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NANOELECTRONIQUE / LASER
0540006540
A31A

Total : 151

Articles in peer-reviewed journal → 58 Show

2015


Low-frequency noise effect on terahertz tomography using thermal detectors.
Guillet, Jean-Paul ; Recur, Benoît ; Balacey, Hugo ; Bou Sleiman, Joyce ; Darracq, F. ; Lewis, Dean ; Mounaix, Patrick
Dans : Applied optics
https://hal.archives-ouvertes.fr/hal-01263737

A way to implement the electro-optical technique to inertial MEMS
Melendez, K ; Desmoulin, A ; , ; Perdu, Philippe ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-01264066

2014


A comprehensive study of the application of the EOP techniques on bipolar devices
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Guillet, Jean-Paul ; Elise, Bernou ; Sanchez, Kevin ; Perdu, Philippe ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-01091179

2013


Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology
El Moukhtari, Issam ; Pouget, Vincent ; Darracq, Frédéric ; Larue, Camille ; Perdu, Philippe ; Lewis, D.
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00880480

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell
El Moukhtari, Issam ; Pouget, Vincent ; Larue, Camille ; Darracq, Frédéric ; Lewis, D. ; Perdu, Philippe
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00880459

Variants at multiple loci implicated in both innate and adaptive immune responses are associated with Sjögren's syndrome.
Lessard, Christopher J ; Li, He ; Adrianto, Indra ; Ice, John A ; Rasmussen, Astrid ; Grundahl, Kiely M ; Kelly, Jennifer A ; Dozmorov, Mikhail G ; Miceli-Richard, Corinne ; Bowman, Simon ; Lester, Sue ; Eriksson, Per ; Eloranta, Maija-Leena ; Brun, Johan G ; Gøransson, Lasse G ; Harboe, Erna ; Guthridge, Joel M ; Kaufman, Kenneth M ; Kvarnström, Marika ; Jazebi, Helmi ; Graham, Deborah S Cunninghame ; Grandits, Martha E ; Nazmul-Hossain, Abu N M ; Patel, Ketan ; Adler, Adam J ; Maier-Moore, Jacen S ; Farris, A Darise ; Brennan, Michael T ; James, James ; James, Judith A ; Gopalakrishnan, Rajaram ; Hefner, Kimberly S ; Houston, Glen D ; Huang, Andrew J W ; Hughes, Pamela J ; Lewis, David M ; Radfar, Lida ; Rohrer, Michael D ; Stone, Donald U ; Wren, Jonathan D ; Vyse, Timothy J ; Gaffney, Patrick M ; Omdal, Roald ; Wahren-Herlenius, Marie ; Illei, Gabor G ; Witte, Torsten ; Jonsson, Roland ; Rischmueller, Maureen ; Rönnblom, Lars ; Nordmark, Gunnel ; Ng, Wan-Fai ; Mariette, Xavier ; Anaya, Juan-Manuel ; Rhodus, Nelson L ; Segal, Barbara M ; Scofield, R Hal ; Montgomery, Courtney G ; Harley, John B ; Sivils, Kathy L ; Lessard, He ; Cunninghame Graham, Deborah S
Dans : Nature Genetics
https://hal.univ-brest.fr/hal-01558145

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
Mbaye, Nogaye ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00880471

2012


Building the electricalmodel of the PhotoelectricLaserStimulation of a PMOS transistor in 90 nm technology
Alexandre, Sarafianos ; Llido, R. ; Dutertre, Jean-Max ; Gagliano, Olivier ; Serradeil, Valérie ; Lisart, Mathieu ; Goubier, V. ; Tria, Assia ; Pouget, Vincent ; Lewis, D.
Dans : Microelectronics Reliability
https://hal-emse.ccsd.cnrs.fr/emse-00742622

Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing
Darracq, Frédéric ; Mbaye, Nogaye ; Azzopardi, Stephane ; Pouget, Vincent ; Lorfèvre, E. ; Bezerra, F. ; Lewis, Dean
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00772095

Effects of 1064 nm laser on MOS capacitor
Llido, R. ; Masson, P. ; Regnier, V. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00988338

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90nm technology
Sarafianos, A ; Llido, R ; Gagliano, O ; Serradeil, V ; Lisart, M ; Goubier, V ; Dutertre, Jean-Max ; Tria, A ; Pouget, V ; Lewis, D
Dans : Microelectronics Reliability
https://hal-emse.ccsd.cnrs.fr/emse-01110360

2011


Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis
Bascoul, G. ; Perdu, Philippe ; Benigni, A. ; Dudit, Sylvain ; Celi, Guillaume ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00669825

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis
Celi, Guillaume ; Dudit, Sylvain ; Parassin, T. ; Perdu, Philippe ; Reverdy, Antoine ; Lewis, D. ; Vallet, M.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00669760

Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing
Faraud, Emeric ; Pouget, V. ; Shao, Kai ; Larue, Camille ; Darracq, Frédéric ; Lewis, D. ; Samaras, A. ; Bezerra, F. ; Lorfèvre, E. ; Ecoffet, R.
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00667336

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization
Infante, Fulvio ; Perdu, Philippe ; Kor, H.B ; Gan, C. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00669757

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory
Llido, R. ; Gomez, J. ; Goubier, V. ; Froidevaux, N. ; Dufayard, L. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00669826

3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing
Shao, Kai ; Morisset, Adèle ; Pouget, V. ; Faraud, Emeric ; Larue, Camille ; Lewis, D. ; Mcmorrow, D.
Dans : Optics Express
https://hal.archives-ouvertes.fr/hal-00667432

