien ; Chakravorty, Anjan ; Chevalier, Pascal ; Celi, Didier ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01399080
A Study on Self-Heating and Mutual Thermal Coupling in SiGe Multi-Finger HBTs
Dwivedi, A. D. D. ; D’esposito, Rosario ; Sahoo, Amit Kumar ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : Journal of Electronic Materials
https://hal.science/hal-01399065
Comments on “Optimization of a Compact I–V Model for Graphene FETs: Extending Parameter Scalability for Circuit Design Exploration”
Fregonese, Sebastien ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01399083
2.5GHz integrated graphene RF power amplifier on SiC substrate
Hanna, T. ; Deltimple, N. ; Khenissa, S. ; Pallecchi, E. ; Happy, H. ; Frégonèse, S.
Dans : Solid-State Electronics
https://hal.science/hal-01399069
Splitting of magnetic dipole modes in anisotropic TiO2 micro-spheres
Khromova, Irina ; Kužel, Petr ; Brener, Igal ; Reno, John L. ; Chung Seu, U-Chan ; Elissalde, Catherine ; Maglione, Mario ; Mounaix, Patrick ; Mitrofanov, Oleg
Dans : Laser and Photonics Reviews
https://hal.science/hal-01370336
Reliability assessment of ultra-short gate length AlGaN/GaN HEMTs on Si substrate by on-state step stress
Lakhdar, Hadhemi ; Labat, Nathalie ; Curutchet, Arnaud ; Defrance, N. ; Lesecq, Marie ; Dejaeger, J.C. ; Malbert, Nathalie
Dans : Microelectronics Reliability
https://hal.science/hal-01718762
Long-Term Stable Organic Photodetectors with Ultra Low Dark Currents for High Detectivity Applications.
Marcin, Kielar ; Dhez, Olivier ; Pecastaings, Gilles ; Curutchet, Arnaud ; Hirsch, Lionel
Dans : Scientific Reports
https://hal.science/hal-01431863
Intrinsic Properties of Anisotropic Dielectric Micro-Resonators Obtained through Near-Field Terahertz Spectroscopy
Mounaix, Patrick ; Khromova, Irina ; Kuzel, P. ; Brener, Igal ; Reno, John L. ; Chung, U-Chan ; Elissalde, Catherine ; Maglione, Mario ; Mitrofanov, Oleg
Dans : Conference on Lasers and Electro-OpticsConference on Lasers and Electro-Optics, OSA Technical Digest (online) (Optical Society of America, 2016)
https://hal.science/hal-01390953
Low-Frequency Noise in Advanced SiGe:C HBTs—Part I: Analysis
Mukherjee, Chhandak ; Jacquet, Thomas ; Chakravorty, Anjan ; Zimmer, Thomas ; Bock, Josef ; Aufinger, Klaus ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01399855
Low-Frequency Noise in Advanced SiGe:C HBTs—Part II: Correlation and Modeling
Mukherjee, Chhandak ; Jacquet, Thomas ; Chakravorty, Anjan ; Zimmer, Thomas ; Bock, Josef ; Aufinger, Klaus ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01399852
FPGA LUT delay degradation due to HCI: Experiment and simulation results
Naouss, Mohammad ; Marc, F.
Dans : Microelectronics Reliability
https://hal.science/hal-01661820
Liquid index matching for 2D and 3D terahertz imaging
Perraud, J. B. ; Bou Sleiman, J. ; Recur, B. ; Balacey, H. ; Simoens, F. ; Guillet, J. P. ; Mounaix, P.
Dans : Applied optics
https://hal.science/hal-01394023
Terahertz imaging and tomography as efficient instruments for testing polymer additive manufacturing objects
Perraud, Jean Baptiste ; Obaton, Anne Françoise ; Bou-Sleiman, Joyce ; Recur, Benoit ; Balacey, Hugo ; Darracq, Frederic ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : Applied optics
https://hal.science/hal-01390875
Bulk magnetic terahertz metamaterials based on dielectric microspheres
Sindler, Michal ; Kadlec, Christelle ; Dominec, Filip ; Kužel, Petr ; Elissalde, Catherine ; Kassas, Ahmad ; Lesseur, Julien ; Bernard, Dominique ; Mounaix, Patrick ; Němec, Hynec
Dans : Optics Express
https://hal.science/hal-01373166
2015
An Accurate Physics-Based Compact Model for Dual-Gate Bilayer Graphene FETs
Aguirre-Morales, Jorge-Daniel ; Fregonese, Sebastien ; Mukherjee, Chhandak ; Maneux, Cristell ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01235964
Quantitative Analysis of Hexahydro-1,3,5-trinitro-1,3,5, Triazine/Pentaerythritol Tetranitrate (RDX–PETN) Mixtures by Terahertz Time Domain Spectroscopy
Bou Sleiman, Joyce ; Bousquet, Bruno ; Palka, Norbert ; Mounaix, Patrick
Dans : Applied Spectroscopy
https://hal.science/hal-01263720
Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes
del Vecchio, Pamela ; Curutchet, Arnaud ; Deshayes, Yannick ; Bettiati, Mauro ; Laruelle, François ; Labat, Nathalie ; Béchou, Laurent
Dans : Microelectronics Reliability
https://hal.science/hal-01214031
Effects of BEOL on self-heating and thermal coupling in SiGe multi-finger HBTs under real operating condition
Dwivedi, A.D.D. ; Chakravorty, Anjan ; D’esposito, Rosario ; Sahoo, Amit Kumar ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : Solid-State Electronics
https://hal.science/hal-01235941
Electrical Compact Modeling of Graphene Base Transistors
Frégonèse, Sébastien ; Venica, Stefano ; Driussi, Francesco ; Zimmer, Thomas
Dans : Advances in OptoElectronics
https://hal.science/hal-01235945
Source-Pull and Load-Pull Characterization of Graphene FET
Fregonese, Sebastien ; de Matos, Magali ; Mele, David ; Maneux, Cristell ; Happy, Henri ; Zimmer, Thomas
Dans : IEEE Journal of the Electron Devices Society
https://hal.science/hal-01090826
Low-frequency noise effect on terahertz tomography using thermal detectors.
Guillet, Jean-Paul ; Recur, Benoît ; Balacey, Hugo ; Bou Sleiman, Joyce ; Darracq, F. ; Lewis, Dean ; Mounaix, Patrick
Dans : Applied optics
https://hal.science/hal-01263737
Reliability of high-speed SiGe:C HBT under electrical stress close to the SOA limit
Jacquet, T. ; Sasso, G. ; Chakravorty, A. ; Rinaldi, N. ; Aufinger, K. ; Zimmer, T. ; d'Alessandro, V. ; Maneux, C.
Dans : Microelectronics Reliability
https://hal.science/hal-01695288
A way to implement the electro-optical technique to inertial MEMS
Melendez, K ; Desmoulin, A ; Sanchez, Kevin ; Perdu, Philippe ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-01264066
Versatile Compact Model for Graphene FET Targeting Reliability-Aware Circuit Design
Mukherjee, Chhandak ; Aguirre-Morales, Jorge-Daniel ; Fregonese, Sebastien ; Zimmer, Thomas ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01127979
Design and implementation of a low cost test bench to assess the reliability of FPGA
Naouss, Mohammad ; Marc, F.
Dans : Microelectronics Reliability
https://hal.science/hal-01661808
Investigation of the dynamic on-state resistance of AlGaN/GaN HEMTs
Rzin, Mehdi ; Labat, Nathalie ; Malbert, Nathalie ; Brunel, Laurent ; Lambert, Benoit ; Curutchet, Arnaud
Dans : Microelectronics Reliability
https://hal.science/hal-01718753
Nonlinear modelling of dynamic self-heating in 28 nm bulk complementary metal–oxide semiconductor technology
Sahoo, A.K. ; Fregonese, S. ; Scheer, P. ; Celi, D. ; Juge, A. ; Zimmer, T.
Dans : Electronics Letters
https://hal.science/hal-01162361
Obtaining DC and AC isothermal electrical characteristics for RF MOSFET
Sahoo, A.K. ; Fregonese, S. ; Scheer, P. ; Celi, D. ; Juge, A. ; Zimmer, T.
Dans : Solid-State Electronics
https://hal.science/hal-01127985
Pulsed radio frequency characterisation on 28 nm complementary metal–oxide semiconductor technology
Sahoo, A.K. ; Fregonese, S. ; Scheer, P. ; Celi, D. ; Juge, A. ; Zimmer, T.
Dans : Electronics Letters
https://hal.science/hal-01100656
A Geometry Scalable Model for Nonlinear Thermal Impedance of Trench Isolated HBTs
Sahoo, Amit Kumar ; Fregonese, Sebastien ; Desposito, Rosario ; Aufinger, Klaus ; Maneux, Cristell ; Zimmer, Thomas
Dans : IEEE Electron Device Letters
https://hal.science/hal-01090801
Isothermal Electrical Characteristic Extraction for mmWave HBTs
Sahoo, Amit Kumar ; Fregonese, Sebastien ; d'Esposito, Rosario ; Maneux, Cristell ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01090791
Remote Lab Experiments in Electronics for Use and Reuse
Zimmer, Thomas ; Billaud, M. ; Pic, M. ; Geoffroy, D.
Dans : International Journal of Interactive Mobile Technologies (iJIM)
https://hal.science/hal-01721447
Graphene Transistor-Based Active Balun Architectures
Zimmer, Thomas ; Fregonese, Sebastien
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01235955
2014
Innovative Dual-Gate CNTFET Logic Cell: Investigation of Technological Dispersion Impact Through Compact Modeling
Maneux, Cristell ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : IEEE Transactions on Nanotechnology
https://hal.science/hal-01090852
A comprehensive study of the application of the EOP techniques on bipolar devices
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Guillet, Jean-Paul ; Elise, Bernou ; Sanchez, Kevin ; Perdu, Philippe ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-01091179
Ordered subsets convex algorithm for 3D terahertz transmission tomography
Recur, Benoît ; Balacey, Hugo ; Bou Sleiman, Joyce ; Perraud, Jean-Baptiste ; Guillet, Jean-Paul ; Kingston, Andrew ; Mounaix, Patrick
Dans : Optics Express
https://hal.science/hal-01066999
A Comprehensive Graphene FET Model for Circuit Design
Rodriguez, Saul ; Vaziri, Sam ; Smith, Anderson ; Frégonèse, Sébastien ; Ostling, Mikael ; Lemme, Max ; Rusu, Ana
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00978699
InP HBT Thermal Management by Transferring to High Thermal Conductivity Silicon Substrate
Thiam, Ndèye Arame ; Roelens, Yannick ; Coinon, Christophe ; Avramovic, Vanessa ; Grandchamp, Brice ; Ducateau, D. ; Wallart, Xavier ; Maneux, Cristell ; Zaknoune, Mohamed
Dans : IEEE Electron Device Letters
https://hal.science/hal-01090844
Evaluation Plan and Preliminary Evaluation of a Network of Remote Labs in the Maghrebian Countries
Tsiatsos, Thrasyvoulos ; Douka, Stella ; Mavridis, Apostolos ; Tegos, Stergios ; Naddami, Ahmed ; Zimmer, Thomas ; Geoffroy, Didier
Dans : International Journal of Online Engineering (iJOE)
https://hal.science/hal-01721437
Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa
Wrobel, Frédéric ; Touboul, Antoine ; Pouget, Vincent ; Dilillo, Luigi ; Ecoffet, Robert ; Lorfèvre, Eric ; Bezerra, Francoise ; Brugger, Markus ; Saigné, Frédéric
Dans : IEEE Transactions on Nuclear Science
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234461
Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses
Wrobel, Frédéric ; Dilillo, Luigi ; Touboul, Antoine ; Pouget, Vincent ; Saigné, Frédéric
Dans : IEEE Transactions on Nuclear Science
https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234429
2013
Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach
Baccar, Fédia ; Azzopardi, Stéphane ; Théolier, Loïc ; El Boubkari, Kamal ; Deletage, Jean-Yves ; Woirgard, Eric
Dans : Microelectronics Reliability
https://hal.science/hal-00955719
Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques
Ben Naceur, W. ; Malbert, N. ; Labat, N. ; Frémont, H. ; Carisetti, D. ; C. Clément, J. ; Bonnet, B.
Dans : Microelectronics Reliability
https://hal.science/hal-00905892
Analysis of Schottky Gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress
Brunel, Laurent ; Lambert, Benoit ; Mezengue, P. ; Bataille, J. ; Floriot, Didier ; Grunenputt, J. ; Blanck, Hans ; Carisetti, Dominique ; Gourdel, Y. ; Malbert, Nathalie ; Curutchet, Arnaud ; Labat, Nathalie
Dans : Microelectronics Reliability
https://hal.science/hal-01002643
La cobotique. La robotique soumise.
Claverie, Bernard ; Le Blanc, Benoît ; Fouillat, Pascal
Dans : Communication & Organisation
https://hal.science/hal-01014650
Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology
El Moukhtari, Issam ; Pouget, Vincent ; Darracq, Frédéric ; Larue, Camille ; Perdu, Philippe ; Lewis, D.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00880480
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell
El Moukhtari, Issam ; Pouget, Vincent ; Larue, Camille ; Darracq, Frédéric ; Lewis, D. ; Perdu, Philippe
Dans : Microelectronics Reliability
https://hal.science/hal-00880459
Benchmarking of GFET devices for amplifier application using multiscale simulation approach
Fregonese, Sébastien ; Potereau, Manuel ; Deltimple, Nathalie ; Maneux, Cristell ; Zimmer, Thomas
Dans : Journal of Computational Electronics
https://hal.science/hal-00918225
Scalable Electrical Compact Modeling for Graphene FET Transistors
Fregonese, Sébastien ; Magallo, Maura ; Maneux, Cristell ; Happy, H. ; Zimmer, Thomas
Dans : IEEE Transactions on Nanotechnology
https://hal.science/hal-00906225
Influence of gate leakage current on AlGaN/GaN HEMTs evidenced by low frequency noise and pulsed electrical measurements
Karboyan, Serge ; Tartarin, Jean-Guy ; Rzin, M ; Brunel, L ; Curutchet, A ; Malbert, N ; Labat, N ; Carisetti, D ; Lambert, B ; Mermoux, M ; Romain-Latu, E ; Thomas, Florian ; Bouexière, C ; Moreau, C
Dans : Microelectronics Reliability
https://hal.science/hal-01343328
A Robust Surface-Potential-Based Compact Model for GaN HEMT IC Design
Khandelwal, Sourabh ; Yadav, Chandan ; Agnihotri, Shantanu ; Chauhan, Yogesh Singh ; Curutchet, Arnaud ; Zimmer, Thomas ; de Jaeger, Jean-Claude ; Defrance, N. ; Fjeldly, T.A.
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00909066
Submicrometer InP/InGaAs DHBT Architecture Enhancements Targeting Reliability Improvements
Koné, Gilles Amadou ; Grandchamp, Brice ; Hainaut, Cyril ; Marc, François ; Labat, Nathalie ; Zimmer, Thomas ; Nodjiadjim, Virginie ; Riet, Muriel ; Dupuy, Jean-Yves ; Godin, Jean ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00909053
Variants at multiple loci implicated in both innate and adaptive immune responses are associated with Sjögren's syndrome.
Lessard, Christopher J ; Li, He ; Adrianto, Indra ; Ice, John A ; Rasmussen, Astrid ; Grundahl, Kiely M ; Kelly, Jennifer A ; Dozmorov, Mikhail G ; Miceli-Richard, Corinne ; Bowman, Simon ; Lester, Sue ; Eriksson, Per ; Eloranta, Maija-Leena ; Brun, Johan G ; Gøransson, Lasse G ; Harboe, Erna ; Guthridge, Joel M ; Kaufman, Kenneth M ; Kvarnström, Marika ; Jazebi, Helmi ; Graham, Deborah S Cunninghame ; Grandits, Martha E ; Nazmul-Hossain, Abu N M ; Patel, Ketan ; Adler, Adam J ; Maier-Moore, Jacen S ; Farris, a Darise ; Brennan, Michael T ; James, James ; James, Judith A ; Gopalakrishnan, Rajaram ; Hefner, Kimberly S ; Houston, Glen D ; Huang, Andrew J W ; Hughes, Pamela J ; Lewis, David M ; Radfar, Lida ; Rohrer, Michael D ; Stone, Donald U ; Wren, Jonathan D ; Vyse, Timothy J ; Gaffney, Patrick M ; Omdal, Roald ; Wahren-Herlenius, Marie ; Illei, Gabor G ; Witte, Torsten ; Jonsson, Roland ; Rischmueller, Maureen ; Rönnblom, Lars ; Nordmark, Gunnel ; Ng, Wan-Fai ; Mariette, Xavier ; Anaya, Juan-Manuel ; Rhodus, Nelson L ; Segal, Barbara M ; Scofield, R Hal ; Montgomery, Courtney G ; Harley, John B ; Sivils, Kathy L ; Lessard, He ; Cunninghame Graham, Deborah S
Dans : Nature Genetics
https://hal.univ-brest.fr/hal-01558145
Multiscale simulation of carbon nanotube transistors
Maneux, Cristell ; Fregonese, Sébastien ; Zimmer, Thomas ; Retailleau, Sylvie ; Nguyen, Huu Nha ; Querlioz, Damien ; Bournel, Arnaud ; Dollfus, Philippe ; Triozon, François ; Niquet, Yann-Michel ; Roche, Stephan
Dans : Solid-State Electronics
https://hal.science/hal-00906950
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
Mbaye, Nogaye ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00880471
Limitations of on-wafer calibration and de-embedding methods in the sub-THz range
Potereau, M. ; Raya, C. ; de Matos, M. ; Fregonese, S. ; Curutchet, A. ; Zhang, M. ; Ardouin, B. ; Zimmer, T.
Dans : Journal of Computer and Communications
https://hal.science/hal-01002098
Single-crystal equation of state of phase D to lower mantle pressures and the effect of hydration on the buoyancy of deep subducted slabs
Rosa, A. D. ; Mezouar, M. ; Garbarino, G. ; Bouvier, P. ; Ghosh, S. ; Rohrbach, A. ; Sanchez-Valle, C.
Dans : Journal of Geophysical Research : Solid Earth
https://hal.science/hal-01067406
Fractional Behavior of Partial Differential Equations whose coefficients are exponential function of the space variable
Sabatier, Jocelyn ; Nguyen, Huy Cuong ; Moreau, Xavier ; Oustaloup, Alain
Dans : Mathematical and computer modelling of dynamical systems, MCMDS
https://hal.science/hal-00939422
80 ns/45 GHz Pulsed measurement system for DC and RF characterization of high speed microwave devices
Weib, Mario ; Fregonese, Sébastien ; Santorelli, Marco ; Sahoo Amit, Kumar ; Maneux, Cristell ; Zimmer, Thomas
Dans : Solid-State Electronics
https://hal.science/hal-00909009
Optimized Ring Oscillator With 1.65-ps Gate Delay in a SiGe:C HBT Technology
Weib, Mario ; Majek, Cédric ; Sahoo Amit, Kumar ; Maneux, Cristell ; Mazouffre, Olivier ; Chevalier, Pascal ; Chantre, Alain ; Zimmer, Thomas
Dans : IEEE Electron Device Letters
https://hal.science/hal-00906390
2012
Building the electricalmodel of the PhotoelectricLaserStimulation of a PMOS transistor in 90 nm technology
Alexandre, Sarafianos ; Llido, R. ; Dutertre, Jean-Max ; Gagliano, Olivier ; Serradeil, Valérie ; Lisart, Mathieu ; Goubier, V. ; Tria, Assia ; Pouget, Vincent ; Lewis, D.
Dans : Microelectronics Reliability
https://hal-emse.ccsd.cnrs.fr/emse-00742622
Modeling Non-Quasi-Static Effects in SiGe HBTs Using Improved Charge Partitioning Scheme
Augustine, Noel ; Kumar, Khamesh ; Bhattacharyya, Arkaprava ; Zimmer, Thomas ; Chakravorty, Anjan
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-01412448
Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL
Buchner, S. ; Roche, Nicolas Jean-Henri ; Warner, J. ; Mcmorrow, D. ; Miller, F. ; Morand, S. ; Pouget, V. ; Larue, C. ; Ferlet-Cavrois, V. ; El Mamouni, F. ; Kettunen, Heikki ; Adell, P. C. ; Allen, G. ; Aveline, David
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01633618
Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing
Darracq, Frédéric ; Mbaye, Nogaye ; Azzopardi, Stephane ; Pouget, Vincent ; Lorfèvre, E. ; Bezerra, F. ; Lewis, Dean
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00772095
Electrical compact modelling of graphene transistors
Fregonese, Sebastien ; Meng, N. ; Nguyen, H.-N. ; Majek, C. ; Maneux, C. ; Happy, H. ; Zimmer, T.
Dans : Solid-State Electronics
https://hal.science/hal-01002093
Characterization and Modeling of Graphene Transistor Low-Frequency Noise
Grandchamp, Brice ; Fregonese, Sebastien ; Majek, Cédric ; Hainaut, Cyril ; Maneux, Cristell ; Meng, Nan ; Happy, Henri ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00669458
Coupling and propagation of Sommerfeld waves at 100 and 300 GHz
Guillet, Jean-Paul ; Chusseau, Laurent
Dans : Journal of Infrared, Millimeter and Terahertz Waves
https://hal.science/hal-01091187
Transient electro-thermal characterization of Si-Ge heterojunction bipolar transistors
Kumar Sahoo, Amit ; Weiss, Mario ; Fregonese, Sébastien ; Malbert, Nathalie ; Zimmer, Thomas
Dans : Solid-State Electronics
https://hal.science/hal-00978809
A scalable electrothermal model for transient self-heating effects in trench-isolated SiGe HBTs
Kumar Sahoo, Amit ; Fregonese, Sebastien ; Weis, Mario ; Malbert, Nathalie ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00978803
Characterization of self-heating in Si-Ge HBTs with pulse, DC and AC measurements
Kumar Sahoo, Amit ; Fregonese, Sébastien ; Weiss, Mario ; Grandchamp, Brice ; Malbert, Nathalie ; Zimmer, Thomas
Dans : Solid-State Electronics
https://hal.science/hal-00978797
Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test
Lambert, B ; Labat, N ; Carisetti, D ; Karboyan, Serge ; Tartarin, Jean-Guy ; Thorpe, J ; Brunel, L ; Curutchet, A ; Malbert, N ; Romain-Latu, E ; Mermoux, M
Dans : Microelectronics Reliability
https://hal.science/hal-01343325
Effects of 1064 nm laser on MOS capacitor
Llido, R. ; Masson, P. ; Regnier, V. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00988338
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology
Sarafianos, A ; Llido, R ; Gagliano, O ; Serradeil, V ; Lisart, M ; Goubier, V ; Dutertre, Jean-Max ; Tria, A ; Pouget, V ; Lewis, D
Dans : Microelectronics Reliability
https://hal-emse.ccsd.cnrs.fr/emse-01110360
2011
Experimental power cycling on insulated TRIAC package: Reliability interpretation thanks to an innovative failure analysis flow
Aubert, A. ; Jacques, S. ; Pétremont, S. ; Labat, N. ; Frémont, H.
Dans : Microelectronics Reliability
https://hal.science/hal-00670531
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis
Bascoul, G. ; Perdu, Philippe ; Benigni, A. ; Dudit, Sylvain ; Celi, Guillaume ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00669825
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis
Celi, Guillaume ; Dudit, Sylvain ; Parassin, T. ; Perdu, Philippe ; Reverdy, Antoine ; Lewis, D. ; Vallet, Maxime
Dans : Microelectronics Reliability
https://hal.science/hal-00669760
L'évolution disciplinaire des sciences de l'information : des technologies à l'ingénierie des usages
Claverie, Bernard ; Fouillat, Pascal
Dans : Projectics / Proyéctica / Projectique
https://hal.science/hal-00669468
Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing
Faraud, Emeric ; Pouget, V. ; Shao, Kai ; Larue, Camille ; Darracq, Frédéric ; Lewis, D. ; Samaras, A. ; Bezerra, F. ; Lorfèvre, E. ; Ecoffet, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00667336
A compact model for dual-gate one-dimensional FET: Application to carbon-nanotube FETs
Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00584879
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
Ghosh, S. ; Grandchamp, B. ; Koné, G.A ; Marc, F. ; Maneux, C. ; Zimmer, T. ; Nodjiadjim, V. ; Riet, M. ; Dupuy, J.-Y. ; Godin, J.
Dans : Microelectronics Reliability
https://hal.science/hal-00671676
Trends in submicrometer InP-based HBT architecture targeting thermal management
Grandchamp, Brice ; Nodjiadjim, Virginie ; Zaknoune, M. ; Koné, Gilles Amadou ; Hainaut, Cyril ; Godin, Jean ; Riet, M. ; Zimmer, Thomas ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00671675
Impact of Power Consumption and Temperature on Processor Lifetime Reliability
Gupta, Tushar ; Bertolini, Clément ; Héron, Olivier ; Ventroux, Nicolas ; Zimmer, Thomas ; Marc, François
Dans : American Scientific Publishers in JOLPE
https://hal.science/hal-00674305
FPGA Design with Double-Gate Carbon Nanotube Transistors
H. Ben Jamaa, M. ; Gaillardon, p.-E. ; Frégonèse, S. ; de Marchi, M. ; de Micheli, G. ; Zimmer, T. ; O'Connor, I. ; Clermidy, F.
Dans : The Electro-Chemical Society Transactions
https://hal.science/hal-01002089
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization
Infante, Fulvio ; Perdu, Philippe ; Kor, H.B ; Gan, C. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00669757
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses
Koné, G. A. ; Grandchamp, B. ; Hainaut, C. ; Marc, F. ; Maneux, C. ; Labat, N. ; Zimmer, T. ; Nodjiadjim, V. ; Riet, M. ; Godin, J.
Dans : Microelectronics Reliability
https://hal.science/hal-00670550
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices
Liao, Si-Yu ; Retrouvey, J.M. ; Agnus, G. ; Zhao, W. ; Maneux, Cristell ; Fregonese, Sebastien ; Zimmer, Thomas ; Chabi, D. ; Filoramo, A. ; Derycke, Vincent ; Gamrat, C. ; Klein, J.O.
Dans : IEEE Transactions on Circuits and Systems
https://hal.science/hal-00584909
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory
Llido, R. ; Gomez, J. ; Goubier, V. ; Froidevaux, N. ; Dufayard, L. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-00669826
Schottky barrier carbon nanotube transistor: Compact modeling, scaling study, and circuit design applications
Najari, Montassar ; Fregonese, Sebastien ; Maneux, Cristell ; Mnif, H. ; Masmoudi, N. ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00584876
E-Learning in science and technology via a common learning platform in a lifelong learning project
Priem, F. ; de Craemer, R. ; Pedreschi, F. ; Zimmer, T. ; Saïghi, S. ; Lilja, J.
Dans : European Journal of Open, Distance and e-Learning
https://hal.science/hal-01002087
Fractional Models for Thermal Modeling and Temperature Estimation of a Transistor Junction
Sabatier, Jocelyn ; Nguyen, H.C. ; Farges, Christophe ; Moreau, Xavier ; Guillemard, Franck ; Bavoux, Bernard
Dans : Advances in Difference Equations
https://hal.science/hal-00668779
Thermal impedance modeling of SiGe HBTs from low-frequency small-signal measurements
Sahoo, A.K. ; Fregonese, Sebastien ; Zimmer, Thomas ; Malbert, Nathalie
Dans : IEEE Electron Device Letters
https://hal.science/hal-00584885
3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing
Shao, Kai ; Morisset, Adèle ; Pouget, V. ; Faraud, Emeric ; Larue, Camille ; Lewis, D. ; Mcmorrow, D.
Dans : Optics Express
https://hal.science/hal-00667432
2010
Failure analysis case study on a Cu/low-k technology in package: New front-side approach using laser and plasma de-processing
Aubert, A. ; Rebrassé, J.P. ; Dantas de Morais, L. ; Labat, N. ; Frémont, H.
Dans : Microelectronics Reliability
https://hal.science/hal-00549513
Facing the defect characterization and localization challenges of bridge defects on submicronic technology (45nm and below)
Celi, Guillaume ; Dudit, Sylvain ; Perdu, Philippe ; Reverdy, Antoine ; Parrassin, Thierry ; Bechet, Emmanuel ; Lewis, Dean ; Vallet, Michel
Dans : Microelectronics Reliability
https://hal.science/hal-00585642
The disciplinary evolution of information science: from technology to usability engineering
Claverie, Bernard ; Fouillat, Pascal
Dans : Projectics / Proyéctica / Projectique
https://hal.science/hal-01672713
CADless laser assisted methodologies for failure analysis and device reliability
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00988334
Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations
Faqir, M. ; Bouya, Moshine ; Malbert, Nathalie ; Labat, Nathalie ; Carisetti, D. ; Lambert, B. ; Verzellesi, G. ; Fantini, F.
Dans : Microelectronics Reliability
https://hal.science/hal-00585069
A versatile compact model for ballistic 1D transistor: GNRFET and CNTFET comparison
Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : Solid-State Electronics
https://hal.science/hal-00512742
Thermal aging model of InP/InGaAs/InP DHBT
Gosh, S. ; Marc, François ; Maneux, Cristell ; Grandchamp, Brice ; Koné, Gilles Amadou ; Zimmer, Thomas
Dans : Microelectronics Reliability
https://hal.science/hal-00674295
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00585644
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT
Koné, Gilles Amadou ; Grandchamp, Brice ; Hainaut, Cyril ; Marc, François ; Maneux, Cristell ; Labat, Nathalie ; Nodjiadjim, V. ; Godin, J.
Dans : Microelectronics Reliability
https://hal.science/hal-00585073
Compact modeling of optically gated carbon nanotube field effect transistor
Liao, Si-Yu ; Maneux, Cristell ; Pouget, Vincent ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : physica status solidi (b)
https://hal.science/hal-00495144
TCAD modeling of NPN-SI-BJT electrical performance improvement through SiGe extrinsic stress layer
Mahmoud, Al-Sadi ; Fregonese, Sébastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : Materials Science in Semiconductor Processing
https://hal.science/hal-00671678
Voltage Controlled Delay Line with Phase Quadrature Outputs for [0.9 4]GHz Factorial Delay Locked Loop Dedicated to Zero-IF Multi Standard Local Oscillator
Majek, Cédric ; Lucas de Peslouan, Pierre-Olivier ; Mariano, André ; Lapuyade, Herve ; Deval, Yann ; Begueret, Jean-Baptiste
Dans : Journal of Integrated Circuits and Systems
https://hal.science/hal-00539233
Efficient physics-based compact model for the Schottky barrier carbon nanotube FET
Najari, Montassar ; Fregonese, Sebastien ; Maneux, Cristell ; Mnif, H. ; Zimmer, Thomas ; Masmoudi, N.
Dans : physica status solidi (c)
https://hal.science/hal-00584855
SiGe HBTs optimization for wireless power amplifier applications
Zimmer, Thomas ; Mans, Pierre-Marie ; Jouan, Sebastien ; Fregonese, Sebastien ; Vandelle, Benoit ; Pache, Denis ; Curutchet, Arnaud ; Maneux, Cristell
Dans : Active and Passive Electronic Components
https://hal.science/hal-00671680
2009
Multiscale simulation of carbon nanotube devices
Adessi, Christophe ; Avriller, R. ; Bournel, A. ; Blase, Xavier ; Cazin d'Honincthun, H. ; Dollfus, P. ; Frégonèse, S. ; Galdin-Retailleau, S. ; López-Bezanilla, A. ; Maneux, C. ; Nha Nguyen, H. ; Querlioz, D. ; Roche, S. ; Triozon, F. ; Zimmer, T.
Dans : Comptes Rendus. Physique
https://hal.science/hal-00400169
Pervasion, transparence et cognition augmentée
Claverie, Bernard ; Lespinet-Najib, Véronique ; Fouillat, Pascal
Dans : Revue des Interactions Humaines Médiatisées (RIHM) = Journal of Human Mediated Interactions
https://hal.science/hal-01672718
A New Technique for SET Pulse Width Measurement in Chains of Inverters Using Pulsed Laser Irradiation
Ferlet-Cavrois, V. ; Mcmorrow, D. ; Kobayashi, D. ; Melinger, J. ; Schwank, J.R ; Gaillardin, M. ; Pouget, V. ; Essely, Fabien ; Baggio, J. ; Girard, Sébastien ; Flament, O. ; Paillet, Philippe ; Flores, R. ; Dodd, P.E. ; Shaneyfelt, M.R. ; Hirose, K. ; Saito, H.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00669755
Implementation of tunneling phenomena in a CNTFET compact model
Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, T.
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00399797
Technological dispersion in CNTFET: Impact of the presence of metallic carbon nanotubes in logic circuits
Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, T.
Dans : Solid-State Electronics
https://hal.science/hal-00399786
Implementation of Electron–Phonon Scattering in a CNTFET Compact Model
Fregonese, Sebastien ; Goguet, Johnny ; Maneux, Cristell ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00388046
Electrical modeling of the effect of beam profile for pulsed laser fault injection
Godlewski, C. ; Pouget, V. ; Lewis, D. ; Lisart, Mathieu
Dans : Microelectronics Reliability
https://hal.science/hal-00669736
Net integrity checking by optical localization techniques
Haller, Gerald ; Machouat, A. ; Lewis, D. ; Pouget, V.
Dans : Microelectronics Reliability
https://hal.science/hal-00669741
A CMOS Resizing Methodology for Analog Circuits: linear and non-linear applications
Levi, Timothée ; Tomas, Jean ; Lewis, Noëlle ; Fouillat, Pascal
Dans : IEEE Design & Test
https://hal.science/hal-00359990
A distance measurement platform dedicated to Electrical Engineering
Lewis, N. ; Billaud, M. ; Geoffroy, D. ; Cazenave, P. ; Zimmer, T.
Dans : IEEE Transactions on Learning Technologies
https://hal.science/hal-00450208
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs
Malbert, Nathalie ; Labat, Nathalie ; Curutchet, Arnaud ; Sury, Charlotte ; Hoel, Virginie ; de Jaeger, Jean-Claude ; Defrance, N. ; Douvry, Yannick ; Dua, Christian ; Oualli, Mourad ; Bru-Chevallier, C. ; Bluet, J.M. ; Chikhaoui, Walf
Dans : Microelectronics Reliability
https://hal.science/hal-00401267
Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits
Roche, Nicolas Jean-Henri ; Gonzalez Velo, Yago ; Dusseau, Laurent ; Boch, Jérôme ; Vaillé, Jean-Roch ; Saigné, Frédéric ; Azais, Bruno ; Auriel, Gérard ; Lorfèvre, Eric ; Pouget, Vincent ; Buchner, Stephen P. ; David, Jean-Pierre ; Marec, Ronan ; Calvel, Philippe
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01631440
2008
Behavior and optimizations of Si/SiGe HBT on thin-film SOI
Avenier, Gregory ; Fregonese, Sebastien ; Vandelle, Benoit ; Dutartre, D. ; Saguin, Fabienne ; Schwartzmann, Thierry ; Maneux, Cristell ; Zimmer, Thomas ; Chantre, Alain
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00197532
Challenges and potential of new approaches for reliability assessment of nanotechnologies
Bechou, L. ; Danto, Y. ; Deletage, J.Y. ; Verdier, F. ; Deshayes, Y. ; Fregonese, S. ; Maneux, C. ; Zimmer, T. ; Laffitte, D.
Dans : Comptes Rendus de l'Academie des Sciences. Série IV, Physique, Astronomie
https://hal.science/hal-00266387
A Nodal Model Dedicated to Self-Heating and Thermal Coupling Simulations
Beckrich-Ros, Hélène ; Ortolland, Sylvie ; Pache, Denis ; Céli, Didier ; Gloria, Daniel ; Zimmer, Thomas
Dans : IEEE Transactions on Semiconductor Manufacturing
https://hal.science/hal-00327444
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications
Bourqui, M.L. ; Bechou, L. ; Gilard, O. ; Deshayes, Y. ; del Vecchio, P. ; How, L.S. ; Rosala, F. ; Ousten, Y. ; Touboul, A.
