Different test benches and instruments for specific measurements are available:

• Vector Network Analyzers up to 500 GHz:
  • PNA 67 GHz (Agilent) and its millimeter test heads 67_110 GHz
    (2 port 110 GHz, 4 ports 50 GHz)
  • ZVA 24 GHz (R&S) and its millimeter test heads (140-500 GHz)
  • PNAX 26,5 GHz (Keysight), 4 ports
  • ZVA 67 GHz, 2 ports
• Tuners 0.8-18 GHz with dedicated software (Focus Microwave) and equipment
  • Multi-harmonic tuners for Load Pull measurement
  • Source tuner for noise measurements
• Tuners 57-90 GHz for Load Pull measurements with dedicated software (Focus Microwave) and equipment
• Spectrum Analyzer with phase noise measurements up to 170 GHz (FSUP R&S)
• Noise Figure test bench with noise sources 0.1_26.5 GHz and 60_90 GHz (FSUP R&S).
• Pulsed DC (100 mA, 60ns) and S parameter measurements up to 45 GHz (ZVA 67 GHz, Keithley 4200, HP4155A)
• Vector Network Analyzer low frequency : 5 Hz-3 GHz (Agilent E5061B)
• Low frequency noise test bench for integrated devices (probe station in Faraday box)
• Pulsed DC (2A) test bench (cryogenic probe station down to 80K)
• Radiofrequency facilities for the characterization of circuits such as  : PA, LNA, Mixer, VCO, PLL (spectrum analyzers 20 GHz, generators 40 GHz, power meters 50 GHz, oscilloscopes 20 GHz, power supplies …)

These equipments can be used on test fixture or on wafer with 8 probe stations. A semi-automatic probe station allows to control temperature from -60 °C to 200 °C and a cryogenic probe station to go down to 77K (nitrogen).