2010


Facing the defect characterization and localization challenges of bridge defects on submicronic technology (45nm and below)
Celi, Guillaume ; Dudit, Sylvain ; Perdu, Philippe ; Reverdy, Antoine ; Parrassin, Thierry ; Bechet, Emmanuel ; Lewis, Dean ; Vallet, Michel
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00585642

CADless laser assisted methodologies for failure analysis and device reliability
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00988334

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00585644

2009


Electrical modeling of the effect of beam profile for pulsed laser fault injection
Godlewski, C. ; Pouget, V. ; Lewis, D. ; Lisart, Mathieu
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00669736

Net integrity checking by optical localization techniques
Haller, Gerald ; Machouat, A. ; Lewis, D. ; Pouget, V.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00669741

2008


Study of Single Event Transients in High-Speed Operational Amplifiers
Jaulent, Patrice ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00397747

Effect of physical defect on shmoos in CMOS DSM technologies
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Perdu, Philippe ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00401309

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Sanchez, Kevin ; Crepel, Olivier ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00401312

2007


Optimizing pulsed OBIC technique for ESD defect localization
Essely, Fabien ; Guitard, Nicolas ; Darracq, Frédéric ; Pouget, Vincent ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : IEEE Transactions on Device and Materials Reliability
https://hal.archives-ouvertes.fr/hal-00382949

In-depth resolution for LBIC technique by two-photon absorption
Wan, Dong Yun ; Pouget, Vincent ; Douin, Alexandre ; Jaulent, Patrice ; Lewis, Dean ; Fouillat, Pascal
Dans : Semiconductors
https://hal.archives-ouvertes.fr/hal-00204572

2006


Evaluation of SRAMs reliability for space electronics using ultrashort laser pulses
Darracq, Frédéric ; Lapuyade, Herve ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : Journal of Integrated Circuits and Systems
https://hal.archives-ouvertes.fr/hal-00359396

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation
Douin, Alexandre ; Pouget, Vincent ; De Matos, Magali ; Lewis, Dean ; Perdu, Philippe ; Fouillat, Pascal
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00204571

Influence of Laser Pulse Duration in Single Event Upset Testing
Douin, Alexandre ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00204547

Application of various optical techniques for ESD defect localization
Essely, Fabien ; Darracq, Frédéric ; Pouget, Vincent ; Remmach, Mustapha ; Beaudoin, Félix ; Guitard, Nicolas ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00204570

2005


Scanning laser ultrasonics experiments for in-situ non-destructive analysis of integrated circuits
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE Transactions on Device and Materials Reliability
https://hal.archives-ouvertes.fr/hal-00181926

Impact of semiconductors material on IR Laser Stimulation signal
Firiti, Abdellatif ; Beaudoin, Félix ; Haller, G. ; Perdu, Philippe ; Lewis, Dean ; Fouillat, Pascal
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00401285

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
Guitard, Nicolas ; Essely, Fabien ; Trémouilles, David ; Bafleur, Marise ; Nolhier, Nicolas ; Perdu, Phillipe ; Touboul, Andre ; Pouget, Vincent ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00397706

Implementing laser-based failure analysis methodologies using test vehicles
Lewis, Dean ; Pouget, Vincent ; Beaudoin, Félix ; Haller, G. ; Perdu, Phillipe ; Fouillat, Pascal
Dans : IEEE Transactions on Semiconductor Manufacturing
https://hal.archives-ouvertes.fr/hal-00397918

Light Emission To time resolved emission for IC debug and failure analysis
Remmach, Mustapha ; Pigozzi, A. ; Desplats, Romain ; Perdu, Philippe ; Lewis, Dean ; Noel, J. ; Dudit, Sylvain
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00401289

NIR Laser stimulation for dynamic timing analysis
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Roux, J.P. ; Lewis, Dean
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00401294

2004


Evaluation of SRAMS reliability for space electronics using ultra short laser pulses
Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : Electrochemical Society
https://hal.archives-ouvertes.fr/hal-00185395

INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER
Fouillat, P. ; Pouget, V. ; Lewis, D. ; Buchner, S. ; Mcmorrow, D.
Dans : International Journal of High Speed Electronics and Systems
https://hal.archives-ouvertes.fr/hal-01887658

Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC
Pouget, V. ; Lewis, D. ; Fouillat, P.
Dans : IEEE Transactions on Instrumentation and Measurement
https://hal.archives-ouvertes.fr/hal-01887656

2003


Application of picosecond ultrasonics to non-destructive analysis in VLSI circuits
Andriamonje, G. ; Pouget, V. ; Ousten, Y. ; Lewis, D. ; Danto, Y. ; Rampnoux, Jean-Michel ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, Stéphane ; Claeys, W. ; Rossignol, C. ; Audoin, B.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-01550917

Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Danto, Yves ; Rampnoux, J. M. ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, S. ; Claeys, W. ; Rossignol, C. ; Audoin, B.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00181929

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing
Beaudoin, F. ; Desplats, R. ; Perdu, P. ; Firiti, Abdellatif ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-01887652

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization
Beauchêne, T. ; Lewis, D. ; Beaudoin, F. ; Pouget, V. ; Desplats, R. ; Fouillat, P. ; Perdu, P. ; Bafleur, Marise ; Trémouilles, David
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-01887647

A physical approach on SCOBIC investigation in VLSI
Beauchêne, T. ; Lewis, D. ; Beaudoin, F. ; Pouget, V. ; Perdu, P. ; Fouillat, P. ; Danto, Y.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-01887645

Investigation of single-event transients in voltage-controlled oscillators
Chen, W. ; Pouget, V. ; Barnaby, H.J. ; Cressler, J. D. ; Niu, G. ; Fouillat, P. ; Deval, Y. ; Lewis, D.
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-01887654

2002


Heavy ion-induced charge collection mechanisms in CMOS active pixel sensor
Belredon, X. ; David, J. ; Lewis, D. ; Beauchene, T. ; Pouget, V. ; Barde, S. ; Magnan, P.
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-01887641