Dans : Microelectronics Reliability
https://hal.science/hal-00334728
Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques
Bouya, Moshine ; Malbert, Nathalie ; Labat, Nathalie ; Carisetti, Dominique ; Perdu, Philippe ; Clement, Jean-Claude ; Lambert, Benoit ; Bonnet, Michel
Dans : Microelectronics Reliability
https://hal.science/hal-00400906
Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains
Cavrois, V.F ; Pouget, Vincent ; Mcmorrow, D. ; Schwank, J.R ; Fel, N. ; Essely, Fabien ; Flores, R. ; Paillet, P. ; Gaillardin, M. ; Kobayashi, D. ; Melinger, J. ; Duhamel, O. ; Dodd, P.E. ; Shaneyfelt, M.R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397995
Nonlinear Characterization and Modeling of Carbon Nanotube Field-Effect Transistors
Curutchet, Arnaud ; Theron, Didier ; Werquin, Matthieu ; Ducatteau, Damien ; Happy, Henri ; Dambrine, Gilles ; Bethoux, Jean-Marc ; Derycke, Vincent ; Gaquière, Christophe
Dans : IEEE Transactions on Microwave Theory and Techniques
https://hal.science/hal-00315911
Computationally Efficient Physics-Based Compact CNTFET Model for Circuit Design
Fregonese, Sebastien ; Cazin d'Honincthun, Hughes ; Goguet, Johnny ; Maneux, Cristell ; Zimmer, Thomas ; Bourgoin, J.-P. ; Dollfus, P. ; Galdin-Retailleau, S.
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00287142
Modeling of Strained CMOS on Disposable SiGe Dots : shape impacts on electrical/thermal characteristics
Fregonese, Sebastien ; Zhuang, Y. ; N. Burghartz, J.
Dans : Solid-State Electronics
https://hal.science/hal-00261552
Investigation of Single-Event Transients in Linear Voltage Regulators
Irom, F. ; Miyahira, T.F ; Adell, P. ; Laird, J.S ; Conder, B. ; Pouget, Vincent ; Essely, Fabien
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397996
Study of Single Event Transients in High-Speed Operational Amplifiers
Jaulent, Patrice ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397747
Effect of physical defect on shmoos in CMOS DSM technologies
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Perdu, Philippe ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien
Dans : Microelectronics Reliability
https://hal.science/hal-00401309
Evaluation of Recent Technologies of Nonvolatile RAM
Nuns, T. ; Duzellier, S. ; Bertrand, J. ; Hubert, G. ; Pouget, V. ; Darracq, Frédéric ; David, J.P ; Soonckindt, S.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00667419
A Stochastic Model for Cancer Stem Cell Origin in Metastatic Colon Cancer
Odoux, C. ; Fohrer, H. ; Hoppo, T. ; Guzik, L. ; Stolz, D. ; Lewis, D. ; Gollin, S. ; Gamblin, T. ; Geller, D. ; Lagasse, E.
Dans : Cancer Research
https://hal.science/hal-02541002
Laser-Induced Current Transients in Silicon-Germanium HBTs
Pellish, J.A ; Reed, R. ; Mcmorrow, D. ; Melinger, J. ; Jenkins, P. ; Sutton, A. ; Diestelhorst, R. ; Phillips, S. ; Cressler, J. ; Pouget, Vincent ; Pate, N. ; Kozub, J. ; Mendehall, M. ; Weller, R. ; Schrimpf, R.D. ; Marshall, P. ; Tipton, A. ; Niu, G.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397926
Scalable Approach for HBT's Base Resistance Calculation
Raya, Christian ; Pourchon, Franck ; Zimmer, Thomas ; Céli, Didier ; Chevalier, Pascal
Dans : IEEE Transactions on Semiconductor Manufacturing
https://hal.science/hal-01721433
Scalable Approach for Base Resistance Calculation
Raya, C. ; Pourchon, F. ; Celi, D. ; Chevalier, P. ; Zimmer, T.
Dans : IEEE Transactions on Semiconductor Manufacturing
https://hal.science/hal-00327447
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Sanchez, Kevin ; Crepel, Olivier ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00401312
2007
Investigation of a new method for dopant characterization
Adrian, J. ; Rodriguez, N. ; Essely, F. ; Haller, G. ; Grosjean, C. ; Portavoce, A. ; Girardeaux, Christophe
Dans : Microelectronics Reliability
https://hal-amu.archives-ouvertes.fr/hal-02386183
Study of passivation defects by electroluminescence in AlGaN/GaN HEMTs on SiC
Bouya, Moshine ; Carisetti, Dominique ; Malbert, Nathalie ; Labat, Nathalie ; Perdu, Philippe ; Clement, Jean-Claude ; Bonnet, Michel ; Pataut, Gerard
Dans : Microelectronics Reliability
https://hal.science/hal-00197479
Impact of VCO Topology on SET Induced Frequency Response
Chen, W. ; Varanasi, N. ; Pouget, V. ; Barnaby, H. ; Vermeire, B. ; Adell, P. ; Copani, T. ; Fouillat, P.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00206290
Optimizing pulsed OBIC technique for ESD defect localization
Essely, Fabien ; Guitard, Nicolas ; Darracq, Frédéric ; Pouget, Vincent ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : IEEE Transactions on Device and Materials Reliability
https://hal.science/hal-00382949
Characterization and analysis of trap-related effects in AlGaAs-GaN HEMTs
Faqir, Mohamed ; Verzellesi F. Fantini F. Danesin F. Rampazzo G. Meneghesso E. Zanoni A. Cavallini A. Castaldini, G. ; Labat, Nathalie ; Dua, Christian ; Touboul, A.
Dans : Microelectronics Reliability
https://hal.science/hal-00199736
Modeling of Strained CMOS on Disposable SiGe Dots: Strain Impacts on Devices' Electrical Characteristics
Fregonese, Sebastien ; Zhuang, Yan ; Burghartz, Joachim N.
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00169352
Total Dose and Single Event Transients in Linear Voltage Regulators
Kelly, A.T. ; Adell, P.C. ; Witulski, A.F. ; Holman, W.T. ; Schrimpf, R.D. ; Pouget, Vincent
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397727
Pedagogical evaluation of remote laboratories in eMerge project
Lang, D. ; Mengelkamp, C. ; S. Jäger, R. ; Geoffroy, D. ; Billaud, M. ; Zimmer, T.
Dans : European Journal of Engineering Education
https://hal.science/hal-00211717
A Heavy-Ion Tolerant Clock and Data Recovery Circuit for Satellite Embedded High-Speed Data Links
Lapuyade, Hervé ; Mazouffre, Olivier ; Goumballa, Birama ; Pignol, Michel ; Malou, Florence ; Neveu, Claude ; Pouget, Vincent ; Deval, Yann ; Begueret, Jean-Baptiste
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00182248
IP-based design for analogue ASICs: A case study
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : Design&Reuse Articles
https://hal.science/hal-00522419
Configuration errors analysis in SRAM-based FPGAs: software tool and practical results
Maingot, V. ; Ferron, J. ; Leveugle, Régis ; Pouget, V. ; Douin, A.
Dans : Microelectronics Reliability
https://hal.science/hal-00184528
CNTFET modeling and reconfigurable logic circuit design
O'Connor, Ian ; Liu, Junchen ; Gaffiot, Frédéric ; Prégaldiny, Fabien ; Maneux, Cristell ; Lallement, C. ; Goguet, Johnny ; Fregonese, Sebastien ; Zimmer, Thomas ; Anghel, Lorena ; Leveugle, Régis ; Dang, T.
Dans : IEEE Transactions on Circuits and Systems
https://hal.science/hal-00187137
Self Heating modeling of Si Ge Heterojunction Bipolar Transistor
Sulima, Pierre Yvan ; Battaglia, Jean-Luc ; Zimmer, Thomas
Dans : International Communications in Heat and Mass Transfer
https://hal.science/hal-00187266
In-depth resolution for LBIC technique by two-photon absorption
Wan, Dong Yun ; Pouget, Vincent ; Douin, Alexandre ; Jaulent, Patrice ; Lewis, Dean ; Fouillat, Pascal
Dans : Semiconductors
https://hal.science/hal-00204572
Integration of remote lab exercises into standard course packages
Zimmer, Thomas ; Billaud, M. ; Geoffroy, Didier
Dans : International Journal of Online Engineering (iJOE)
https://hal.science/hal-00211709
2006
Single Event Induced Instability in Linear Voltage Regulators
Adell, P.C. ; Witulski, A.F. ; Schrimpf, R.D. ; Marec, R. ; Pouget, Vincent ; Calvel, P. ; Bezerra, F.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397721
Radiation Hardened by Design RF Circuits Implemented in 0.13µm CMOS Technology
Chen, W. ; Pouget, Vincent ; Gentry, G.K. ; Barnaby, H. J. ; Vermeire, B. ; Bakkaloglu, B. ; Kiaei, K. ; Holbert, K.E. ; Fouillat, Pascal
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397725
Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses
Darracq, Frédéric ; Lapuyade, Herve ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : Journal of Integrated Circuits and Systems
https://hal.science/hal-00359396
A 4 Gsample/s 2 bits flash ADC with 2–4 GHz input bandwidth for radio astronomy application
Deschans, D. ; Bégueret, J.-B. ; Deval, Y. ; Scarabello, C. ; Fouillat, P. ; Montignac, G. ; Baudry, Alain
Dans : Analog Integrated Circuits and Signal Processing
https://hal.science/hal-00206668
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation
Douin, Alexandre ; Pouget, Vincent ; de Matos, Magali ; Lewis, Dean ; Perdu, Philippe ; Fouillat, Pascal
Dans : Microelectronics Reliability
https://hal.science/hal-00204571
Influence of Laser Pulse Duration in Single Event Upset Testing
Douin, Alexandre ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00204547
Application of various optical techniques for ESD defect localization
Essely, Fabien ; Darracq, Frédéric ; Pouget, Vincent ; Remmach, Mustapha ; Beaudoin, Félix ; Guitard, Nicolas ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00204570
Thin film SOI HBT: A study of the effect of substrate bias on the electrical characteristics
Fregonese, Sébastien ; Avenier, Gregory ; Maneux, Cristell ; Chantre, A. ; Zimmer, Thomas
Dans : Solid-State Electronics
https://hal.science/hal-00181972
A computationally efficient physics-based compact bipolar transistor model for circuit design - Part II:Experimental results
Fregonese, Sébastien ; Lehmann, S. ; Zimmer, Thomas ; Schroter, M. ; Celi, D. ; Ardouin, Bertrand ; Beckrich, Helene ; Brenner, P. ; Kraus, W.
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00181970
A compact model for SiGe HBT on thin film SOI
Fregonese, Sébastien ; Avenier, Gregory ; Maneux, Cristell ; Chantre, A. ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00181969
Cyberchip pour l'étude à distance des circuits integrés
Geoffroy, Didier ; Zimmer, Thomas ; Billaud, Michel
Dans : Journal sur l'enseignement des sciences et technologies de l'information et des systèmes
https://hal.science/hal-00211718
Off-state and on-state breakdown in GaAs MESFET, PHEMT and power PHEMT
Ismaïl, N. ; Malbert, N. ; Labat, N. ; Touboul, A. ; Muraro, J.L.
Dans : physica status solidi (c)
https://hal.science/hal-00185717
A Radiation-Hardened Injection Locked Oscillator Devoted to Radio-Frequency Applications
Lapuyade, Hervé ; Pouget, Vincent ; Begueret, Jean-Baptiste ; Hellmuth, Patrick ; Taris, Thierry ; Mazouffre, Olivier ; Fouillat, Pascal ; Deval, Yann
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00183155
Laser mapping of SRAM Sensitive Cells : a way to obtain input parameters for DASIE calculation code
Miller, F. ; Buard, N. ; Hubert, G. ; Alestra, S. ; Baudrillard, G. ; Carrière, T. ; Gaillard, R. ; Palau, J.-M. ; Saigné, Frédéric ; Fouillat, P.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00206425
A computationally efficient physics-based compact bipolar transistor model for circuit design - Part I: model formulation
Schroter, M. ; Lehmann, S. ; Fregonese, Sébastien ; Zimmer, Thomas
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00181971
AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements
Sozza, Alberto ; Curutchet, Arnaud ; Dua, Christian ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre
Dans : Microelectronics Reliability
https://hal.science/hal-00196943
A remote laboratory for electrical engineering education
Zimmer, T. ; Billaud, M. ; Geoffroy, D.
Dans : International Journal of Online Engineering (iJOE)
https://hal.science/hal-00327439
2005
Scanning laser ultrasonics experiments for in-situ non-destructive analysis of integrated circuits
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE Transactions on Device and Materials Reliability
https://hal.science/hal-00181926
Impact of semiconductors material on IR Laser Stimulation signal
Firiti, Abdellatif ; Beaudoin, Félix ; Haller, G. ; Perdu, Philippe ; Lewis, Dean ; Fouillat, Pascal
Dans : Microelectronics Reliability
https://hal.science/hal-00401285
A Scalable Substrate Network for HBT Compact Modeling
Fregonese, Sébastien ; Celi, D. ; Zimmer, Thomas ; Maneux, Cristell ; Sulima, Pierre-Yvan
Dans : Solid-State Electronics
https://hal.science/hal-00181973
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
Guitard, Nicolas ; Essely, Fabien ; Trémouilles, David ; Bafleur, Marise ; Nolhier, Nicolas ; Perdu, Phillipe ; Touboul, Andre ; Pouget, Vincent ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00397706
Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions
Ismail, Naoufel ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Muraro, Jean-Luc ; Brasseau, Francis ; Langrez, Dominique
Dans : Microelectronics Reliability
https://hal.science/hal-00183490
Implementing laser-based failure analysis methodologies using test vehicles
Lewis, Dean ; Pouget, Vincent ; Beaudoin, Félix ; Haller, G. ; Perdu, Phillipe ; Fouillat, Pascal
Dans : IEEE Transactions on Semiconductor Manufacturing
https://hal.science/hal-00397918
An Analog Circuit Fault Characterization Methodology
Maidon, Yvan ; Zimmer, Thomas ; Ivanov, I.
Dans : Journal of Electronic Testing: : Theory and Applications
https://hal.science/hal-00203965
Two dimensional DC simulation methodology for InP/GaAs0.51Sb0.49/InP heterojunction bipolar transistor
Maneux, Cristell ; Belhaj, Mohamed ; Grandchamp, Brice ; Labat, Nathalie ; Touboul, Andre
Dans : Solid-State Electronics
https://hal.science/hal-00183087
Rate Predictions for Single Event Effects – Critique II
Petersen, E. ; Pouget, Vincent ; Massengill, L. ; Buchner, S. ; Mcmorrow, D.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00397715
Light Emission To time resolved emission for IC debug and failure analysis
Remmach, Mustapha ; Pigozzi, A. ; Desplats, Romain ; Perdu, Philippe ; Lewis, Dean ; Noel, J. ; Dudit, Sylvain
Dans : Microelectronics Reliability
https://hal.science/hal-00401289
NIR Laser stimulation for dynamic timing analysis
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Roux, J.P. ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.science/hal-00401294
2004
Investigation of millisecond-long analog single-event transients in the LM6144 op amp
Boulghassoul, Y. ; Buchner, S. ; Mcmorrow, D. ; Pouget, V. ; Massengill, L.W. ; Fouillat, P. ; Holman, W.T. ; Poivey, C. ; Howard, J.W. ; Savage, M. ; Maher, M.C.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01887662
Analysis of Low Frequency Drain current Noise in AlGaN/GaN HEMTs on Si Substrate
Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Gaquière, Christophe ; Minko, A.
Dans : Fluctuation and Noise Letters
https://hal.science/hal-00183491
Evaluation of SRAMS reliability for space electronics using ultra short laser pulses
Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : Electrochemical Society
https://hal.science/hal-00185395
INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER
Fouillat, P. ; Pouget, V. ; Lewis, D. ; Buchner, S. ; Mcmorrow, D.
Dans : International Journal of High Speed Electronics and Systems
https://hal.science/hal-01887658
Obtaining Isothermal Data for HBT
Fregonese, Sébastien ; Zimmer, Thomas ; Mnif, Hassene ; Baureis, P. ; Maneux, Cristell
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00181975
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise
Grandchamp, Brice ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Zimmer, Thomas
Dans : Microelectronics Reliability
https://hal.science/hal-00183089
Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors
Labat, Nathalie ; Malbert, Nathalie ; Maneux, Cristell ; Touboul, Andre
Dans : Microelectronics Reliability
https://hal.science/hal-00183088
Representation of the SiGe HBT's Thermal Impedance by Linear and Recursive Networks
Mnif, Hassene ; Zimmer, Thomas ; Battaglia, Jean Luc ; Fregonese, Sébastien
Dans : Microelectronics Reliability
https://hal.science/hal-00181976
Analysis and modeling of the self-heating effect in SiGe HBTs
Mnif, Hassene ; Zimmer, Thomas ; Battaglia, Jean Luc ; Fregonese, Sébastien
Dans : European Physical Journal: Applied Physics
https://hal.science/hal-00181974
Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC
Pouget, V. ; Lewis, D. ; Fouillat, P.
Dans : IEEE Transactions on Instrumentation and Measurement
https://hal.science/hal-01887656
Dynamic Behavior of a Chemical Sensor for Real-Time Measurement of Humidity Variations in Human Breath
Tetelin, Angélique ; Pouget, Vincent ; Lachaud, Jean-Luc ; Pellet, Claude
Dans : IEEE Transactions on Instrumentation and Measurement
https://hal.science/hal-00183110
2003
Application of picosecond ultrasonics to non-destructive analysis in VLSI circuits
Andriamonje, G. ; Pouget, V. ; Ousten, Y. ; Lewis, D. ; Danto, Y. ; Rampnoux, Jean-Michel ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, Stéphane ; Claeys, W. ; Rossignol, C. ; Audoin, Bertrand
Dans : Microelectronics Reliability
https://hal.science/hal-01550917
Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Danto, Yves ; Rampnoux, J. M. ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, S. ; Claeys, W. ; Rossignol, C. ; Audoin, Bertrand
Dans : Microelectronics Reliability
https://hal.science/hal-00181929
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing
Beaudoin, F. ; Desplats, R. ; Perdu, P. ; Firiti, Abdellatif ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.science/hal-01887652
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization
Beauchêne, T. ; Lewis, D. ; Beaudoin, F. ; Pouget, V. ; Desplats, R. ; Fouillat, P. ; Perdu, P. ; Bafleur, Marise ; Trémouilles, David
Dans : Microelectronics Reliability
https://hal.science/hal-01887647
A physical approach on SCOBIC investigation in VLSI
Beauchêne, T. ; Lewis, D. ; Beaudoin, F. ; Pouget, V. ; Perdu, P. ; Fouillat, P. ; Danto, Y.
Dans : Microelectronics Reliability
https://hal.science/hal-01887645
High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects
Belhaj, Mohamed ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Bove, Philippe ; Lareche, H.
Dans : Microelectronics Reliability
https://hal.science/hal-00183091
Investigation of single-event transients in voltage-controlled oscillators
Chen, W. ; Pouget, V. ; Barnaby, H.J. ; Cressler, J. D. ; Niu, G. ; Fouillat, P. ; Deval, Y. ; Lewis, D.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01887654
Low frequency drain noise comparison of AlGaN/GaN HEMT's grown on silicon, SiC and sapphire substrates
Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Gaquière, Christophe ; Lareche, H. ; Minko, A. ; Uren, Michael
Dans : Microelectronics Reliability
https://hal.science/hal-00183492
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects
Darracq, Frédéric ; Lapuyade, Hervé ; Buard, N. ; Fouillat, Pascal ; Dufayel, R. ; Carriere, T.
Dans : Microelectronics Reliability
https://hal.science/hal-00185396
1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses
Martin, Jean-Christophe ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Blayac, S. ; Kahn, Myrtil L. ; Godin, Jean
Dans : Microelectronics Reliability
https://hal.science/hal-00183090
2002
Heavy ion-induced charge collection mechanisms in CMOS active pixel sensor
Belredon, X. ; David, J. ; Lewis, D. ; Beauchene, T. ; Pouget, V. ; Barde, S. ; Magnan, P.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01887641
Backside SEU laser testing for commercial off-the-shelf SRAMs
Darracq, Frédéric ; Lapuyade, Herve ; Buard, Nadine ; Mounsi, Faresse ; Foucher, Bruno ; Fouillat, Pascal ; Calvet, M. C. ; Dufayel, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00204728
Single-Event Sensitivity of a Single SRAM Cell
Darracq, Frédéric ; Beauchene, Thomas ; Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Touboul, Andre
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00185398
Evaluation of a Design Methodology Dedicated to Dose-Rate-Hardened Linear Integrated Circuits
Deval, Yann ; Lapuyade, Hervé ; Fouillat, Pascal ; Barnaby, H. J. ; Darracq, Frédéric ; Briand, Renaud ; Lewis, Dean ; Schrimpf, Rd
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00184299
Instrumentation virtuelle sur le World Wide Web pour faire des mesures réelles
Kadionik, Patrice ; Zimmer, Thomas ; Danto, Yves
Dans : Journal sur l'enseignement des sciences et technologies de l'information et des systèmes
https://hal.science/hal-00183053
Degradation mechanisms induced by thermal and bias stresses in InP HEMTs
Labat, Nathalie ; Malbert, Nathalie ; Lambert, Benoit ; Touboul, Andre ; Garat, François ; Proust, B.
Dans : Microelectronics Reliability
https://hal.science/hal-00183493
Study of the interaction between Heavy Ions and Integrated Circuits using a Pulsed Laser Beam
Lewis, Dean ; Fouillat, Pascal ; Pouget, Vincent ; Lapuyade, Hervé
Dans : European Physical Journal: Applied Physics
https://hal.science/hal-00185399
A VLSI CMOS Delay Oriented Waveform Converter for Polyphase Frequency Synthesizer
Spataro, Anne ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal ; Belot, D.
Dans : IEEE Journal of Solid-State Circuits
https://hal.science/hal-00183165
2001
hiperLAN 5.4 GHz Low-Power CMOS Synchronous Oscillator
Deval, Yann ; Begueret, Jean-Baptiste ; Spataro, Anne ; Fouillat, Pascal ; Belot, D. ; Badets, Franck
Dans : IEEE Transactions on Microwave Theory and Techniques
https://hal.science/hal-00183168
Low Frequency Gate Noise in a Diode-Connected MESFET: Measurements and Modeling
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Verdier, Frédéric ; Touboul, Andre ; K.J. Vandamme, Lode
Dans : IEEE Transactions on Electron Devices
https://hal.science/hal-00183496
Evolution of LF noise in power PHEMTs submitted to RF and DC step Stresses
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Verdier, Frédéric ; Touboul, Andre ; Huguet, Pierre ; Bonnet, René ; Pataud, Gérard
Dans : Microelectronics Reliability
https://hal.science/hal-00183495
Empirical modeling of LF gate noise in GaAs DCFET in impact ionization regime
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Verdier, Frédéric ; Touboul, Andre
Dans : IEEE Electron Device Letters
https://hal.science/hal-00183494
Front side and Backside OBIT Mappings applied to Single Event Transient Testing
Lewis, Dean ; Pouget, Vincent ; Beauchene, Thomas ; Lapuyade, Hervé ; Fouillat, Pascal ; Touboul, Andre ; Beaudoin, Félix ; Perdu, Philippe
Dans : Microelectronics Reliability
https://hal.science/hal-00185401
Backside Laser Testing of ICs for SET Sensitivity Evaluation
Lewis, Dean ; Pouget, Vincent ; Beaudoin, Félix ; Perdu, Philippe ; Lapuyade, Hervé ; Fouillat, Pascal ; Touboul, Andre
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00185400
Experimental procedure for the evaluation of GaAs-based HBT's reliability
Maneux, Cristell ; Labat, Nathalie ; Malbert, Nathalie ; Touboul, Andre ; Danto, Yves ; Dumas, Jean-Michel ; Benchimol, Jean-Louis ; Riet, Muriel
Dans : Microelectronics Journal
https://hal.science/hal-00183093
Theoretical Investigation of an Equivalent Laser LET
Pouget, Vincent ; Lapuyade, Hervé ; Fouillat, Pascal ; Lewis, Dean ; Buchner, S.
Dans : Microelectronics Reliability
https://hal.science/hal-00185402
2000
Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs
Duzellier, S. ; Falguere, D. ; Guibert, L. ; Pouget, V. ; Fouillat, P. ; Ecoffet, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-01887628
Comparison of RF and DC life-test effects on GaAs power MESFETs
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Verdier, Frédéric ; Touboul, Andre ; Huguet, Pierre ; Garat, François
Dans : Microelectronics Reliability
https://hal.science/hal-00183497
Laser Cross Section Measurement for the Evaluation of Single-Event Effects in Integrated Circuits
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Darracq, Frédéric ; Touboul, Andre
Dans : Microelectronics Reliability
https://hal.science/hal-00185403
SPICE Modeling of the Transient Response of Irradiated MOSFETs
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Deval, Yann ; Fouillat, Pascal ; Sarger, L.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00184300
1999
Effects of RF life-test on LF electrical parameters of GaAs power MESFETs
Malbert, Nathalie ; Lambert, Benoit ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves ; K.J. Vandamme, Lode ; Huguet, Pierre ; Auxemery, P. ; Garat, François
Dans : Microelectronics Reliability
https://hal.science/hal-00183094
Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
Pouget, Vincent ; Lewis, Dean ; Lapuyade, Hervé ; Briand, Renaud ; Fouillat, Pascal ; Sarger, L. ; Calvet, M. C.
Dans : Microelectronics Reliability
https://hal.science/hal-00185404
1998
Multiple fault diagnosis in analogue circuits using time domain response features and multilayer perceptrons
Ogg, S. ; Lesage, S. ; Jervis, B.W. ; Maidon, Y. ; Zimmer, T.
Dans : IEE Proceedings - Circuits, Devices and Systems
https://hal.science/hal-01721401
Method for BJT transit time evaluation
Zimmer, T. ; Duluc, J.B. ; Lewis, N.
Dans : Electronics Letters
https://hal.science/hal-01721403
1997
Analysis of hot electron degradations in pseudomorphic HEMTs by DCTS and LF noise characterization
Labat, Nathalie ; Saysset, Nathalie ; Maneux, Cristell ; Touboul, Andre ; Danto, Yves ; Cova, Paolo ; Fantini, Fausto
Dans : Microelectronics Reliability
https://hal.science/hal-00183095
Experimental analysis and 2D simulation of AlGaAs/GaAs HBT base leakage current
Maneux, Cristell ; Labat, Nathalie ; Saysset, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : Microelectronics Reliability
https://hal.science/hal-00183096
Modélisation des effets des radiations sur les transistors bipolaires
Montagner, Xavier ; Fouillat, Pascal ; Touboul, Andre ; Lapuyade, Hervé ; Schrimpf, Rd ; Galloway, Kf
Dans : REVUE DE l'ELECTRICITE ET DE L'ELECTRONIQUE
https://hal.science/hal-00185405
1996
A wafer level reliability method for short-loop processing
Duluc, J.B. ; Zimmer, T. ; Milet, N. ; Dom, J.P.
Dans : Microelectronics Reliability
https://hal.science/hal-01721400
Numerical Modelling of Mechanisms involved in Latchup Triggering by a Laser Beam
Fouillat, Pascal ; Lapuyade, Hervé ; Touboul, Andre ; Dom, Jean-Paul ; Gaillard, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.science/hal-00185407
Analysis of Latchup susceptibility to internal logical states by using a Laser beam
Fouillat, Pascal ; Lapuyade, Hervé ; Maidon, Yvan ; Dom, Jean-Paul
Dans : Microelectronic Engineering
https://hal.science/hal-00185406
Analysis of the surface base current drift in GaAs HBT's
Maneux, Cristell ; Labat, Nathalie ; Saysset, Nathalie ; Touboul, Andre ; Danto, Yves ; Dangla, Jean ; Launay, P. ; Dumas, Jean-Michel
Dans : Microelectronics Reliability
https://hal.science/hal-00183097
Comparison of conventional and pseudomorphic HEMTs performances by drain current transient spectroscopy and L.F. channel noise
Saysset, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves ; Dumas, Jean-Michel
Dans : Quality and Reliability Engineering International
https://hal.science/hal-00183498
1995
LF excess noise analysis of AlGaAs/GaAs and AlGaAs/InGaAs/GaAs HEMTs
Saysset, Nathalie ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves ; Dumas, Jean-Michel
Dans : Journal de Physique III
https://hal.science/hal-00183098
1994
Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing
Fouillat, Pascal ; Gervais-Ducouret, Stéphane ; Lapuyade, Hervé ; Dom, Jean-Paul
Dans : Quality and Reliability Engineering International
https://hal.science/hal-00185408
1992
Kink effect in HEMT structures: A trap-related semi-quantitative model and an empirical approach for spice simulation
Zimmer, T. ; Ouro Bodi, D. ; Dumas, J.M. ; Labat, N. ; Touboul, A. ; Danto, Y.
Dans : Solid-State Electronics
https://hal.science/hal-01721397
1991
Simple determination of BJT extrinsic base resistance
Zimmer, T. ; Meresse, A. ; Cazenave, Ph. ; Dom, J.P.
Dans : Electronics Letters
https://hal.science/hal-01721394
1990
Effect of cathode spacer layer on the current‐voltage characteristics of resonant tunneling diodes
Mounaix, Patrick ; Vanbesien, O. ; Lippens, D.
Dans : Applied Physics Letters
https://hal.science/hal-03932642
1981
HOT CARRIERS IN REDUCED GEOMETRY SURFACE-CHANNEL CHARGE-COUPLED DEVICES
Touboul, André ; Lopez, J. ; Lecoy, G.
Dans : Journal de Physique Colloques
https://hal.science/jpa-00221658
Articles dans des revues sans comité de lecture → 10 Voir
2023
Resonant tunneling diodes as sources for millimeter and submillimeter wavelengths
Bouregba, R. ; Vanbesien, O. ; Mounaix, Patrick ; Lippens, D. ; Palmateer, L. ; Pernot, J.C. ; Beaudin, G. ; Encrenaz, P. ; Bockenhoff, E. ; Nagle, J. ; Bois, P. ; Chevoir, F. ; Vinter, B.
Dans : IEEE Transactions on Microwave Theory and Techniques
https://hal.science/hal-03932659
2016
Les ondes Térahertz, une alternative prometteuse aux méthodes classiques de CND
Mounaix, Patrick ; Obaton, Anne Françoise
Dans :
https://hal.science/hal-01404483
2009
L'innovation comme moteur d'évolution des technologies de l'information ; vers un rapprochement des techniques et des usages
Claverie, Bernard ; Fouillat, Pascal
Dans : I-Revues - Edition Electronique de l'INIST - Information, innovation et interdisciplinarité
https://hal.science/hal-00983471
2007
IP-based design for analogue ASICs: A case study
Levi, Timothée ; Lewis, Noëlle ; Tomas, Jean ; Fouillat, Pascal
Dans : Einfochips Dashboard
https://hal.science/hal-00522423
1992
Resonant tunneling of holes in Ga 0.51 In 0.49 P/GaAs double‐barrier heterostructures
Lippens, D. ; Mounaix, Patrick ; Sadaune, V. ; Poisson, M. ; Brylinski, C.
Dans : Journal of Applied Physics
https://hal.science/hal-03932655
1991
Fabrication of high-performance Al/sub x/Ga/sub 1-x/As/In/sub y/Ga/sub 1-y/As/GaAs resonant tunneling diodes using a microwave-compatible technology
Lippens, D. ; Barbier, E. ; Mounaix, Patrick
Dans : IEEE Electron Device Letters
https://hal.science/hal-03932654
Integration of a resonant-tunneling structure for microwave applications
Mounaix, Patrick ; Fattorini, A. ; Lorriaux, J. ; Francois, M. ; Miens, M. ; Vanbremeerseh, J. ; Lippens, D.
Dans : Journal de Physique III
https://hal.science/hal-03932650
Measurement of negative differential conductance to 40 GHz for vertically integrated resonant tunnelling diodes
Mounaix, Patrick ; Bedu, P. ; Lippens, D. ; Barbier, E.
Dans : Electronics Letters
https://hal.science/hal-03932647
1989
Tunnel résonnant et effets d'électrons chauds dans les structures à double barrière : synthèse
Lippens, D. ; de Saint Pol, L. ; Bouregba, R. ; Mounaix, Patrick ; Vinchon, T.
Dans : Revue de Physique Appliquée
https://hal.science/hal-03932661
1988
Small-signal impedance of GaAs-AlxGa1−x as resonant tunnelling heterostructures at microwave frequency
Lippens, D. ; Mounaix, Patrick
Dans : Electronics Letters
https://hal.science/hal-03932662
Communication dans un congrès → 588 Voir
2023
Threshold voltage shift of deep-depletion ZrO2/O-terminated diamond MOSFET: numerical simulations and comparison with measurements
Couret, Marine ; Soto, Beatriz ; Araujo, Daniel ; Villar, Maria del Pilar ; Pernot, Julien ; Rouger, Nicolas
Dans : Hasselt Diamond Workshop 2023 - SBDD XXVII, Hasselt (Belgium)
https://hal.science/hal-04099953
SiGe-based Nanowire HBT for THz Applications
Panda, Soumya ; Fregonese, Sebastien ; Chakravorty, Anjan ; Zimmer, Thomas
Dans : IEEE Electron Devices Technology and Manufacturing (IEEE EDTM) Conference 2023, SEOUL (South Korea)
https://hal.science/hal-04037313
2022
TRL-calibration Standards with Emphasis on Crosstalk Reduction
Cabbia, Marco ; Fregonese, Sebastien ; Yadav, Chandan ; Zimmer, Thomas
Dans : 2022 14th Global Symposium on Millimeter-Waves & Terahertz (GSMM), Seoul (South Korea)
https://hal.science/hal-03776360
THz Spectroscopic Characterization of Oil Shales, IRMMW-THz 2022
Ojo, Moses ; Fauquet, Fréderic ; Bigourd, Damien ; Mounaix, Patrick
Dans : 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft (Netherlands)
https://hal.science/hal-03795106
THz pulse generation and single shot detection in a single ZnTe Crystal IRMMW-THz 2022
Ojo, Moses ; Fauquet, Fréderic ; Mounaix, Patrick ; Bigourd, Damien
Dans : 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft, Netherlands (France)
https://hal.science/hal-03795104
THz generation and single shot detection in a single-crystal layout
Ojo, Moses ; Fauquet, Frédéric ; Mounaix, Patrick ; Bigourd, D
Dans : French-German TeraHertz Conference 2022, Grande Motte (France)
https://hal.science/hal-03777627
THz-based spectral images of oil shales
Ojo, Moses ; Fauquet, Fréderic ; Bigourd, Damien ; Mounaix, Patrick
Dans : French-German TeraHertz Conference 2022, Grande Motte (France)
https://hal.science/hal-03777626
Multiplane phase retrieval with monochromatic terahertz sources
Petrov, Nikolay ; Chopard, Adrien ; Tsiplakova, Elizaveta ; Perraud, Jean-Baptiste ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : Unconventional Optical Imaging III, Strasbourg (France)
https://hal.science/hal-03845683
300 GHz frequency modulated continuous wave (FMCW) radar system for detecting rocks’ lithological changes
Sanjuan, Federico ; Fauquet, Frederic ; Fasentieux, Bertrand ; Mounaix, Patrick ; Guillet, Jean Paul
Dans : 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft (Netherlands)
https://hal.science/hal-03867518
Epoxy Mold Compound Characterization for Modeling Packaging Reliability
Tomas, Ariane ; Lambert, Benoit ; Fremont, Helene ; Malbert, Nathalie ; Labat, Nathalie
Dans : 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), St Julian (France)
https://hal.science/hal-03666406
S-Parameter Measurement and EM Simulation of Electronic Devices towards THz frequency range
Yadav, Chandan ; Fregonese, Sebastien ; Cabbia, Marco ; Deng, Marina ; de Matos, Magali ; Zimmer, Thomas
Dans : 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022), Cleveland, OH (United States)
https://hal.science/hal-03856275
2021
Teragogic : Open source platform for low cost millimeter wave sensing and terahertz imaging
Chopard, Adrien ; Fauquet, Frederic ; Goh, Jing Shun ; Pan, Mingming ; Mounaix, Patrick ; Simonov, Anton ; Smolyanskaya, Olga ; Guillet, Jean-Paul
Dans : 2021 IEEE Radar Conference (RadarConf21), Atlanta (France)
https://hal.science/hal-03273550
Concours CUBE2020 et réduction de l'impact environnemental du laboratoire IMS
Dejous, Corinne ; Alquier, Benoît ; Ferré, Guillaume ; Hirsch, Lionel ; Salotti, Jean-Marc ; Villesuzanne, Patrick ; Zimmer, Thomas
Dans : Colloque de l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes (CETSIS 2020), Valenciennes (en ligne) (France)
https://hal.science/hal-03315572
Toward Mid-Infrared Ultra-Short Pulse Generation in a Gas-Filled Hollow-Core Photonic Crystal fiber
Fourcade-Dutin, Coralie ; Miranda, Olivia ; Mounaix, Patrick ; Bigourd, Damien
Dans : OSA Advanced Photonics Congress, Washington DC (United States)
https://hal.science/hal-03425625
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance
Fregonese, Sebastien ; Mukherjee, Chhandak ; Rucker, Holger ; Chevalier, Pascal ; Fischer, Gerhard ; Celi, Didier ; Deng, Marina ; Couret, Marine ; Marc, Francois ; Maneux, Cristell ; Zimmer, Thomas
Dans : 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), Monterey (France)
https://hal.science/hal-03776392
Augmented reality terahertz (AR-THz) interface for imaging and sensing
Guillet, Jean-Paul ; Fauquet, Frederic ; Chopard, Adrien ; Mounaix, Patrick ; Rioult, Jean ; Jaeschke, Timo
Dans : IRMMW-THz 2021, 46th International Conference on Infrared, Millimeter and Terahertz Waves, Chengdu (China)
https://hal.science/hal-03274777
Terahertz Diffractive Reflection Phase Imaging
Mounaix, Patrick
Dans : The 28th International Conference on Advanced Laser Technologies (ALT'21), Moscou (Russia)
https://hal.science/hal-03450100
Terahertz data processing for imaging and spectroscopy of artwork
Odlyanitskiy, Evgeniy ; Smolyanskaya, Olga ; Sirro, Sergei ; Guillet, Jean-Paul ; Detalle, Vincent ; Menu, Michel
Dans : Optics for Arts, Architecture, and Archaeology (O3A) VIII, Online Only (France)
https://hal.science/hal-03277818
Influence of Calibration Methods and RF Probes on the RF Characterization of 28FD-SOI MOSFET
Pradeep, Karthi ; Deng, Marina ; Dormieu, Benjamin ; Scheer, Patrick ; Matos, Magali De ; Zimmer, Thomas ; Fregonese, Sebastien
Dans : 2021 IEEE Latin America Electron Devices Conference (LAEDC), Mexico (Mexico)
https://hal.science/hal-03273422
Reliability of Fan-Out Wafer Level Packaging For III-V RF Power MMICs
Tomas, Ariane ; Marechal, Laurent ; Almeida, Rodrigo ; Neffati, Mehdy ; Malbert, Nathalie ; Fremont, Helene ; Labat, Nathalie ; Garnier, Arnaud
Dans : 2021 IEEE 71st Electronic Components and Technology Conference (ECTC), San Diego (United States)
https://hal.science/hal-03336953
Guideline for test-structures placement for on-Wafer calibration in sub-THz Si device characterization
Yadav, Chandan ; Cabbia, Marco ; Fregonese, Sebastien ; Deng, Marina ; de Matos, Magali ; Zimmer, Thomas
Dans : 2021 IEEE/MTT-S International Microwave Symposium - IMS 2021, Atlanta (United States)
https://hal.science/hal-03851109
Four-wave mixing process induced by a self-phase modulated pulse in a hollow core capillary
Zurita Miranda, Olivia ; Fourcade Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frédéric ; Maillotte, Hervé ; Mounaix, Patrick ; Bigourd, Damien
Dans : Advanced Photonics Congress, Washington (United States)
https://hal.science/hal-03446874
Four-wave mixing process induced by a self-phase modulated pulse in a hollow core capillary
Zurita-Miranda, Olivia ; Fourcade-Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frederic ; Maillotte, Hervé ; Mounaix, Patrick ; Bigourd, Damien
Dans : OSA Advanced Photonics Congress, Washington DC (United States)
https://hal.science/hal-03425631
2020
In-Situ Calibration and De-Embedding Test Structure Design for SiGe HBT On-Wafer Characterization up to 500 GHz
Cabbia, M. ; Deng, Marina ; Fregonese, S. ; Matos, M. De ; Celi, D. ; Zimmer, T.
Dans : 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), San Antonio (United States)
https://hal.science/hal-02569052
3D painting distribution extracted by time domain spectroscopy
Cassar, Q ; Chopard, A ; Fauquet, F ; Guillet, Jean-Paul ; Perraud, J ; Mounaix, P
Dans : SNAIA 2020, Paris (France)
https://hal.science/hal-03284459
Simplified FMCW Radars Implementation for Guided Terahertz Reflectometry Sensing
Chopard, A. ; Pan, M. ; Fauquet, F. ; Mounaix, P. ; Guillet, Jean-Paul
Dans : 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Buffalo (France)
https://hal.science/hal-03273467
Spectral Distributions of Chirped Pulsed Four-Wave Mixing in a Photonic Crystal Fiber Measured by Dispersive Fourier Transform Method
Fourcade-Dutin, Coralie ; Robert, Paul ; Dauliat, Romain ; Jamier, Raphaël ; Munõz-Marco, Hector ; Pérez-Millan, Pere ; Dudley, John ; Maillotte, Hervé ; Roy, Philippe ; Bigourd, Damien
Dans : Advanced Photonics Congress-Nonlinear Photonics,, Montreal (virtual ) (Canada)
https://hal.science/hal-02965784
Teragogic: Open source platform for low cost millimeter wave sensing, terahertz imaging and control
Guillet, Jean-Paul ; Chopard, Adrien ; Fauquet, Frederic ; Goh, Jing ; Pan, Mingming ; Simonov, Anton ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : SNAIA 2020, paris (France)
https://hal.science/hal-03284466
Terahertz Multiple-Plane Phase Retrieval
Mounaix, Patrick ; Petrov, Nikolay ; Perraud, Jean Baptiste ; Choppard, Adriene ; Guillet, Jean-Paul ; Smolyanskaya, Olga
Dans : Digital Holography and Three-Dimensional Imaging, Washington (United States)
https://hal.science/hal-03000014
Reconstruction of optical parameters for blood plasma pellets using pulse terahertz holography method
Odlyanitskiy, E.L. ; Kulya, M.S. ; Cassar, Q. ; Mustafin, I.A. ; Trukhin, V.N. ; Korolev, D.V. ; Kononova, Y.V. ; Mounaix, P. ; Guillet, Jean-Paul ; Petrov, N.V. ; Smolyanskaya, O.A.
Dans : 2020 International Conference Laser Optics (ICLO), St. Petersburg (France)
https://hal.science/hal-03273456
A fast and homogeneous illumination applied to full-field terahertz imaging
Perraud, J-B. ; Chopard, A. ; Guillet, Jean-Paul ; Gellie, P. ; Fauquet, F. ; Mounaix, P.
Dans : 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Buffalo (France)
https://hal.science/hal-03273485
Terahertz Phase Retrieval Imaging with Multiple-Plane Data
Petrov, Nikolay ; Baptiste Perraud, Jean ; Choppard, Adriene ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : SNAIA 2020, Paris (France)
https://hal.science/hal-03284478
Terahertz Diffractive Reflection Phase Imaging
Petrov, Nikolay ; Perraud, Jean-Baptiste ; Chopard, Adrien ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Mounaix, Patrick
Dans : 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Buffalo (France)
https://hal.science/hal-03273489
TeraPulse Lx for terahertz imaging of painting on canvas
Sirro, Sergei ; Guillet, Jean-Paul ; Smolyanskaya, Olga ; Portieri, Alessia ; Taday, Phil ; Arnone, Donald
Dans : SNAIA 2020, Paris (France)
https://hal.science/hal-03284485
Tunable source of infrared pulses in gas-filled hollow core capillary
Zurita Miranda, Olivia ; Fourcade Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frédéric ; Guillet, Jean-Paul ; Darracq, Frédéric ; Mounaix, Patrick ; Maillotte, Hervé ; Bigourd, Damien
Dans : OSA Laser Congress, Washington, DC (United States)
https://hal.science/hal-03103884
Tunable source of infrared pulses in gas-filled hollow core capillary
Zurita-Miranda, Olivia ; Fourcade-Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frederic ; Guillet, Jean-Paul ; Darracq, Frédéric ; Mounaix, Patrick ; Maillotte, Hervé ; Bigourd, Damien
Dans : Laser Congress (virtual event), San Diego (France)
https://hal.science/hal-02965842
Optical parametric amplification in gas-filled hollow core capillary for the generation of tunable pulses in the infrared
Zurita-Miranda, Olivia ; Fourcade Dutin, Coralie ; Béjot, Pierre ; Fauquet, Frederic ; Guillet, Jean-Paul ; Darracq, Frédéric ; Mounaix, Patrick ; Maillotte, H ; Bigourd, D
Dans : 9TH EPS-QEOD EUROPHOTON, Prague (Czech Republic)
https://hal.science/hal-02965824
2019
Terahertz pulse time-domain holography method for phase imaging of breast tissue
Balbekin, Nikolay ; Cassar, Quentin ; Smolyanskaya, Olga ; Kulya, Maksim ; Petrov, Nikolay ; Macgrogan, Gaëtan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Tuchin, Valery
Dans : Quantitative Phase Imaging V, San Francisco (France)
https://hal.science/hal-02481331
The terahertz pulse time-domain holography method for phase imaging of breast tissue sample
Balbekin, Nikolay ; Cassar, Quentin ; Smolyanskaya, Olga ; Macgrogan, Gaëtan ; Guillet, Jean-Paul ; Mounaix, Patrick ; Kravtsenyuk, Olga ; Kulya, Maksim ; Petrov, Nikolay
Dans : Digital Holography and Three-Dimensional Imaging, Bordeaux (France)
https://hal.science/hal-02381146
Characterization of Sub-THz & THz Transistors
Cabbia, Marco ; Fregonese, Sebastien ; Deng, Marina ; de Matos, Magalie ; Thomas, Zimmer ; Upadhyay, Abhishek Kumar
Dans : 3rd IEEE Student Branch BEE Week, Bordeaux (France)
https://hal.science/hal-02512268
Caractérisation RF de transistors bipolaires à hétérojonction SiGe jusqu’à 500 GHz
Cabbia, Marco ; Deng, Marina ; Yadav, Chandan ; Fregonese, Sebastien ; de Matos, Magalie ; Zimmer, Thomas
Dans : XIIIème colloque national du GDR SOC², Montpellier (France)
https://hal.science/hal-02512232
Contactless Terahertz Paint Thickness Measurements : specificity of aeronautics industry
Cassar, Quentin ; Susset, A. ; Fauché, P. ; Bou Sleiman, J. ; Perraud, J-B. ; Guillet, J-P. ; Mounaix, Patrick
Dans : AeroNDT 2019 11th International Symposium on NDT in Aerospace, Nov 2019, Paris-Saclay, France, Saclay (France)
https://hal.science/hal-02877394
Iterative Tree Algorithm for the Assessment of Optical Path Contributions within Stratified Structures
Cassar, Q. ; Chopard, A. ; Fauquet, F. ; Guillet, J.P. ; Pan, M. ; Perraud, J.B. ; Mounaix, Patrick
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350806
Ancient Painting on Copper Substrate Inspected by Terahertz Spectroscopy-Imaging
Cassar, Q. ; Koch-Dandolo, C.L. ; Guillet, J.P. ; Roux, M. ; Fauquet, F. ; Mounaix, Patrick
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350792
Compact Modeling of UTC Photodiodes Enabling Future Terahertz Communication System Design
Chhandak, Mukherjee ; Natrella, M. ; Seddon, J. ; Grahams, C. ; Mounaix, Patrick ; Renaud, C. C. ; Maneux, Cristell
Dans : XIIIème Colloque du GdR SOC2, Montpellier (France)
https://hal.science/hal-02511632
Millimeter waves Radar: A way to see through the airplane covering?
Chopard, Adrien ; Sleiman, Joyce ; Cassar, Q. ; Fauché, P. ; Guillet, J. ; Mounaix, Patrick ; Jean-Baptiste, Perraud ; Susset, A.
Dans : 11 symposium international : NDT in Aerospace, Saclay (France)
https://hal.science/hal-02877339
A fast and homogeneous lighting for full-field THz imaging
Chopard, Angèle ; Perraud, J-B. ; Guillet, J-P. ; Gellie, P. ; Fauquet, F. ; Mounaix, Patrick
Dans : Information Storage System and Technology, Wuhan (France)
https://hal.science/hal-02877264
Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current
Couret, Marine ; Fischer, Gerhard ; Garcia-Lopez, Iria ; de Matos, Magali ; Marc, François ; Maneux, Cristell
Dans : ESSDERC 2019, Cracow (Poland)
https://hal.science/hal-02379120
Physical, small-signal and pulsed thermal impedance characterization of multi-finger SiGe HBTs close to the SOA edges
Couret, Marine ; Fischer, Gerhard ; Fregonese, Sebastien ; Zimmer, Thomas ; Maneux, Cristell
Dans : 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), Kita-Kyushu City (Japan)
https://hal.science/hal-02276656
Co-integration of Enhancement and Depletion Modes of GaN-based Transistors for Next Generation RF Communication Circuits
Defrance, N. ; Okada, Etienne ; Albany, Florent ; Labat, Nathalie ; Malbert, Nathalie ; Frayssinet, Éric ; Cordier, Yvon ; Cozette, Flavien ; Hassan, Maher, ; Walasiak, E ; Lecourt, François
Dans : WOCSDICE 2019, Cabourg (France)
https://hal.science/hal-02502499
RF Characterization of 28 nm FD-SOI Transistors Up to 220 GHz
Deng, Marina ; Frégonèse, Sébastien ; Dorrnieu, Benjamin ; Scheer, Patrick ; de Matos, Magali ; Zimmer, Thomas
Dans : 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble (France)
https://hal.science/hal-02517274
Sensing with terahertz FMCW radars
Guillet, Jean-Paul ; Fauquet, Frederic ; Mounaix, Patrick
Dans : Smart NanoMaterials 2019: Advances, Innovation and Applications, Paris (France)
https://hal.science/hal-02481272
Comparative study of millimeter wave III/V semiconductor and integrated silicon based FMCW radars
Guillet, Jean-Paul ; Fauquet, Frederic ; Chopard, Adrien ; Perraud, Jean-Baptiste ; Roux, Marie ; Mounaix, Patrick
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350788
Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions
Jaoul, Mathieu ; Ney, David ; Celi, Didier ; Maneux, Cristell ; Zimmer, Thomas
Dans : 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), Kita-Kyushu City (Japan)
https://hal.science/hal-02379157
Méthodologie d’extraction de la puissance de sortie au cours de vieillissements accélérés à partir de mesures I-V pulsées
Magnier, Florent ; Chang, Christophe ; Lambert, Benoit ; Curutchet, Arnaud ; Labat, Nathalie ; Malbert, Nathalie
Dans : JNM 2019, Caen (France)
https://hal.science/hal-02462791
Investigation of trap induced power drift on 0.15µm GaN technology after aging tests
Magnier, Florent ; Lambert, Benoit ; Chang, Christophe ; Curutchet, Arnaud ; Labat, Nathalie ; Malbert, Nathalie
Dans : ESREF 2019, Toulouse (France)
https://hal.science/hal-02462713
Using soy protein in the three-component phantom for breast cancer mimicking
Mounaix, Patrick ; Cassar, Q. ; Lykina, A.A. ; Lepeshkin, A.I. ; Baranenko, D.A. ; Kravtsenyuk, O.V. ; Mounaux, P. ; Guillet, J.-P. ; Smolyanskaya, O.A.
Dans : SNAIA 2019, Paris (France)
https://hal.science/hal-02883376
Near field and far field investigations on breast cancer tissus
Mounaix, Patrick ; Quentin, Cassar ; Macgrogan, Gaëtan ; Pfeiffer, Ullrich ; Zimmer, Thomas ; Guillet, Jean-Paul
Dans : Smart NanoMaterials 2019: Advances, Innovation and Applications, Paris (France)
https://hal.science/hal-02481268
First Uni-Traveling Carrier Photodiode Compact Model Enabling Future Terahertz Communication System Design
Mukherjee, C ; Mounaix, Patrick ; Maneux, C. ; Natrella, M. ; Seddon, J ; Graham, C. ; Renaud, Cédric
Dans : ESSDERC 2019, Cracow (Poland)
https://hal.science/hal-02379096
Scanning laser terahertz near-field reflection microscope for biological analysis
Okada, Kosuke ; Serita, Kazunori ; Zang, Zirui ; Murakami, Hironaru ; Kawayama, Iwao ; Cassar, Quentin ; Al-Ibadi, Amel ; Macgrogan, Gaëtan ; Zimmer, Thomas ; Guillet, Jean-Paul ; Mounaix, Patrick ; Tonouchi, Masayoshi
Dans : Bio-Optics: Design and Application, Tucson (United States)
https://hal.science/hal-02381160
Pulse terahertz holographic reconstruction of optical parameters for blood plasma pellets
Olga, Smolyanskaya ; Trukhin, Valery ; Quentin, Cassar ; Evgeniy, Odlyanitskiy ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : Smart NanoMaterials 2019: Advances, Innovation and Applications, Paris (France)
https://hal.science/hal-02481283
THz imaging with a hollow core waveguide
Pan, Mingming ; Guillet, Jean-Paul ; Humbert, Georges ; Fauquet, Frederic ; Lewis, Dean ; Mounaix, Patrick
Dans : French-German THz Conference, Kaiserslautern (Germany)
https://hal.science/hal-02523215
Study of a THz Hollow-core Fiber for Sample Reflectance Analysis
Pan, Mingming ; Cordeiro, Cristiano ; Fauquet, Frederic ; Mounaix, Patrick ; Rodrigues, Gildo ; Franco, Marcos ; Guillet, Jean-Paul
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350784
TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range
Panda, Soumya Ranjan ; Frégonèse, Sébastien ; Chakravorty, Anjan ; Zimmer, Thomas
Dans : 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), Nashville (United States)
https://hal.science/hal-02532692
Assessment of device RF performance and behavior using TCAD simulation
Ranjan Panda, Soumya ; Fregonese, Sébastien ; Deng, Marina ; Chakravorty, Anjan ; Zimmer, Thomas
Dans : IEEE BEE BRANCH, Bordeaux - Talence (France)
https://hal.science/hal-02404058
Theoretical and Experimental Analysis of the Mechanisms of the Interaction of Terahertz Radiation with Neurons
Ratushniak, A ; Zapara, T ; Proskura, A ; Kozlov, A ; Serdyukov, D ; Cherkasova, O ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : Bright Far-Infrared Optoelectronic Sources Applied to Field-Matter Interaction Studies, Life Sciences and Environmental Monitoring International Workshop, Nizhny Novgorod (Russia)
https://hal.science/hal-02482586
Collector-substrate modeling of SiGe HBTs up to THz range
Saha, Bishwadeep ; Frégonèse, Sébastien ; Panda, Soumya Ranjan ; Chakravorty, Anjan ; Celi, Didier ; Zimmer, Thomas
Dans : 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), Nashville (France)
https://hal.science/hal-02532693
Interaction of Terahertz Radiation with Bio-Like Objects: Theoretical and Numerical Modelling, Real Objects and Phantom Experiments
Smolyanskaya, O. ; Cassar, Q. ; Kravtsenyuk, O ; Odlyanitskiy, E ; Mounaix, Patrick ; Guillet, Jean-Paul ; Zaytsev, K. ; Petrov, N
Dans : Bright Far-Infrared Optoelectronic Sources Applied to Field-Matter Interaction Studies, Life Sciences and Environmental Monitoring International Workshop, Nizhny Novgorod (Russia)
https://hal.science/hal-02482611
Reconstructed THz phase image of the two-component numerical model of breast cancer tissue
Smolyanskaya, Olga ; Kulya, Maksim ; Cassar, Quentin ; Kravtsenuk, Olga ; Mounaix, Patrick ; Guillet, Jean-Paul ; Zaytsev, Kirill ; Petrov, Nikolay
Dans : 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Paris (France)
https://hal.science/hal-02350797
Terahertz spectra of drug-laden magnetic nanoparticles
Smolyanskaya, Olga ; Trukhin, Valery ; Gavrilova, Polina ; Odlyanitskiy, Evgeniy ; Semenova, Anna ; Cassar, Quentin ; Guillet, Jean-Paul ; Mounaix, Patrick ; Gareev, Kamil ; Korolev, Dmitry
Dans : Colloidal Nanoparticles for Biomedical Applications XIV, San Francisco (United States)
https://hal.univ-grenoble-alpes.fr/hal-02335873
On the Variation in Short-Open De-embedded S-parameter Measurement of SiGe HBT upto 500 GHz
Yadav, Chandan ; Fregonese, Sebastien ; Deng, Marina ; Cabbia, Marco ; de Matos, Magali ; Zimmer, Thomas
Dans : 2019 12th German Microwave Conference (GeMiC), Stuttgart (Germany)
https://hal.science/hal-02305963
Analysis of Test Structure Design Induced Variation in on Si On-wafer TRL Calibration in sub-THz
Yadav, Chandan ; Fregonese, Sebastien ; Deng, Marina ; Cabbia, Marco ; de Matos, Magali ; Jaoul, Mathieu ; Zimmer, Thomas
Dans : 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS), Kita-Kyushu City (France)
https://hal.science/hal-02163807
2018
Studies on PCA for Breast Tissue Segmentation
Cassar, Q. ; Al-Ibadi, A. ; Mavarani, L. ; Hillger, P. ; Grzyb, J. ; Macgrogan, G. ; Pfeiffer, U.R. ; Zimmer, T. ; Guillet, J.P. ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (France)
https://hal.science/hal-02877404
Varnishes of painting material studied by terahertz spectroscopy
Cassar, Q. ; Koch-Dandolo, C.L. ; Guillet, J.P. ; Roux, M. ; Fauquet, F. ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (France)
https://hal.science/hal-02877398
Varnishes of painting material studied by terahertz spectroscopy
Cassar, Q. ; Koch-Dandolo, C.L. ; Guillet, J.P. ; Roux, M. ; Fauquet, F. ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (France)
https://hal.science/hal-02877395
2D-Graphene Epitaxy on SiC for RF Application: Fabrication, Electrical Characterization and Noise Performance
Fadil, Dalal ; Wei, Wei ; Deng, Marina ; Fregonese, Sebastien ; Stuprinski, Wlodek ; Pallecchi, Emiliano ; Happy, Henri
Dans : 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018, Philadelphia (United States)
https://hal.science/hal-02372682
3D-additive manufacturing non-destructive characterization with terahertz waves (Conference Presentation)
Guillet, Jean-Paul ; Obaton, Anne-Françoise ; Perraud, Jean Baptiste ; Balacey, Hugo ; Recur, Benoît ; Mounaix, Patrick
Dans : Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, San Francisco (United States)
https://hal.science/hal-02877419
A 128-pixel 0.56THz sensing array for real-time near-field imaging in 0.13μm SiGe BiCMOS
Hillger, Philipp ; Jain, Ritesh ; Grzyb, Janusz ; Mavarani, Laven ; Heinemann, Bernd ; Grogan, Gaëtan Mac ; Mounaix, Patrick ; Zimmer, Thomas ; Pfeiffer, Ullrich
Dans : 2018 IEEE International Solid-State Circuits Conference (ISSCC), San Francisco (United States)
https://hal.science/hal-02877416
A Solid-State 0.56 THz Near-Field Array for μM-Scale Surface Imaging
Hillger, Philipp ; Jain, Ritesh ; Grzyb, Janusz ; Mavarani, Laven ; Bucher, Thomas ; Pfeiffer, Ullrich ; Macgrogan, Gaëtan ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya (Japan)
https://hal.science/hal-01923726
Shape from Focus Applied to Real- Time Terahertz Imaging
Jean-Baptiste, Perraud ; Guillet, Jean-Paul ; Hamdi, Maher ; Redon, Olivier ; Meilhan, Jérôme ; Simoens, François ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya (Japan)
https://hal.science/hal-01923691
Investigation of the trap-limited transient response of GaN HEMTs
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : 2018 Integrated Nonlinear Microwave and Millimetre-wave Circuits Workshop, Brives (France)
https://hal.science/hal-01851997
Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN HEMTs
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : 2018 IEEE International Reliability Physics Symposium (IRPS), Burlingham (United States)
https://hal.science/hal-01787593
Investigation of Trapping Behaviour in GaN HEMTs through physical TCAD Simulation of Capacitance Voltage characteristics
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : EuroSimE 2018, Toulouse (France)
https://hal.science/hal-01718857
Comprehensive Study into Underlying Mechanisms of Anomalous Gate Leakage Degradation in GaN High Electron Mobility Transistors
Kalparupa, Mukherjee ; Darracq, Frédéric ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : IRPS 2018, San Francisco (United States)
https://hal.science/hal-01718850
Terahertz Spectroscopy and Quantum Mechanical Simulations of Crystalline Historical Pigments
Kleist, Elyse ; Dandolo, Corinna ; Korter, Timothy ; Mounaix, Patrick
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (France)
https://hal.science/hal-02877401
Terahertz frequency modulated continuous wave imaging for non-destructive evaluation of painting and multilayer parts
Ma, Xue ; Wang, Kejia ; Fauquet, Frederic ; Roux, Marie ; Koch Dandolo, Corinna Ludovica ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, San Francisco (France)
https://hal.science/hal-01923526
Towards industrial applications of terahertz real-time imaging
Mounaix, Patrick ; Simoens, François ; Dussopt, Laurent ; Meilhan, Jérôme ; Nicolas, Nicolas ; Monnier, Nicolas ; Siligaris, Alexandre ; Hiberty, Bruno ; Perraud, Jean-Baptiste ; Lalanne-Dera, Jérémy ; Redon, Olivier ; Sadwick, Laurence ; Yang, Tianxin
Dans : Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, San Francisco (France)
https://hal.science/hal-01734577
Guided terahertz pulsed reflectometry: a remote probe for near-field imaging (Conference Presentation)
Pan, Mingming ; Fauquet, Frederic ; Lewis, Dean ; Darracq, Frédéric ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, San Francisco (United States)
https://hal.science/hal-02877422
Comparative study of terahertz waveguide in reflective mode configuration
Pan, M. ; Guillet, J.P. ; Humbert, G. ; Fauquet, F. ; Lewis, D. ; Mounaix, P.
Dans : 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz 2018), Nagoya (Japan)
https://hal.science/hal-02522845
Interaction of terahertz radiation with tissue phantoms: numerical and experimental studies
Smolyanskaya, O.A. ; Cassar, Q. ; Kulya, M.S. ; Petrov, N.V. ; Zaytsev, K.I. ; Lepeshkin, A.I. ; Guillet, J.-P. ; Mounaix, P. ; Tuchin, V.
Dans : 3rd International Conference “Terahertz and Microwave Radiation: Generation, Detection and Applications” (TERA-2018), Nizhny Novgorod (Russia)
https://hal.science/hal-02481311
Impact of on-Silicon De-Embedding Test Structures and RF Probes Design in the Sub-THz Range
Yadav, Chandan ; Deng, Marina ; Fregonese, Sebastien ; de Matos, Magali ; Plano, Bernard ; Zimmer, Thomas
Dans : 2018 48th European Microwave Conference (EuMC), Madrid (Spain)
https://hal.science/hal-01985501
Importance of complete characterization setup on on-wafer TRL calibration in sub-THz range
Yadav, Chandan ; Deng, Marina ; de Matos, Magali ; Fregonese, Sébastien ; Zimmer, Thomas
Dans : 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS), Austin (United States)
https://hal.science/hal-01838050
Characterization of external pressure effects on lithium-ion pouch cell
Zhang, Yuanci ; Briat, Olivier ; Delétage, Jean-Yves ; Martin, Cyril ; Gager, Guillaume ; Vinassa, Jean-Michel
Dans : 19th International Conference of IEEE on Industrial Technology (ICIT), Lyon (France)
https://hal.science/hal-01892433
2017
Terahertz Biomedical Imaging: From Multivariate Analysis and Detection to Material Parameter Extraction
Amel, Al-Ibadi ; Bou-Sleiman, Joyce ; Quentin, Cassar ; Macgrogan, Gaëtan ; Balacey, Hugo ; Thomas, Zimmer ; Mounaix, Patrick ; Guillet, Jean-Paul
Dans : 2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), Saint Petersbourg (Russia)
https://u-bourgogne.hal.science/hal-01546451
Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs
Balanethiram, Suresh ; d'Esposito, Rosario ; Fregonese, Sebastien ; Zimmer, Thomas ; Berkner, Jorg ; Céli, Didier
Dans : 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Miami (France)
https://hal.science/hal-01695326
Phase uncertainty in different THz time-domain spectrometers
Bernier, Maxime ; Garet, Frédéric ; Coutaz, Jean-Louis ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun (Mexico)
https://hal.univ-grenoble-alpes.fr/hal-02009670
Characterization and modelling of SubTHz & THz-transistors
Deng, Marina ; Fregonese, Sebastien ; de Matos, Magali ; Thomas, Zimmer
Dans : 2nd IEEE Student Branch BEE Week, Bordeaux (France)
https://hal.science/hal-02512287
Design of Silicon On-Wafer Sub-THz Calibration Kit
Deng, Marina ; Fregonese, Sebastien ; Céli, Didier ; Chevalier, Pascal ; de Matos, Magali ; Zimmer, Thomas
Dans : 2017 Mediterranean Microwave Symposium (MMS), Marseille (France)
https://hal.science/hal-01985481
Agar and Silica Gel Based Biotissue-mimicking Phantoms in THz Frequency Range
Evgeniy, Odlyanitskiy ; Olga, Smolyanskaya ; Kravtsenyuk, O ; Guillet, Jean-Paul ; A, Popov ; Mikhail, Khodzitsky
Dans : 2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), Saint Petersbourg (Russia)
https://u-bourgogne.hal.science/hal-01546453
HOBIT: Hybrid Optical Bench for Innovative Teaching
Furio, David ; Fleck, Stéphanie ; Bousquet, Bruno ; Guillet, Jean-Paul ; Canioni, Lionel ; Hachet, Martin
Dans : CHI'17 - Proceedings of the 2017 CHI Conference on Human Factors in Computing Systems, Denver (United States)
https://inria.hal.science/hal-01455510
Performances and robustness of IR seed Laser diodes under large overcurrent and short-pulse conditions for fiber Laser applications
Galès, Germain Le ; Joly, Simon ; Bolanos, Western ; Pedroza, Guillaume ; Morisset, Adèle ; Darracq, Frédéric ; Lewis, Dean ; Bettiati, Mauro ; Laruelle, François ; Bechou, Laurent
Dans : EMN Americas Meetings, Victoria (Canada)
https://hal.science/hal-01719975
Enseignement dans le supérieur impliquant l'usage du Smartphone.
Guillet, Jean-Paul
Dans : Réunion annuel du programme IDEX, Bordeaux (France)
https://hal.science/hal-03637774
Art Painting Testing with Terahertz Pulse and Frequency Modulated Continuous Wave
Guillet, Jean-Paul ; Roux, Marie ; Wang, Kejian ; Ma, Xue ; Fauquet, Frederic ; Darracq, Frederic ; Mounaix, Patrick
Dans : 2017 Progress In Electromagnetics Research Symposium, Saint Petersbourg (Russia)
https://u-bourgogne.hal.science/hal-01546450
Contrôle non destructif terahertz et fabrication additive
Guillet, Jean-Paul ; Mounaix, Patrick
Dans : La photonique appliquée à l'aéronautique, Bordeaux (France)
https://hal.science/hal-01456318
Class-J Power Amplifier for 5G Applications in 28nm CMOS FD-SOI Technology
Hanna, Tony ; Deltimple, Nathalie ; Fregonese, Sebastien
Dans : SBCCI 2017, Fortaleza (Brazil)
https://hal.science/hal-01618189
A Wideband Highly Efficient Class-J Integrated Power Amplifier for 5G Applications
Hanna, Tony ; Deltimple, Nathalie ; Fregonese, Sebastien
Dans : NEWCAS2017, Strasbourg (France)
https://hal.science/hal-01618182
Avalanche Compact model featuring SiGe HBTs Characteristics up to BVCBO
Jaoul, Mathieu ; Céli, Didier ; Maneux, Cristell
Dans : HICUM Workshop 2017, Dresden (Germany)
https://hal.science/hal-02511645
Évaluation de la fiabilité des composants HEMTs AlGaN / GaN à grille nanométrique sur substrat de silicium par des essais de vieillissement accéléré « on-state »
Lakhdar, Hadhemi ; Labat, Nathalie ; Curutchet, Arnaud ; Defrance, N. ; Lesecq, Marie ; de Jaeger, Jean-Claude ; Malbert, Nathalie
Dans : JNM 2017, Saint Malo (France)
https://hal.science/hal-02462775
Évaluation de la fiabilité des composants HEMTs AlGaN / GaN à grille nanométrique sur substrat de silicium par des essais de vieillissement accéléré on-state
Lakhdar, Hadhemi ; Labat, Nathalie ; Curutchet, Arnaud ; Defrance, N. ; Lesecq, Marie ; Dejaeger, J.C. ; Malbert, Nathalie
Dans : JNM 2017, Saint Malo (France)
https://hal.science/hal-01718864
NF 50 Ohm: Improvement of the high frequency noise measurement bench 0.8 – 18 GHz of the NANOCOM platform
Medzegue, Ghyslain ; de Matos, Magali ; Fregonese, Sebastien ; Thomas, Zimmer ; Deng, Marina
Dans : 2nd IEEE Student Branch BEE Week, Bordeaux (France)
https://hal.science/hal-02512283
THz Tomography and image processing: a new tool for polymer and ceramic additive manufacturing quality control
Mounaix, Patrick
Dans : 15th ASIA PACIFIC CONFERENCE FOR NON-DESTRUCTIVE TESTING (APCNDT) , singapour (Singapore)
https://hal.science/hal-01653651
Terahertz Paint Thickness Measurements : from lab to automotive and aeronautics Industry
Mounaix, Patrick
Dans : 5th ASIA PACIFIC CONFERENCE FOR NON-DESTRUCTIVE TESTING (APCNDT), Singapour (Singapore)
https://hal.science/hal-01653647
Advantages of TCAD simulation towards inverstigation of reliability concerns in GaN HEMTs for RF power applications
Mukherjee, Kalparupa ; Darracq, Frederic ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : BEE Week at IEEE IM an MTT-S Day, IEEE student Branch, Bordeaux (France)
https://hal.science/hal-02462765
TCAD simulation capabilities towards gate leakage current analysis of advanced AlGaN/GaN HEMT devices
Mukherjee, Kalparupa ; Darracq, Frederic ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : ESREF 2017, Bordeaux (France)
https://hal.science/hal-02462694
Guided terahertz pulsed reflectometry simulation with near field probe
Pan, M. ; Guillet, J.P. ; Fauquet, F. ; Lewis, D. ; Mounaix, P.
Dans : 2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun (Mexico)
https://hal.science/hal-02478521
High frequency and noise performance of GFETs
Wei, W. ; Fadil, D. ; Pallecchi, Emiliano ; Dambrine, Gilles ; Happy, Henri ; Deng, Marina ; Fregonese, S. ; Zimmer, T.
Dans : 24th International Conference on Noise and Fluctuations, ICNF 2017, Vilnius (Lithuania)
https://hal.science/hal-01639676
Performance quantification of last generation Li-ion batteries in wide temperature range
Zhang, Yuanci ; Briat, Olivier ; Martin, Cyril ; Delétage, Jean-Yves ; Gager, Guillaume ; Vinassa, Jean-Michel
Dans : 43th Annual Conference of the IEEE Industrial Electronics Society, IECON, Beijing (China)
https://hal.science/hal-01657701
High Frequency Device Characterization and Modeling for THz applications Under MHRD Scheme on Global Initiative on Academic Network (GIAN)
Zimmer, Thomas ; Chauhan, Yogesh Singh
Dans : IEEE Workshop on Compact Modeling, Kanpur (India)
https://hal.science/hal-02475467
2016
Physics-based electrical compact model for monolayer Graphene FETs
Aguirre-Morales, Jorge Daniel ; Fregonese, Sebastien ; Mukherjee, Chhandak ; Maneux, Cristell ; Zimmer, Thomas ; Wei, Wei ; Happy, Henri
Dans : Solid-State Device Research Conference (ESSDERC), 2016 46th European, Lausanne (Switzerland)
https://hal.science/hal-01399868
An improved scalable self-consistent iterative model for thermal resistance in SiGe HBTs
Balanethiram, Suresh ; Chakravorty, Anjan ; Esposito, Rosario ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2016 IEEE, New Brunswick (United States)
https://hal.science/hal-01399878
Dedicated test-structures for investigation of the thermal impact of the BEOL in advanced SiGe HBTs in time and frequency domain
d'Esposito, Rosario ; Fregonese, Sebastien ; Zimmer, Thomas ; Chakravorty, Anjan
Dans : 2016 International Conference on Microelectronic Test Structures (ICMTS), Yokohama (Japan)
https://hal.science/hal-01399905
Frequency modulated continuous wave terahertz imaging for art restoration
Guillet, Jean-Paul ; Wang, Kejian ; Roux, Marie ; Fauquet, Frederic ; Darracq, Frédéric ; Mounaix, Patrick
Dans : IRMMW 2016, Copenhagen (Denmark)
https://hal.science/hal-01418837
Reliability assessment of ultra-short gate length AlGaN/GaN HEMTs on Si substrate by on-state step stress
Lakhdhar, Hadhemi ; Labat, Nathalie ; Curutchet, Arnaud ; Defrance, N. ; Lesecq, Marie ; de Jaeger, Jean-Claude ; Malbert, Nathalie
Dans : ESREF 2016, Händel-Halle (Germany)
https://hal.science/hal-02462684
1060nm seed laser diodes in pulsed operation: performances and safe operating area
Le Gales, Germain ; Giulia, Marcello ; Joly, Simon ; Pedroza, Guillaume ; Morisset, Adèle ; Laruelle, François ; Darracq, Frederic ; Bechou, Laurent
Dans : ISROS 2016, Otwock (Poland)
https://hal.science/hal-01720731
Bulk rigid terahertz metamaterials based on dielectric microspheres
Mounaix, Patrick ; Kadlec, C. ; Elissalde, Catherine ; Dominec, Filip ; Nemec, H. ; Kuzel, P.