Single-Event Sensitivity of a Single SRAM Cell
Darracq, Frédéric ; Beauchene, Thomas ; Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Touboul, Andre
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00185398

Evaluation of a Design Methodology Dedicated to Dose-Rate-Hardened Linear Integrated Circuits
Deval, Yann ; Lapuyade, Hervé ; Fouillat, Pascal ; Barnaby, H. J. ; Darracq, Frédéric ; Briand, Renaud ; Lewis, Dean ; Schrimpf, Rd
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00184299

Study of the interaction between Heavy Ions and Integrated Circuits using a Pulsed Laser Beam
Lewis, Dean ; Fouillat, Pascal ; Pouget, Vincent ; Lapuyade, Hervé
Dans : European Physical Journal: Applied Physics
https://hal.archives-ouvertes.fr/hal-00185399

2001


Front side and Backside OBIT Mappings applied to Single Event Transient Testing
Lewis, Dean ; Pouget, Vincent ; Beauchene, Thomas ; Lapuyade, Hervé ; Fouillat, Pascal ; Touboul, Andre ; Beaudoin, Félix ; Perdu, Philippe
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00185401

Backside Laser Testing of ICs for SET Sensitivity Evaluation
Lewis, Dean ; Pouget, Vincent ; Beaudoin, Félix ; Perdu, Philippe ; Lapuyade, Hervé ; Fouillat, Pascal ; Touboul, Andre
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00185400

Theoretical Investigation of an Equivalent Laser LET
Pouget, Vincent ; Lapuyade, Hervé ; Fouillat, Pascal ; Lewis, Dean ; Buchner, S.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00185402

2000


Laser Cross Section Measurement for the Evaluation of Single-Event Effects in Integrated Circuits
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Darracq, Frédéric ; Touboul, Andre
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00185403

SPICE Modeling of the Transient Response of Irradiated MOSFETs
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Deval, Yann ; Fouillat, Pascal ; Sarger, L.
Dans : IEEE Transactions on Nuclear Science
https://hal.archives-ouvertes.fr/hal-00184300

1999


Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
Pouget, Vincent ; Lewis, Dean ; Lapuyade, Hervé ; Briand, Renaud ; Fouillat, Pascal ; Sarger, L. ; Calvet, M. C.
Dans : Microelectronics Reliability
https://hal.archives-ouvertes.fr/hal-00185404

1995


OPTICAL AMMETER FOR INTEGRATED-CIRCUIT CHARACTERIZATION AND FAILURE ANALYSIS
Claeys, W. ; Dilhaire, S. ; Lewis, D. ; Quintard, V. ; Phan, T. ; Aucouturier, J. L.
Dans : Quality and Reliability Engineering International
https://hal.archives-ouvertes.fr/hal-01549895

1994


TESTING OF THE QUALITY OF SOLDER JOINTS THROUGH THE ANALYSIS OF THEIR THERMAL-BEHAVIOR WITH AN INTERFEROMETRIC LASER PROBE
Claeys, W. ; Quintard, V. ; Dilhaire, S. ; Lewis, D. ; Danto, Y.
Dans : Quality and Reliability Engineering International
https://hal.archives-ouvertes.fr/hal-01549896
Conference with proceedings (national) → 14 Show

2005


Intra-IC Inspection and Metrology with Picosecond Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Fouillat, Pascal ; Danto, Yves
Dans : 22nd IEEE Instrumentation and Measurement Technology Conference (IMTC) 2005, (Canada)
https://hal.archives-ouvertes.fr/hal-00182901

2004


Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE International Reliability Physics Symposium (IRPS), (United States)
https://hal.archives-ouvertes.fr/hal-00182909

Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics
Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean ; Plano, Bernard ; Danto, Yves
Dans : IEEE International Reliability Physics Symposium (IRPS), (United States)
https://hal.archives-ouvertes.fr/hal-00182908

Evaluation of SRAMs Reliability for Space Electronics Using Ultra Short Laser Pulses
Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Danto, Yves
Dans : 19th Symposium on Microelectronics Technology and Devices (SBMicro 2004), (Brazil)
https://hal.archives-ouvertes.fr/hal-00185409

Applications de l acoustique picoseconde à l analyse non destructive de circuits intégrés
Rampnoux, J. M. ; Ezzahri, Y. ; Dilhaire, S. ; Grauby, S. ; Claeys, W. ; Rossignol, C. ; Audoin, B. ; Andriamonje, Grégory ; Pouget, Vincent ; Ousten, Yves ; Lewis, Dean
Dans : Colloque Interdisciplinaire en Instrumentation (C2I), (France)
https://hal.archives-ouvertes.fr/hal-00182903

2001


Single-event Sensitivity of a single SRAM cell
Darracq, Frédéric ; Beauchene, Thomas ; Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Touboul, Andre
Dans : RADECS, (France)
https://hal.archives-ouvertes.fr/hal-00185411

Evaluation of a Design Methodology Dedicated to Dose Rate Hardened Linear Integrated Circuits
Deval, Yann ; Briand, Renaud ; Fouillat, Pascal ; Barnaby, H. J. ; Lapuyade, Hervé ; Lewis, Dean ; Schrimpf, Rd
Dans : European Conference on Radiation and its Effects on Components and Systems (RADECS), (France)
https://hal.archives-ouvertes.fr/hal-00184303

Test de circuits intégrés par faisceau laser pulsé
Lewis, Dean ; Pouget, Vincent ; Darracq, Frédéric ; Lapuyade, Hervé ; Fouillat, Pascal
Dans : Colloque Interdisciplinaire en Instrumentation (C2I), (France)
https://hal.archives-ouvertes.fr/hal-00185412