Dans : TST 2016 , Budapest (Hungary)
https://hal.science/hal-01404436
Automated Data And Image Processing For Biomedical Sample Analysis
Mounaix, Patrick ; Balacey, Hugo ; Guillet, Jean-Paul ; Pickwell-Macpherson, Emma ; Macgrogan, Gaëtan ; Alabadi, Amel
Dans : IRRMW 2016, copenague (Denmark)
https://hal.science/hal-01404429
Near-field THz Time-domain Spectroscopy Of Anisotropic Dielectric Micro-particles
Mounaix, Patrick ; Matheisen, Christopher ; Brener, Igal ; Khromova, Irina ; Reno, John L. ; Kuzel, P. ; Chung, U-Chan ; Elissalde, Catherine
Dans : IRMMW 2016, copenague (Denmark)
https://hal.science/hal-01404422
Frequency Modulated Continuous Wave Terahertz Imaging For Art Restoration
Mounaix, Patrick ; Darracq, Frederic ; Guillet, Jean-Paul ; Fauquet, Frederic ; Roux, Marie ; Wang, Kejian
Dans : IRMMW 2016, copenague (Denmark)
https://hal.science/hal-01404415
Photoconductive Microprobe Based Near-field Scanning Of Terahertz Resonances Of A Single High-index TiO2 Microsphere
Mounaix, Patrick ; Elissalde, Catherine ; Nagel, Michael ; Sawallich, S. ; Matheisen, Christopher
Dans : IRMMW 2016, copenague (Denmark)
https://hal.science/hal-01404349
Extending Terahertz Paint Thickness Measurements To Advanced Industry-Standard Automotive Paint Structures
Mounaix, Patrick ; Gregory, Ian ; Taday, Phil ; May, Robert M.
Dans : IRMMW 2016, copenague (Denmark)
https://hal.science/hal-01404335
THz tomography and image processing : a new tool for polymer and ceramic additive manufacturing characrerization
Mounaix, Patrick ; Obaton, Anne Françoise ; Balacey, Hugo ; Perraud, Jean Baptiste ; Guillet, Jean-Paul ; Bou-Sleiman, Joyce ; Recur, Benoit
Dans : Pharos event 2016, Talence (France)
https://hal.science/hal-01404322
Terahertz paint thickness measurements : from automotive to aeronautics industry
Mounaix, Patrick ; Balacey, Hugo ; Taday, Phil ; Gregory, Ian ; May, Robert M.
Dans : PHAROS, Talence (France)
https://hal.science/hal-01404314
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations
Mukherjee, C. ; Jacquet, T. ; Zimmer, T. ; Maneux, C. ; Chakravorty, A. ; Boeck, J. ; Aufinger, K.
Dans : ESSDERC 2016 - 46th European Solid-State Device Research Conference, Lausanne (France)
https://hal.science/hal-01695274
Modelling delay degradation due to NBTI in FPGA Look-up tables
Naouss, Mohammad ; Marc, François
Dans : 26th International Conference on Field Programmable Logic and Applications (FPL 2016) , Lausanne (Switzerland)
https://hal.science/hal-01661828
A Test Structure Set for on-wafer 3D-TRL calibration
Potéreau, Manuel ; Curutchet, Arnaud ; d'Esposito, Rosario ; de Matos, Magali ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : 2016 International Conference on Microelectronic Test Structures (ICMTS), Yokohama (Japan)
https://hal.science/hal-01399900
Meander type transmission line design for on-wafer TRL calibration
Potéreau, Manuel ; Deng, Marina ; Raya, C ; Ardouin, Bertrand ; Aufinger, Klaus ; Ayela, Cédric ; Dematos, Magalie ; Curutchet, Arnaud ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : EuMW 2016, Londres (United Kingdom)
https://hal.science/hal-01301312
Advanced Si/SiGe HBT architecture for 28-nm FD-SOI BiCMOS
Vu, Tuan Van ; Celi, Didier ; Zimmer, Thomas ; Fregonese, Sebastien ; Chevalier, Pascal
Dans : Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2016 IEEE, New Brunswick (France)
https://hal.science/hal-01399885
TCAD Calibration of High-Speed Si/SiGe HBTs in 55-nm BiCMOS
Vu, T. ; Celi, D. ; Zimmer, T. ; Fregonese, S. ; Chevalier, P.
Dans : PriMe 2016, Honolulu (United States)
https://hal.science/hal-01399104
2015
A new physics-based compact model for Bilayer Graphene Field-Effect Transistors
Aguirre-Morales, Jorgue Daniel ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : Proceeding of the Solid State Device Research Conference (ESSDERC), 2015 45th European, Gratz (Austria)
https://hal.science/hal-01235950
Towards amplifier design with a SiC graphene field-effect transistor
Aguirre-Morales, Jorgue Daniel ; Frégonèse, Sébastien ; Dwivedi, Arun Dev Dhar ; Zimmer, Thomas ; Khenissa, Mohamed Salah ; Belhaj, Mohamed Moez ; Happy, Henri
Dans : Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International EUROSOI Workshop and International Conference on, Bologna (Italy)
https://hal.science/hal-01158691
Efficient modeling of static self-heating and thermal-coupling in multi-finger SiGe HBTs
Balanethiram, Suresh ; Chakravorty, Anjan ; d'Esposito, Rosario ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 2015 IEEE, Boston (United States)
https://hal.science/hal-01399911
Ordered subsets convex algorithm and automatic image processing sequences: the solid bases for 3D THz inspection
Balacey, Hugo ; Perraud, Jb ; Bou Sleiman, Joyce ; Recur, Benoît ; Mounaix, Patrick
Dans : 8èmes Journées THz , Areches-Beaufort (France)
https://hal.science/hal-01264807
Imagerie et spectroscopie Terahertz: applications aux problématiques de défense et de sécurité
Bou Sleiman, Joyce ; Perraud, Jb ; Recur, Benoît ; Bousquet, Bruno ; Palka, Norbert ; Mounaix, Patrick
Dans : JNRDM 2015, Bordeaux (France)
https://hal.science/hal-01264765
Discrimination and identification of RDX/PETN explosives by chemometrics applied to terahertz time-domain spectral imaging
Bou Sleiman, Joyce ; Perraud, Jb ; Bousquet, Bruno ; Guillet, Jean-Paul ; Palka, Norbert ; Mounaix, Patrick
Dans : VIII Millimetre Wave and Terahertz Sensors and Technology conference, Toulouse (France)
https://hal.science/hal-01263937
Chemical imaging and quantification of RDX/PETN mixtures by PLS applied on terahertz time-domain spectroscopy
Bou Sleiman, Joyce ; Perraud, Jb ; Bousquet, Bruno ; Palka, Norbert ; Guillet, Jean-Paul ; Mounaix, Patrick
Dans : 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015, Hong Kong (China)
https://hal.science/hal-01263833
Early Demonstration of a High VSWR Microwave Coaxial Programmable Impedance Tuner with Coaxial Slugs
Curutchet, Arnaud ; Ghiotto, Anthony ; Potereau, Manuel ; de Matos, Magali ; Fregonese, Sebastien ; Kerherve, Eric ; Thomas, Zimmer
Dans : EUMW2015, PARIS (France)
https://hal.science/hal-01163596
Original Screening Methodology based on Correlation between Low-Frequency Noise Measurements and Reverse Bias Behavior of GaAs-based Laser Diodes
del Vecchio, Pamela ; Curutchet, Arnaud ; Deshayes, Yannick ; Joly, Simon ; Bettiati, Mauro ; Laruelle, François ; Bechou, Laurent
Dans : CLEO/EUROPE, Munich (Germany)
https://hal.science/hal-01721054
Correlation between Forward-Reverse Low-Frequency Noise and atypical I-V signatures in 980nm High-Power Laser Diodes
del Vecchio, Pamela ; Curutchet, Arnaud ; Deshayes, Yannick ; Bettiati, Mauro ; Laruelle, François ; Labat, Nathalie ; Bechou, Laurent
Dans : ESREF, Toulouse (France)
https://hal.science/hal-01219200
Original Screening Methodology based on Correlation betweenLow-Frequency Noise Measurements and Reverse Bias Behaviorof GaAs-based Laser Diodes
del Vecchio, Pamela ; Curutchet, Arnaud ; Deshayes, Yannick ; Joly, Simon ; Bettiati, Mauro ; Laruelle, François ; Bechou, Laurent
Dans : CLEO 2015 (Conference on Lasers and Electro-Optics), munich (Germany)
https://hal.science/hal-01163620
AMI : Augmented Michelson Interferometer
Furio, David ; Hachet, Martin ; Guillet, Jean-Paul ; Bousquet, Bruno ; Fleck, Stéphanie ; Reuter, Patrick ; Canioni, Lionel
Dans : ETOP 2015 - Education and Training in Optics & Photonics, Bordeaux (France)
https://inria.hal.science/hal-01121917
Etude de l’effet « belly shape » dans les HEMT GaN sur substrat SiC
Malbert, Nathalie ; Brunel, Laurent ; Carisetti, Dominique ; Curutchet, Arnaud ; Lambert, Benoit ; Labat, Nathalie
Dans : JFMMA 2015, meknes (Morocco)
https://hal.science/hal-01163624
Near-field spectroscopy of sub-wavelength (<λ/10) anisotropic dielectric resonators at terahertz frequencies
Mitrofanov, Oleg ; Khromova, Irina ; Dominec, F. ; Kuzel, P. ; Reno, Jl ; Brener, Igal ; Chung, U-Chan ; Elissalde, Catherine ; Maglione, Mario ; Mounaix, Patrick
Dans : 2015 European Conference on Lasers and Electro-Optics, Munich (Germany)
https://hal.science/hal-01264060
Magnetic dipole and electric dipole resonances in TiO2 microspheres at terahertz frequencies
Mitrofanov, Oleg ; Domenic, Filip ; Kuzel, P. ; Reno, John ; Brener, Igal ; Chung, U-Chan ; Elissalde, Catherine ; Maglione, Mario ; Mounaix, Patrick
Dans : Quantum Sensing and Nanophotonic Devices XII,, San Francisco (United States)
https://hal.science/hal-01263842
Characterization and modeling of low-frequency noise in CVD-grown graphene FETs
Mukherjee, Chhandak ; Aguirre-Morales, Jorgue-Daniel ; Fregonese, Sebastien ; Zimmer, Thomas ; Maneux, Cristell ; Happy, Henri ; Wei, Wei
Dans : proceeding of the Solid State Device Research Conference (ESSDERC), 2015 45th European, Gratz (Austria)
https://hal.science/hal-01235951
Metrological Evaluation of Tomography Methods Applied to Objects Fabricated by Additive Manufacturing
Obaton, Anne-Françoise ; Costin, Marius ; Mounaix, Patrick ; Geffrin, Jean Michel ; Eyraud, Christelle ; Souvignet, Christelle ; Moschetta, Jean-Marc
Dans : International symposium on Digital Industrial radiology and computed tomography, Ghent (Belgium)
https://hal.science/hal-01264659
Terahertz detection of explosive materials and dangerous objects
Palka, Norbert ; Kowalski, M. ; Walczakowski, M ; Szustakowski, M ; Ciurapinski, W ; Wrobel, J. ; Jodlowski, L ; Rurka, E ; Bou Sleiman, Joyce ; Mounaix, Patrick ; Ellrich, F. ; Molter, D. ; Jonuscheit, J. ; von Freymann, G ; Beigang, R.
Dans : NATO ARW on THz Diagnostics of CBRN effects and Detection of Explosives & CBRN, Izmir (Turkey)
https://hal.science/hal-01264649
Monocristaux de semiconducteurs organiques : le premier transistor bipolaire organique et d’autres applications en MEMS organiques
Pereira, Marco ; Ayela, Cédric ; Fregonese, Sebastien ; Bachevillier, Stéphane ; Hirsch, Lionel ; Crosby, Alfred ; Briseno, Alejandro ; Wantz, Guillaume
Dans : SPIC 2015 : Science et Technologie des Systèmes pi-Conjugués, Angers (France)
https://hal.science/hal-01228631
Immersion in refractive index matching liquid for 2D and 3D terahertz imaging
Perraud, Jb ; Bou Sleiman, Joyce ; Simoens, François ; Mounaix, Patrick
Dans : 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), Hong Kong (France)
https://hal.science/hal-01263947
Nouvelles structures 3D pour calibrage TRL sur puces adaptées à la mesure de paramètres S très hautes fréquences
Potereau, Manuel ; Fregonese, Sebastien ; Curutchet, Arnaud ; Baureis, Peter ; Zimmer, Thomas
Dans : Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM2015), Talence (France)
https://hal.science/hal-01163604
New 3D-TRL structures for on-wafer calibration for high frequency S-parameter measurement
Potereau, Manuel ; Fregonese, Sebastien ; Curutchet, Arnaud ; Baureis, Peter ; Zimmer, Thomas
Dans : EUMW2015, PARIS (France)
https://hal.science/hal-01163593
Caractérisation et modélisation d’une nouvelle technologie de synthétiseur d’impédances automatiques coaxial 3,5mm à fort TOS
Potéreau, Manuel ; Curutchet, Arnaud ; Ghiotto, Anthony ; de Matos, Magali ; Fregonese, Sébastien ; Kerhervé, Eric ; Zimmer, Thomas
Dans : 19èmes Journées Nationales Microondes, Bordeaux (France)
https://hal.science/hal-01158220
THz imaging versus X-Ray tomography: Applications to material inspection
Recur, Benoît ; Balacey, Hugo ; Bou Sleiman, Joyce ; Perraud, Jb ; Mounaix, Patrick
Dans : ICMTS, Quebec (Canada)
https://hal.science/hal-01264760
Investigation of the dynamic on-state resistance of AlGaN/GaN HEMTs
Rzin, Mehdi ; Labat, Nathalie ; Malbert, Nathalie ; Curutchet, Arnaud ; Brunel, Laurent ; Lambert, Benoit
Dans : ESREF 2015, Toulouse (France)
https://hal.science/hal-02462670
Schottky gate of AlGaN/GaN HEMTs: investigation with DC and low frequency noise measurements after 7000 hours HTOL test
Rzin, Mehdi ; Curutchet, Arnaud ; Labat, Nathalie ; Malbert, Nathalie ; Brunel, Laurent ; Lambert, Benoit
Dans : 23rd International conference on noise and fluctuations (ICNF2015), Xi'AN (China)
https://hal.science/hal-01163601
Etude du contact Schottky de HEMTs AlGaN/GaN sur substrat SiC après 7000h de test de vieillissement de type HTOL
Rzin, Mehdi ; Curutchet, Arnaud ; Labat, Nathalie ; Malbert, Nathalie ; Brunel, Laurent ; Lambert, Benoit
Dans : XIXèmes Journées Nationales Micro-ondes (JNM2015), TALENCE (France)
https://hal.science/hal-01163586
THz response of TiO2 microspheres embedded in a dielectric layer
Sindler, Michal ; Kadlec, C ; Nemec, H. ; Dominec, F. ; Kuzel, P. ; Elissalde, Catherine ; Chung, U-C ; Mounaix, Patrick
Dans : 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), Hong Kong (France)
https://hal.science/hal-01264034
Impact study of the process thermal budget of advanced CMOS nodes on SiGe HBT performance
Vu, Tuan Van ; Rosenbaum, Tommy ; Saxod, O. ; Céli, Didier ; Zimmer, Thomas ; Fregonese, Sebastien ; Chevalier, Pascal
Dans : Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 2015 IEEE, Boston (United States)
https://hal.science/hal-01399915
2014
Analytical Study of Performances of Bilayer and Monolayer Graphene FETs based on Physical Mechanisms
Aguirre-Morales, J.D. ; Mukherjee, C. ; Fregonese, Sebastien ; Maneux, C. ; Zimmer, T.
Dans : Graphene week, Toulouse (France)
https://hal.science/hal-01002504
Processing sequence for non-destructive inspection based on 3D terahertz images
Balacey, Hugo ; Jean-Baptiste, Perraud ; Bou Sleiman, Joyce ; Guillet, Jean-Paul ; Recur, Benoît ; Mounaix, Patrick
Dans : Infrared, Millimeter-Wave, and Terahertz Technologies III, Beijing (China)
https://hal.science/hal-01091194
Critical failure mechanism of 0.25 µm AlGaN/GaN HEMT under severe stress test conditions
Carisetti, Dominique ; Sarazin, Nicolas ; Brunel, Laurent ; Clement, J.C. ; Malbert, Nathalie ; Curutchet, Arnaud ; Labat, Nathalie
Dans : 7th Wide band gap semiconductor and components workshop, pp. 309-315, septembre 2014, Frascati, Italy, Frascati (Italy)
https://hal.science/hal-01718823
Qualitative Assessment of Epitaxial Graphene FETs on SiC Substrates via Pulsed Measurements and Temperature Variation
Chhandak, Mukherjee ; Fregonese, Sebastien ; Zimmer, Thomas ; Happy, H. ; Mele, David ; Maneux, Cristell
Dans : Solid State Device Research Conference (ESSDERC), 2014, 44th European, Venise (Italy)
https://hal.science/hal-01090864
A study on transient intra-device thermal coupling in multifinger SiGe HBTs
d'Esposito, Rosario ; Weiss, Mario ; Kumar Sahoo, Amit ; Frégonèse, Sébastien ; T., Zimmer
Dans : Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2014 IEEE, Coronado, CA (United States)
https://hal.science/hal-01158666
Improved integrated circuits qualification using dynamic laser stimulation technique
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, D.
Dans : IEEE International Reliability Physics Symposium, 2009, Montreal (Canada)
https://hal.science/hal-00988351
Statistical Study on the Variation of Device Performance in CVD-grown Graphene FETs
Mukherjee, C. ; Morales, D.A. ; Fregonese, Sebastien ; Maneux, C. ; Zimmer, T.
Dans : Graphene week 2014, Toulouse (France)
https://hal.science/hal-01002511
Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Guillet, Jean-Paul ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, Dean
Dans : 21th International symposium on the Physical and Failure Analysis of integrated circuits, Singapour (Singapore)
https://hal.science/hal-01091188
Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures
Rebai, Mohamed ; Darracq, Frédéric ; Guillet, Jean-Paul ; Perdu, Philippe ; Sanchez, Kévin ; Lewis, D.
Dans : 21th International symposium on the Physical and Failure Analysis of integrated circuits (IPFA), Singapour (Singapore)
https://hal.science/hal-01020683
Evaluation and Modeling of Voltage Stress-Induced Hot Carrier Effects in High-Speed SiGe HBTs
Sasso, G. ; C., Maneux ; Boeck, J. ; d'Alessandro, V. ; Aufinger, K. ; Rinaldi, N. ; Zimmer, T.
Dans : Compound Semiconductor Integrated Circuit Symposium (CSICs), 2014 IEEE, La Jolla (United States)
https://hal.science/hal-01134190
Evaluation Plan of a network of remote labs in the Maghrebian countries
Tsiatsos, T. ; Douka, S. ; Zimmer, T. ; Geoffroy, D.
Dans : Conference REV 2014, porto (Portugal)
https://hal.science/hal-01002476
2013
A new processing sequence to assess airways using 3D CT-scan
Balacey, Hugo ; Dournes, Gaël ; Desbarats, Pascal ; Domenger, Jean-Philippe ; Laurent, François
Dans : 20th IEEE International Conference on Image Processing (ICIP), Melbourne (Australia)
https://hal.science/hal-01465173
Thermal Laser Stimulation technique for AlGaN/GaN HEMT technologies improvement
Carisetti, Dominique ; Sarazin, N. ; Labat, Nathalie ; Malbert, Nathalie ; Curutchet, Arnaud ; Lambert, Benoit ; Brunel, Laurent ; Rousseau, K. ; Romain Latu, Eddy ; Frank, Thomas
Dans : ISTFA 2013 ( International Symp. For Testing and Failure Analysis), San Jose (United States)
https://hal.science/hal-00989606
A one week-lecture in the Euro-dots course program: Microelectronic assemblies: From packaging to reliability
Debéda, H. ; Favre, I. ; Guédon-Gracia, A. ; Labat, N. ; Plano, B. ; Frémont, H.
Dans : 24th EAEEIE Annual Conference, (Greece)
https://hal.science/hal-00905901
Failure initiation of IGBT due to emitter contact degradation: a 2D finite elements electro-thermal multi-cell simulation approach under hard switching, short-circuit and avalanche operations
El Boubkari, Kamal ; Azzopardi, Stephane ; Théolier, Loïc ; Roder, Raphaël ; Woirgard, Eric ; Bontemps, Serge
Dans : IEEE Applied Power Electronics Conference (APEC), Long Beach (United States)
https://hal.science/hal-00955738
Analysis of Short-Term NBTI Effect on the Single-Event Upset Sensitivity of a 65nm SRAM using Two-Photon Absorption
Issam, El Moukthari ; Pouget, Vincent ; Darracq, Frédéric ; Larue, Camille ; Lewis, Dean ; Perdu, Philippe
Dans : 14th European Conference on Radiation and Its Effects on Components and Systems, Oxford (United Kingdom)
https://hal.science/hal-01091193
Gate and drain low frequency noise of ALGaN/GaN HEMTs featuring high and low gate leakage currents
Karboyan, Serge ; Tartarin, Jean-Guy ; Labat, N ; Lambert, B.
Dans : 22nd International Conference on Noise and Fluctuations (ICNF 2013), Montpellier (France)
https://hal.science/hal-01343429
Simultaneous gene selection and cancer classification using a hybrid Group Search Optimizer
Magatrao, D. ; Ghosh, S. ; Valadi, J. ; Siarry, P.
Dans : Genetic and Evolutionary Computation Conference GECCO 2013, Abstract (2 pages), Amsterdam, the (Netherlands)
https://hal.science/hal-01682060
Characterization and modelling of laser-induced single-event burn-out in SiC power diodes
Mbaye, N. ; Pouget, V. ; Darracq, F. ; Lewis, D.
Dans : ESREF 2013, Arcachon (France)
https://hal.science/hal-01935694
High frequency noise characterisation of graphene FET Device
Mele, D. ; Fregonese, S. ; Lepilliet, Sylvie ; Pichonat, E. ; Dambrine, Gilles ; Happy, H.
Dans : 61st IEEE MTT-S International Microwave Symposium, IMS 2013, Seattle, WA (United States)
https://hal.science/hal-00944030
Analysis of short-term NBTI effect on the Single-Event Upset sensitivity of a 65nm SRAM using two-photon absorption
Moukhtari, I. El ; Pouget, V. ; Darracq, F. ; Larue, C. ; Perdu, P. ; Lewis, D.
Dans : IEEE RADECS, Oxford (United Kingdom)
https://hal.science/hal-01935693
Impact of Negative Bias Temperature Instability on the Single-Event Upset Threshold of a 65nm SRAM cell
Moukhtari, I. El ; Pouget, V. ; Larue, C. ; Darracq, Frédéric ; Lewis, D. ; Perdu, P.
Dans : ESREF 2013, Arcachon (France)
https://hal.science/hal-01935692
Limitations of on-wafer calibration and de-embedding methods in the sub-THz range
Potereau, M. ; Raya, C. ; de Matos, Magali ; Fregonese, Sébastien ; Curutchet, Arnaud ; Zhang, M. ; Ardouin, B. ; Zimmer, Thomas
Dans : ECC 2013 conference, Sanya (China)
https://hal.science/hal-00909399
How to Interpret the Reflected Laser Probe Signal of Multiple Elementary Substructures in Very Deep Submicron Technologies
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Lewis, D. ; Perdu, Philippe ; Sanchez, Kévin
Dans : 39th International Symposium for Testing and Failure Analysis (ISTFA 2013), San José (United States)
https://hal.science/hal-00903364
Investigation of gate and drain leakage currents of AlGaN/GaN HEMTs at subthreshold regime for temperature range 300K - 400K
Rzin, Mehdi ; Curutchet, Arnaud ; Labat, Nathalie ; Malbert, Nathalie ; Brunel, Laurent ; Lambert, Benoit
Dans : European Microwave week (EuMIC 2013), Nüremberg (Germany)
https://hal.science/hal-00987798
Analyse électrique des courants de fuite de HEMTs AlGaN/GaN sur SiC
Rzin, Mehdi ; Labat, Nathalie ; Malbert, Nathalie ; Curutchet, Arnaud ; Brunel, Laurent ; Lambert, Benoit
Dans : Journées Nationales Microondes (JNM) 2013, Paris (France)
https://hal.science/hal-00987763
Impact of Back-end-of-line on Thermal Impedance in SiGe HBTs
Sahoo Amit, Kumar ; Fregonese, Sébastien ; Weib, Mario ; Santorelli, Marco ; Malbert, Nathalie ; Zimmer, Thomas
Dans : SISPAD 2013, Glasgow - Ecosse (United Kingdom)
https://hal.science/hal-00906141
A Scalable Model for Temperature Dependent Thermal Resistance of SiGe HBTs
Sahoo Amit, Kumar ; Fregonese, Sebastien ; Weib, Mario ; Maneux, Cristell ; Zimmer, Thomas
Dans : IEEE Bipolar / BiCMOS Circuits and Technology Meeting, Bordeaux (France)
https://hal.science/hal-00905673
A physical prediction model issued from TCAD investigations for single event burnout in power MOSFETs
Sara, Siconolfi ; Guillaume, Hubert ; Laurent, Artola ; Darracq, Frédéric ; Jean Pierre, David
Dans : 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Oxford (United Kingdom)
https://hal.science/hal-01091195
Modeling of mutual thermal coupling in SiGe:C HBTs
Weib, Mario ; Sahoo Amit, Kumar ; Maneux, Cristell ; Fregonese, Sébastien ; Zimmer, Thomas
Dans : SBMicro 2013, Curitiba (Brazil)
https://hal.science/hal-00905817
Characterization of intra device mutual thermal coupling in multi finger SiGe:C HBTs
Weib, Mario ; Sahoo Amit, Kumar ; Raya, Cristian ; Santorelli, Marco ; Fregonese, Sébastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : EDSSC 2013, Hong Kong (China)
https://hal.science/hal-00905765
Mutual thermal coupling in SiGe:C HBTs
Weiss, M. ; Sahoo, A.K. ; Maneux, C. ; Fregonese, S. ; Zimmer, T.
Dans : Chip in Curitiba 2013 - SBMicro 2013: 28th Symposium on Microelectronics Technology and Devices, Curitiba (Brazil)
https://hal.science/hal-00978734
eSience: Setting up a network of remote labs in the Maghrebian countries
Zimmer, T. ; Geoffroy, D. ; Pester, A. ; Oros, R. ; Tsiatsos, T. ; Douka, S.
Dans : iCEER International Conference on Engineering Education and Research, (Morocco)
https://hal.science/hal-01002470
The potential of graphene for electronics
Zimmer, Thomas ; Fregonese, Sébastien ; Maneux, Cristell
Dans : The International Multi-Conference on Systems, Signals and Devices 2013, Hammamet (Tunisia)
https://hal.science/hal-00905774
2012
Analysis of InP/GaAsSb DHBT failure mechanisms under accelerated aging tests
A. Koné, G. ; Grandchamp, B. ; Maneux, C. ; Labat, N. ; Zimmer, T. ; Maher, H.
Dans : International Conference on Indium Phosphide and Related Materials (IPRM), 2012, santa barbara (United States)
https://hal.science/hal-01002159
Building the electricalmodel of the PhotoelectricLaserStimulation of a NMOS transistor in 90 nm technology
Alexandre, Sarafianos ; Llido, R. ; Dutertre, Jean-Max ; Gagliano, Olivier ; Serradeil, Valérie ; Lisart, Mathieu ; Goubier, V. ; Tria, Assia ; Pouget, Vincent ; Lewis, D.
Dans : 38th International Symposium for Testing and Failure Analysis, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-00742629
Efficient Models for Non-Quasi-Static Effects and Correlated Noise in SiGe HBTs,
Augustine, N. ; Kumar, K. ; Chakravorty, A. ; Bhattacharyya, A. ; Zimmer, T.
Dans : Electron Devices and Solid State Circuit (EDSSC), bangkok (Thailand)
https://hal.science/hal-01002184
Signal propagation analysis by digital lock-in time resolved imaging
Bascoul, G. ; Perdu, Philippe ; Lewis, D.
Dans : 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2012, Singapour (Singapore)
https://hal.science/hal-00988346
Kink effect characterization in AlGaN/GaN HEMTs by DC and Drain Current Transient measurements
Brunel, Laurent ; Malbert, Nathalie ; Curutchet, Arnaud ; Labat, Nathalie ; Lambert, Benoit
Dans : essderc 2012, Bordeaux (France)
https://hal.science/hal-00987040
Intérêt de la simulation 2D multicellulaire par éléments-finis pour l'analyse d'un défaut lié un décollement de fil de câblage sur une puce de puissance IGBT
El Boubkari, Kamal ; Azzopardi, Stéphane ; Théolier, Loïc ; Delétage, Jean-Yves ; Woirgard, Eric
Dans : 14ème édition de la Conférence sur l'Electronique de Puissance du Futur, Bordeaux (France)
https://hal.science/hal-00955758
2D finite elements electro-thermal modeling for IGBT: uni and multicellular approach
El Boubkari, Kamal ; Azzopardi, Stephane ; Théolier, Loïc ; Delétage, Jean-Yves ; Woirgard, Eric
Dans : EuroSimE, Lisbone (Portugal)
https://hal.science/hal-00795341
Improving defect localization techniques with laser beam with specific analysis and set-up modules
Llido, R. ; Gomez, J. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : 2012 IEEE International Reliability Physics Symposium (IRPS), (France)
https://hal.science/hal-00988382
Characterization and TCAD Simulation of 90nm Technology PMOS Transistor Under Continuous Photoelectric Laser Stimulation for Failure Analysis Improvement
Llido, R ; Sarafianos, A ; Gagliano, O ; Serradeil, V ; Goubier, V ; Lisart, M ; Haller, G ; Pouget, Vincent ; Lewis, Dean ; Dutertre, Jean-Max ; Tria, Assia
Dans : 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-01130626
Evaluation of Quasi-Hermetic Packaging Solutions for Active Microwave Devices and Space Applications
Naceur W., Ben ; Malbert, N. ; Labat, N. ; Fremont, H. ; Muraro, J.L. ; Monfraix, P.
Dans : EuroSimE (2012), (Portugal)
https://hal.science/hal-00799929
On partial differential equations that exhibit fractional behaviors
Sabatier, Jocelyn ; Nguyen, H.C. ; Moreau, Xavier ; Oustaloup, Alain
Dans : 7th Vienna International Conference on Mathematical Modelling, Vienne (Austria)
https://hal.science/hal-00797594
Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology
Sarafianos, A ; Llido, R ; Gagliano, O ; Serradeil, V ; Lisart, Mathieu ; Goubier, V. ; Dutertre, Jean-Max ; Tria, Assia ; Pouget, Vincent ; Lewis, Dean
Dans : 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-01130636
Characterization and TCAD simulation of 90 nm technology transistors under continuous photoelectric laser stimulation for failure analysis improvement
Sarafianos, Alexandre ; Llido, R. ; Gagliano, Olivier ; Serradeil, Valérie ; Goubier, V. ; Lisart, M. ; Haller, G. ; Pouget, V. ; Lewis, D. ; Dutertre, Jean-Max ; Tria, Assia
Dans : 19th IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS, Singapore (Singapore)
https://hal-emse.ccsd.cnrs.fr/emse-00742705
Characterization of Mutual Heating inside a SiGe Ring Oscillator
Weiss, M. ; Ghosh, S. ; Santorelli, M. ; Chevalier, P. ; Chantre, A. ; Kumar Sahoo, A. ; Maneux, C. ; Zimmer, T.
Dans : Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2012 IEEE, Portland (United States)
https://hal.science/hal-01002179
Pulsed I(V) - Pulsed RF Measurement System for Microwave Device Characterization with 80ns/45GHz
Weiss, M. ; Fregonese, Sebastien ; Santorelli, M. ; Kumar Sahoo, A. ; Maneux, C. ; Zimmer, T.
Dans : European Solid-State Device Research Conference (ESSDERC), 2012, Bordeaux (France)
https://hal.science/hal-01002174
Pulsed I(V) pulsed RF measurement system for microwave device characterization with 80ns/45GHz
Weis, Mario ; Fregonese, Sebastien ; Santorelli, Marco ; Kumar Sahoo, Amit ; Maneux, Cristell ; Zimmer, Thomas
Dans : Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European, Bordeaux (France)
https://hal.science/hal-00978793
2011
Reliability of submicron InGaAs/InP DHBT on Accelerated Aging Tests under Thermal and Electrical stresses
A. Koné, G. ; Grandchamp, B. ; Hainaut, C. ; Marc, F. ; Maneux, C. ; Labat, N. ; Zimmer, T. ; Nodjiadjim, V. ; Riet, M. ; Godin, J.
Dans : 22th European Symposium on the RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, bordeaux (France)
https://hal.science/hal-01002459
New front side access approach for low-k dielectric/Cu technologies in plastic package
Aubert, A. ; Dantas de Morais, L. ; Pétremont, S. ; Labat, N. ; Frémont, H.
Dans : ISTFA 2011, 37th International Symposium for Testing and Failure Analysis, San Jose (United States)
https://hal.science/hal-00670567
Time resolved imaging at low power supply on 45nm technology
Bascoul, G. ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, D. ; Dudit, Sylvain ; Celi, Guillaume
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2011, Incheon (South Korea)
https://hal.science/hal-00988376
On-Si calibration vs ISS calibration
Bazzi, Jad ; Curutchet, Arnaud ; Baureis, P. ; Zimmer, Thomas
Dans : 24th BipAk, Munich (Germany)
https://hal.science/hal-00590786
Investigation of de-embedding procedure up to 110GHz
Bazzi, Jad ; Raya, C. ; Curutchet, Arnaud ; Pourchon, F. ; Derrier, N. ; Celi, D. ; Zimmer, Thomas
Dans : MOS-AK/GSA Workshop, Paris (France)
https://hal.science/hal-00590781
Evaluation des solutions de packaging quasi-hermétique sur composants actifs hyperfréquences
Ben Naceur, Walim ; Malbert, Nathalie ; Labat, Nathalie ; Fremont, Hélène ; Muraro, Jean-Luc ; Monfraix, Philippe
Dans : Journées Nationales Microondes, Brest (France)
https://hal.science/hal-00585624
FPGA design with double-gate carbon nanotube transistors
Ben Jamma, Haykel ; Gaillardon, Pierre-Emmanuel ; Fregonese, Sebastien ; de Marchi, Michele ; de Micheli, Giovanni ; Zimmer, Thomas ; Clermidy, Fabien ; O'Connor, Ian
Dans : 10th China Semiconductor Technology International Conference 2011, CSTIC 2011, Shanghai (China)
https://hal.science/hal-00669403
Modeling of SiGe spike mono emitter HBT with HICUM in static and dynamic operations
Bhattacharyya, Arkaprava ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : 2011 25th IEEE Bipolar/BiCMOS Technology and Circuits Meeting, BCTM 2011, Atlanta (United States)
https://hal.science/hal-00669452
NQS modelling with HiCuM: What works, what doesn't
Bhattacharyya, Arkaprava ; Maneux, Cristell ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : 24th BipAk, Munich (Germany)
https://hal.science/hal-00590790
NQS effect and implementation in compact transistor model
Bhattacharyya, Arkaprava ; Maneux, Cristell ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : MOS-AK/GSA Workshop, Paris (France)
https://hal.science/hal-00590784
Détection et identification des pièges dans les HEMTS AlGaN/GaN
Brunel, L. ; Malbert, N. ; Curutchet, A. ; Labat, N. ; Lambert, Benoit
Dans : 17èmes Journées Nationales Microondes, Brest (France)
https://hal.science/hal-00672186
Détection et identification des pièges dans les HEMTs AlGaN/GaN
Brunel, Laurent ; Malbert, Nathalie ; Curutchet, Arnaud ; Labat, Nathalie ; Lambert, Benoit
Dans : Journées Nationales Microondes, Brest (France)
https://hal.science/hal-00585618
Does power device sensitivity to mechanical stress can be used as sensor for power assembly health monitoring?