A New Laser System for X-Rays Flashes Sensitivity Evaluation
Lewis, Dean ; Lapuyade, Hervé ; Deval, Yann ; Maidon, Yvan ; Darracq, Frédéric ; Briand, Renaud ; Fouillat, Pascal
Dans : Proc. of the 7th IEEE International On-Line Testing Workshop, (Italy)
https://hal.archives-ouvertes.fr/hal-00184302

2000


An Overview of the Applications of a Pulsed Laser System for SEU Testing
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Sarger, L. ; Roche, Fernand-Michel ; Ecoffet, R.
Dans : 6th IEEE International On Line Testing Workshop, (Spain)
https://hal.archives-ouvertes.fr/hal-00185413

1999


A New SPICE Model Dedicated to the Analysis of the Transient Response of Irradiated MOSFETS for On Line Testing
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Sarger, L.
Dans : 5th IEEE International On Line Testing Workshop, (Greece)
https://hal.archives-ouvertes.fr/hal-00185414

SPICE Modeling of the Transient Response of Irradiated MOSFETs
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Deval, Yann ; Fouillat, Pascal ; Sarger, L.
Dans : 5th European Conference on Radiation and its Effects on Components and Systems (RADECS), (France)
https://hal.archives-ouvertes.fr/hal-00184305

1998


New Capabilities for SEE Testing with a Femtosecond Pulsed Laser System
Pouget, Vincent ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Sarger, L.
Dans : Journées Nationales d Etudes de l association RADECS, (United Kingdom)
https://hal.archives-ouvertes.fr/hal-00185416

Elaboration of a New Pulsed Laser System for SEE Testing
Pouget, Vincent ; Calin, T. ; Lapuyade, Hervé ; Lewis, Dean ; Fouillat, Pascal ; Velazco, R. ; Maidon, Yvan ; Sarger, L.
Dans : 4th IEEE International On Line Testing Workshop, (Italy)
https://hal.archives-ouvertes.fr/hal-00185415
Conference with proceedings (international) → 56 Show

2014


Improved integrated circuits qualification using dynamic laser stimulation technique
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, D.
Dans : IEEE International Reliability Physics Symposium, 2009, Montreal (Canada)
https://hal.archives-ouvertes.fr/hal-00988351

Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Guillet, Jean-Paul ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, Dean
Dans : 21th International symposium on the Physical and Failure Analysis of integrated circuits, Singapour (Singapore)
https://hal.archives-ouvertes.fr/hal-01091188

Temperature Effect on Reflected Laser Probing Signal of Multiple Elementary Substructures
Rebai, Mohamed ; Darracq, Frédéric ; Guillet, Jean-Paul ; Perdu, Philippe ; Sanchez, Kévin ; Lewis, D.
Dans : 21th International symposium on the Physical and Failure Analysis of integrated circuits (IPFA), Singapour (Singapore)
https://hal.archives-ouvertes.fr/hal-01020683

2013


Analysis of Short-Term NBTI Effect on the Single-Event Upset Sensitivity of a 65nm SRAM using Two-Photon Absorption
Issam, El Moukthari ; Pouget, Vincent ; Darracq, Frédéric ; Larue, Camille ; Lewis, Dean ; Perdu, Philippe
Dans : 14th European Conference on Radiation and Its Effects on Components and Systems, Oxford (United Kingdom)
https://hal.archives-ouvertes.fr/hal-01091193

How to Interpret the Reflected Laser Probe Signal of Multiple Elementary Substructures in Very Deep Submicron Technologies
Rebai, Mohamed Mehdi ; Darracq, Frédéric ; Lewis, D. ; Perdu, Philippe ; Sanchez, Kévin
Dans : 39th International Symposium for Testing and Failure Analysis (ISTFA 2013), San José (United States)
https://hal.archives-ouvertes.fr/hal-00903364

2012


Building the electricalmodel of the PhotoelectricLaserStimulation of a NMOS transistor in 90 nm technology
Alexandre, Sarafianos ; Llido, R. ; Dutertre, Jean-Max ; Gagliano, Olivier ; Serradeil, Valérie ; Lisart, Mathieu ; Goubier, V. ; Tria, Assia ; Pouget, Vincent ; Lewis, D.
Dans : 38th International Symposium for Testing and Failure Analysis, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-00742629

Signal propagation analysis by digital lock-in time resolved imaging
Bascoul, G. ; Perdu, Philippe ; Lewis, D.
Dans : 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2012, Singapour (Singapore)
https://hal.archives-ouvertes.fr/hal-00988346

Improving defect localization techniques with laser beam with specific analysis and set-up modules
Llido, R. ; Gomez, J. ; Goubier, V. ; Haller, G. ; Pouget, V. ; Lewis, D.
Dans : 2012 IEEE International Reliability Physics Symposium (IRPS), (France)
https://hal.archives-ouvertes.fr/hal-00988382

Characterization and TCAD Simulation of 90nm Technology PMOS Transistor Under Continuous Photoelectric Laser Stimulation for Failure Analysis Improvement
Llido, R ; Sarafianos, A ; Gagliano, O ; Serradeil, V ; Goubier, V ; Lisart, M ; Haller, G ; Pouget, Vincent ; Lewis, Dean ; Dutertre, Jean-Max ; Tria, Assia
Dans : 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-01130626

Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology
Sarafianos, A ; Llido, R ; Gagliano, O ; Serradeil, V ; Lisart, Mathieu ; Goubier, V. ; Dutertre, Jean-Max ; Tria, Assia ; Pouget, Vincent ; Lewis, Dean
Dans : 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix (United States)
https://hal-emse.ccsd.cnrs.fr/emse-01130636

Characterization and TCAD simulation of 90 nm technology transistors under continuous photoelectric laser stimulation for failure analysis improvement
Sarafianos, Alexandre ; Llido, R. ; Gagliano, Olivier ; Serradeil, Valérie ; Goubier, V. ; Lisart, M. ; Haller, G. ; Pouget, V. ; Lewis, D. ; Dutertre, Jean-Max ; Tria, Assia
Dans : 19th IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS, Singapore (Singapore)
https://hal-emse.ccsd.cnrs.fr/emse-00742705

2011


Time resolved imaging at low power supply on 45nm technology
Bascoul, G. ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, D. ; Dudit, Sylvain ; Celi, Guillaume
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2011, Incheon (South Korea)
https://hal.archives-ouvertes.fr/hal-00988376

Imaging the Single Event Burnout sensitive volume of vertical power MOSFETs using the laser Two-Photon Absorption technique
Darracq, Frédéric ; Mbaye, Nogaye ; Larue, Camille ; Pouget, V. ; Azzopardi, Stephane ; Lorfèvre, E. ; Bezerra, F. ; Lewis, D.
Dans : 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Seville (Spain)
https://hal.archives-ouvertes.fr/hal-00772102

3D current path in stacked devices: Metrics and challenges
Kor, H.B ; Infante, Fulvio ; Perdu, Philippe ; Gan, P. ; Lewis, D.
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2011, Incheon (South Korea)
https://hal.archives-ouvertes.fr/hal-00988371

Comparison of classical and two-photon photoelectric laser stimulation capabilities for failure analysis
Shao, Kai ; Pouget, V. ; Faraud, Emeric ; Larue, C. ; Lewis, D.
Dans : 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Incheon (South Korea)
https://hal.archives-ouvertes.fr/hal-00669828

2010


Facing the defect characterization and localization challenges of bridge defects on submicronic technology (45nm and below)
Celi, Guillaume ; Dudit, Sylvain ; Perdu, Philippe ; Reverdy, A. ; Parrassin, T. ; Bechet, E. ; Lewis, Dean ; Vallet, M.
Dans : 20th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Monteccassino (Italy)
https://hal.archives-ouvertes.fr/hal-00585662

Dynamic power analysis under laser stimulation: a new Dynamic Laser Simulation approach
Deyine, Amjad ; Perdu, Philippe ; Sanchez, K. ; Courrège, J.C. ; Lewis, Dean
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.archives-ouvertes.fr/hal-00585673

Magnetic Microscopy for 3D structures: use of the Simulation Approach for the
precise localization of deep buried weak currents
Infante, Fulvio ; Gomes, R. ; Perdu, Philippe ; Battistella, Fabien ; Annereau, Sébastien ; Lewis, D.
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.archives-ouvertes.fr/hal-00988364

Magnetic microscopy for 3D structures: use of the Simulation Approach for the precise localization of deep buried weak currents
Infante, Fulvio ; Gomes, Rodolphe ; Perdu, Philippe ; Battistella, Fabien ; Annereau, Sébastien ; Lewis, Dean
Dans : 36th International Symposium for Testing and Failure Analysis, Addison (United States)
https://hal.archives-ouvertes.fr/hal-00585670

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulation
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : 20th European Symposium Reliabilty on Electron Devices, Failure Physics and Analysis (ESREF) 2010, Monteccassino (Italy)
https://hal.archives-ouvertes.fr/hal-00585666

2009


Investigation of single event burnout sensitive depth in power MOSFETS
Darracq, Frédéric ; Pouget, V. ; Lewis, D. ; Fouillat, P. ; Lorfèvre, E. ; Ecoffet, R. ; Bezerra, F.
Dans : 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS),, Bruges (Belgium)
https://hal.archives-ouvertes.fr/hal-00667364

Full Dynamic Laser simulation set up
Deyine, Amjad ; Sanchez, Kevin ; Perdu, Philippe ; Battistella, F. ; Lewis, D. ; Deslandes, H.
Dans : 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009., Suzhou (China)
https://hal.archives-ouvertes.fr/hal-00988356

Net integrity checking by optical localization techniques
Haller, G. ; Machouat, A. ; Lewis, Dean ; Pouget, Vincent
Dans : 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Arcachon (France)
https://hal.archives-ouvertes.fr/hal-00585657

Magnetic Microscopy for 3D devices: defect localization with high resolution and long working distance on complex System in Package
Infante, F. ; Perdu, Philippe ; Lewis, Dean
Dans : 19th European Symposium Reliability on Electron Devices, Failure Physics and Analysis (ESREF) 2009, Arcachon (France)
https://hal.archives-ouvertes.fr/hal-00585654

Short circuit localization on integrated circuits using magnetic microscopy techniques coupled to simulations
Infante, F. ; Perdu, Philippe ; Petremont, S. ; Lewis, Dean
Dans : 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou (China)
https://hal.archives-ouvertes.fr/hal-00585648

Best test pattern failure analysis flow for functional logic failure localization by IR-OBIRCH technique
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, D. ; Perdu, Philippe ; Pouget, V. ; Essely, Fabien
Dans : International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, Singapour (Singapore)
https://hal.archives-ouvertes.fr/hal-00670058

Picosecond Single-Photon and Femtosecond Two-Photon Pulsed Laser Stimulation for IC Characterization and Failure Analysis
Pouget, V. ; Faraud, Emeric ; Shao, Kai ; Jonathas, S. ; Horain, D. ; Haller, G. ; Goubier, V. ; Picart, B. ; Forli, L. ; Lewis, D.
Dans : 35th International Symposium for Testing and Failure Analysis (ISTFA), Sans José (United States)
https://hal.archives-ouvertes.fr/hal-00670060