Capy, Florence ; Azzopardi, Stephane ; El Boubkari, Kama ; Belmehdi, Yassine ; Delétage, Jean-Yves ; Woirgard, Eric
Dans : 3rd IEEE Energy Conversion Congress and Exposition, Phoénix (United States)
https://hal.science/hal-00591063
Imaging the Single Event Burnout sensitive volume of vertical power MOSFETs using the laser Two-Photon Absorption technique
Darracq, Frédéric ; Mbaye, Nogaye ; Larue, Camille ; Pouget, V. ; Azzopardi, Stephane ; Lorfèvre, E. ; Bezerra, F. ; Lewis, D.
Dans : 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Seville (Spain)
https://hal.science/hal-00772102
Electrical compact modelling of graphene transistors
Fregonese, Sebastien ; Nguyen, Huu-Nha ; Majek, Cédric ; Maneux, Cristell ; Happy, Henri ; Meng, Nan ; Zimmer, Thomas
Dans : Conference Graphene 2011, Bilbao (Spain)
https://hal.science/hal-00588825
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
Ghosh, S. ; Grandchamp, B. ; A. Koné, G. ; Marc, F. ; Maneux, C. ; Zimmer, T. ; Nodjiadjim, V. ; Riet, M. ; Y. Dupuy, J. ; Godin, J.
Dans : 22th European Symposium on the RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS, bordeaux (France)
https://hal.science/hal-01002192
Sondes de champ proche THz sensibles à la polarisation
Guillet, J-P. ; Chusseau, Laurent ; Adam, R. ; Pénarier, A.
Dans : Journée "Antenne de Champ Proche'' du GDR Ondes, Paris (France)
https://hal.science/hal-01904167
Transition from rectangular waveguide to Sommerfeld mode on a wire
Guillet, J-P. ; Chusseau, Laurent
Dans : 6e Journées Térahertz, La Grande Motte (France)
https://hal.science/hal-01904163
Propagating and coupling Sommerfeld waves on wires
Guillet, J-P. ; Blin, S. ; Chusseau, Laurent
Dans : 6e Journées Térahertz, La Grande Motte (France)
https://hal.science/hal-01904162
Millimetric near-field imaging experiment using a transition from rectangular waveguide to cylindrical surface wave guide
Guillet, J-P. ; Chusseau, Laurent
Dans : ICONIC 2011, 5th International Conference on Electromagnetic Near-Field Characterization and Imaging, Rouen (France)
https://hal.science/hal-01904160
System Level Analysis and Accurate Prediction of Electromigration
Gupta, Tushar ; Bertolini, Clément ; Héron, Olivier ; Ventroux, Nicolas ; Zimmer, Thomas ; Marc, François
Dans : European Workshop on CMOS Variability (VARI), Grenoble (France)
https://hal.science/hal-00674319
Preliminary results of storage accelerated aging test on InP/GaAsSb DHBT
Kone, Gilles Amadou ; Ghosh, S. ; Grandchamp, Brice ; Maneux, Cristell ; Marc, François ; Labat, Nathalie ; Zimmer, Thomas ; Maher, H. ; Bourqui, M.L. ; Smith, D.
Dans : International Conference on Indium Phosphide and Related Materials (IPRM 2011), Berlin (Germany)
https://hal.science/hal-00585590
3D current path in stacked devices: Metrics and challenges
Kor, H.B ; Infante, Fulvio ; Perdu, Philippe ; Gan, P. ; Lewis, D.
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2011, Incheon (South Korea)
https://hal.science/hal-00988371
A new frequency synthesizer stabilization method based on a mixed phase locked loop and delay locked loop
Lucas de Peslouan, Pierre-Olivier ; Majek, Cédric ; Taris, Thierry ; Deval, Yann ; Begueret, Jean-Baptiste ; Belot, Didier
Dans : IEEE International Symposium on Circuits and Systems (ISCAS), Rio de Janeiro (Brazil)
https://hal.science/hal-00583970
Carbon-based Schottky barrier transistor: From compact modeling to digital circuit applications
Najari, Montassar ; Fregonese, Sebastien ; Maneux, Cristell ; Mnif, Hassene ; Zimmer, Thomas ; Masmoudi, Nouri
Dans : 6th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS'11, (France)
https://hal.science/hal-00669416
De la modélisation électrothermique des faisceaux aux MOS intelligents
Nguyen, H.C. ; Sabatier, Jocelyn ; Moreau, Xavier ; Guillemard, Franck ; Bavoux, Bernard
Dans : Groupe de Travail " Automatique et Automobile et Journées d'étude Automatique et Automobile - GTAA - JAA 2011, Bordeaux (France)
https://hal.science/hal-00797827
Transistor thermal fractional modeling for junction temperature estimation
Sabatier, Jocelyn ; Farges, Christophe ; Nguyen, H.C. ; Moreau, Xavier ; Delétage, Jean-Yves
Dans : IFAC, Milan (Italy)
https://hal.science/hal-00668926
Electro-thermal dynamic simulation and thermal spreading impedance modeling of Si-Ge HBTs
Sahoo Amit, Kumar ; Fregonese, Sebastien ; Weib, Mario ; Malbert, Nathalie ; Zimmer, Thomas
Dans : 25th IEEE Bipolar/BiCMOS Technology and Circuits Meeting, BCTM 2011, ATLANTA (United States)
https://hal.science/hal-00669443
Electro-thermal characterization of Si-Ge HBTs with pulse measurement and transient simulation
Sahoo Amit, Kumar ; Fregonese, Sebastien ; Weib, Mario ; Malbert, Nathalie ; Zimmer, Thomas
Dans : 41st European Solid-State Device Research Conference, Helsinki (Finland)
https://hal.science/hal-00669428
Comparison of classical and two-photon photoelectric laser stimulation capabilities for failure analysis
Shao, Kai ; Pouget, V. ; Faraud, Emeric ; Larue, C. ; Lewis, D.
Dans : 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Incheon (South Korea)
https://hal.science/hal-00669828
Dégradation du bruit en courant de drain de HEMTs AlGaN/GaN sur substrat SiC
Sury, Charlotte ; Malbert, Nathalie ; Labat, Nathalie ; Curutchet, Arnaud ; Dua, Christian ; Oualli, Mourad ; Diforte-Poisson, M.A. ; Aubry, Raphaël
Dans : Journées Nationales Microondes, Brest (France)
https://hal.science/hal-00585621
2010
TCAD simulation and development within the European DOTFIVE project on 500GHz SiGe:C HBT's
Al-Sa'Di, Mahmoud ; d'Alessandro, V. ; Fregonese, Sebastien ; Hong, S.M. ; Jungemann, C. ; Maneux, Cristell ; Marano, I. ; Pakfar, A. ; Rinaldi, N. ; Sasso, G. ; Schröter, M. ; Sibaja-Hernandez, A. ; Tavernier, C. ; Wedel, G.
Dans : European Microwave Week 2010: Connecting the World, EuMIC 2010, Paris (France)
https://hal.science/hal-00584869
Modeling of a novel NPN-SiGe-HBT device structure using strain engineering technology in the collector region for enhanced electrical performance
Al-Sa'Di, Mahmoud ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, Austin (United States)
https://hal.science/hal-00584860
Modeling of NPN-SiGe-HBT Electrical Performance Improvement through Employing Si3N4 Strain in the Collector Region
Al-Sa'Di, M. ; Fregonese, S. ; Maneux, C. ; Zimmer, T.
Dans : 218th ECS Meeting, Las Vegas (United States)
https://hal.science/hal-00526042
TCAD Modeling of NPN-SiGe-HBT Electrical Performance Improvement Through Extrinsic Stress Layer
Al-Sa'Di, M. ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : International Conference on Microelectronics, Nis (Serbia)
https://hal.science/hal-00488682
Nouvelle préparation d'échantillon pour l'analyse de défaillance de technologie Cu/low-k encapsulée en boitier plastique
Aubert, A. ; Dantas de Morais, L. ; Rebrassé, J.P. ; Fremont, Hélène ; Labat, Nathalie
Dans : Atelier de l'ANADEF, Port d'albret (France)
https://hal.science/hal-00585609
Les techniques électro-optique pour l'analyse de défaillance des composants III-V
Bouya, Moshine ; Carisetti, D. ; Malbert, Nathalie ; Labat, Nathalie ; Perdu, P. ; Clément, J.C.
Dans : Atelier de l'ANADEF, Port d'Albret (France)
https://hal.science/hal-00585600
IR and Vis-NIR electroluminescence developments for FA in AlGaN/GaN HEMTs on SiC
Bouya, Moshine ; Carisetti, D. ; Malbert, Nathalie ; Labat, Nathalie ; Perdu, Philippe ; Clement, J.C.
Dans : 36th International Symposium for Testing and Failure Analysis (ISTFA), Dallas (United States)
https://hal.science/hal-00585192
La mise en place de contrôles internes de la masse salariale en contexte universitaire
Carassus, David ; Cazenave, Philippe ; Montava, Emmanuel
Dans : L'autonomie des universités. Contours d'un premier bilan et perspectives d'évolution du paysage universitaire, Ernst and Young, Paris (France)
https://hal-univ-pau.archives-ouvertes.fr/hal-02431993
Facing the defect characterization and localization challenges of bridge defects on submicronic technology (45nm and below)
Celi, Guillaume ; Dudit, Sylvain ; Perdu, Philippe ; Reverdy, A. ; Parrassin, T. ; Bechet, E. ; Lewis, Dean ; Vallet, Maxime
Dans : 20th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Monteccassino (Italy)
https://hal.science/hal-00585662
Dynamic power analysis under laser stimulation: a new Dynamic Laser Simulation approach
Deyine, Amjad ; Perdu, Philippe ; Sanchez, K. ; Courrège, J.C. ; Lewis, Dean
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.science/hal-00585673
Degradations during pulsed measurements in temperature of AlGaN/GaN HEMTs
Douvry, Y. ; Hoel, Virginie ; de Jaeger, Jean-Claude ; Defrance, N. ; Malbert, Nathalie ; Labat, Nathalie ; Curutchet, Arnaud ; Sury, Charlotte ; Dua, C. ; Oualli, M. ; Piazza, M. ; Bluet, J.M. ; Chikhaoui, W. ; Bru-Chevallier, C.
Dans : European Solid-State Device Research Conference 2010, Séville (Spain)
https://hal.science/hal-00585101
Conception et qualification d'un amplificateur de puissance radiofréquence à base de HEMT GaN.
Fonder, Jean Baptiste ; Temcamani, Farid ; Duperrier, Cédric ; Latry, Olivier ; Dherbecourt, Pascal ; Lacheze, Ludovic ; Stanislawiak, Michel ; Eudeline, Philippe
Dans : 13èmes Journées Nano Micro et Optoélectronique, Les Issambres (France), Les Issambres (France)
https://hal.science/hal-00735895
From nanoscale technology scenarios to compact device models for ambipolar devices
Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : 17th IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Athènes (Greece)
https://hal.science/hal-00589113
A compact model for double gate carbon nanotube FET
Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : ESSDERC 2010, Séville (Spain)
https://hal.science/hal-00584874
Thermal aging model of InP/InGaAs/InP DHBT
Ghosh, S. ; Marc, F. ; Maneux, C. ; Grandchamp, B. ; A. Koné, G. ; Zimmer, T.
Dans : Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, gaeta (Italy)
https://hal.science/hal-01002465
Benchmarking of HBT Models for InP Based DHBT Modeling
Ghosh, S. ; Zimmer, T. ; Ardouin, B. ; Maneux, C. ; Frégonèse, S. ; Marc, F. ; Grandchamp, B. ; Koné, G.A.
Dans : International Conference on Microelectronics, Nis (Serbia)
https://hal.science/hal-00488687
Predicting Lifetime using power consumption from 'Wattch'
Gupta, Tushar ; Bertolini, Clément ; Héron, Olivier ; Ventroux, Nicolas ; Zimmer, Thomas ; Marc, François
Dans : 6th International Summer School on Adv. Computer Arch. and Compilation for Embedded Systems, ACACES, Terrassa (Spain)
https://hal.science/hal-00674317
Reliability Aware ArchC based Processor Simulator
Gupta, Tushar ; Bertolini, Clément ; Héron, Olivier ; Ventroux, Nicolas ; Zimmer, Thomas ; Marc, François
Dans : IEEE Int. Integrated Reliability Workshop Final Report (IRW), lake Tahoe (United States)
https://hal.science/hal-00674316
High Level Power and Energy Exploration Using ArchC
Gupta, Tushar ; Bertolini, Clément ; Héron, Olivier ; Ventroux, Nicolas ; Zimmer, Thomas ; Marc, François
Dans : 22nd Int Computer Architecture and High Performance Computing (SBAC-PAD) Symp, Rio de Janeiro (Brazil)
https://hal.science/hal-00674311
Magnetic Microscopy for 3D structures: use of the Simulation Approach for the precise localization of deep buried weak currents
Infante, Fulvio ; Gomes, R. ; Perdu, Philippe ; Battistella, Fabien ; Annereau, Sébastien ; Lewis, D.
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.science/hal-00988364
Magnetic microscopy for 3D structures: use of the Simulation Approach for the precise localization of deep buried weak currents
Infante, Fulvio ; Gomes, Rodolphe ; Perdu, Philippe ; Battistella, Fabien ; Annereau, Sébastien ; Lewis, Dean
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.science/hal-00585670
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : 20th European Symposium Reliabilty on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Monteccassino (Italy)
https://hal.science/hal-00585666
Optically-Gated CNTFET compact model including source and drain Schottky barrier
Liao, Si-Yu ; Najari, Montassar ; Maneux, Cristell ; Fregonese, Sebastien ; Zimmer, Thomas ; Mnif, H. ; Masmoudi, N.
Dans : 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, Hammamet (Tunisia)
https://hal.science/hal-00584845
Low Power and High Gain Double-Balanced Mixer dedicated to 77 GHz Automotive Radar Applications
Mariano, André ; Taris, Thierry ; Leite, Bernardo ; Majek, Cédric ; Deval, Yann ; Kerherve, Eric ; Begueret, Jean-Baptiste ; Belot, Didier
Dans : ESSCIRC 2010, (Spain)
https://hal.science/hal-00498733
A Low Power and High Gain Double-Balanced Active Mixer with Integrated Transformer-Based Baluns dedicated to 77 GHz Automotive Radar Applications
Mariano, André ; Leite, Bernardo ; Majek, Cédric ; Taris, Thierry ; Deval, Yann ; Begueret, Jean-Baptiste ; Belot, Didier
Dans : newcas2010, (Canada)
https://hal.science/hal-00476797
Accurate Multi-bit Feedback DAC Dedicated to High-speed Continuous-time DS Converters
Mariano, André ; Majek, Cédric ; Dallet, Dominique ; Begueret, Jean-Baptiste ; Deval, Yann
Dans : Latin American Symposium on Circuits and Systems, Iguaçu Falls (Brazil)
https://hal.science/hal-00448816
On the Use of Body Biasing to Control Gain, Linearity, and Noise Figure of a mm-Wave CMOS LNA
Rashtian, Hooman ; Majek, Cédric ; Mirabbasi, Shahriar ; Taris, Thierry ; Deval, Yann ; Begueret, Jean-Baptiste
Dans : NEWCASTAISA, MONTREAL (Canada)
https://hal.science/hal-00840675
Electrical simulation of learning stage in OG-CNTFET based neural crossbar
Retrouvey, J.M. ; Klein, Jacques-Olivier ; Liao, Si-Yu ; Maneux, Cristell
Dans : 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, (Tunisia)
https://hal.science/hal-00671681
A versatile compact model for ballistic 1D transistor: Applications to GNRFET and CNTFET
Zimmer, Thomas ; Fregonese, Sebastien ; Maneux, Cristell
Dans : First EuroGRAPHENE Symposium, Strasbourg (France)
https://hal.science/hal-00588829
2009
Investigation of Electrical BJT Performance through Extrinsic Stress Layer Using TCAD Modeling
Al-Sa'Di, M. ; Fregonese, S. ; Maneux, C. ; Zimmer, T.
Dans : Semiconductor Conference Dresden 2009, Dresden (Germany)
https://hal.science/hal-00399917
Investigation of High Frequency coupling between Probe tips and Wafer surface.
Bazzi, J. ; Raya, C. ; Curutchet, A. ; Zimmer, T.
Dans : IEEE BiCMOS Technology Meeting 2009, (Italy)
https://hal.science/hal-00400373
UV emission microscopy development for high band gap components
Bouya, Moshine ; Carisetti, D. ; Malbert, Nathalie ; Labat, Nathalie ; Perdu, Philippe ; Clement, J.C.
Dans : 34th International Symposium for Testing and Failure Analysis, San Jose (United States)
https://hal.science/hal-00585086
Caractérisation et modélisation des sources de bruit aux basses fréquences dans la filière HEMT à base de nitrure de gallium
Curutchet, A. ; Sury, C. ; Malbert, N. ; Labat, N.
Dans : - XVIèmes Journées Nationales Microondes, France, (France)
https://hal.science/hal-00401250
Investigation of single event burnout sensitive depth in power MOSFETS
Darracq, Frédéric ; Pouget, V. ; Lewis, D. ; Fouillat, P. ; Lorfèvre, E. ; Ecoffet, R. ; Bezerra, F.
Dans : 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS),, Bruges (Belgium)
https://hal.science/hal-00667364
Full Dynamic Laser simulation set up
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, D. ; Deslandes, H.
Dans : 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009., Suzhou (China)
https://hal.science/hal-00988356
A versatile compact model for ballistic 1D transistor: Applications to GNRFET and CNTFET
Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : Semiconductor Device Research Symposium, 2009. ISDRS '09. International, (United States)
https://hal.science/hal-00450128
Effects of various applications on relative lifetime of processor cores
Gupta, Tushar ; Bertolini, Clément ; Héron, Olivier ; Ventroux, Nicolas ; Zimmer, T. ; Marc, F.
Dans : IRW, Lake Tahoe (United States)
https://hal.science/hal-00674313
Effects of Power consumption and Temperature on Lifetime Reliability of ArchC based Processor Architecture
Gupta, Tushar ; Bertolini, Clément ; Héron, Olivier ; Ventroux, Nicolas ; Zimmer, Thomas ; Marc, François
Dans : Workshop on Design for Reliability and Variability, Austin (United States)
https://hal.science/hal-00499484
Effects of various applications on relative lifetime of processor cores
Gupta, Tushar ; Héron, Olivier ; Zimmer, Thomas ; Ventroux, Nicolas ; Marc, François ; Bertolini, Clément
Dans : International Integrated Reliability Workshop, South Lake Tahoe (United States)
https://hal.science/hal-00499480
Net integrity checking by optical localization techniques
Haller, G. ; Machouat, A. ; Lewis, Dean ; Pouget, Vincent
Dans : 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Arcachon (France)
https://hal.science/hal-00585657
Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Arcachon (France)
https://hal.science/hal-00585654
Short circuit localization on integrated circuits using magnetic microscopy techniques coupled to simulations
Infante, F. ; Perdu, Philippe ; Petremont, S. ; Lewis, Dean
Dans : 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou (China)
https://hal.science/hal-00585648
RF doubling and rectification in Three-Terminal Junctions: experimental characterization and Monte Carlo analysis
Iñiguez-De-La-Torre, I. ; González, T. ; Pardo, D. ; Gardes, Chantal ; Roelens, Yannick ; Bollaert, S. ; Curutchet, A. ; Gaquière, Christophe ; Mateos, J.
Dans : EDISON 16, (France)
https://hal.science/hal-00401237
Audio/video fusion for objects recognition
Lacheze, L. ; Guo, Y. ; Benosman, R. ; Gas, Bruno ; Couverture, C.
Dans : IEEE/RSJ International Conference on Intelligent RObots and Systems, - (Unknown Region)
https://hal.science/hal-03416476
Compact modeling of Optically-Gated Carbon NanoTube Field Effect Transistor
Liao, Si-Yu ; Maneux, Cristell ; Pouget, Vincent ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : Trends in NanoTechnologies 2009, Barcelonna (Spain)
https://hal.science/hal-00399897
Etude d'un synthétiseur de fréquence fractionnaire large bande à éléments à retard contrôlable
Lucas de Peslouan, Pierre-Olivier ; Majek, Cédric ; Taris, Thierry ; Deval, Yann ; Begueret, Jean-Baptiste
Dans : Journées Nationales du Réseau Doctoral de Microélectronique, Lyon (France)
https://hal.science/hal-00380888
A Digitally Tuned Voltage Controlled Delay Element for 1-10GHz DLL-based Frequency Synthesis
Lucas de Peslouan, Pierre-Olivier ; Majek, Cédric ; Taris, Thierry ; Deval, Yann ; Belot, Didier ; Begueret, Jean-Baptiste
Dans : NEWCAS – TAISA'09, Toulouse (France)
https://hal.science/hal-00380884
Best test pattern failure analysis flow for functional logic failure localization by IR-OBIRCH technique
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, D. ; Perdu, Philippe ; Pouget, V. ; Essely, Fabien
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, Singapour (Singapore)
https://hal.science/hal-00670058
60 GHz cascode LNA with interstage matching: performance comparison between 130nm BiCMOS and 65nm CMOS-SOI technologies
Majek, Cédric ; Severino, Raffaele ; Taris, Thierry ; Deval, Yann ; Mariano, André ; Begueret, Jean-Baptiste ; Belot, Didier
Dans : Signals, Circuits & Systems, Jerba (Tunisia)
https://hal.science/hal-00418915
Voltage Controlled Delay Line with phase quadrature outputs for [0.9-4] GHz F-DLL dedicated to Zero-IF multi-standard LO
Majek, Cédric ; Lapuyade, Herve ; Deval, Yann ; Begueret, Jean-Baptiste
Dans : 22nd Symposium on Integrated Circuits and Systems Design (SBCCI), (Brazil)
https://hal.science/hal-00402264
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs
Malbert, Nathalie ; Labat, Nathalie ; Curutchet, Arnaud ; Sury, Charlotte ; Hoel, Virginie ; de Jaeger, Jean-Claude ; Defrance, N. ; Douvry, Yannick ; Dua, Christian ; Oualli, Mourad ; Bru-Chevallier, Catherine ; Bluet, Jean-Marie ; Chikhaoui, Walf
Dans : GaN microwave component technology workshop, Ulm (Germany)
https://hal.science/hal-00401323
Modélisation compacte et transport balistique
Maneux, Cristell ; Fregonese, Sebastien ; Zimmer, T.
Dans : ATELIER DU GDR NANOELECTRONIQUE DE LA REALITE ET DE L'INTERET DU TRANSPORT BALISTIQUE DANS LES COMPOSANTS NANOELECTRONIQUES, (France)
https://hal.science/hal-00399887
Analytical modeling of the tunneling current in schottky barrier carbon nanotube field effect transistor using the verilog-a language
Najari, Montassar ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas ; Mnif, Hassene ; Masmoudi, Nouri
Dans : ) 2009 6th International Multi-Conference on Systems, Signals and Devices, (Tunisia)
https://hal.science/hal-00674301
Efficient Physics-Based Compact Schottky Barrier Carbon Nanotube FET
Najari, M. ; Maneux, C. ; Zimmer, T. ; Mnif, H. ; Masmoudi, N.
Dans : Trends in NanoTechnologies 2009, Barcelonna (Spain)
https://hal.science/hal-00399901
Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation for IC Characterization and Failure Analysis
Pouget, V. ; Faraud, Emeric ; Shao, Kai ; Jonathas, S. ; Horain, D. ; Haller, G. ; Goubier, V. ; Picart, B. ; Forli, L. ; Lewis, D.
Dans : 35th International Symposium for Testing and Failure Analysis (ISTFA), Sans José (United States)
https://hal.science/hal-00670060
Improved GeOI substrates for pMOSFET off-state leakage control
Romanjek, K. ; Augendre, E. ; van den Daele, W. ; Grandchamp, B. ; Sanchez, L. ; Le Royer, C. ; Hertmann, J.-M. ; Ghyselen, B. ; Guiot, E. ; Bourdelle, K. ; Cristoloveanu, S. ; Boulanger, F. ; Clavelier, L.
Dans : International Conference on Insulating Films on Semiconductors (INFOS),, Cambridge (United Kingdom)
https://hal.science/hal-00603830
Low frequency Noise evolution of AlGaN/GaN HEMT after 2000 Hours of HTRB and HTO life test
Sury, Charlotte ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : 20 th International Conference on Noise and Fluctuations, Pise (Italy)
https://hal.science/hal-00401286
2008
Backside failure analysis by electroluminescence on microwave devices
Bouya, Moshine ; Carisetti, Dominique ; Malbert, Nathalie ; Labat, Nathalie ; Perdu, Philippe ; Delaqueze, P. ; Clement, Jean Claude
Dans : Int. Symp. for Testing and Failure Analysis ISTFA, Portland (United States)
https://hal.science/hal-00401293
Dynamic Laser Stimulation Technique for device qualification process
Deyne-Barth, A. ; Perdu, Philippe ; Benetti, G. ; Sanchez, Kevin ; Battistella, F. ; Lewis, Dean
Dans : International Symposium for Testing and Failure Analysis (ISTFA), (France)
https://hal.science/hal-00401698
Effects of surface and buffer traps in passivated AlGaN-GaN HEMTs
Faqir, M. ; Verzellesi, G. ; Fantini, F. ; Danesin, F. ; Meneghesso, G. ; Zanoni, E. ; Labat, N. ; Touboul, A. ; Dua, C.
Dans : 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2008, Leuven (Belgium)
https://hal.science/hal-00415763
Effects of surface and buffer traps in passivated AlGaN-GaN HEMTs
Faqir, Mustapha ; Verzellesi, G. ; Fantini, F. ; Danesin, F. ; Rampazzo, F. ; Zanoni, E. ; Meneghesso, G. ; Labat, Nathalie ; Touboul, A. ; Dua, Christian
Dans : 32th workshop on Compound semiconductor Devices and Integrated Circuits WOCSDICE, Leuven (Belgium)
https://hal.science/hal-00401301
Methodologies and Tools for the Evaluation of the Sensitivity to Radiation of SRAM-based FPGAs
Foucard, G. ; Perronnard, P. ; Velazco, Raoul ; Ferron, J. ; Douin, A. ; Pouget, V. ; Bocquillon, A. ; Miller, F. ; Berger, G. ; Charlier, F. ; Boldrin, F.
Dans : 23rd International Conference on Design of Circuits and Integrated Systems (DCIS'08), Grenoble (France)
https://hal.science/hal-00347662
Characterization of carbon nanotube field-effect transistors using an active load pull LSNA setup
Gaquière, Christophe ; Curutchet, Arnaud ; Theron, Didier ; Werquin, Matthieu ; Ducatteau, Damien ; Bethoux, Jean-Marc ; Happy, Henri ; Dambrine, Gilles ; Derycke, Vincent
Dans : 71st ARFTG Microwave Measurement Conference, ARFTG 2008, Atlanta, GA (United States)
https://hal.science/hal-00362030
Compact Model of a Dual Gate CNTFET: Description and Circuit Application
Goguet, Johnny ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : 8th IEEE Conference on Nanotechnology, Arlington, TEXAS, USA (United States)
https://hal.science/hal-00319955
A Charge Approach for a Compact Model of Dual Gate CNTFET
Goguet, Johnny ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : IEEE 2008 International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Tozeur (Tunisia)
https://hal.science/hal-00288046
SET sensitive volume imaging and measurement with two-photon absorption laser testing
Jaulent, Patrice ; Pouget, Vincent ; Mcmorrow, D. ; Bezerra, F. ; Fouillat, Pascal ; Lewis, Dean
Dans : Nuclear and Space Radiation Effects Conference (NSREC), Tucson (United States)
https://hal.science/hal-00401702
Méthodologie de calibration de simulation numérique TCAD de TLM AlGaN/GaN
Lacheze, L. ; Malbert, N. ; Labat, N.
Dans : JNRDM, (France)
https://hal.science/hal-00401349
MODELISATION DU COURANT DE GRILLE DES HEMTs AlGaN/GaN
Lacheze, L. ; Sury, C. ; Curutchet, A. ; Malbert, N. ; Labat, N. ; Touboul, A.
Dans : XIVème Journées Nationales Microélectronique Optoélectronique, (France)
https://hal.science/hal-00401345
Analytical modelling of the Schottky gate current in AlGaN/GaN HEMT
Lacheze, Ludovic ; Malbert, Nathalie ; Labat, Nathalie
Dans : 33nd Workshop on Compound Semiconductor Devices and Integrated Circuits WOCSDICE 2009, Malaga (Spain)
https://hal.science/hal-00401306
IP-based methodology for analog design flow: Application on neuromorphic engineering
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : IEEE NEWSCAS-TAISA 2008, Montréal (Canada)
https://hal.science/hal-00514205
An E-Learning Experience in Practical Electronics: Technological and Pedagogical Aspects
Lewis, Noelle ; Zimmer, Thomas ; Billaud, Michel ; Geoffroy, Didier
Dans : 5th Congress of Scientific Research Outlook in the Arab World, Fez (Morocco)
https://hal.science/hal-00327562
Toward compact model of Optical-Gated Carbon Nanotube Field Effect Transistor (OG-CNTFET)
Liao, Si-Yu ; Maneux, Cristell ; Fregonese, Sébastien ; Zimmer, Thomas
Dans : JNTE 08, French Symposium on Emerging Technologies for micro-nanofabrication, Toulouse (France)
https://hal.science/hal-00337487
Effect of Physical defect on schmoos in CMOS DSM technologies
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Perdu, Philippe ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Maastricht (Netherlands)
https://hal.science/hal-00401696
Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien ; Perdu, Philippe
Dans : 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapour (Singapore)
https://hal.science/hal-00398000
Ge Base Profile Engineering in SiGe:C HBTs for Power Amplifier Applications : Influence on Current Gain and Input Impedance over a Wide Range of Temperature
Mans, P.M. ; Jouan, S. ; Brossard, F. ; Comte, Myriam ; Pache, D. ; Maneux, C. ; Zimmer, T.
Dans : 4th International SiGe Technology and Device Meeting, (Taiwan)
https://hal.science/hal-00327467
Germanium Base Profile Optimization to Improve fT Characteristics at High Injection in RF Power SiGe:C HBTs
Mans, P.M. ; Jouan, S. ; Pakfar, A. ; Fregonese, S. ; Brossard, F. ; Perrotin, A. ; Maneux, C. ; Zimmer, T.
Dans : 7th IEEE Topical Symposium on Power Amplifiers for Wireless Communications, Orlando (United States)
https://hal.science/hal-00327463
Electronic Practical Course via the Web in a Virtual Laboratory
Mnif, Hassene ; Sahnoun, Salwa ; Hdiji, Fatma ; Geoffroy, Didier ; Billaud, Michel ; Lewis, Noelle ; Zimmer, Thomas
Dans : Conference REV 2008, Düsseldorf (Germany)
https://hal.science/hal-00327567
COMPACT MODELING OF THE SCHOTTKY BARRIER JUNCTION IN THE CARBON NANOTUBE FIELD EFFECT TRANSISTOR
Najari, Montassar ; Frégonèse, Sébastien ; Maneux, Cristell ; Zimmer, Thomas ; Mnif, Hasséne ; Masmoudi, Nouri
Dans : JNTE 08, French Symposium on Emerging Technologies for micro-nanofabrication, Toulouse (France)
https://hal.science/hal-00337489
Towards Compact Modelling of Schottky Barrier CNTFET
Najari, Montassar ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas ; Mnif, Hassene ; Masmoudi, N.
Dans : IEEE 2008 International Conference on Design & Technology of Integrated Systems in Nanoscale Era, (Tunisia)
https://hal.science/hal-00288040
Remote SEE Testing Capabilities with Heavy Ions and Laser Beams at CYCLONE-HIF and ATLAS Facilities
Peronnard, P. ; Velazco, Raoul ; Foucard, G. ; Pouget, V. ; Berger, G. ; Charlier, F. ; Boldrin, F.
Dans : Radiation Effects Data Workshop, Tucson, AZ (United States)
https://hal.science/hal-00374744
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection
Pouget, V. ; Douin, A. ; Foucard, G. ; Peronnard, P. ; Lewis, D. ; Fouillat, P. ; Velazco, Raoul
Dans : 14th IEEE International Symposium On-Line Testing (IOLT'08), Rhodes (Greece)
https://hal.science/hal-00347751
Investigation of De-embedding Methods up to 110GHz
Raya, C. ; Celi, D. ; Zimmer, T.
Dans : 8th European HICUM Workshop, Dresden (Germany)
https://hal.science/hal-00327490
Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits
Roche, N. ; Velo, Y. Gonzalez ; Dusseau, L. ; Boch, J. ; Vaillé, J.-R. ; Saigné, Frédéric ; Azais, B. ; Auriel, G. ; Lorfèvre, E. ; Pouget, V. ; Buchner, S. P. ; David, J.-P. ; Calvel, P. ; Marec, R.
Dans : 7th European Workshop on Radiation and its Effects on Components and Systems, Jyvaskyla (Finland)
https://hal.science/hal-01822766
Failure Analysis enhancement by evaluating the photoelectric laser stimulation impact on mixed-mode ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Sanchez, Kevin ; Crepel, Olivier ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Maastricht (Netherlands)
https://hal.science/hal-00401699
Failure analysis enhancement by evaluating the thermal laser stimulation impact on analog ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Crepel, Olivier ; Lewis, Dean
Dans : International Symposium on the Physical and Failure Analysis on Integrated Circuits (IPFA), Suzhou (China)
https://hal.science/hal-00401695
Étude du bruit aux basses fréquences des contacts ohmiques des hétérostructures à base de Nitrure de Gallium
Sury, C. ; Curutchet, A. ; Malbert, N. ; Labat, N.
Dans : JNMO, (France)
https://hal.science/hal-00401350
Extraction et modélisation des sources de bruit aux basses fréquences des hétérostructures à base de Nitrure de Gallium
Sury, C. ; Curutchet, A. ; Malbert, N. ; Labat, N. ; Touboul, A.
Dans : XIVème Journées Nationales Microélectronique Optoélectronique, (France)
https://hal.science/hal-00401347
2007
Integration of remote lab exercises into standard course packages
Billaud, M. ; Zimmer, T. ; Geoffroy, D.
Dans : Conference IMCL2007, Amman (Jordan)
https://hal.science/hal-00327559
Highlights of Laser Testing Capabilities Regarding the Understanding of SEE in SRAM-based FPGA
Bocquillon, A. ; Foucard, G. ; Miller, F. ; Buard, Nadine ; Leveugle, Régis ; Daniel, C. ; Rakers, S. ; Carriere, T. ; Pouget, Vincent ; Velazco, Raoul
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Deauville (France)
https://hal.science/hal-00397854
Highlights of laser testing capabilities regarding the understanding of SEE in SRAM Based FPGAs
Bocquillon, A. ; Foucard, G. ; Miller, F. ; Buard, N. ; Leveugle, Régis ; Daniel, C. ; Rakers, S. ; Carriere, T. ; Pouget, V. ; Velazco, Raoul
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS'07), Deauville (France)
https://hal.science/hal-00288250
Techniques de détection de défauts dans les transistors à haute mobilité électronique AlGaN/GaN à contact Schottky Pt/Ti/Au
Bouya, Moshine ; Carisetti, Dominique ; Malbert, Nathalie ; Labat, Nathalie ; Perdu, Philippe ; Clement, Jean-Claude ; Pataut, Gerard ; Bonnet, Michel
Dans : XVIèmes Journées Nationales Microondes, Toulouse (France)
https://hal.science/hal-00197484
Electrical OverStress/ElectroStatic Discharges (EOS/ESD) specificities in MEMS: outline of a protection strategy
Caillard, Benjamin ; Pellet, Claude ; Touboul, Andre ; Mita, Yoshio ; Fujita, Hirohito
Dans : IEEE International symposium on the Physical and Failure Analysis of integrated circuits (IPFA'07), Bangalore (India)
https://hal.science/hal-00162196
Impact of VCO Topology on SET Induced Frequency Response
Chen, W. ; Varanasi, N. ; Pouget, Vincent ; Barnaby, H. J. ; Vermeire, B. ; Adell, P.C. ; Copani, T. ; Fouillat, Pascal
Dans : Nuclear and Space Radiation Effects Conference (NSREC) 2007, Honolulu (United States)
https://hal.science/hal-00398031
Caractérisation et modélisation non linéaire de Transistors hyperfréquences à Effet de Champ à base de Nano tubes de Carbone (CNFETs) à l'aide d'un Analyseur de réseau Large Signal (LSNA)
Curutchet, Arnaud ; Bethoux, Jean-Marc ; Werquin, Matthieu ; Happy, Henri ; Theron, Didier ; Ducatteau, Damien ; Dambrine, Gilles ; Gaquière, Christophe ; Derycke, Vincent
Dans : XVIèmes Journées Nationales Microondes, Toulouse (France)
https://hal.science/hal-00197497
Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : 45th annual ieee International Reliability Physics Symposium (IRPS), Phoenix (United States)
https://hal.science/hal-00204584
Jitter Improvement of Time-Resolved Photoelectric Laser Stimulation for Dynamic Imaging of Integrated Circuits
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : Instrumentation and Measurement Technology Conference 2007, Varsovie (Poland)
https://hal.science/hal-00204580
IC Debug and Defect Localization using Dynamic Laser Stimulation and Time-Resolved Emission
Ferrigno, Julie ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, Dean ; Vallet, Michel ; Dudit, Sylvain
Dans : 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2007, Bangalore (India)
https://hal.science/hal-00204582
Modèle compact du transistor double grille CNTFET
Goguet, Johnny ; Fregonese, Sebastien ; Maneux, Cristell ; Zimmer, Thomas
Dans : Journées thématiques sur la simulation multiphysique de composants et dispositifs nanométriques, Lille (France)
https://hal.science/hal-00197536
Study of Single Event Transients in High-Speed Operational Amplifiers
Jaulent, Patrice ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Deauville (France)
https://hal.science/hal-00397836
Influence of the Strain on Static I-V Characteristics of AlGaN/GaN HEMT Determined by Physical Simulation
Lacheze, Ludovic ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre
Dans : International Workshop on Heterostructures HETECH, Frejus (France)
https://hal.science/hal-00197501
IP-Based Library for Analog Design Reuse
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : GDR SoC-SIP, Paris (France)
https://hal.science/hal-00514216
Scaling Guidelines for CMOS Linear Analog Design
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : International Conference on Ph.D. Research in Microelectronics & Electronics, Bordeaux (France)
https://hal.science/hal-00414788
IP-Based Library for Analog Design Reuse
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : GDR SoC-SIP, Paris (France)
https://hal.science/hal-00181424
Resizing methodology for CMOS analog circuit
Levi, Timothée ; Tomas, J. ; Lewis, N. ; Fouillat, P.
Dans : Proceedings SPIE VLSI Circuits and Systems III, Maspalomas, Gran Canaria (Spain)
https://hal.science/hal-00181420
IP-based design reuse for analogue systems: a case study
Levi, Timothée ; Tomas, J. ; Lewis, N. ; Fouillat, P.
Dans : Proceedings SPIE VLSI Circuits and Systems III, Maspalomas, Gran Canaria (Spain)
https://hal.science/hal-00181417
Configuration errors analysis in SRAM-based FPGAs
Maingot, V. ; Ferron, J. ; Leveugle, Régis ; Pouget, Vincent ; Douin, Alexandre
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon (France)
https://hal.science/hal-00401694
Synthétiseur de fréquence reconfigurable [900 MHz - 5,8 GHz] totalement intégrable en technologie CMOS SOI 130nm
Majek, Cédric ; Deval, Yann ; Lapuyade, Herve ; Taris, Thierry ; Begueret, Jean-Baptiste
Dans : Journées Nationales Micro-ondes 2007, Toulouse (France)
https://hal.science/hal-00178334
The Factorial Delay Locked Loop: a solution to fulfill multistandard RF synthesizer requirements
Majek, Cédric ; Deval, Yann ; Lapuyade, Herve ; Begueret, Jean-Baptiste
Dans : PRIME'07 (PhD Research in Microelectronics and Electronics Conference), Bordeaux (France)
https://hal.science/hal-00178327
LF noise analysis of InP/GaAsSb/InP and InP/InGaAs/InP HBTs
Maneux, C. ; Grandchamp, B. ; Labat, N. ; Touboul, A. ; Scavennec, A. ; Riet, M. ; Godin, J. ; Bove, Ph.
Dans : 19th IEEE Conference on Indium Phosphide and Related Materials, (Japan)
https://hal.science/hal-00401338
Optimisation du transistor bipolaire à hétérojonction Si/SiGe:C pour les applications d'amplification de puissance
Mans, P.M. ; Maneux, C. ; Zimmer, T. ; Jouan, S.
Dans : Journées Nationales du Réseau Doctorant en Microélectronique, Lille (France)
https://hal.science/hal-00327470
Investigation of Ge content in the BC transition region with respect to transit frequency
Mans, Pierre-Marie ; Jouan, Sebastien ; Pakfar, A. ; Fregonese, Sebastien ; Brossard, F. ; Perrotin, A. ; Maneux, Cristell ; Zimmer, Thomas
Dans : 20th BipAk, Munchen (Germany)
https://hal.science/hal-00189397
Evaluation of Recent Technologies of Non-Volatile RAM
Nuns, T. ; Duzellier, S. ; Bertrand, J. ; Hubert, G. ; Pouget, Vincent ; Darracq, Frédéric ; David, J.P. ; Soonckindt, S.
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Deauville (France)
https://hal.science/hal-00397841
Single Event Transient Mapping of a Voltage-Controlled Oscillator
Pouget, Vincent ; Chen, W. ; Lewis, Dean ; Barnaby, H. J. ; Fouillat, Pascal
Dans : 16th Single-Event Effects Symposium, Long Beach (United States)
https://hal.science/hal-00398024
Tools and methodology development for pulsed laser fault injection in SRAM-based FPGAs
Pouget, V. ; Douin, A. ; Lewis, D. ; Fouillat, P. ; Foucard, G. ; Peronnard, P. ; Maingot, V. ; Ferron, J. ; Anghel, Lorena ; Leveugle, Régis ; Velazco, Raoul
Dans : 8th Latin-American Test Workshop (LATW'07), Cuzco (Peru)
https://hal.science/hal-00156318
A new transit time extraction algorithm based on matrix deembedding techniques
Raya, C. ; Kaufmann, N. ; Celi, D. ; Zimmer, T.
Dans : 7th European HICUM Workshop, Dresden (Germany)
https://hal.science/hal-00327487
Scalable Approach for External Collector Resistance Calculation
Raya, Christian ; Kauffmann, Nicolas ; Pourchon, Franck ; Celi, Didier ; Zimmer, Thomas
Dans : ICMTS International Conference on Microelectronic Test Structures, Tokyo (Japan)
https://hal.science/hal-00187269
New Method for Oxide Capacitance Extraction
Raya, Christian ; Schwartzmann, Thierry ; Chevalier, Pascal ; Pourchon, Franck ; Celi, Didier ; Zimmer, Thomas
Dans : IEEE Bipolar/BiCMOS circuits and technology meeting, (United States)
https://hal.science/hal-00187268
Failure Localization and design debug on mixed-mode ICs by using the dynamic laser stimulation techniques
Sienkiewicz, Magdalena ; Sanchez, Kevin ; Firiti, Abdellatif ; Crepel, Olivier ; Perdu, Philippe ; Lewis, Dean
Dans : International Symposium for Testing and Failure Analysis (ISTFA) 2007, San Jose (United States)
https://hal.science/hal-00204668
the Heat Equation with the Quadrupole Approach
Sulima, P.Y. ; Battaglia, J.L. ; Zimmer, T.
Dans : 7th European HICUM Workshop, Dresden (Germany)
https://hal.science/hal-00415624
Solving the Heat Equation with the Quadrupole Approach
Sulima, P.Y. ; Battaglia, J.L. ; Zimmer, T.
Dans : 7th European HICUM Workshop, Dresden (Germany)
https://hal.science/hal-00327485
Linear Systems Analysis of Single Event Transients in Voltage Controlled Oscillators
Varanasi, N. ; Chen, W. ; Vermeire, B. ; Adell, P.C. ; Pouget, Vincent ; Fouillat, Pascal ; Barnaby, H. J.
Dans : 16th Single-Event Effects Symposium, Long Beach (United States)
https://hal.science/hal-00398028
2006
Power Transistor Electrical Behavior
Beckrich, Helene ; Ortolland, Sylvie ; Pache, D. ; Céli, Didier ; Gloria, D. ; Zimmer, Thomas
Dans : ICMTS International Conference on Microelectronic Test Structures, Austin (United States)
https://hal.science/hal-00187276
SiGe HBT design for CMOS compatible SOI
Chantre, Alain ; Avenier, Gregory ; Chevalier, Pascal ; Vandelle, Benoit ; Saguin, Fabienne. ; Maneux, Cristell ; Dutartre, Didier ; Zimmer, Thomas
Dans : International Silicon-Germanium Technology and Device Meeting, (United States)
https://hal.science/hal-00187273
Prospects for Complementary SiGeC BiCMOS on Thin-Film SOI
Chantre, Alain ; Boissonnet, Laurence ; Avenier, Gregory ; Borot, Gael ; Bouillon, Pierre ; Brossard, Florence ; Chevalier, Pascal ; Deleglise, Florence ; Dutartre, Didier ; Duvernay, Julien ; Fregonese, Sebastien ; Judong, Fabienne ; Pantel, Roland ; Perrotin, Andre ; Rauber, Bruno ; Rubaldo, Laurent ; Saguin, Fabienne ; Schwartzmann, Thierry ; Vandelle, Benoit ; Zimmer, Thomas
Dans : ECS Transactions, Cancun (Mexico)
https://hal.science/hal-00181206
Caractérisation et modélisation non linéaire de Transistors à Effet de Champs à Nano tubes de Carbone (CNFETs) à l'aide d'un Analyseur de réseau non linéaire (LSNA)
Curutchet, Arnaud ; Bethoux, Jean-Marc ; Werquin, Matthieu ; Happy, Henri ; Theron, Didier ; Ducatteau, Damien ; Gaquière, Christophe
Dans : GDR G2054 Nanoélectronique, Grenoble (France)
https://hal.science/hal-00197505
Time resolved imaging using synchronous picosecond photoelectric laser stimulation
Douin, Alexandre ; Pouget, Vincent ; de Matos, Magali ; Lewis, Dean ; Perdu, Philippe ; Fouillat, Pascal
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Wuppertal (Germany)
https://hal.science/hal-00401692
Applications of various optical techniques for ESD defect localization
Essely, Fabien ; Darracq, Frédéric ; Pouget, Vincent ; Remmach, Mustapha ; Beaudoin, Félix ; Guitard, Nicolas ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), wuppertal (Germany)
https://hal.science/hal-00401519
OBIC technique for ESD defect localization : Influence of the experimental procedure
Essely, F. ; Guitard, Nicolas ; Darracq, F. ; Pouget, V. ; Bafleur, Marise ; Touboul, A. ; Lewis, D.
Dans : 3th Workshop EOS/ESD/EMI, Toulouse (France)
https://hal.science/hal-00327412
Optimizing pulsed OBIC technique for ESD defect localization
Essely, Fabien ; Guitard, Nicolas ; Darracq, Frédéric ; Pouget, Vincent ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapour (Singapore)
https://hal.science/hal-00204574
Dynamic optical techniques for IC debug and failure analysis
Ferrigno, Julie ; Desplats, Romain ; Perdu, Philippe ; Sanchez, Kevin ; Beaudoin, Félix ; Lewis, Dean
Dans : 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2006, Singapour (Singapore)
https://hal.science/hal-00204578
3D Simulation Study of Strained CMOS based on a disposable SiGe Dot Technology
Fregonese, Sebastien ; Zhuang, Yan ; Burghartz, Joachim Norbert
Dans : GDR Nanoélectronique, Grenoble (France)
https://hal.science/hal-00181694
IP-based design for analogue ASICs: A case study
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : IP-based SoC Design Conference 2006, IP-SoC 2006, Grenoble (France)
https://hal.science/hal-00181401
Scaling Rules for MOS Analog Design Reuse
Levi, Timothée ; Lewis, N. ; Tomas, J. ; Fouillat, P.
Dans : Mixed Design of Integrated Circuits and Systems MIXDES 2006, Gdynia (Poland)
https://hal.science/hal-00181379
Modélisation compacte du transistor à nanotube de carbone
Maneux, Cristell ; Goguet, Johnny ; Zimmer, Thomas
Dans : Journées thématiques du Club EEA, Nanoélectronique, (France)
https://hal.science/hal-00181996
Analysis of CNTFET physical compact model
Maneux, Cristell ; Goguet, Johnny ; Fregonese, Sebastien ; Zimmer, Thomas ; Cazin d'Honincthun, Hughes ; Galdin-Retailleau, S.
Dans : IEEE Design and Test of integrated Systems In Nanoscale Technology, (Tunisia)
https://hal.science/hal-00181481
Recent developments for SEE testing at the ATLAS laser facility
Pouget, Vincent ; Wan, Dong Yun ; Jaulent, Patrice ; Douin, Alexandre ; Lewis, Dean ; Fouillat, Pascal
Dans : 15th Single-Event Effects Symposium, Long Beach (United States)
https://hal.science/hal-00398021
Sheet Resistance in BiCMOS Technology
Raya, Christian ; Pourchon, Franck ; Celi, Didier ; Laurens, M. ; Zimmer, Thomas
Dans : International Conference on Microelectronic Test Structures, Austin (United States)
https://hal.science/hal-00187305
Single Event Transients (SETs) in RF Circuits
Varanasi, N. ; Chen, W. ; Barnaby, H. J. ; Vermeire, B. ; Cressler, J. ; Lapuyade, Herve ; Pouget, Vincent ; Fouillat, Pascal
Dans : 15th Single-Event Effects Symposium, Long Beach (United States)
https://hal.science/hal-00398023
In-depth resolution for LBIC technique by two-photon absorption
Wan, Dong Yun ; Pouget, Vincent ; Douin, Alexandre ; Jaulent, Patrice ; Lewis, Dean ; Fouillat, Pascal
Dans : Beam Injection Assessment of Microstructurs in Semiconductors (BIAMS), Saint Petersbourg (Russia)
https://hal.science/hal-00401693
A remote laboratory for electrical engineering education
Zimmer, T. ; Billaud, M. ; Geoffroy, D.
Dans : Conference IMCL2006, Amman (Jordan)
https://hal.science/hal-00327558
HBT's thermal impedance measurement
Zimmer, Thomas ; Baureis, Peter ; Beckrich, Helene ; Yvan Sulima, Pierre
Dans : 19th BipAk, (Germany)
https://hal.science/hal-00189401
2005
Intra-IC Inspection and Metrology with Picosecond Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Fouillat, Pascal ; Danto, Yves
Dans : 22nd IEEE Instrumentation and Measurement Technology Conference (IMTC) 2005, (Canada)
https://hal.science/hal-00182901
Investigation of fully- and partially-depleted self-aligned SiGeC HBTs on thin film SOI
Avenier, Gregory ; Chevalier, Pascal ; Vandelle, Benoit ; Lenoble, Damien ; Saguin, Fabienne ; Fregonese, Sébastien ; Zimmer, Thomas ; Chantre, A.
Dans : European Solid-State Device Research Conference - ESSDERC 2005, (France)
https://hal.science/hal-00181981
A self-aligned vertical HBT for thin SOI SiGeC BiCMOS
Avenier, Gregory ; Schwartzmann, Thierry ; Chevalier, Pascal ; Vandelle, Benoit ; Rubaldo, Laurent ; Dutartre, Didier ; Boissonnet, L. ; Saguin, Fabienne ; Pantel, Roland ; Fregonese, Sébastien ; Maneux, Cristell ; Zimmer, Thomas ; Chantre, A.
Dans : BCTM 2005, Bipolar/BiCMOS circuits and technology meeting, (United States)
https://hal.science/hal-00181977
A thermal sub-circuit for modelling temperature distribution in multi-finger HBTs and in multi-HBTs structures
Beckrich, Helene ; Ortoland, Sylvie ; Schwartzmann, Thierry ; Celi, D. ; Zimmer, Thomas
Dans : 5th European HICUM Workshop, (France)
https://hal.science/hal-00203983
A SPICE model for predicting static thermal coupling between bipolar transistors
Beckrich, Helene ; Schwartzmann, Thierry ; Celi, D. ; Zimmer, Thomas
Dans : PRIME 2005, Ph.D. Research in Micro-Electronics & Electronics, (Switzerland)
https://hal.science/hal-00203982
Bipolar Transistor Temperature Modeling
Beckrich, Helene ; Celi, D. ; Berger, Dominique ; Sulima, Pierre-Yvan ; Zimmer, Thomas
Dans : MIXDES, Mixed Design of Integrated Circuits and Systems, (Poland)
https://hal.science/hal-00203966
Cyberchip for analogue integrated circuit design teaching
Billaud, M. ; Zimmer, T. ; Geoffroy, D.
Dans : 16th EAEEIE Annual Conference on Innovation in Education for Electrical and Information Engineering (EIE), Lappeenranta (Finland)
https://hal.science/hal-00415676
The Cyberchip for analogue integrated circuit design teaching
Billaud, M. ; Zimmer, Thomas ; Geoffroy, Didier
Dans : 16th EAEEIE Annual Conference on Innovation in Education for Electrical and Information Engineering, (Finland)
https://hal.science/hal-00203967
Formations à distance en EEA : Le projet de Master première année M1 e-EEA
Chambrelan, C. ; Gervais, N. ; Grisel, R. ; Horn, R. ; Danto, Yves ; Fouillat, Pascal ; Pellet, Claude ; Bonnaud, O. ; Thouroude, D. ; Despaux, G. ; Glaize, C. ; Nolhier, Nicolas ; Ablart, G. ; Graffeuil, Jacques ; Caignet, Fabrice ; Cazarré, Alain ; Barbier, Damien ; Abouchi, N. ; Jourlin, M. ; Garda, Patrick
Dans : 5ème Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes, (France)
https://hal.science/hal-00183071
Disruptive design solutions for frequency generation in silicon RFIC
Deval, Yann ; Mazouffre, Olivier ; Majek, Cédric ; Lapuyade, Herve ; Taris, Thierry ; Begueret, Jean-Baptiste
Dans : IEEE International Workshop on Radio-Frequency Integration Technology: Integrated Circuits for Wideband Communication and Wireless Sensor Networks, (Singapore)
https://hal.science/hal-00178633
Influence of Laser Pulse Duration in Single Event Upset Testing
Douin, Alexandre ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Phillipe
Dans : 8th European Conference on Radiation and its Effects on Components and Systems (RADECS) 2005, Cap d'Agde (France)
https://hal.science/hal-00397942
Electrical Modeling for Laser Testing with Different Pulse Durations
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Phillipe
Dans : 11th IEEE International On Line Testing Symposium, Saint Raphael (France)
https://hal.science/hal-00397739
Impact of semiconductors material on IR stimulation signal
Firiti, Abdellatif ; Beaudoin, Félix ; Haller, G. ; Perdu, Philippe ; Lewis, Dean ; Fouillat, Pascal
Dans : European Symposium of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon (France)
https://hal.science/hal-00401389
A Hicum SOI extension
Fregonese, Sébastien ; Avenier, Gregory ; Maneux, Cristell ; Chantre, A. ; Zimmer, Thomas
Dans : 5th European HICUM Workshop, (France)
https://hal.science/hal-00181989
Base-collector junction charge investigation of Si/SiGe HBT on thin film SOI
Fregonese, Sébastien ; Avenier, Gregory ; Maneux, Cristell ; Chantre, A. ; Zimmer, Thomas
Dans : European Solid-State Device Research Conference - ESSDERC 2005, (France)
https://hal.science/hal-00181980
A transit time model for thin SOI Si/SiGe HBT
Fregonese, Sébastien ; Avenier, Gregory ; Maneux, Cristell ; Chantre, A. ; Zimmer, Thomas
Dans : BCTM 2005, Bipolar/BiCMOS circuits and technology meeting, (United States)
https://hal.science/hal-00181979
A GaAsSb/InP HBT circuit technology
Godin, Jean ; Riet, Muriel ; Konczykowska, A. ; Berdaguer, P. ; Kahn, Myrtil L. ; Bove, Philippe ; Lareche, H. ; Langer, R. ; Lijadi, Mélania ; Pardo, F. ; Bardou, N. ; Pelouard, Jean-Luc ; Maneux, Cristell ; Belhaj, Mohamed ; Grandchamp, Brice ; Labat, Nathalie ; Touboul, Andre ; Bru-Chevallier, Catherine ; Chouaib, H. ; Benyattou, T.
Dans : Conference GaAs 2005, (France)
https://hal.science/hal-00183099
Evidence of RTS noise in emitter-base periphery of InP/GaAsSb/InP HBT
Grandchamp, B. ; Maneux, C. ; Labat, N. ; Touboul, A. ; Scavennec, A. ; Riet, M. ; Godin, J.
Dans : 20th IEEE Conference on Indium Phosphide and Related Materials, (France)
https://hal.science/hal-00401340
Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
Guitard, Nicolas ; Essely, Fabien ; Trémouilles, David ; Bafleur, Marise ; Nolhier, Nicolas ; Perdu, Philippe ; Touboul, Andre ; Pouget, Vincent ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.science/hal-00401483
Méthodologie pour la définition d'une Aire de sécurité de fonctionnement statique de la technologie MESFET à substrat GaAs
Ismail, N. ; Malbert, N. ; Labat, N. ; Touboul, A. ; Muraro, J.-L.
Dans : Journées Nationales du Réseau Doctoral de Microélectronique et Microsystèmes, (France)
https://hal.science/hal-00401367
On-state safe operating area of GaAs MESFET defined for non linear applications
Ismail, Naoufel ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Muraro, Jean-Luc ; Brasseau, Francis ; Langrez, Dominique
Dans : 13th GAAS Symposium, (France)
https://hal.science/hal-00183503
Off-state and on-state breakdown of GaAs MESFET, PHEMT, and PPHEMT
Ismail, Naoufel ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Muraro, Jean-Luc
Dans : 32nd International Symposium on Compound Semiconductors, (Germany)
https://hal.science/hal-00183502
Méthodologie pour la définition d'une Aire de sécurité de fonctionnement non linéaire des transistors FETs GaAs
Ismail, Naoufel ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Muraro, Jean-Luc
Dans : XVèmes Journées Nationales Microondes, (France)
https://hal.science/hal-00183501
A methodology to delimit the on-state safe operating area of GaAs MESFET for nonlinear applications
Ismail, Naoufel ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Muraro, Jean-Luc
Dans : International Symposium on physical and Failure Analysis of Integrated Circuits, (Singapore)
https://hal.science/hal-00183499
Total Dose and Single Event Transients in Linear Voltage Regulators
Kelly, A.T. ; Adell, P.C. ; Witulski, A.F. ; Holman, W.T. ; Schrimpf, R.D. ; Pouget, Vincent
Dans : 8th European Conference on Radiation and Its Effects on Components and System (RADECS) 2005, Cap d 'Agde (France)
https://hal.science/hal-00397998
A radiation-hardened injection locked oscillator devoted to radio-frequency applications
Lapuyade, H. ; Pouget, V. ; Bequeret, J.-B. ; Hellmuth, P. ; Taris, T. ; Mazouffre, O. ; Fouillat, P. ; Deval, Y.
Dans : 8th European Conference on Radiation and its Effects on Components and Systems (RADECS 2005), Cap d'Agde (France)
https://hal.in2p3.fr/in2p3-00101436
A Radiation-Hardened Injection Locked Oscillator Devoted to Radio-Frequency Applications
Lapuyade, Hervé ; Pouget, Vincent ; Begueret, Jean-Baptiste ; Hellmuth, Patrick ; Fouillat, Pascal ; Deval, Yann
Dans : 8th European Conference on Radiation and Its Effects on Components and Systems (RADECS05), (France)
https://hal.science/hal-00183189
Laser Mapping of SRAM sensitive cells. A way to obtain input parameter for DASIE calculation code
Miller, F. ; Buard, N. ; Hubert, G. ; Alestra, S. ; Baudrillard, G. ; Carriere, T. ; Gaillard, R. ; Palau, J.-M. ; Saigné, Frédéric ; Fouillat, P.
Dans : 8th European Conference on Radiation and its Effects on Components and Systems, Cap d'Agde (France)
https://hal.science/hal-01807197
Banc de génération et détection de faisceau THz par photo commutateur ultrarapide sur GaAs BT
Mounaix, Patrick ; Tondusson, M. ; Sarger, Laurent ; Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : 3ème journées Thz, Aussois (France)
https://hal.science/hal-00398013
Identification of Some Key Parameters for Photoelectric Laser Simulation of IC: An Experimental Approach
Perdu, Phillipe ; Desplats, Romain ; Sanchez, Kevin ; Beaudoin, Félix ; Lewis, Dean ; Pouget, Vincent ; Douin, Alexandre ; Fouillat, Pascal
Dans : 12th International Symposium on the Physical and Failure Analysis Circuits (IPFA), Singapour (Singapore)
https://hal.science/hal-00397736
Light Emission to time resolved emission for IC debug and failure analysis
Remmach, Mustapha ; Pigozzi, A. ; Desplats, Romain ; Perdu, Philippe ; Lewis, Dean ; Noel, J. ; Dudit, Sylvain
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.science/hal-00401497
NIR Laser stimulation for dynamic timing analysis
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Roux, J.P. ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.science/hal-00401503
Delay Variation Mapping Induced by Dynamic Laser Stimulation
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Lewis, Dean ; Vedagarbha, P.
Dans : IEEE International Reliability Physics Symposium (IRPS), Santa Clara (United States)
https://hal.science/hal-00401387
Traps characterization inSi-doped GaN/AlGaN/GaN HEMT on SiC by means of low frequency techniques
Sozza, Alberto ; Dua, Christian ; Sarazin, N. ; Morvan, E. ; Delage, Sylvain ; Rampazzo, F. ; Tazzoli, A. ; Danesin, F. ; Meneghesso, G. ; Zanoni, Enrico ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie
Dans : Proceeding of International Workshop on Heterostructures HETECH, (Slovakia)
https://hal.science/hal-00183504
Evidence of traps creation in GaN/AlGaN/GaN HEMTs after a 3000 hour on-state and off-state hot electron stress
Sozza, Alberto ; Dua, Christian ; Morvan, E. ; Diforte-Poisson, Ma ; Delage, Sylvain ; Rampazzo, F. ; Tazzoli, A. ; Danesin, F. ; Meneghesso, G. ; Zanoni, Enrico ; Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie ; Grimber, B. ; de Jaeger, Jean-Claude
Dans : Proceeding of IEDM, (United States)
https://hal.science/hal-00183500
Self-heating investigation of bulk and SOI transistors
Sulima, Pierre-Yvan ; Beckrich, Helene ; Battaglia, Jean Luc ; Zimmer, Thomas
Dans : MOS-AK Meeting, (France)
https://hal.science/hal-00203984
3D self Heating medelling for electrothermal characterisation of SiGe HBTs
Sulima, Pierre-Yvan ; Battaglia, Jean Luc ; Zimmer, Thomas ; Beckrich, Helene ; Celi, D.
Dans : 5th European HICUM Workshop, (France)
https://hal.science/hal-00203981
Study of a 3D thermal characterization of SiGe HBTS
Sulima, Pierre-Yvan ; Battaglia, Jean Luc ; Zimmer, Thomas ; Fregonese, Sébastien ; Celi, D.
Dans : Microtherm 2005, VI Conference Thermal Problems in Electronics, (Poland)
https://hal.science/hal-00181990
A Transient Measurement Setup for Electro-thermal Characterisation for SiGe HBTs
Sulima, Pierre-Yvan ; Zimmer, Thomas ; Beckrich, Helene ; Battaglia, Jean Luc ; Fregonese, Sébastien ; Celi, D.
Dans : MIXDES, Mixed Design of Integrated Circuits and Systems, (Poland)
https://hal.science/hal-00181978
Water solubility and diffusivity in BCB resins used in microelectronics packaging and sensor applications
Tetelin, Angélique ; Achen, A. ; Pouget, Vincent ; Pellet, Claude ; Toepper, M. ; Lachaud, Jean-Luc
Dans : 22nd Instrumentation and Measurement Technology Conference, (Canada)
https://hal.science/hal-00183075
2004
Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE International Reliability Physics Symposium (IRPS), (United States)
https://hal.science/hal-00182909
Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE International Reliability Physics Symposium (IRPS), (United States)
https://hal.science/hal-00182908
A 1.8 V 4.3 GHz SiGe Tunable Synchronous Oscillator
Begueret, Jean-Baptiste ; Deval, Yann ; Taris, Thierry ; Hellmuth, Patrick ; Mazouffre, Olivier ; Fouillat, Pascal
Dans : IEEE Asian Pacific Microwave Conference (APMC'2002), (Japan)
https://hal.science/hal-00183014
An eLab platform for electrical engineers education
Billaud, M. ; Geoffroy, Didier ; Zimmer, Thomas
Dans : ICEE International Conference on Engineering Education, (United States)
https://hal.science/hal-00203968
Analyse du bruit basses fréquences de HEMTs AlGaN/GaN sur substrat SiC et Saphir
Curutchet, A. ; Malbert, N. ; Labat, N. ; Touboul, A. ; Uren, M.
Dans : Xème Journées Nationales Microélectronique Optoélectronique, La Grande Motte (France)
https://hal.science/hal-00401361
Analyse du bruit basse fréquence de HEMTs AlGaN/GaN sur substrat SiC et saphir
Curutchet, A. ; Malbert, N. ; Labat, N. ; Touboul, A. ; Uren, M.
Dans : GDR Semi-Conducteur Grand Gap, Freyjus (France)
https://hal.science/hal-00401359
Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses
Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : 19th Symposium on Microelectronics Technology and Devices (SBMicro 2004), (Brazil)
https://hal.science/hal-00185409
Test chip for qualification of packaging assemblies
Deletage, Jean-Yves ; Fremont, Hélène ; Puig, Olivier ; Pellet, Claude ; Fouillat, Pascal ; Danto, Yves
Dans : SBMicro 2004, (Brazil)
https://hal.science/hal-00183081
Réalisation d un convertisseur 3 bits à 4 Géchantillons/s pour radiotélescopes en bande millimétrique et submillimétrique
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : Colloque Interdisciplinaire en Instrumentation (C2I), (France)
https://hal.science/hal-00183229
Sorting Out of Analogue IC Architectures using the DOE Method : a New Tool for Quality Design
Deval, Yann ; Tomas, Jean ; Fouillat, Pascal ; Dom, Jean-Paul
Dans : proceeding ESREF 93, (France)
https://hal.science/hal-00184310
Scalable bipolar transistor modelling with HICUM L0
Fregonese, Sébastien ; Berger, Dominique ; Zimmer, Thomas ; Maneux, Cristell ; Sulima, Pierre-Yvan ; Celi, D.
Dans : 4th European HICUM Workshop, (France)
https://hal.science/hal-00181991
Scalable Substrate Modeling based on 3D Physical Simulation Substrat
Fregonese, Sébastien ; Celi, D. ; Zimmer, Thomas ; Maneux, Cristell
Dans : XIX Conference on Design of Circuits and Integrated Systems - DCIS, (France)
https://hal.science/hal-00181985
Scalable Bipolar Transistor Modelling with HICUM
Fregonese, Sébastien ; Berger, Dominique ; Zimmer, Thomas ; Maneux, Cristell ; Sulima, Pierre-Yvan ; Celi, D.
Dans : IEEE Mixed Design of Integrated Circuits and Systems, (Poland)
https://hal.science/hal-00181984
Barrier effects in SiGe HBT: Modeling of high-injection base current increase
Fregonese, Sébastien ; Zimmer, Thomas ; Maneux, Cristell ; Sulima, Pierre-Yvan
Dans : IEEE Bipolar/BiCMOS circuits and technology meeting, (Canada)
https://hal.science/hal-00181982
Simulation Physique des mécanismes de recombinaisons d'un TBH InP/GaAsSb/InP
Grandchamp, B. ; Maneux, C. ; Labat, N. ; Touboul, A.
Dans : Xème Journées Nationales Microélectronique Optoélectronique, La Grande Motte (France)
https://hal.science/hal-00401365
Comparaison des lieux de claquage BV on-state des différentes technologies à substrat GaAs
Ismail, N. ; Malbert, N. ; Labat, N. ; Touboul, A. ; Lambert, B. ; Muraro, J.-L.
Dans : Xème Journées Nationales Microélectronique Optoélectronique, (France)
https://hal.science/hal-00401360
Methodology to compare on-state breakdown loci of GaAs FETs
Ismail, Naoufel ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Muraro, Jean-Luc
Dans : ICM Conference, (Tunisia)
https://hal.science/hal-00183506
Implementing laser based failure analysis methodologies using test vehicles
Lewis, D. ; Pouget, V. ; Beaudoin, F. ; Beauchene, T. ; Haller, G. ; Desplat, R. ; Perdu, P. ; Fouillat, P.
Dans : 2004 International Conference on Microelectronic Test Structures, Awaji Yumebutai (Japan)
https://hal.science/hal-01887706
A 2-6 GHz CMOS Factorial Delay Locked Loop Dedicated to Multi-Standard Frequency Synthesis
Majek, Cédric ; Deltimple, Nathalie ; Lapuyade, Hervé ; Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann
Dans : Prooceedings of the IEEE International Symposium on Industrial Electronics ISIE2004, (France)
https://hal.science/hal-00183197
A Programmable CMOS RF Frequency Synthesizer for Multi-standard Wireless Applications
Majek, Cédric ; Deltimple, Nathalie ; Lapuyade, Herve ; Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann
Dans : 2nd annual IEEE Northeast Workshop on Circuits and Systems (NEWCAS2004), Montréal, Québec (Canada)
https://hal.science/hal-00180789
Low frequency drain and gate noise in GaN FEMTs
Malbert, Nathalie ; Labat, Nathalie ; Curutchet, Arnaud ; Verdier, Frédéric ; Touboul, Andre
Dans : 2004 European Microwave Week, Workshop on Wide band gap Research for Microwave applications : Materials, devices and circuit Issues, (Netherlands)
https://hal.science/hal-00183569
InP/GaAsSb/InP DHBT: Analysis of specific material parameters and high current effect by physical simulation
Maneux, Cristell ; Belhaj, Mohamed ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Kahn, Myrtil L. ; Godin, Jean ; Bove, Philippe
Dans : Conference GAAS 2004, (Netherlands)
https://hal.science/hal-00183102
InP based HBT reliability
Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Kahn, Myrtil L. ; Godin, Jean
Dans : Journées du GDR Nanoélectronique, (France)
https://hal.science/hal-00183101
Analysis of avalanche regime in InP HBT's using physical simulation - Implementation in a DC Model
Maneux, Cristell ; Martin, Jean-Christophe ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Kahn, Myrtil L. ; Godin, Jean
Dans : International Conference on Industrial Technology, (Tunisia)
https://hal.science/hal-00183100
InP/InGaAs/InP DHBT submitted to bias and thermal stresses: LF base noise analysis
Martin, Jean-Christophe ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre
Dans : SPIE Fluctuation and Noise Conference, (Spain)
https://hal.science/hal-00183103
Representation of the SiGe HBT's Thermal Impedance by Linear and Recursive Networks
Mnif, Hassene ; Battaglia, Jean Luc ; Fregonese, Sébastien ; Zimmer, Thomas
Dans : IFAC - FDA04, (France)
https://hal.science/hal-00181983
Radiation Hardness Assessment of an ADC for Space Application using a Laser Test Equipment
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Darracq, Frédéric
Dans : Proc. of XIX Conference on Design of Circuits and Integrated Systems (DCIS) 2004, ISBN 2-9522971-0-X, Bordeaux (France)
https://hal.science/hal-01887701
Applications de l acoustique picoseconde à l analyse non destructive de circuits intégrés
Rampnoux, J. M. ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, S. ; Claeys, W. ; Rossignol, C. ; Audoin, Bertrand ; Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean
Dans : Colloque Interdisciplinaire en Instrumentation (C2I), (France)
https://hal.science/hal-00182903
A 10 GHz dielectric resonator oscillator using GaN technology
Rice, P. ; Sloan, R. ; Moore, M. ; Barnes, Ar ; Uren, Michael ; Malbert, Nathalie ; Labat, Nathalie
Dans : 2004 IEEE MTT-Symposium, (United States)
https://hal.science/hal-00183505
2003
Limitations des performances du TBH InP/GaAsSb/InP à forts niveaux d'injection
Belhaj, Mohamed ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre
Dans : Journées du GDR Nanoélectronique, (France)
https://hal.science/hal-00183471
Analyse de la dégradation des performances des TBH InP/GaAsSb/InP aux forts niveaux de courant
Belhaj, Mohamed ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Blayac, S. ; Kahn, Myrtil L. ; Godin, Jean ; Bove, Philippe
Dans : Journées Nationales Microondes 2003, (France)
https://hal.science/hal-00183467
Analyse du bruit BF du canal de la technologie HEMT sur nitrure de gallium (GaN)
Curutchet, A. ; Malbert, N. ; Labat, N. ; Touboul, A.