2008


Dynamic Laser Stimulation Technique for device qualification process
Deyne-Barth, A. ; Perdu, Philippe ; Benetti, G. ; Sanchez, Kevin ; Battistella, F. ; Lewis, Dean
Dans : International Symposium for Testing and Failure Analysis (ISTFA), (France)
https://hal.archives-ouvertes.fr/hal-00401698

Effect of Physical defect on schmoos in CMOS DSM technologies
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Perdu, Philippe ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Maastricht (Netherlands)
https://hal.archives-ouvertes.fr/hal-00401696

Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure
Machouat, A. ; Haller, G. ; Goubier, V. ; Lewis, Dean ; Pouget, Vincent ; Fouillat, Pascal ; Essely, Fabien ; Perdu, Philippe
Dans : 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapour (Singapore)
https://hal.archives-ouvertes.fr/hal-00398000

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection
Pouget, V. ; Douin, A. ; Foucard, G. ; Peronnard, P. ; Lewis, D. ; Fouillat, P. ; Velazco, R.
Dans : 14th IEEE International Symposium On-Line Testing (IOLT'08), Rhodes (Greece)
https://hal.archives-ouvertes.fr/hal-00347751

Failure Analysis enhancement by evaluating the photoelectric laser stimulation impact on mixed-mode ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Sanchez, Kevin ; Crepel, Olivier ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Maastricht (Netherlands)
https://hal.archives-ouvertes.fr/hal-00401699

Failure analysis enhancement by evaluating the thermal laser stimulation impact on analog ICs
Sienkiewicz, Magdalena ; Perdu, Philippe ; Firiti, Abdellatif ; Crepel, Olivier ; Lewis, Dean
Dans : International Symposium on the Physical and Failure Analysis on Integrated Circuits (IPFA), Suzhou (China)
https://hal.archives-ouvertes.fr/hal-00401695

2007


Picosecond Timing Analysis in Integrated Circuits with Pulsed Laser Stimulation
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : 45th annual ieee International Reliability Physics Symposium (IRPS), Phoenix (United States)
https://hal.archives-ouvertes.fr/hal-00204584

Jitter Improvement of Time-Resolved Photoelectric Laser Stimulation for Dynamic Imaging of Integrated Circuits
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Philippe
Dans : Instrumentation and Measurement Technology Conference 2007, Varsovie (Poland)
https://hal.archives-ouvertes.fr/hal-00204580

IC Debug and Defect Localization using Dynamic Laser Stimulation and Time-Resolved Emission
Ferrigno, Julie ; Perdu, Philippe ; Sanchez, Kevin ; Lewis, Dean ; Vallet, Michel ; Dudit, Sylvain
Dans : 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2007, Bangalore (India)
https://hal.archives-ouvertes.fr/hal-00204582

Study of Single Event Transients in High-Speed Operational Amplifiers
Jaulent, Patrice ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : 9th European Conference on Radiation and its Effects on Components and Systems (RADECS), Deauville (France)
https://hal.archives-ouvertes.fr/hal-00397836

Tools and methodology development for pulsed laser fault injection in SRAM-based FPGAs
Pouget, V. ; Douin, A. ; Lewis, D. ; Fouillat, P. ; Foucard, G. ; Peronnard, P. ; Maingot, V. ; Ferron, J. ; Anghel, L. ; Leveugle, R. ; Velazco, R.
Dans : 8th Latin-American Test Workshop (LATW'07), Cuzco (Peru)
https://hal.archives-ouvertes.fr/hal-00156318

Failure Localization and design debug on mixed-mode ICs by using the dynamic laser stimulation techniques
Sienkiewicz, Magdalena ; Sanchez, Kevin ; Firiti, Abdellatif ; Crepel, Olivier ; Perdu, Philippe ; Lewis, Dean
Dans : International Symposium for Testing and Failure Analysis (ISTFA) 2007, San Jose (United States)
https://hal.archives-ouvertes.fr/hal-00204668

2006


Time resolved imaging using synchronous picosecond photoelectric laser stimulation
Douin, Alexandre ; Pouget, Vincent ; De Matos, Magali ; Lewis, Dean ; Perdu, Philippe ; Fouillat, Pascal
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Wuppertal (Germany)
https://hal.archives-ouvertes.fr/hal-00401692

Applications of various optical techniques for ESD defect localization
Essely, Fabien ; Darracq, Frédéric ; Pouget, Vincent ; Remmach, Mustapha ; Beaudoin, Félix ; Guitard, Nicolas ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), wuppertal (Germany)
https://hal.archives-ouvertes.fr/hal-00401519

OBIC technique for ESD defect localization : Influence of the experimental procedure
Essely, F. ; Guitard, Nicolas ; Darracq, F. ; Pouget, V. ; Bafleur, Marise ; Touboul, A. ; Lewis, D.
Dans : 3th Workshop EOS/ESD/EMI, Toulouse (France)
https://hal.archives-ouvertes.fr/hal-00327412

Optimizing pulsed OBIC technique for ESD defect localization
Essely, Fabien ; Guitard, Nicolas ; Darracq, Frédéric ; Pouget, Vincent ; Bafleur, Marise ; Perdu, Philippe ; Touboul, Andre ; Lewis, Dean
Dans : 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapour (Singapore)
https://hal.archives-ouvertes.fr/hal-00204574

Dynamic optical techniques for IC debug and failure analysis
Ferrigno, Julie ; Desplats, Romain ; Perdu, Philippe ; Sanchez, Kevin ; Beaudoin, Félix ; Lewis, Dean
Dans : 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2006, Singapour (Singapore)
https://hal.archives-ouvertes.fr/hal-00204578

In-depth resolution for LBIC technique by two-photon absorption
Wan, Dong Yun ; Pouget, Vincent ; Douin, Alexandre ; Jaulent, Patrice ; Lewis, Dean ; Fouillat, Pascal
Dans : Beam Injection Assessment of Microstructurs in Semiconductors (BIAMS), Saint Petersbourg (Russia)
https://hal.archives-ouvertes.fr/hal-00401693

2005


Influence of Laser Pulse Duration in Single Event Upset Testing
Douin, Alexandre ; Pouget, Vincent ; Darracq, Frédéric ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Phillipe
Dans : 8th European Conference on Radiation and its Effects on Components and Systems (RADECS) 2005, Cap d'Agde (France)
https://hal.archives-ouvertes.fr/hal-00397942

Electrical Modeling for Laser Testing with Different Pulse Durations
Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal ; Perdu, Phillipe
Dans : 11th IEEE International On Line Testing Symposium, Saint Raphael (France)
https://hal.archives-ouvertes.fr/hal-00397739

Impact of semiconductors material on IR stimulation signal
Firiti, Abdellatif ; Beaudoin, Félix ; Haller, G. ; Perdu, Philippe ; Lewis, Dean ; Fouillat, Pascal
Dans : European Symposium of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon (France)
https://hal.archives-ouvertes.fr/hal-00401389

Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
Guitard, Nicolas ; Essely, Fabien ; Trémouilles, David ; Bafleur, Marise ; Nolhier, Nicolas ; Perdu, Philippe ; Touboul, Andre ; Pouget, Vincent ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.archives-ouvertes.fr/hal-00401483

Identification of Some Key Parameters for Photoelectric Laser Simulation of IC: An Experimental Approach
Perdu, Phillipe ; Desplats, Romain ; Sanchez, Kevin ; Beaudoin, Félix ; Lewis, Dean ; Pouget, Vincent ; Douin, Alexandre ; Fouillat, Pascal
Dans : 12th International Symposium on the Physical and Failure Analysis Circuits (IPFA), Singapour (Singapore)
https://hal.archives-ouvertes.fr/hal-00397736

Light Emission to time resolved emission for IC debug and failure analysis
Remmach, Mustapha ; Pigozzi, A. ; Desplats, Romain ; Perdu, Philippe ; Lewis, Dean ; Noel, J. ; Dudit, Sylvain
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.archives-ouvertes.fr/hal-00401497

NIR Laser stimulation for dynamic timing analysis
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Roux, J.P. ; Lewis, Dean
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), arcachon (France)
https://hal.archives-ouvertes.fr/hal-00401503

Delay Variation Mapping Induced by Dynamic Laser Stimulation
Sanchez, Kevin ; Desplats, Romain ; Beaudoin, Félix ; Perdu, Philippe ; Lewis, Dean ; Vedagarbha, P.
Dans : IEEE International Reliability Physics Symposium (IRPS), Santa Clara (United States)
https://hal.archives-ouvertes.fr/hal-00401387

2001


Improving an SEU Hard Design using a Pulsed Laser
DUTERTRE, Jean-Max ; Roche, Fernand-Michel ; Fouillat, Patrice ; Lewis, Dean
Dans : Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on, Grenoble (France)
https://hal-emse.ccsd.cnrs.fr/emse-01130950

1998


Elaboration of a new pulsed laser system for SEE testing
Pouget, V. ; Calin, T. ; Lapuyade, H. ; Lewis, D. ; Fouillat, P. ; Velazco, R. ; Maidon, Y. ; Sarger, L.
Dans : IEEE International On-Line Testing Workshop (IOLTW'98), Capri (Italy)
https://hal.archives-ouvertes.fr/hal-01384704

1993


EARLY DETECTION OF AGING IN SOLDER JOINTS THROUGH LASER PROBE THERMAL-ANALYSIS OF THE PELTIER EFFECT
Claeys, W. ; Quintard, V. ; Dilhaire, S. ; Lewis, D. ; Danto, Y.
Dans : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 1993 (ESREF 93), Unknown (Unknown Region)
https://hal.archives-ouvertes.fr/hal-01549746
Conference without proceedings → 13 Show

2017


Performances and robustness of IR seed Laser diodes under large overcurrent and short-pulse conditions for fiber Laser applications
Galès, Germain Le ; Joly, Simon ; Bolanos, Western ; Pedroza, Guillaume ; Morisset, Adèle ; Darracq, Frédéric ; Lewis, Dean ; Bettiati, Mauro ; Laruelle, François ; Bechou, Laurent
Dans : EMN Americas Meetings, Victoria (Canada)
https://hal.archives-ouvertes.fr/hal-01719975

2013


Characterization and modelling of laser-induced single-event burn-out in SiC power diodes
Mbaye, N. ; Pouget, V. ; Darracq, F. ; Lewis, D.
Dans : ESREF 2013, Arcachon (France)
https://hal.archives-ouvertes.fr/hal-01935694

Analysis of short-term NBTI effect on the Single-Event Upset sensitivity of a 65nm SRAM using two-photon absorption
Moukhtari, I. El ; Pouget, V. ; Darracq, F. ; Larue, C. ; Perdu, P. ; Lewis, D.
Dans : IEEE RADECS, Oxford (United Kingdom)
https://hal.archives-ouvertes.fr/hal-01935693

Impact of Negative Bias Temperature Instability on the Single-Event Upset Threshold of a 65nm SRAM cell
Moukhtari, I. El ; Pouget, V. ; Larue, C. ; Darracq, Frédéric ; Lewis, D. ; Perdu, P.
Dans : ESREF 2013, Arcachon (France)
https://hal.archives-ouvertes.fr/hal-01935692

2008


SET sensitive volume imaging and measurement with two-photon absorption laser testing
Jaulent, Patrice ; Pouget, Vincent ; Mcmorrow, D. ; Bezerra, F. ; Fouillat, Pascal ; Lewis, Dean
Dans : Nuclear and Space Radiation Effects Conference (NSREC), Tucson (United States)
https://hal.archives-ouvertes.fr/hal-00401702