Dans : JNRDM, Toulouse (France)
https://hal.science/hal-00401358
Analyse du bruit basses fréquences du courant de drain de HEMTs AlGaN/GaN sur substrats silicium et saphir
Curutchet, Arnaud ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Gaquière, Christophe ; Minko, A. ; Uren, Michael
Dans : XIIIèmes Journées Nationales Microondes, (France)
https://hal.science/hal-00183507
A Non-Linear Model to Express Laser-induced SRAM Cross-sections versus an Effective Laser LET
Darracq, Frédéric ; Lapuyade, Hervé ; Pouget, Vincent ; Fouillat, Pascal
Dans : 7th European Conference on Radiation and its Effects on Components and Systems (RADECS), (Netherlands)
https://hal.science/hal-00185410
The Factorial DLL : Application to a 5 GHz Frequency Synthesizer
Deltimple, Nathalie ; Majek, Cédric ; Lapuyade, Hervé ; Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann
Dans : IEEE Proceedings of Design of Ciruicts and Integrated Systems (DCIS2003), (Spain)
https://hal.science/hal-00183235
Synthétiseur de Fréquence à base de DLL Factorisée pour application HiperLAN
Deltimple, Nathalie ; Majek, Cédric ; Lapuyade, Hervé ; Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann
Dans : Actes du colloque TELECOM 2003 & 3èmes JFMMA, (Morocco)
https://hal.science/hal-00183234
The Factorial DLL : Application to a 5 GHz Frequency Synthesizer
Deltimple, Nathalie ; Majek, Cédric ; Lapuyade, Hervé ; Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann
Dans : IEEE Proceedings of Design of Ciruicts and Integrated Systems (DCIS2003), (Spain)
https://hal.science/hal-00183219
Synthétiseur de Fréquence à base de DLL Factorisée pour application HiperLAN
Deltimple, Nathalie ; Majek, Cédric ; Lapuyade, Hervé ; Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann
Dans : Actes du colloque TELECOM 2003 & 3èmes JFMMA, (Morocco)
https://hal.science/hal-00183218
Simulation physique de TBH SiGe : Etude du temps de transit sur une structure 1D et 2D
Fregonese, Sébastien ; Maneux, Cristell ; Mnif, Hassene ; Zimmer, Thomas
Dans : Journées Nationales du GDR Nanoélectronique - 4èmes Journées, (France)
https://hal.science/hal-00181992
Low frequency drain noise in AlGaN/GaN HEMTs on Si substrate
Malbert, Nathalie ; Labat, Nathalie ; Curutchet, Arnaud ; Touboul, Andre ; Gaquière, Christophe ; Minko, A.
Dans : Fluctuation and Noise Conference, (United States)
https://hal.science/hal-00183510
Evolution of LF noise in Power PHEMT's ubmitted to RF and DC step stresses
Malbert, Nathalie ; Labat, Nathalie ; Lambert, Benoit ; Touboul, Andre
Dans : Journées Scientifiques Francophones Electronique, Télécoms et Informatique, (Tunisia)
https://hal.science/hal-00183509
Analysis of low frequency drain noise in AlGaN/GaN HEMTs on sapphire substrate
Malbert, Nathalie ; Labat, Nathalie ; Curutchet, Arnaud ; Touboul, Andre ; Uren, Michael
Dans : 17th International Conference on Noise in Physical Systems and 1/f Fluctuations, (Czech Republic)
https://hal.science/hal-00183508
Modèles de dégradation des TBH sur substrat InP
Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre
Dans : Journées électroniques du CLUB EEA et du RTP 31 : Fiabilité des Composants et Packaging, (France)
https://hal.science/hal-00183472
InP-based HBT Reliability
Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Godin, Jean ; Blayac, S. ; Kahn, Myrtil L. ; Riet, Muriel
Dans : 2003 European Microwave Week, Workshop on Reliability of microwave devices, (Germany)
https://hal.science/hal-00183104
Fiabilité du TBH sur InP - Analyse du Bruit aux Basses Fréquences
Martin, Jean-Christophe ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Blayac, S. ; Kahn, Myrtil L. ; Godin, Jean
Dans : Journées Nationales Microondes - JNM, (France)
https://hal.science/hal-00183470
Extrinsic leakage current on InP/InGaAs DHBTs
Martin, Jean-Christophe ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Blayac, S. ; Kahn, Myrtil L. ; Godin, Jean
Dans : 2003 IEEE Conference on Indium Phosphide and Related Materials, (United States)
https://hal.science/hal-00183469
Analyse des courants de fuite extrinsèques des HBTs InP/InGaAs
Martin, Jean-Christophe ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Blayac, S. ; Kahn, Myrtil L. ; Godin, Jean
Dans : Journées Scientifiques Francophones Electronique, Télécoms et Informatique, (Tunisia)
https://hal.science/hal-00183468
Fractional Order Model for the Thermal Behavior of Bipolar Transistors
Mnif, Hassene ; Zimmer, Thomas ; Luc Battaglia, Jean
Dans : Les journées de l'Action Thématique "Les systèmes à dérivées non entières, Bordeaux (France)
https://hal.science/hal-00189393
Modélisation thermique des TBH SiGe destinés à des applications radiofréquences
Mnif, Hassene ; Zimmer, Thomas ; Battaglia, Jean Luc ; Fregonese, Sébastien
Dans : Conférence Internationale Sciences Electroniques, Technologies de l'Information et des Télécommunications, (Tunisia)
https://hal.science/hal-00181988
Bipolar modeling and selfheating: An Equivalent Network representation For The Thermal Spreading Impedance In SiGe HBTs
Mnif, Hassene ; Zimmer, Thomas ; Battaglia, Jean Luc ; Fregonese, Sébastien
Dans : 10th International Conference Mixed Design of Integrated Circuits and Systems, (Poland)
https://hal.science/hal-00181987
Analytical model for the self-heating effect in SiGe HBTs and its network representationAnalytical model for the self-heating effect in SiGe HBTs and its network representation
Mnif, Hassene ; Zimmer, Thomas ; Battaglia, Jean Luc ; Fregonese, Sébastien
Dans : IEEE International Conference on Signals, Systems, Decision and Information Technology, (Tunisia)
https://hal.science/hal-00181986
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC
Pouget, V. ; Lewis, D. ; Fouillat, P.
Dans : 2003 IEEE Instrumentation and Measurement Technology Conference (IMTC 2003), Vail (United States)
https://hal.science/hal-01887685
Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures
Pouget, V. ; Fouillat, P. ; Velazco, Raoul ; Lewis, D. ; Dallet, D.
Dans : IEEE Nuclear and Space Radiation Effects Conference (NSREC'03), Monterey, CA (United States)
https://hal.science/hal-01376266
Dynamic Behavior of a Chemical Sensor for Real-Time Measurement of Humidity Variations in Human Breath
Tetelin, Angélique ; Pouget, Vincent ; Lachaud, Jean-Luc ; Pellet, Claude
Dans : 20th IEEE Instrumentation and Measurement Technology Conference, (United States)
https://hal.science/hal-00183123
Obtaining isothermal data with standard measurement equipment
Zimmer, Thomas ; Fregonese, Sebastien ; Mnif, Hassene ; Ardouin, Bertrand
Dans : 3th European HICUM Workshop, Dresden (Germany)
https://hal.science/hal-00189389
2002
An IC-CAP Toolkit for HICUM Model Parameter Extraction
Ardouin, Bertrand ; Zimmer, Thomas
Dans : European ICCAP User meeting, (Germany)
https://hal.science/hal-00203985
Caractérisation à distance de circuits radiofréquences
Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann ; Fouillat, Pascal ; Devreese, Regis ; Faurens, Christian
Dans : Septièmes Journées Pédagogiques du CNFM, (France)
https://hal.science/hal-00179943
HICUM Parameter Extraction Methodology for a Single Transistor Geometry
Berger, Dominique ; Céli, Didier ; Schröter, Michael ; Malorny, M. ; Zimmer, Thomas ; Ardouin, Bertrand
Dans : IEEE Bipolar/BiCMOS circuits and technology meeting, Monterey (United States)
https://hal.science/hal-00187309
A SiGe 4-Gsps 2-Bits Digitizer with 2-4 GHz Input Bandwidth
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Scarabello, Christophe ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : 9th IEEE Proc. Of International Conf. On Electronics, Circuits and Systems (ICECS'2002), (Croatia)
https://hal.science/hal-00183238
A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Scarabello, Christophe ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : EEE 15th Symposium on Integrated Circuits and System Design (SBCCI 2002), (Brazil)
https://hal.science/hal-00183236
A SiGe 4-Gsps 2-Bits Digitizer with 2-4 GHz Input Bandwidth
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Scarabello, Christophe ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : 9th IEEE Proc. Of International Conf. On Electronics, Circuits and Systems (ICECS'2002), (Croatia)
https://hal.science/hal-00183222
A 4 Gsamples/S with 2-4 GHz Input Bandwidth SIGE Digitizer for Radio Astronomy Applications
Deschans, David ; Begueret, Jean-Baptiste ; Deval, Yann ; Scarabello, Christophe ; Fouillat, Pascal ; Montignac, G. ; Baudry, Alain
Dans : EEE 15th Symposium on Integrated Circuits and System Design (SBCCI 2002), (Brazil)
https://hal.science/hal-00183220
The Synchronous Oscillator in Frequency Generation : an Overview
Deval, Yann ; Begueret, Jean-Baptiste ; Lapuyade, Hervé ; Fouillat, Pascal ; Kerherve, Eric
Dans : 14th IEEE International Conference on Microelectronics (ICM'2002), (Lebanon)
https://hal.science/hal-00183023
The Synchronous Oscillator in Frequency Generation : an Overview
Deval, Yann ; Begueret, Jean-Baptiste ; Lapuyade, Hervé ; Fouillat, Pascal ; Kerherve, Eric
Dans : 14th IEEE International Conference on Microelectronics (ICM'2002), (Lebanon)
https://hal.science/hal-00183003
Laser Utilization for Various Testing Purposes
Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Pouget, Vincent
Dans : 3rd IEEE Latin American Test Worksop LATW 02, (Uruguay)
https://hal.science/hal-00185423
Evidence of surface trap effects on pseudomorphic HEMT submitted to impact ionization stresses
Malbert, Nathalie ; Labat, Nathalie ; Lambert, Benoit ; Touboul, Andre ; Pataud, Gérard
Dans : GAAS 2002, (Italy)
https://hal.science/hal-00183511
Fiabilité du TBH à double hétérojonction sur InP : Résultats préliminaires
Martin, Jean-Christophe ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Kahn, Myrtil L. ; Godin, Jean
Dans : Journées Nationales Microélectronique Optoélectronique 2002, (France)
https://hal.science/hal-00183473
Caractérisation électrique et modélisation de l'ionisation par impact sur des Transistors Bipolaires à Hétérojonction sur InP
Martin, Jean-Christophe ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre
Dans : Journées Nationales du Réseau Doctoral Microélectronique 2002, (France)
https://hal.science/hal-00183105
Modeling the self-heating effect in SiGe HBTs
Mnif, Hassene ; Zimmer, Thomas ; Battaglia, Jean Luc ; Ardouin, Bertrand
Dans : IEEE Bipolar/BiCMOS circuits and technology meeting, (United States)
https://hal.science/hal-00203970
A new approach for modelling the thermal behaviour of bipolar transistors
Mnif, Hassene ; Zimmer, Thomas ; Battaglia, Jean Luc ; Ardouin, Bertrand ; Berger, Dominique ; Celi, D.
Dans : IEEE International Caracas Conference on devices, circuits ans systems, (Venezuela)
https://hal.science/hal-00203969
A Novel 1-Gbps Clock and Data Recovery Architecture using Synchronous Oscillator in CMOS VLSI technology
Scarabello, Christophe ; Begueret, Jean-Baptiste ; Deval, Yann ; Deschans, David ; Fouillat, Pascal ; Pignol, Michel ; Le Gall, Jean-Yves
Dans : IEEE Proceedings of the 28th European Solid State Circuits Conference (ESSCIRC'2002), (Italy)
https://hal.science/hal-00183022
A Novel 1-Gbps Clock and Data Recovery Architecture using Synchronous Oscillator in CMOS VLSI technology
Scarabello, Christophe ; Begueret, Jean-Baptiste ; Deval, Yann ; Deschans, David ; Fouillat, Pascal ; Pignol, Michel ; Le Gall, Jean-Yves
Dans : IEEE Proceedings of the 28th European Solid State Circuits Conference (ESSCIRC'2002), (Italy)
https://hal.science/hal-00183001
2001
Transit Time Parameter Extraction for the HICUM Bipolar Compact Model
Ardouin, Bertrand ; Zimmer, Thomas ; Berger, Dominique ; Celi, D. ; Mnif, Hassene ; Burdeau, T. ; Fouillat, Pascal
Dans : IEEE Bipolar/BiCMOS circuits and technology meeting, (United States)
https://hal.science/hal-00203974
Direct Method for Bipolar Base-Emitter and Base-Collector Capacitance Splitting using High Frequency Measurements
Ardouin, Bertrand ; Zimmer, Thomas ; Mnif, Hassene ; Fouillat, Pascal
Dans : IEEE Bipolar/BiCMOS circuits and technology meeting, (United States)
https://hal.science/hal-00203972
Bipolar Transistor's Intrinsic and Extrinsic Capacitance Determination
Ardouin, Bertrand ; Zimmer, Thomas ; Mnif, Hassene ; Fouillat, Pascal ; Berger, Dominique ; Celi, D.
Dans : SISPAD 2001, International Conference on Simulation of Semiconductor Processes and Devices, (Greece)
https://hal.science/hal-00203971
Clock Generator Using Factorial DLL for Video Applications
Begueret, Jean-Baptiste ; Deval, Yann ; Mazouffre, Olivier ; Spataro, Anne ; Fouillat, Pascal ; Benoit, E. ; Mendoza, J.
Dans : IEEE Proceedings of the Custom IC Conf. (CICC'2001), (United States)
https://hal.science/hal-00183241
Clock Generator Using Factorial DLL for Video Applications
Begueret, Jean-Baptiste ; Deval, Yann ; Mazouffre, Olivier ; Spataro, Anne ; Fouillat, Pascal ; Benoit, E. ; Mendoza, J.
Dans : IEEE Proceedings of the Custom IC Conf. (CICC'2001), (United States)
https://hal.science/hal-00183225
Videoteaching for RF measurements of ICs in L - S - C bands
Begueret, Jean-Baptiste ; Deval, Yann ; Kerherve, Eric ; Fouillat, Pascal ; Devreese, Regis ; Faurens, Christian
Dans : 12th Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE'2001), (France)
https://hal.science/hal-00180917
Télé-enseignement de la caractérisation de circuits radiofréquences
Begueret, Jean-Baptiste ; Kerherve, Eric ; Deval, Yann ; Fouillat, Pascal ; Devreese, Regis ; Faurens, Christian
Dans : CETSIS-EEA'01, (France)
https://hal.science/hal-00180916
VHDL-AMS for mixed technology and mixed signal, an overview
Charlot, Jean Jacques ; Lewis, Noëlle ; Zimmer, Thomas ; Levi, Herve
Dans : 9th Mediterranean Conference on Control and Automation, MED 01, (Croatia)
https://hal.science/hal-00203975
Single-event Sensitivity of a single SRAM cell
Darracq, Frédéric ; Beauchene, Thomas ; Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Touboul, Andre
Dans : RADECS, (France)
https://hal.science/hal-00185411
Evaluation of a Design Methodology Dedicated to Dose Rate Hardened Linear Integrated Circuits
Deval, Yann ; Briand, Renaud ; Fouillat, Pascal ; Barnaby, H. J. ; Lapuyade, Hervé ; Lewis, Dean ; Schrimpf, Rd
Dans : European Conference on Radiation and its Effects on Components and Systems (RADECS), (France)
https://hal.science/hal-00184303
Improving an SEU Hard Design using a Pulsed Laser
Dutertre, Jean-Max ; Roche, Fernand-Michel ; Fouillat, Patrice ; Lewis, Dean
Dans : Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on, Grenoble (France)
https://hal-emse.ccsd.cnrs.fr/emse-01130950
L'ionisation par impact dans un HEMT pseudomorphique sur GaAs
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre
Dans : Journées Nationales de Microélectronique et Optoélectronique, JNMO, (France)
https://hal.science/hal-00183516
LF gate noise in P-HEMT in impact ionization regime
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre
Dans : 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, (United States)
https://hal.science/hal-00183515
Influence of thermal and impact ionization stresses on AlGaAs/InGaAs HEMT DC performances
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Huguet, Pierre
Dans : International Symposium on Physical and Failure Analysis of Integrated Circuits, (Singapore)
https://hal.science/hal-00183514
Analysis of LF noise evolution in power HEMT after DC step lifetests
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Huguet, Pierre ; Pataud, Gérard
Dans : 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, (United States)
https://hal.science/hal-00183513
Analyse du bruit de grille aux basses fréquences des transistors à effet de champ de puissance sur GaAs
Lambert, Benoit ; Verdier, Frédéric ; Labat, Nathalie ; Malbert, Nathalie ; Touboul, Andre
Dans : Colloque Interdisciplinaire en Instrumentation (Ed. Hermes), (France)
https://hal.science/hal-00183512
Test de circuits intégrés par faisceau laser pulsé
Lewis, Dean ; Pouget, Vincent ; Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal
Dans : Colloque Interdisciplinaire en Instrumentation (C2I), (France)
https://hal.science/hal-00185412
A New Laser System for X-Rays Flashes Sensitivity Evaluation
Lewis, Dean ; Lapuyade, Hervé ; Deval, Yann ; Maidon, Yvan ; Darracq, Frédéric ; Briand, Renaud ; Fouillat, Pascal
Dans : Proc. of the 7th IEEE International On-Line Testing Workshop, (Italy)
https://hal.science/hal-00184302
Experimental Evidence of Impact Ionisation in InP HBT's Designed for Rapid Digital Applications:Implementation in a DC Model
Maneux, Cristell ; Martin, Jean-Christophe ; Labat, Nathalie ; Touboul, Andre ; Riet, Muriel ; Benchimol, Jean-Louis
Dans : ESSDERC, (Germany)
https://hal.science/hal-00183474
A CMOS VLSI Delay Oriented Waveform Converter Dedicated to the Synthesizer of an UMTS Transceiver
Spataro, Anne ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal ; Belot, D.
Dans : IEEE Proceedings of the Custom IC Conf. (CICC'2001), (United States)
https://hal.science/hal-00183239
A CMOS VLSI Delay Oriented Waveform Converter Dedicated to the Synthesizer of an UMTS Transceiver
Spataro, Anne ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal ; Belot, D.
Dans : IEEE Proceedings of the Custom IC Conf. (CICC'2001), (United States)
https://hal.science/hal-00183223
Convertisseur de signaux orienté délai en technologie CMOS dédié à la réalisation d'un synthétiseur 2 GHz
Spataro, Anne ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal ; Belot, D.
Dans : Journées Nationales Micro-ondes (JNM'2001), (France)
https://hal.science/hal-00183024
A VLSI CMOS 2 GHz active load body effect mixer
Taris, Thierry ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal
Dans : IEEE Proceedings of the Design of Circuits and Integrated Systems Conf. (DCIS'2001), (Portugal)
https://hal.science/hal-00183240
A VLSI CMOS 2 GHz active load body effect mixer
Taris, Thierry ; Deval, Yann ; Begueret, Jean-Baptiste ; Fouillat, Pascal
Dans : IEEE Proceedings of the Design of Circuits and Integrated Systems Conf. (DCIS'2001), (Portugal)
https://hal.science/hal-00183224
HICUM parameter extraction in ICCAP
Zimmer, Thomas ; Ardouin, Bertrand
Dans : HICUM Workshop / User s Meeting, (United States)
https://hal.science/hal-00203986
Transistor model parameter determination with non-conventional optimisation algorithms
Zimmer, Thomas ; Ardouin, Bertrand ; Franze, Francesco ; Berger, Dominique ; Fouillat, Pascal
Dans : IEEE Electron Devices Conference, (Spain)
https://hal.science/hal-00203973
2000
Use of Genetic Algorithm for Efficient Integrated Circuits Compact Modelling and Parameter Extraction
Ardouin, Bertrand ; Zimmer, Thomas ; Batiste Duluc, Jean ; Marc, Francois ; Fouillat, Pascal
Dans : ACIDCA'2000, Monastir (Tunisia)
https://hal.science/hal-00189377
Model parameter extraction with non-conventional optimisation algorithms
Ardouin, Bertrand ; Zimmer, Thomas ; Franzè, F. ; Fouillat, Pascal
Dans : JSFT, (Tunisia)
https://hal.science/hal-00187311
Speaking VHDL-AMS, a Newly Standarized Description Language, for Teaching Mixed Technology and Mixed Signal Systems
Charlot, Jean Jacques ; Oudinot, Jean ; Lewis, Noëlle ; Zimmer, Thomas ; Levi, Herve
Dans : International Conference on Information Technology Based Higher Education and Training, ITHET 2000, (Turkey)
https://hal.science/hal-00203977
A Systematic Approach for the Behavioural Modelling of Analogue Integrated Systems
Fakhfakh, Ahmed ; Lewis, Noëlle ; Levi, Herve ; Zimmer, Thomas
Dans : International Conference on Artificial and Computational Intelligence For Decision, Control and Automation In Engineering and Industrial Applications, ACIDCA 2000, (Tunisia)
https://hal.science/hal-00203976
RETWINE : A Experience in Teleinstrumentation by the web
Kadionik, Patrice ; Zimmer, Thomas ; Danto, Yves
Dans : COST254: Intelligent Terminals Workshop on friendly Exchanging through the Net, Bordeaux (France)
https://hal.science/hal-00183061
Breakdown voltage of AlGaAs/InGaAs HEMT submitted to life-tests in impact ionization regime
Lambert, Benoit ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Huguet, Pierre
Dans : IEEE GaAs Reliability Workshop, (United States)
https://hal.science/hal-00183517
An Overview of the Applications of a Pulsed Laser System for SEU Testing
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Sarger, L. ; Roche, Fernand-Michel ; Ecoffet, R.
Dans : 6th IEEE International On Line Testing Workshop, (Spain)
https://hal.science/hal-00185413
1999
RETWINE : A new distributed Environment for Microelectronics Intrumentation Learning and Measurement
Kadionik, Patrice ; Zimmer, Thomas ; Danto, Yves
Dans : IMTC: IEEE Instrumentation and Measurement Technology Conference, Venice (Italy)
https://hal.science/hal-00183034
Using VHDL-AMS to build a specific analogue behavioural model library
Lewis, Noëlle ; Charlot, Jean Jacques ; Levi, Herve ; Zimmer, Thomas ; Laflaquiere, Arnaud
Dans : International Forum on Design Languages, FDL 99, (France)
https://hal.science/hal-00203980
Comparing four analog HDL modelings and simulations of a complex system
Lewis, Noëlle ; Charlot, Jean Jacques ; Zimmer, Thomas ; Levi, Herve ; Laflaquiere, Arnaud
Dans : IEEE/ACM International Workshop on Behavioral Modeling And Simulation, BMAS 99, (United States)
https://hal.science/hal-00203978
Investigation on GaAs power MESFETs submitted to RF life-test by LF noise and drain current transient analysis
Malbert, Nathalie ; Lambert, Benoit ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves ; K.J. Vandamme, Lode ; Huguet, Pierre ; Auxemery, P. ; Garat, François
Dans : IEEE GaAs Reliability Workshop, (United States)
https://hal.science/hal-00183476
TBH GaInP/GaAs planar : Analyse de deux mécanismes de défaillances
Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves ; Riet, Muriel ; Scavennec, André
Dans : Journées Nationales Microélectroniques et optoélectroniques, (France)
https://hal.science/hal-00183479
Reliability evaluation of GaAs HBT technologies
Maneux, Cristell ; Labat, Nathalie ; Malbert, Nathalie ; Touboul, Andre ; Danto, Yves ; Dumas, Jean-Michel ; Riet, Muriel ; Scavennec, André
Dans : IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications, (United Kingdom)
https://hal.science/hal-00183478
Reliability evaluation of GaAs HBT technologies
Maneux, Cristell ; Labat, Nathalie ; Malbert, Nathalie ; Touboul, Andre ; Danto, Yves ; Dumas, Jean-Michel
Dans : Workshop on Compound Semiconductor Devices and Integrated Circuits, (France)
https://hal.science/hal-00183477
Analysis of Two Degradation Mechanisms in GaInP/GaAs Fully Planar HBT Technology
Maneux, Cristell ; Malbert, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves ; Riet, Muriel ; Scavennec, André
Dans : State-Of-The-Art Program on compound Semiconductros XXX, Ed. Electrochem. Soc, (United States)
https://hal.science/hal-00183475
A New SPICE Model Dedicated to the Analysis of the Transient Response of Irradiated MOSFETS for On Line Testing
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Sarger, L.
Dans : 5th IEEE International On Line Testing Workshop, (Greece)
https://hal.science/hal-00185414
SPICE Modeling of the Transient Response of Irradiated MOSFETs
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Deval, Yann ; Fouillat, Pascal ; Sarger, L.
Dans : 5th European Conference on Radiation and its Effects on Components and Systems (RADECS), (France)
https://hal.science/hal-00184305
Hierarchical Analogue Design and Behavioral Modelling
Zimmer, Thomas ; Lewis, Noëlle ; Fakhfakh, Ahmed ; Ardouin, Bertrand ; Levi, Herve ; Fouillat, Pascal
Dans : Microelectronic Systems Education Conference, MSE99, (United States)
https://hal.science/hal-00203979
Les travaux pratiques à distance
Zimmer, Thomas ; Kadionik, Patrice ; Danto, Yves
Dans : Journées d'études internationales. Les TIC au service des relations internationales des établissements d'enseignement supérieur et de recherche, (France)
https://hal.science/hal-00183062
1998
A distributed environment in Microelectronics Instrumentation Learning
Kadionik, Patrice ; Zimmer, Thomas ; Danto, Yves
Dans : EAEEIE: European Association for Education in Electrical and Information Engineering Conference, Lisboa (Portugal)
https://hal.science/hal-00183035
Evolution of base current in C-In doped GaInP/GaAs HBT under current induced stress
Maneux, Cristell ; Labat, Nathalie ; Fouillat, Pascal ; Touboul, Andre ; Danto, Yves
Dans : European Solid State Device Research Conference (Ed. Frontières), ESSDERC, (France)
https://hal.science/hal-00183480
Elaboration of a new pulsed laser system for SEE testing
Pouget, V. ; Calin, T. ; Lapuyade, H. ; Lewis, D. ; Fouillat, P. ; Velazco, Raoul ; Maidon, Y. ; Sarger, L.
Dans : IEEE International On-Line Testing Workshop (IOLTW'98), Capri (Italy)
https://hal.science/hal-01384704
New Capabilities for SEE Testing with a Femtosecond Pulsed Laser System
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Sarger, L.
Dans : Journées Nationales d Etudes de l association RADECS, (United Kingdom)
https://hal.science/hal-00185416
Elaboration of a New Pulsed Laser System for SEE Testing
Pouget, Vincent ; Calin, T. ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Velazco, Raoul ; Maidon, Yvan ; Sarger, L.
Dans : 4th IEEE International On Line Testing Workshop, (Italy)
https://hal.science/hal-00185415
BJT avalanche breakdown voltage improvement by introduction of a floating P-layer in the epitaxial collector region
Zimmer, Thomas ; N?doye, M. ; Lewis, Noelle ; Batiste Duluc, Jean ; Fremont, Helene ; Paul Dom, Jean
Dans : Symposium on Microelectronic Facturing, Santa Clara (United States)
https://hal.science/hal-00189380
A new Approach of continuing Education for Engineer : advanced Instruments Training in a telematic Network
Zimmer, Thomas ; Kadionik, Patrice ; Danto, Yves ; Dulau, Laurent
Dans : WCCEE: World Conference on Continuing Engineering Education, Torino (Italy)
https://hal.science/hal-00183039
A Network based training Tool for electrical Engineer's Education
Zimmer, Thomas ; Kadionik, Patrice ; Danto, Yves
Dans : CILT: Conference on broadband Communications in Education and Training, Cambridge (United Kingdom)
https://hal.science/hal-00183038
1997
Simulation d upsets dans une mémoire SRAM CMOS utilisant des capteurs de courant intégrés
Calin, T. ; Lapuyade, Hervé ; Nicolaidis, Michael ; Velazco, Raoul ; Fouillat, Pascal
Dans : Journées Nationales d Etudes de l association RADECS, (France)
https://hal.science/hal-00185417
Instrumentation virtuelle sur le World Wide Web pour faire des mesures réelles
Kadionik, Patrice ; Zimmer, Thomas ; Danto, Yves
Dans : CETSIS: Colloque sur l Enseignement des Technologies et des Sciences de l Information et des Systèmes, (France)
https://hal.science/hal-00183007
Experimental analysis and 2D simulation of AlGaAs/GaAs HBT base leakage current
Maneux, Cristell ; Labat, Nathalie ; Saysset, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : ESREF'97, (France)
https://hal.science/hal-00183483
Evaluation de la fiabilité du TBH GaAs : justification d'un protocole expérimental spécifique
Maneux, Cristell ; Labat, Nathalie ; Saysset, Nathalie ; Touboul, Andre ; Danto, Yves ; Dangla, Jean ; Launay, P. ; Dumas, Jean-Michel
Dans : Journée TBH dans le cadre des Journées Microélectronique et Optoélectronique III-V, (France)
https://hal.science/hal-00183482
Analysis of GaAs HBT failure mechanisms : impact on the life testing strategy
Maneux, Cristell ; Labat, Nathalie ; Saysset, Nathalie ; Danto, Yves ; Dangla, Jean ; Launay, P. ; Dumas, Jean-Michel
Dans : International Symposium on the Physical and Failure Analysis of integrated circuits, (Singapore)
https://hal.science/hal-00183481
Influence des effets de dose cumulée sur les règles de conception des circuits intégrés bipolaires
Montagner, Xavier ; Deval, Yann ; Fouillat, Pascal ; Touboul, Andre ; Dom, Jean-Paul
Dans : Colloque CAO des circuits intégrés et systèmes, (France)
https://hal.science/hal-00184311
Evaluation of ÑH and N parameters of conventional and pseudomorphic HEMTs L.F. noise
Saysset, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : International Conference on Noise in Physical Systems and 1/f fluctuations ICNF¡¦97, (Belgium)
https://hal.science/hal-00183568
Efficiency of trap detection in HEMTs by DCTS combined with LF noise analysis
Saysset, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : International Conference on Noise in Physical Systems and 1/f Fluctuations ICNF'97, (Belgium)
https://hal.science/hal-00183519
Applications of trap characterization in III-V devices : modeling and/or technological improvement
Saysset, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : ESA Electronic Components Conference EECC'97, (Netherlands)
https://hal.science/hal-00183518
A World Wide Web based Instrumentation Pool
Zimmer, Thomas ; Kadionik, Patrice ; Danto, Yves
Dans : MSE: IEEE Conference of Microelectronics Systems Education, Arlington (United States)
https://hal.science/hal-00183005
1996
Low frequency noise and pulse response of GaAs PHEMTs submitted to hot electrons stress
Cova, Paolo ; Boselli, Gianlucca ; Menozzi, Roberto ; Fantini, Fausto ; Saysset, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : Worshop onHeterostructures Technology - HETECH, (France)
https://hal.science/hal-00183563
Simulations électriques des effets de débit de dose et de dose cumulée dans les circuits intégrés bipolaires : méthodologie de conception durcie aux radiations
Deval, Yann ; Briand, Renaud ; Montagner, Xavier ; Fouillat, Pascal ; Tomas, Jean ; Dom, Jean-Paul
Dans : Journées d'étude RADECS96, (France)
https://hal.science/hal-00184312
Determination of critical process steps for enhanced yield improvement
Duluc, J. ; Zimmer, Thomas ; Lewis, N. ; Dom, Jean
Dans : Microelectronic Manufacturing 1996, Austin (France)
https://hal.science/hal-01721693
Analysis of Latchup susceptibility to internal logical states by using a Laser beam
Fouillat, Pascal ; Lapuyade, Hervé ; Maidon, Yvan ; Dom, Jean-Paul
Dans : Proc. of the 5th European Conference on Electron and Optical Beam Testing of Electronic Devices, (Germany)
https://hal.science/hal-00185418
A new approach to determine active doping profiles of bipolar transistors using electrical measurements and a physical device simulator
Hachicha, I. ; Fouillat, P. ; Zimmer, T. ; Dom, J.P.
Dans : International Conference on Microelectronic Test Structures, Trento (France)
https://hal.science/hal-01721688
Built-In Laser Sensitive Cells For a New Testing Technique
Lapuyade, Hervé ; Fouillat, Pascal ; Dom, Jean-Paul
Dans : Proc. of the 2nd IEEE International On-Line Testing Workshop, (France)
https://hal.science/hal-00185419
Complementary of drain current transient spectroscopy (DCTS) and G.R. noise analysis to detect traps in HEMTs
Saysset, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : European Solid State Device Research Conference, ESSDERC'96, (Italy)
https://hal.science/hal-00183562
Caractérisation d'un dysfonctionnement du HEMT et impact sur une application système
Saysset, Nathalie ; Dumas, Jean-Michel ; Labat, Nathalie ; Maneux, Cristell ; Touboul, Andre ; Danto, Yves
Dans : 5ème atelier du cercle thématique 21.70/SEE, (France)
https://hal.science/hal-00183484
Method for determining the effective base resistance of bipolar transistors
Zimmer, T. ; Berkner, J. ; Branciard, B. ; Lewis, N. ; Duluc, J.B. ; Dom, J.P.
Dans : 1996 BIPOLAR/BiCMOS Circuits and Technology Meeting, Minneapolis (France)
https://hal.science/hal-01721689
1995
Numerical Modelling of Mechanisms involved in Latchup Triggering by a Laser Beam
Fouillat, Pascal ; Lapuyade, Hervé ; Touboul, Andre ; Dom, Jean-Paul ; Gaillard, R.
Dans : Proc. of the Third European Conference on Radiation and its Effects on Components and Systems, (France)
https://hal.science/hal-00185422
A microcontroller failure analysis using a LASER beam latchup triggering technique
Fouillat, Pascal ; Le Calve, Jean-Edmond ; Lapuyade, Hervé ; Maidon, Yvan ; Dom, Jean-Paul
Dans : Proc. of the 6th European Symposium on Reliability of Electronic devices, Failure Physics and analysis, (France)
https://hal.science/hal-00185420
Design For Testability of Built-In Laser Sensitive Cells
Lapuyade, Hervé ; Fouillat, Pascal ; Maidon, Yvan ; Tomas, Jean ; Dom, Jean-Paul
Dans : Proc. of the 6th European Symposium Reliability of Electronic devices, Failure Physics and analysis, (France)
https://hal.science/hal-00185421
SPICE data base for neutron (1 MeV) radiation hardening design: permanent damage effects simulation of bipolar transistors
Rinaudo, O. ; Zimmer, T. ; Limtouch, S. ; Bourgoin, G. ; Lalande, P.
Dans : Third European Conference on Radiation and its Effects on Components and Systems, Arcachon (France)
https://hal.science/hal-01721687
Analysis of drain current transients and L.F. channel noise to detect deep levels in HEMTs
Saysset, Nathalie ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : International Workshop on Noise and Reliability of Semiconductor Devices, (Czech Republic)
https://hal.science/hal-00183564
Quality evaluation of S-HEMTs and PM-HEMTs by drain current transients and L.F. channel noise analysis
Saysset, Nathalie ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : ESREF'95, (France)
https://hal.science/hal-00183486
Comparison of 1/f noise sources in single-well and pseudomorphic HEMTs
Saysset, Nathalie ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : International Conference on Noise in Physical Systems and 1/f Fluctuations ICNF'95,, (Lithuania)
https://hal.science/hal-00183485
A new WLR method based on model parameter analysis
Zimmer, T. ; Duluc, J.B. ; Milet, N. ; Dom, J.P.
Dans : IEEE 1995 International Integrated Reliability Workshop. Final Report, Lake Tahoe (France)
https://hal.science/hal-01721684
1994
Electrical response of screen-printed varistors to transient overvoltages
Gouverneur, Sandrine ; Lucat, Claude ; Menil, Francis ; Verdier, Frédéric ; Touboul, Andre ; Aucouturier, Jean-Louis ; Pinel, J.
Dans : Lightnings and Mountains, (France)
https://hal.science/hal-00203780
Quality evaluation of AlGaAs/GaAs and AlGaAs/InGaAs/GaAs HEMTs by LF excess noise analysis
Saysset, Nathalie ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre ; Danto, Yves
Dans : ESREF'94, (United Kingdom)
https://hal.science/hal-00183489
Comparaison de HEMTs AlGaAs/GaAs et AlGaAs/InGaAs par l'analyse du bruit basses fréquences
Saysset, Nathalie ; Labat, Nathalie ; Maneux, Cristell ; Touboul, Andre ; Danto, Yves ; Dumas, Jean-Michel
Dans : Journées Microélectronique et Optoélectronique III-V, (France)
https://hal.science/hal-00183488
Analyse technologique de composants GaAs : méthodologie - complémentarité avec la caractérisation électrique
Saysset, Nathalie ; Labat, Nathalie ; Maneux, Cristell ; Danto, Yves
Dans : 4ème atelier du cercle thématique 21.70/SEE, (France)
https://hal.science/hal-00183487
Evaluation of low voltage ZnO varistors quality by low frequency noise characteristics
Verdier, Frédéric ; Gouverneur, Sandrine ; Lucat, Claude ; Touboul, Andre
Dans : ESREF 94, (United Kingdom)
https://hal.science/hal-00203781
1993
Investigations on the origin of AlGaAs/GaAs HEMTs LF channel noise
Labat, Nathalie ; Saysset, Nathalie ; Ouro Bodi, Dissadama ; Touboul, Andre ; Danto, Yves
Dans : Proc. of International Conference on Noise in Physical Systems and 1/f Fluctuations, (United States)
https://hal.science/hal-00183565
1992
A fast VLSI SRAM mapping methodology using voltage contrast techniques on SEM
Marc, François ; Fremont, Hélène ; Jounet, Paul ; Touboul, Andre ; Danto, Yves
Dans : ESREF, Schwäbisch-Gmünd (Germany)
https://hal.science/hal-00181911
Conférences invitées → 72 Voir
2022
Advanced Data Processing For Tomography and 3D Rendering With Terahertz Waves
Mounaix, Patrick
Dans : 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Delft (Netherlands)
https://hal.science/hal-03845666
2021
Electro-thermal limitations and device degradation of SiGe HBTs with emphasis on circuit performance (Invited)
Fregonese, Sebastien ; Chhandak, Mukherjee ; Rucker, Holger ; Chevalier, Pascal ; Fischer, Gerhard ; Céli, Didier ; Deng, Marina ; Marc, François ; Maneux, Cristell ; Zimmer, Thomas
Dans : 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), Monterey (United States)
https://hal.science/hal-03408053
2020
THz Spectroscopy, Holographic Approach and Phantoms Design for the Diagnostics of Socially Significant Diseases
Smolyanskaya, O. ; Petrov, N. ; Nazarov, M. ; Vaks, V. ; Kistenev, Yu. ; Cherkasova, O. ; Guillet, Jean-Paul ; Mounaix, P. ; Shkurinov, A.
Dans : 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Buffalo (France)
https://hal.science/hal-03273482
Graphene for radio frequency electronics
Wei, Wei ; Dalal, Fadil ; Fregonese, Sebastien ; Strupinski, Wlodek ; Pallecchi, Emiliano ; Happy, Henri
Dans : 2020 IEEE Latin America Electron Devices Conference (LAEDC), San Jose (Costa Rica)
https://hal.science/hal-02920359
2019
On wafer small signal characterization beyond 100 GHz for compact model assessment
Fregonese, Sebastien ; Deng, Marina ; Cabbia, Marco ; Yadav, Chandan ; Ranjan Panda, Soumya ; Zimmer, Thomas
Dans : European Microwave Week Workshop Recent advances in SiGe BiCMOS: technologies, modelling & circuits for 5G, radar & imaging, Paris (France)
https://hal.science/hal-02386275
Breakdown Voltage, SOA and Aging of HBTs: A Physics Base approach for Compact modeling
Jaoul, Mathieu ; Maneux, Cristell ; Zimmer, Thomas ; Céli, Didier
Dans : 31th Bipolar ArbeitsKreis, Crolles (France)
https://hal.science/hal-02511653
Terahertz systems for NDT demonstration and contact-less coatings thickness determination
Mounaix, Patrick
Dans : Albatros Techno Day (ATD), Merignac (France)
https://hal.science/hal-02381436
Data processing for multilayered material characterized by terahertz spectroscopy
Mounaix, Patrick
Dans : THz French Poland meeting , (October 17 and 18) Annual International Associated Laboratory - TERAMIR – warsaw, Varsovie (Poland)
https://hal.science/hal-02381417
Data processing for multilayered material characterized by terahertz spectroscopy
Mounaix, Patrick
Dans : THz symposium in Paris, 10-13 December 2019 (https://snaia2019.com/thz-optoelectronics-and-photonics-symposium/), Paris (France)
https://hal.science/hal-02381401
Advances in Aging Compact Model for Hot Carrier Degradation in SiGe HBTs under Dynamic Operating conditions for reliability-aware circuit design
Mukherjee, C ; Marc, F. ; Couret, M ; Fischer, G ; Jaoul, M ; Celi, D. ; Aufinger, K ; Zimmer, T. ; Maneux, C.
Dans : European Microwave Week Workshop Recent advances in SiGe BiCMOS: technologies, modelling & circuits for 5G, radar & imaging, Paris (France)
https://hal.science/hal-02386290
Modelling and Simulation of Heterojunction Bipolar Transistors for THz Applications Modeling and characterization of HBT in THz range
Zimmer, Thomas ; Deng, Marina ; Chhandak, Mukherjee ; Maneux, Cristell ; Fregonese, Sebastien
Dans : XXth International Workshop on Physics of Semiconductor Devices: IWPSD 2019, Kolkata (India)
https://hal.science/hal-02453238
2018
Extension of HICUM/L2 Avalanche Model at High Current: Proposal
Celi, Didier ; Jaoul, Mathieu ; Zimmer, Thomas
Dans : AKB Group Meetings, Frickenhausen (Germany)
https://hal.science/hal-02380248
2D RF Electronics: from devices to circuits - challenges and applications
Fadil, Dalal ; Wei, Wei ; Pallecchi, Emiliano ; Anderson, M ; Stake, Jan ; Deng, Marina ; Fregonese, Sebastien ; Zimmer, Thomas ; Happy, Henri
Dans : 2018 76th Device Research Conference (DRC), Santa Barbara (United States)
https://hal.science/hal-02372652
Extension of HICUM/L2 Avalanche Model at High Current: Proposal
Jaoul, Mathieu ; Maneux, Cristell ; Zimmer, Thomas ; Céli, Didier ; Schröter, Michael
Dans : 18th HICUM Workshop, Munich (Germany)
https://hal.science/hal-02511651
High Current Impact Ionization Model
Jaoul, Mathieu ; Maneux, Cristell ; Zimmer, Thomas ; Céli, Didier ; Schröter, Michael
Dans : HICUM WORKSHOP, Munich (Germany)
https://hal.science/hal-01820049
Interaction THz / matière biologique : état des lieux
Mounaix, Patrick
Dans : Effets Biologiques et Sanitaires des Rayonnements Non-Ionisants, Montpellier (France)
https://hal.science/hal-02389070
Submillimeter wave Tomography and image processing advances : Applications additive manufacturing quality control
Mounaix, Patrick
Dans : TERA 2018, nizhny novgorod (Russia)
https://hal.science/hal-02389066
Measurement issues of on-Silicon de- embedding test structures in the Sub-THz range
Yadav, Chandan ; Deng, Marina ; Fregonese, Sebastien ; de Matos, Magali ; Zimmer, Thomas
Dans : AKB working group, Frickenhausen (Germany)
https://hal.science/hal-02380246
2017
Practical implementation of reliability aware compact models in simulation software environnement
Ardouin, Bertrand ; Thomas, Zimmer ; Dupuy, Jean-Yves ; Godin, Jean ; Nodjiadjim, Virginie ; Riet, Muriel ; Marc, François ; Koné, Gilles Amadou ; Gosh, S. ; Grandchamps, B ; Maneux, Cristell
Dans : Bipolar ArbeitsKreis, Erfurt (Germany)
https://hal.science/hal-02511647
Beyond 100 GHz: High frequency device characterization for THz applications
Fregonese, S. ; Deng, M ; Potereau, M ; de Matos, M. ; Zimmer, T.
Dans : Conférence invitée, 2nd Sino MOS-AK Workshop, Hangzhou (China)
https://hal.science/hal-02379050
Tomography and terahertz image processing : a new tool for polymer and ceramic additive manufacturing characterization
Mounaix, Patrick
Dans : 4ème édition 3D PRINT, Lyon (France)
https://hal.science/hal-02389099
Advances on spectro thz imaging : From sources to applications
Mounaix, Patrick
Dans : RFIC 2017, Honolulu (United States)
https://hal.science/hal-02389097
Terahertz spectroscopy imaging for oncology studies
Mounaix, Patrick
Dans : SON2017 workshop, Grenoble (France)
https://hal.science/hal-02389093
Spectro terahertz imaging : from lab to industrial applications
Mounaix, Patrick
Dans : AG GDR Ondes, Nice (France)
https://hal.science/hal-02389089
Data And Image Processing For Biomedical Sample Analysis with terahertz beam
Mounaix, Patrick
Dans : BIPSA 2017, Bordeaux (France)
https://hal.science/hal-02389084
Production , structural characterization of TiO2 spheres and characterization at THz frequencies
Mounaix, Patrick
Dans : ICAE 2017, Jeju island (South Korea)
https://hal.science/hal-02389079
Terahertz, perspectives pour la filière viti/vini
Mounaix, Patrick
Dans : Seminaire VVOP , IOA bordeaux, Talence (France)
https://hal.science/hal-02389075
Tomography and terahertz image processing : a new tool for polymer and ceramic additive manufacturing characterization
Mounaix, Patrick
Dans : 3D Print lyon, Lyon (France)
https://hal.science/hal-01653672
Data And Image Processing For Biomedical Sample Analysis with terahertz beam
Mounaix, Patrick
Dans : BIPSA 2017, Bordeaux (France)
https://hal.science/hal-01653668
Terahertz spectroscopy imaging for oncology studies
Mounaix, Patrick
Dans : Complementarity between Optics and Neutron spectroscopy in the THz domain – SON2017, Grenoble (France)
https://hal.science/hal-01653664
Spectro terahertz imaging : from lab to industrial applications
Mounaix, Patrick
Dans : AG du GDR Ondes, sophia antipolis (France)
https://hal.science/hal-01653658
Production , structural characterization of TiO2 spheres and characterization at THz frequencies
Mounaix, Patrick
Dans : ICAE 2017, JeJu (South Korea)
https://hal.science/hal-01653655
Advances on spectro thz imaging : From sources to applications
Mounaix, Patrick
Dans : RFIC 2017, Honolulu (United States)
https://hal.science/hal-01653639
High frequency and noise performance of GFETs
Wei, W. ; Fadil, D. ; Deng, Marina ; Fregonese, S. ; Zimmer, T. ; Pallecchi, E. ; Dambrine, Gilles ; Happy, H.
Dans : 2017 International Conference on Noise and Fluctuations (ICNF), Vilnius (Lithuania)
https://hal.science/hal-01695812
2016
BEOL-investigation on selfheating and SOA of SiGe HBT
d'Esposito, Rosario ; Fregonese, Sebastien ; Zimmer, Thomas
Dans : 28th BipAK 2016, Munich (Germany)
https://hal.science/hal-01399956
Tomography And Image Processing For Polymeradditive Manufacturing Characterization
Mounaix, Patrick
Dans : 8th International Symposium on Ultrafast Phenomena and Terahertz Waves, chonqking (China)
https://hal.science/hal-02389117
2D and 3D THz imaging: necessity of automated data processing tools
Mounaix, Patrick
Dans : SPIE Asia, Beijing (China)
https://hal.science/hal-02389111
Automated data and image processing tools for THz applications : Additive manufacturing and Biomedical cases
Mounaix, Patrick
Dans : 7 THz Bio conference, Seoul (South Korea)
https://hal.science/hal-02389107
Advanced processing sequence for 3D THz imaging
Mounaix, Patrick
Dans : 7th International Workshop on Terahertz Technology and Applications, Kaiserlautern (Germany)
https://hal.science/hal-02389102
2D and 3D THz imaging: necessity of automated data processing tools
Mounaix, Patrick
Dans : SPIE Asia Beijing 2016, pekin (China)
https://hal.science/hal-01393433
Tomography and image processing for polymer additive manufacturing objects
Mounaix, Patrick
Dans : 8th International Symposium on Ultrafast Phenomena and Terahertz Waves, Chongqing (China)
https://hal.science/hal-01393428
Automated data and image processing tools for THz applications : Additive manufacturing and Biomedical cases
Mounaix, Patrick
Dans : 7 THz Bio conference , Seoul (South Korea)
https://hal.science/hal-01393425
Advanced processing sequence for 3D THz imaging
Mounaix, Patrick
Dans : 7th International Workshop on Terahertz Technology and Applications,, Kaiserslautern (Germany)
https://hal.science/hal-01393422
2015
Compact Model Validation Strategies Based on Dedicated and Benchmark Circuit Blocks for the mm-Wave Frequency Range
Ardouin, Bertrand ; Schroter, Michael ; Zimmer, Thomas ; Aufinger, Klaus ; Pfeiffer, Ulrich ; Raya, Christian ; Mukherjee, A. ; Malz,, S. ; Fregonese, Sebastien ; d'Esposito, Rosario ; de Matos, Magali
Dans : proceeding of the Compound Semiconductor Integrated Circuit Symposium (CSICS), 2015 IEEE,, New Orleans, LA, USA (United States)
https://hal.science/hal-01235946
Chemical imaging of RDX/PETN explosives by chemometrics appliyed on terahertz time-domain spectroscopy
Bou Sleiman, Joyce ; Perraud, Jb ; Bousquet, Bruno ; Palka, Norbert ; Mounaix, Patrick
Dans : SPIE Security + Defence, Toulouse (France)
https://hal.science/hal-01264631
Graphene FET evaluation for RF and mmWave circuit applications
Fregonese, Sebastien ; Morales, Jorgue Daniel Aguirre ; de Matos, Magali ; Maneux, Cristell ; Zimmer, Thomas
Dans : Circuits and Systems (ISCAS), 2015 IEEE International Symposium on, Lisbonne (Portugal)
https://hal.science/hal-01235960
Substrate-coupling effect in BiCMOS technology for millimeter wave applications
Fregonese, Sebastien ; d'Esposito, Rosario ; de Matos, Magali ; Kohler, Andreas ; Maneux, Cristell ; Zimmer, Thomas
Dans : New Circuits and Systems Conference (NEWCAS), Grenoble (France)
https://hal.science/hal-01235958
The Organic Bipolar Heterojunction Transistor (OHBT)
Wantz, Guillaume ; Pereira, Marco ; Ayela, Cédric ; Fregonese, Sébastien ; Briseno, Alejandro ; Hirsch, Lionel ; Thuau, Damien
Dans : MRS Fall Meeting 2015, Boston (United States)
https://hal.science/hal-02505589
On the Use of Single-Crystals of Organic Semiconductors in Novel Electronic Devices
Wantz, Guillaume ; Bachevillier, Stéphane ; Reyes-Martinez, Marcos ; Ayela, Cédric ; Fregonese, Sebastien ; Hirsch, Lionel ; Briseno, Alejandro
Dans : MRS Spring Meeting 2015, San Francisco (United States)
https://hal.science/hal-01228731
2014
Graphene electronics: how far from industrial applications
Zimmer, Thomas ; Fregonese, Sebastien
Dans : ICTC Compact Modeling Workshop, Shangai (China)
https://hal.science/hal-01002135
The potential of graphene for RF applications
Zimmer, Thomas ; Fregonese, Sebastien ; Maneux, Cristell
Dans : BIT's 3rd World Congress of Advanced Materials, (China)
https://hal.science/hal-01002132
Electro-Thermal Investigation and Modeling of Sige Hbt High-Speed Devices
Zimmer, Thomas ; Weiss, Mario ; Maneux, Cristell ; Fregonese, Sebastien
Dans : SiGe, Ge & Related Compounds: Materials, Processing and Devices, (Mexico)
https://hal.science/hal-00987211
2013
Electro-Thermal Device Characterization & Modelling
Fregonese, Sebastien ; Kumar Sahoo, Amit ; Weib, Mario ; Maneux, Cristell
Dans : OBip: Open Bipolar Workshop at BCTM in Bordeaux, (France)
https://hal.science/hal-00987256
The potential of graphene for electronics
Zimmer, T. ; Fregonese, S. ; Maneux, Cristell
Dans : SDD, International Multi-Conference on Systems Signals & Devices, (Tunisia)
https://hal.science/hal-01002124
2011
Anything else beyond CMOS?
Fregonese, Sebastien ; Cristell, Maneux ; Thomas, Zimmer
Dans : Atelier CNRS : " Nouveaux paradigmes de traitement de l'information ", Paris (France)
https://hal.science/hal-00987253
Link between low frequency noise and reliability of compound semiconductor HEMTs and HBTs
Labat, Nathalie ; Malbert, Nathalie ; Maneux, Cristell ; Curutchet, Arnaud ; Grandchamp, Brice
Dans : INCF 2011, Toronto (Canada)
https://hal.science/hal-00585593
2009
Failure mechanisms in deep sub-micron technologies
Pouget, Vincent
Dans : Latin America Test Workshop, Buzios (Brazil)
https://hal.science/hal-00398047
2008
Transistors hautes fréquences à base de nanotubes de carbone
Happy, H. ; Zimmer, T.
Dans : JOURNEES NANO, MICRO ET OTOELECTRONIQUE, (France)
https://hal.science/hal-00327452
Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges
Perdu, Philippe ; Lewis, Dean ; Pouget, V.
Dans : European Symposium on Reliability of Electron Devices (ESREF), Maastricht (Netherlands)
https://hal.science/hal-00401385
2007
CAD tools dedicated to the design and test of RFICs
Deval, Yann ; Taris, Thierry ; Shirakawa, Alexandre ; Mazouffre, Olivier ; Pouget, Vincent ; Kerherve, Eric ; Lewis, Deal ; Begueret, Jean-Baptiste
Dans : Design, Automation & Test in Europe (DATE) 2007, (France)
https://hal.science/hal-00178343
Using Pulsed laser for security purpose
Pouget, V.
Dans : USE-IT Workshop, Toulouse (France)
https://hal.science/hal-00401384
Test et analyse par faisceau laser: plateforme et applications
Pouget, V.
Dans : Journée thématique du GDR SOC-SiP, Paris (France)
https://hal.science/hal-00401383
Fundamentals and recent developments on laser testing at the IMS laboratory
Pouget, V.
Dans : RALFDAY, Suresnes (France)
https://hal.science/hal-00401382
Current status of e-Learning in Europe
Zimmer, Thomas
Dans : Kumamoto University GP International Symposium 2007, (Japan)
https://hal.science/hal-00211728
Best practice of on-line labs in electrical engineering education: A ten years experience at the University Bordeaux
Zimmer, T. ; Geoffroy, D. ; Billaud, M.
Dans : International Conference on Information Technology Based Higher Education and Training ITHET, Kumamoto (Japan)
https://hal.science/hal-00211727
2006
A Review and some Future Prospects on Laser-Based Techniques for Single-Event Effects Testing and Analysis
Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Darracq, Frédéric
Dans : International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA), Tokyo (Japan)
https://hal.science/hal-00398038
Fundamentals of the Pulsed Laser Technique for single-event effects testing
Mcmorrow, D. ; Pouget, Vincent ; Fouillat, Pascal ; Darracq, Frédéric ; Buchner, S. ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Séville (Spain)
https://hal.science/hal-00401321
Analog Single Event Transients in Linear and RF Devices
Pouget, Vincent
Dans : 2nd International School on the Effects of Radiation on Embedded Systems for Space Applications, Séville (Spain)
https://hal.science/hal-00398045
2005
Fundamentals of the Pulsed Laser Technique for single-event upset testing
Fouillat, Pascal ; Pouget, Vincent ; Mcmorrow, D. ; Darracq, Frédéric ; Buchner, S. ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Manaus (Brazil)
https://hal.science/hal-00401314
Laser SEE Testing and Analysis Case Studies
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Manaus (Brazil)
https://hal.science/hal-00401316
2004
Bias dependence of LF drain and gate noise in GaN HEMT s
Malbert, Nathalie ; Labat, Nathalie ; Curutchet, Arnaud ; Verdier, Frédéric ; Touboul, Andre
Dans : Fluctuation and Noise Conference, (Spain)
https://hal.science/hal-00183566
2003
Low frequency noise as early indicator of degradation in compound semiconductor FETs and HBTs
Malbert, Nathalie ; Maneux, Cristell ; Labat, Nathalie ; Touboul, Andre
Dans : 17th International Conference on Noise in Physical Systems and 1/f Fluctuations, (Czech Republic)
https://hal.science/hal-00183106
Chapitres d'ouvrages scientifiques → 12 Voir
2011
Chapter 9: Electronics Basics E-Learning: From Lectures to Lab
Saïghi, S. ; Billaud, M. ; Geoffroy, D. ; Zimmer, T.
https://hal.science/hal-01002610
2009
Pour un rapprochement des technologies et des usages : le futur du pôle TIC de Bordeaux
Fouillat, Pascal ; Claverie, Bernard
https://hal.science/hal-00983405
2007
Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing
Fouillat, P. ; Pouget, V. ; Mcmorrow, D. ; Darracq, F. ; Buchner, S. ; Lewis, D.
https://hal.science/hal-00206315
Using the SEEM software for SET testing and analysis
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean
https://hal.science/hal-00397867
Using the SEEM Software for Laser SET Testing and Analysis
Pouget, V. ; Fouillat, P. ; Lewis, D.
https://hal.science/hal-00206320
2005
Transistors bipolaires à hétérojonctions : dispositifs Si/SiGe
Ardouin, Bertrand ; Zimmer, Thomas ; Cazenave, Philippe
https://hal.science/hal-00203989
Modélisation bipolaires avancée
Ardouin, Bertrand ; Zimmer, Thomas
https://hal.science/hal-00203988
Running remote lab experiments through the eLab platform
Billaud, Michel ; Geoffroy, Didier ; Zimmer, Thomas
https://hal.science/hal-00211724
Network Analysis for SiGe HBT's Thermal Impedance Modelling
Mnif, Hassene ; Battaglia, Jean-Luc ; Sulima, Pierre Yvan ; Fregonese, Sebastien ; Zimmer, Thomas
https://hal.science/hal-00181751
Extraction des paramètres des modèles électriques bipolaires
Zimmer, Thomas ; Ardouin, Bertrand
https://hal.science/hal-00203987
2004
EMERGE: A EUROPEAN EDUCATIONAL NETWORK FOR DISSEMINATION OF ONLINE LABORATORY EXPERIMENTS
Cabello, Ruben ; Gonzalez, Ivan ; Gomez-Arribas, Francisco ; Martinez, Xavier ; Billaud, Michel ; Zimmer, Thomas ; Geoffroy, Didier ; Effinger, Hans ; Seifert, Wilhelm ; Jaeger, Reinhold ; Fjeldly, T.A. ; Jeppson, Kjell ; Mann, Hermann ; Asimopoulos, Nikolaos ; German-Sallo, Zoltan
https://hal.science/hal-00364931
2003
Instrumentation on the WEB
Zimmer, Thomas ; Geoffroy, Didier ; Billaud, M.
https://hal.science/hal-00203990
Habilitation à diriger des recherches → 1 Voir
2019
Caractérisation et modélisation des transistors avancés et émergents pour la conception de circuit
Fregonese, Sebastien
https://hal.science/tel-02379493
Preprint, Working Paper, Document sans référence, etc. → 7 Voir
2017
Des ondes térahertz pour sonder les tableaux et les peintures
Mounaix, Patrick
https://hal.science/hal-01653682
Frequency analysis of the penetration depth of the heat flow in SiGe HBTs
Rosario, d'Esposito ; Fregonese, Sébastien ; Suresh, Balanethiram ; Zimmer, Thomas
https://hal.science/hal-01649953
2016
Franco-Chinese Workshop : Collaboration in Photonics between University of Bordeaux and Huazhong University of Science and Technology
Guillet, Jean-Paul ; Mounaix, Patrick ; Canioni, Lionel ; Prakasam, Mythili ; Jubera, Veronique ; Dousset, Vincent
https://hal.science/hal-01456327
Photonics & Aeronautics: a wedding with a promising future
Mounaix, Patrick ; Bechou, Laurent
https://hal.science/hal-01404480
CONTRÔLES ET MESURES UN NOUVEL ENJEU POUR LA FABRICATION ADDITIVE
Mounaix, Patrick ; Obaton, Anne Françoise
https://hal.science/hal-01404478
De nouvelles ondes pour le CND
Mounaix, Patrick
https://hal.science/hal-01404469
2015
De nouvelles ondes à la vue perçante
Mounaix, Patrick
https://hal.science/hal-01404487
Ouvrages scientifiques → 3 Voir
2017
Alles über Photovoltaik
Zimmer, Thomas
https://hal.science/hal-02474990
2011
From Lectures to Lab: Electronics of Devices and Circuits - Essentials
Zimmer, T. ; Saïghi, S.
https://hal.science/hal-01002608
2010
Contribution à la modélisation des TBH SiGe en température et en bruit
Mnif, H. ; Zimmer, T.
https://hal.science/hal-01002607
Brevets → 14 Voir
2017
Hybrid simulator and method for teaching optics or for training adjustment of an optical device
Canioni, Lionel ; Hachet, Martin ; Guillet, Jean-Paul ; Bousquet, Bruno ; Furio, David
https://u-bourgogne.hal.science/hal-01536384
Semiconductor Device Having a Graphene Layer, and Method of Manufacturing Thereof
Ruhl, Gunter ; Lippert, G. ; Schulze, H.-J. ; Zimmer, Thomas
https://hal.science/hal-02474968
2016
Vertikale Graphen-bauelemente auf SiC on SiC
Ruhl, Gunter ; Schulze, H. -J. ; Lippertz, G. ; Zimmer, Thomas
https://hal.science/hal-02474980
Balun device with GFET transistors
Zimmer, Thomas ; Fregonese, Sebastien ; Happy, Henri
https://hal.science/hal-01721670
2015
Dispositif de calibrage pour l'ajustement d'une mesure radiofréquence
Zimmer, Thomas ; Sebastien, Fregonese ; Curutchet, A. ; Potéreau, Manuel ; Raya, Christian
https://hal.science/hal-01721675
2014
MACHINE TOURNANTE A ROTOR FLUIDIQUE A PALES ORIENTABLES
Curutchet, Arnaud ; Gabriel, Cordé ; Grosmangin, Stephane ; Renaud, Fourton
https://hal.science/hal-00993368
2013
ELECTRONIC DEVICE FOR PROTECTING AN ELECTRIC CONDUCTOR AND METHOD FOR CONTROLLING SUCH A DEVICE
Guillemard, Franck ; Bavoux, Bernard ; Nguyen, Huy Cuong ; Nocquet, C. ; Pavero, G. ; Cloup, J. P. ; Sabatier, Jocelyn ; Moreau, Xavier
https://hal.science/hal-00983945
Dispositif électronique de protection d'un conducteur électrique
Guillemard, Franck ; Bavoux, Bernard ; Nguyen, Huy Cuong ; Nocquet, C. ; Pavero, G. ; Cloup, J. P. ; Sabatier, Jocelyn ; Moreau, Xavier
https://hal.science/hal-00949718
2012
Device And Method For Generating A Signal Of Parametrizable Frequency
Belot, Didier ; Lucas de Peslouan, Pierre-Olivier ; Majek, Cédric ; Deval, Yann ; Taris, Thierry ; Begueret, Jean-Baptiste
https://hal.science/hal-01582204
Dispositif et procédé de génération d'un signal de fréquence paramétrable
Belot, Didier ; Lucas de Peslouan, Pierre-Olivier ; Majek, Cédric ; Deval, Yann ; Taris, Thierry ; Begueret, Jean-Baptiste
https://hal.science/hal-00840498
SYNTHÉTISEUR D'IMPÉDANCE COAXIAL
Curutchet, Arnaud
https://hal.science/hal-00986959
2010
ENSEMBLE D'ADAPTATION D'IMPÉDANCE, CIRCUIT ÉLECTRONIQUE ET PROCÉDÉS DE FABRICATION ASSOCIES
Curutchet, Arnaud
https://hal.science/hal-00556588
2002
Récupération d'Horloge et de Données à Base d'Oscillateur Synchrone
Begueret, Jean-Baptiste ; Deval, Yann ; Fouillat, Pascal ; Le Gall, Jean-Yves ; Pignol, Michel ; Scarabello, Christophe
https://hal.science/hal-00178602
2000
Circuits et Procédés de Génération de Signaux en Décalage de Phase
Begueret, Jean-Baptiste ; Belot, Didier ; Deval, Yann ; Fouillat, Pascal ; Spataro, Anne
https://hal.science/hal-00178593
Rapport de recherche → 1 Voir
2016
Modèle dans NANOHUB : Physics-Based Compact Model for Dual-Gate Bilayer Graphene FETs 1.0.0
Aguirre-Morales, Jorge-Daniel ; Fregonese, Sebastien ; Mukherjee, Chhandak ; Maneux, Cristell ; Zimmer, Thomas
https://hal.science/hal-01399947
Theses → 41 Voir
2021
Robustness assessment of normally-off GaN HEMT technology with fluorine ions implantation co-integrated with normally-on GaN HEMT technology
Albany, Florent
https://theses.hal.science/tel-03572025
(Sub)-millimeter wave on-wafer calibration and device characterization
Cabbia, Marco
https://theses.hal.science/tel-03150165
Reliability study of 0.15um GaN technology on SiC - Electrical characterization and analysis of parasitic effects and failure mechanisms
Magnier, Florent
https://theses.hal.science/tel-03336174
Investigation and Modeling of High Frequency Effects in SiGe HBTs
Saha, Bishwadeep
https://theses.hal.science/tel-03506299
2020
Terahertz radiations for breast tumour recognition
Cassar, Quentin
https://theses.hal.science/tel-03053722
Terahertz Radiations for Breast Tumour Recognition
Cassar, Quentin
https://hal.science/tel-02899590
Failure mechanisms implementation into SiGe HBT compact model operating close to safe operating area edges
Couret, Marine
https://theses.hal.science/tel-03121111
Study of the reliability and mechanisms of degradation in DSM digital integrated circuits
Coutet, Julien
https://theses.hal.science/tel-03352879
Study of HBT operation beyond breakdown voltage : Definition of a Safe Operating Area in this operation regime including the aging laws
Jaoul, Mathieu
https://theses.hal.science/tel-02945952
Terahertz wave-guided reflectometry system
Pan, Mingming
https://hal.science/tel-02926290
2019
Performance and ageing quantification of electrochemical energy storage elements for aeronautical usage
Zhang, Yuanci
https://theses.hal.science/tel-02275816
2018
Terahertz imaging and spectroscopy of biomedical tissues : application to breast cancer detection
Al-Ibadi, Amel
https://theses.hal.science/tel-01834560
Investigation into trapping mechanisms and impact on performances and reliability of GaN HEMTs through physical simulation and electro-optical characterization
Mukherjee, Kalparupa
https://theses.hal.science/tel-02115969
Characterization and simulation of defects induced by a continuous wave laser during electrical failure analysis on the 28FDSOI technology
Penzes, Maxime
https://theses.hal.science/tel-01783955
Fast 3D terahertz imaging
Perraud, Jean-Baptiste
https://theses.hal.science/tel-01949401
2017
Reliability assessment of GaN HEMTs on Si substrate with ultra-short gate dedicated to power applications at frequency above 40 GHz
Lakhdhar, Hadhemi
https://theses.hal.science/tel-01763431
2016
Characterization and modeling of graphene-based transistors towards high frequency circuit applications
Aguirre Morales, Jorge Daniel
https://theses.hal.science/tel-01455081
Imagerie et spectroscopie térahertz : application aux problématiques de défense et de sécurité
Bou Sleiman, Joyce
https://theses.hal.science/tel-01343342
Reliability of SiGe, C HBTs operating at 500 GHz : characterization and modeling
Jacquet, Thomas
https://theses.hal.science/tel-01476084
Design and operation of an auto-characterization test bench for predicting the reliability of programmable digital circuits.
Naouss, Mohammad
https://theses.hal.science/tel-01412351
2015
Deep electrical characterization and modeling of parisitc effects and degradation mechanisms of AlGaN/GaN HEMTs on SiC substrate
Rzin, Mehdi
https://hal.science/tel-02462845
2014
Contribution in reliability insurance of GaN HEMT on SiC substrate : electrical characterization and modeling of parasitic effects
Brunel, Laurent
https://theses.hal.science/tel-01133679
Integrated circuit analysis by laser probing techniques
Rebaï, Mohamed Mehdi
https://theses.hal.science/tel-01150670
SPICE Modeling of TeraHertz Heterojunction bipolar transistors
Stein, Félix
https://theses.hal.science/tel-01200490
2013
Evaluation of non-hermetic packaging solutions for active microwave devices and space applications
Ben Naceur, Walim
https://theses.hal.science/tel-00991023
Study, applications and improvements of the LVI technique on the advanced CMOS technologies 45nm and below.
Celi, Guillaume
https://theses.hal.science/tel-00904697
Impact of bidimensional physical modeling multicellular of power semiconductor device on the evaluation of the reliability package applied to automotive
El Boubkari, Kamal
https://theses.hal.science/tel-00926599
Prediction tool development of an Integrated Circuit behavior under laser impact in CMOS technology
Godlewski, Catherine
https://theses.hal.science/tel-00958998
Study of the atmospherical neutrons effect on electronic components embbeded for avionics application and search of hardening solutions
Renard, Sébastien
https://theses.hal.science/tel-01015741
Electrothermal device-to-circuit interactions for half THz SiGe∶C HBT technologies
Weisz, Mario
https://theses.hal.science/tel-01249529
2012
DEVELOPPEMENT ET APPLICATIONS DE TECHNIQUES LASER IMPULSIONNELLES POUR L'ANALYSE DE DEFAILLANCE DES CIRCUITS INTEGRES
Faraud, Emeric
https://theses.hal.science/tel-00997458
Electro-thermal Characterizations, Compact Modeling and TCAD based Device Simulations of advanced SiGe:C BiCMOS HBTs and of nanometric CMOS FET
Sahoo, Amit Kumar
https://hal.science/tel-02457044
NOUVELLES METHODES D'IMAGERIE HAUTE RESOLUTION POUR L'ANALYSE DES COMPOSANTS NANOELECTRONIQUES
Shao, Kai
https://theses.hal.science/tel-00997436
2011
NON QUASI-STATIC EFFECTS INVESTIGATION FOR COMPACT BIPOLAR TRANSISTOR MODELING
Bhattacharyya, Arkaprava
https://hal.science/tel-02474895
Electrical and electro-optic characterisation of carbon nanotube transistor for the compact modeling
Liao, Si-Yu
https://theses.hal.science/tel-00592479
2010
Terahertz-Nahfeldmikroskopie
Guillet, Jean-Paul
https://theses.hal.science/tel-01316243
Compact modeling of the Schottky carbon nanotube transistor and its application to digital circuit design
Najari, Montassar
https://theses.hal.science/tel-00560346
METHODOLOGIE DE LOCALISATION DES DEFAUTS SOFT DANS LES CIRCUITS INTEGRES MIXTES ET ANALOGIQUES PAR STIMULATION PAR FAISCEAU LASER : ANALYSE DE RESULTATS DES TECHNIQUES DYNAMIQUES PARAMETRIQUES
Sienkiewicz, Magdalena
https://theses.hal.science/tel-00998834
2009
Contribution à la modélisation physique et électrique compacte du transistor à nanotube
Goguet, Johnny
https://theses.hal.science/tel-00585836
Etude des effets singuliers transitoires dans les amplificateurs opérationnels linéaires par photogénération impulsionnelle non-linéaire
Jaulent, Patrice
https://theses.hal.science/tel-00997385
2006
Contribution to the study of a frequency synthesizer dedicated to multistandard communicating objects in SOI CMOS technology
Majek, Cédric
https://theses.hal.science/tel-00188659