2007


Single Event Transient Mapping of a Voltage-Controlled Oscillator
Pouget, Vincent ; Chen, W. ; Lewis, Dean ; Barnaby, H. J. ; Fouillat, Pascal
Dans : 16th Single-Event Effects Symposium, Long Beach (United States)
https://hal.archives-ouvertes.fr/hal-00398024

2006


Recent developments for SEE testing at the ATLAS laser facility
Pouget, Vincent ; Wan, Dong Yun ; Jaulent, Patrice ; Douin, Alexandre ; Lewis, Dean ; Fouillat, Pascal
Dans : 15th Single-Event Effects Symposium, Long Beach (United States)
https://hal.archives-ouvertes.fr/hal-00398021

2005


Banc de génération et détection de faisceau THz par photo commutateur ultrarapide sur GaAs BT
Mounaix, Patrick ; Tondusson, M. ; Sarger, Laurent ; Douin, Alexandre ; Pouget, Vincent ; Lewis, Dean ; Fouillat, Pascal
Dans : 3ème journées Thz, Aussois (France)
https://hal.archives-ouvertes.fr/hal-00398013

2004


Implementing laser based failure analysis methodologies using test vehicles
Lewis, D. ; Pouget, V. ; Beaudoin, F. ; Beauchene, T. ; Haller, G. ; Desplat, R. ; Perdu, P. ; Fouillat, P.
Dans : 2004 International Conference on Microelectronic Test Structures, Awaji Yumebutai (Japan)
https://hal.archives-ouvertes.fr/hal-01887706

Radiation Hardness Assessment of an ADC for Space Application using a Laser Test Equipment
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean ; Darracq, Frédéric
Dans : Proc. of XIX Conference on Design of Circuits and Integrated Systems (DCIS) 2004, ISBN 2-9522971-0-X, Bordeaux (France)
https://hal.archives-ouvertes.fr/hal-01887701

2003


Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC
Pouget, V. ; Lewis, D. ; Fouillat, P.
Dans : 2003 IEEE Instrumentation and Measurement Technology Conference (IMTC 2003), Vail (United States)
https://hal.archives-ouvertes.fr/hal-01887685

Performance impact of various SEE mechanisms in classical analog-to-digital converter architectures
Pouget, V. ; Fouillat, P. ; Velazco, R. ; Lewis, D. ; Dallet, D.
Dans : IEEE Nuclear and Space Radiation Effects Conference (NSREC'03), Monterey, CA (United States)
https://hal.archives-ouvertes.fr/hal-01376266

2002


Laser Utilization for Various Testing Purposes
Fouillat, Pascal ; Lewis, Dean ; Lapuyade, Hervé ; Pouget, Vincent
Dans : 3rd IEEE Latin American Test Worksop LATW 02, (Uruguay)
https://hal.archives-ouvertes.fr/hal-00185423
Invited lectures → 6 Show

2008


Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges
Perdu, Philippe ; Lewis, Dean ; Pouget, V.
Dans : European Symposium on Reliability of Electron Devices (ESREF), Maastricht (Netherlands)
https://hal.archives-ouvertes.fr/hal-00401385

2007


CAD tools dedicated to the design and test of RFICs
Deval, Yann ; Taris, Thierry ; Shirakawa, Alexandre ; Mazouffre, Olivier ; Pouget, Vincent ; Kerherve, Eric ; Lewis, Deal ; Begueret, Jean-Baptiste
Dans : Design, Automation & Test in Europe (DATE) 2007, (France)
https://hal.archives-ouvertes.fr/hal-00178343

2006


A Review and some Future Prospects on Laser-Based Techniques for Single-Event Effects Testing and Analysis
Fouillat, Pascal ; Pouget, Vincent ; Lewis, Dean ; Darracq, Frédéric
Dans : International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA), Tokyo (Japan)
https://hal.archives-ouvertes.fr/hal-00398038

Fundamentals of the Pulsed Laser Technique for single-event effects testing
Mcmorrow, D. ; Pouget, Vincent ; Fouillat, Pascal ; Darracq, Frédéric ; Buchner, S. ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Séville (Spain)
https://hal.archives-ouvertes.fr/hal-00401321

2005


Fundamentals of the Pulsed Laser Technique for single-event upset testing
Fouillat, Pascal ; Pouget, Vincent ; Mcmorrow, D. ; Darracq, Frédéric ; Buchner, S. ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Manaus (Brazil)
https://hal.archives-ouvertes.fr/hal-00401314

Laser SEE Testing and Analysis Case Studies
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean
Dans : School on the Effects of Radiation on Embedded Systems for Space Application (SERESSA), Manaus (Brazil)
https://hal.archives-ouvertes.fr/hal-00401316
Book chapters → 3 Show

2007


Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing
Fouillat, P. ; Pouget, V. ; Mcmorrow, D. ; Darracq, F. ; Buchner, S. ; Lewis, D.
https://hal.archives-ouvertes.fr/hal-00206315

Using the SEEM software for SET testing and analysis
Pouget, Vincent ; Fouillat, Pascal ; Lewis, Dean
https://hal.archives-ouvertes.fr/hal-00397867

Using the SEEM Software for Laser SET Testing and Analysis
Pouget, V. ; Fouillat, P. ; Lewis, D.
https://hal.archives-ouvertes.fr/hal-00206320
Directions of work or proceedings → 1 Show

2009


Proceedings of 20th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2009 (Special issue of Microelectronics Reliability, Vol. 49, Issues 9-11)
Labat, Nathalie ; Lewis, D.
https://hal.archives-ouvertes.fr/hal-00670468